G S. Cargill
Affiliations: | Lehigh University, Bethlehem, PA, United States |
Area:
Materials Science Engineering, Electricity and Magnetism PhysicsGoogle:
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Publications
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| Maniatty AM, Cargill GS, Moyer LE, et al. (2011) Investigation of thermal stress variability due to microstructure in thin aluminum films Journal of Applied Mechanics, Transactions Asme. 78: 0110121-0110128 |
| Hongqing Z, Cargill GS, Youzhang G, et al. (2008) Grain-scale strain and orientation measurements during electromigration in Al conductor lines by synchrotron x-ray microbeam diffraction Materials Research Society Symposium Proceedings. 1027: 7-12 |
| Zhang H, Cargill GS, Ge Y, et al. (2008) Strain evolution in Al conductor lines during electromigration Journal of Applied Physics. 104 |
| Nikiforov AY, Cargill GS, Guo SP, et al. (2008) Effects of bias on cathodoluminescence in ZnCdSe quantum well light emitting diodes Journal of Applied Physics. 104: 114506 |
| Zhang H, Wang G, Cargill GS. (2007) Local Melting during Electromigration in Cu Conductor Lines Journal of Electronic Materials. 36: 117-122 |
| Wang G, Zhang H, Cargill GS, et al. (2006) Thermal and Electromigration-Induced Strains in Copper Conductor Lines: X-ray Microbeam Measurements and Analysis Mrs Proceedings. 914 |
| Nikiforov AY, Cargill GS, Guo SP, et al. (2005) Electron bombardment induced enhancement of luminescence from ZnCdMgSe quantum well light emitting diodes Journal of Applied Physics. 97: 63521 |
| Collins CJ, Sampath AV, Garrett GA, et al. (2005) Enhanced room-temperature luminescence efficiency through carrier localization in Alx Ga1-x N alloys Applied Physics Letters. 86: 1-3 |
| Cargill GS. (2004) White Beam X-ray Microdiffraction Analysis of Polycrystalline Thin Films Microscopy and Microanalysis. 10: 1024-1025 |
| Nikiforov AY, Cargill GS, Guo SP, et al. (2004) Time‐ and bias‐dependent effects in ZnCd(Mg)Se blue and red quantum well light emitting diodes studied by cathodoluminescence Physica Status Solidi B-Basic Solid State Physics. 241: 759-762 |