Glenn Chapman

Affiliations: 
Engineering Science Simon Fraser University, Burnaby, British Columbia, Canada 
Area:
Optics Physics, Electronics and Electrical Engineering
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"Glenn Chapman"
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Publications

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Chapman GH, Gray BL. (2016) Enhancing defect tolerance in periodic post microfluidic channels Progress in Biomedical Optics and Imaging - Proceedings of Spie. 9705
Chapman GH, Thomas R, Koren Z, et al. (2015) Enhanced correction methods for high density hot pixel defects in digital imagers Proceedings of Spie - the International Society For Optical Engineering. 9403
Mehran M, Gray BL, Chapman GH. (2015) Modeling defect tolerance sensitivity to periodic post parameters in microfluidic channels Progress in Biomedical Optics and Imaging - Proceedings of Spie. 9320
Chapman GH, Thomas R, Meneses KJCS, et al. (2015) Single Event Upsets and Hot Pixels in digital imagers Proceedings of the 2015 Ieee International Symposium On Defect and Fault Tolerance in Vlsi and Nanotechnology Systems, Dfts 2015. 41-46
Chapman GH, Qarehbaghi R, Roche S. (2014) Calibrating bimetallic grayscale photomasks to photoresist response for precise micro-optics fabrication Proceedings of Spie - the International Society For Optical Engineering. 8973
Chapman GH, Thomas R, Koren Z, et al. (2014) Correcting high-density hot pixel defects in digital imagers Proceedings of Spie - the International Society For Optical Engineering. 9022
Mehran M, Bryer J, Chapman GH, et al. (2014) Modeling particle flow and blockages in microfluidic channels supported by periodic posts Proceedings of Spie - the International Society For Optical Engineering. 8976
Chapman GH, Thomas R, Koren I, et al. (2014) Improved correction for hot pixels in digital imagers Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 116-121
Chapman GH, Thomas R, Koren Z, et al. (2013) Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO Proceedings of Spie - the International Society For Optical Engineering. 8659
Chapman GH, Thomas R, Koren I, et al. (2013) Improved image accuracy in Hot Pixel degraded digital cameras Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 172-177
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