Bryan C. Valek, Ph.D.

Affiliations: 
2003 Stanford University, Palo Alto, CA 
Area:
Materials Science Engineering, Metallurgy Engineering
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John C. Bravman grad student 2003 Stanford
 (X-ray microdiffraction studies of mechanical behavior and electromigration in thin film structures.)
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Publications

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MacDowell AA, Celestre RS, Tamura N, et al. (2001) Submicron X-ray diffraction Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 467: 936-943
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