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Yelena V. White, Ph.D.

Affiliations: 
2005 Vanderbilt University, Nashville, TN 
Area:
Optics Physics, Condensed Matter Physics
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"Yelena White"
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Norman H. Tolk grad student 2005 Vanderbilt
 (Charge carrier dynamics in silicon-on-insulator and silicon/silicon dioxide/magnesium oxide heterostructures studied by second-harmonic generation.)

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Publications

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White YV, Lu X, Pasternak R, et al. (2006) Studies of charge carrier trapping and recombination processes in Si/SiO 2/MgO structures using second-harmonic generation Applied Physics Letters. 88
Jun B, Schrimpf RD, Fleetwood DM, et al. (2004) Charge trapping in irradiated SOI wafers measured by second harmonic generation Ieee Transactions On Nuclear Science. 51: 3231-3237
Jun B, White YV, Schrimpf RD, et al. (2004) Characterization of multiple Si/SiO 2 interfaces in silicon-on-insulator materials via second-harmonic generation Applied Physics Letters. 85: 3095-3097
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