G. J. Brakenhoff

University of Amsterdam, Amsterdam, Netherlands 
Applied Optics
"G. J. Brakenhoff"

Prof. dr. G.J. Brakenhoff at the Album Academicum of the University of Amsterdam

Mean distance: 11.47


Sign in to add mentor
Jacob Kistemaker grad student 1970 Amsterdam
 ( Instabilities in an ion beam-plasma system)


Sign in to add trainee
Koen Visscher grad student 1993 Amsterdam
BETA: Related publications


You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Xi P, Ren QS, Brakenhoff GJ. (2010) An international optical microscopy event-"Focus on Microscopy 2010" Chinese Science Bulletin. 55: 1840
Oomen LCJM, Sacher R, Brocks HHJ, et al. (2008) Immersion oil for high-resolution live-cell imaging at 37°C: Optical and physical characteristics Journal of Microscopy. 232: 353-361
Zwier JM, Oomen L, Brocks L, et al. (2008) Quantitative image correction and calibration for confocal fluorescence microscopy using thin reference layers and SIPchart-based calibration procedures Journal of Microscopy. 231: 59-69
Zwier JM, Oomen L, Brocks L, et al. (2007) Absolute and relative quantification and calibration for sectioning fluorescence microscopy using standardized uniform fluorescent layers and SIPchart based correction procedures Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6443
Pillai RS, Brakenhoff GJ, Müller M. (2007) Third harmonic generation: Anomalous behavior in the THG z-response and microscopy applications Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6442
Pillai RS, Brakenhoff GJ, Müller M. (2006) Analysis of the influence of spherical aberration from focusing through a dielectric slab in quantitative nonlinear optical susceptibility measurements using third-harmonic generation Optics Express. 14: 260-269
Pillai RS, Oh-E M, Yokoyama H, et al. (2006) Imaging colloidal particle induced topological defects in a nematic liquid crystal using third harmonic generation microscopy Optics Express. 14: 12976-12983
Pillai RS, Brakenhoff GJ, Muller M. (2006) Anomalous behavior in the third harmonic generation z response through dispersion induced shape changes and matching χ(3) Applied Physics Letters. 89
Brakenhoff GJ, Wurpel GWH, Jalink K, et al. (2005) Characterization of sectioning fluorescence microscopy with thin uniform fluorescent layers: Sectioned Imaging Property or SIPcharts Journal of Microscopy. 219: 122-132
Zwier JM, Van Rooij GJ, Hofstraat JW, et al. (2004) Image calibration in fluorescence microscopy Journal of Microscopy. 216: 15-24
See more...