Marcus H. Mendenhall
Affiliations: | Vanderbilt University, Nashville, TN |
Area:
Radiation Physics, Biomedical Engineering, OncologyGoogle:
"Marcus Mendenhall"Mean distance: (not calculated yet)
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Publications
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| Szabo CI, Cline JP, Henins A, et al. (2022) The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra. Journal of Research of the National Institute of Standards and Technology. 126: 126049 |
| Mendenhall MH, Black D, Windover D, et al. (2021) Polarization effects of X-ray monochromators modeled using dynamical scattering theory. Acta Crystallographica. Section a, Foundations and Advances. 77: 262-267 |
| Mendenhall MH, Black D, Cline JP. (2019) The optics of focusing bent-crystal monochromators on X-ray powder diffractometers with application to lattice parameter determination and microstructure analysis. Journal of Applied Crystallography. 52 |
| Mendenhall MH, Hudson LT, Szabo CI, et al. (2019) The Molybdenum K-shell X-ray Emission Spectrum. Journal of Physics. B, Atomic, Molecular, and Optical Physics : An Institute of Physics Journal. 52 |
| Mendenhall MH. (2018) Poisson errors and adaptive rebinning in X-ray Powder Diffraction Data. Powder Diffraction. 33 |
| Black DR, Mendenhall MH, Whitfield PS, et al. (2018) Certification of Standard Reference Material 1879b Respirable Cristobalite. Powder Diffraction. 33 |
| Mendenhall MH, Henins A, Hudson LT, et al. (2017) High-precision measurement of the X-ray Cu Kα spectrum. Journal of Physics. B, Atomic, Molecular, and Optical Physics : An Institute of Physics Journal. 50 |
| Mendenhall MH, Mullen K, Cline JP. (2015) An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line Profiles. Journal of Research of the National Institute of Standards and Technology. 120: 223-51 |
| Cline JP, Mendenhall MH, Black D, et al. (2015) The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials. Journal of Research of the National Institute of Standards and Technology. 120: 173-222 |
| Dasgupta A, Fleetwood DM, Reed RA, et al. (2010) Dose enhancement and reduction in SiO2 and high-κ MOS insulators Ieee Transactions On Nuclear Science. 57: 3463-3469 |