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Zhi Cui, Ph.D.

Affiliations: 
2005 University of Central Florida, Orlando, FL, United States 
Area:
Electronics and Electrical Engineering
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"Zhi Cui"
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Juin J. Liou grad student 2005 University of Central Florida
 (Modeling and simulation of long term degradation and lifetime of deep -submicron MOS device and circuit.)

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Publications

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Cui Z, Liou JJ, Yue Y, et al. (2006) A new approach to characterize and predict lifetime of deep-submicron nMOS devices International Journal of High Speed Electronics and Systems. 16: 315-323
Cui Z, Liou JJ. (2005) A spice-like reliability model for deep-submicron CMOS technology Solid-State Electronics. 49: 1702-1707
Cui Z, Liou JJ, Yue Y, et al. (2005) Substrate current, gate current and lifetime prediction of deep-submicron nMOS devices Solid-State Electronics. 49: 505-511
Cui Z, Liou JJ, Yue Y. (2003) A new extrapolation method for long-term degradation prediction of deep-submicron MOSFETs Ieee Transactions On Electron Devices. 50: 1398-1401
Cui Z, Liou JJ, Yue Y, et al. (2003) Empirical reliability modeling for 0.18-μm MOS devices Solid-State Electronics. 47: 1515-1522
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