Scott X. Mao
Affiliations: | University of Pittsburgh, Pittsburgh, PA, United States |
Area:
Materials Science Engineering, Mechanical Engineering, Condensed Matter PhysicsGoogle:
"Scott Mao"Mean distance: (not calculated yet)
Children
Sign in to add traineeMinhua Zhao | grad student | 2004 | University of Pittsburgh |
Zhiwei Shan | grad student | 2005 | University of Pittsburgh |
Junhang Luo | grad student | 2010 | University of Pittsburgh |
Jiangwei Wang | grad student | 2009-2014 | Zhejiang University |
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Publications
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Zhong L, Zhang Y, Wang X, et al. (2024) Atomic-scale observation of nucleation- and growth-controlled deformation twinning in body-centered cubic nanocrystals. Nature Communications. 15: 560 |
Wang X, Zheng S, Deng C, et al. (2023) Atomic-Scale Observation of 5-Fold Twin Formation in Nanoscale Crystal under Mechanical Loading. Nano Letters |
Zhu Q, Huang Q, Guang C, et al. (2020) Metallic nanocrystals with low angle grain boundary for controllable plastic reversibility. Nature Communications. 11: 3100 |
Wang J, Zeng Z, Wen M, et al. (2020) Anti-twinning in nanoscale tungsten. Science Advances. 6: eaay2792 |
Wang X, Wang J, He Y, et al. (2020) Unstable twin in body-centered cubic tungsten nanocrystals. Nature Communications. 11: 2497 |
He Y, Li B, Wang C, et al. (2020) Direct observation of dual-step twinning nucleation in hexagonal close-packed crystals. Nature Communications. 11: 2483 |
Zhao S, Zhu Q, An X, et al. (2020) In situ atomistic observation of the deformation mechanism of Au nanowires with twin–twin intersection Journal of Materials Science & Technology. 53: 118-125 |
Zhu Q, Zhao S, Deng C, et al. (2020) In situ atomistic observation of grain boundary migration subjected to defect interaction Acta Materialia. 199: 42-52 |
Zhu Q, Cao G, Wang J, et al. (2019) In situ atomistic observation of disconnection-mediated grain boundary migration. Nature Communications. 10: 156 |
Spiecker E, Oh SH, Shan Z, et al. (2019) Insights into fundamental deformation processes from advanced in situ transmission electron microscopy Mrs Bulletin. 44: 443-449 |