Markus Brink, Ph.D.
Affiliations: | 2007 | Cornell University, Ithaca, NY, United States |
Area:
Condensed Matter PhysicsGoogle:
"Markus Brink"Mean distance: (not calculated yet)
Parents
Sign in to add mentorPaul L. McEven | grad student | 2007 | Cornell | |
(Imaging single -electron charging in nanostructures by low-temperature scanning force microscopy.) |
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Publications
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Abdo B, Brink M, Chow JM. (2017) Gyrator Operation Using Josephson Mixers Physical Review Applied. 8 |
Abdo B, Chavez-Garcia JM, Brink M, et al. (2017) Time-multiplexed amplification in a hybrid-less and coil-less Josephson parametric converter Applied Physics Letters. 110: 082601 |
Brink M, Lauer I, Engelmann SU, et al. (2014) Contamination mitigation of hydrogen silsesquioxane resist processed with Na+-containing developer for nanoscale CMOS device patterning Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 32 |
Zhu J, Brink M, McEuen PL. (2008) Single-electron force readout of nanoparticle electrometers attached to carbon nanotubes. Nano Letters. 8: 2399-404 |
Bunch JS, Yaish Y, Brink M, et al. (2005) Coulomb oscillations and Hall effect in quasi-2D graphite quantum dots. Nano Letters. 5: 287-90 |
Zhu J, Brink M, McEuen PL. (2005) Frequency shift imaging of quantum dots with single-electron resolution Applied Physics Letters. 87: 1-3 |
Yaish Y, Park JY, Rosenblatt S, et al. (2004) Electrical nanoprobing of semiconducting carbon nanotubes using an atomic force microscope. Physical Review Letters. 92: 046401 |
Javey A, Kim H, Brink M, et al. (2002) High-kappa dielectrics for advanced carbon-nanotube transistors and logic gates. Nature Materials. 1: 241-6 |
Park JY, Yaish Y, Brink M, et al. (2002) Electrical cutting and nicking of carbon nanotubes using an atomic force microscope Applied Physics Letters. 80: 4446-4448 |