Zuhui Chen, Ph.D.

Affiliations: 
2005 University of Florida, Gainesville, Gainesville, FL, United States 
Area:
Electronics and Electrical Engineering
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"Zuhui Chen"
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Chih-Tang Sah grad student 2005 UF Gainesville
 (Investigation of theoretical limitations of recombination DCIV methodology for characterization of MOS transistors.)
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Publications

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Chen Z, Jie BB, Sah CT. (2008) High concentration effects of neutral-potential-well interface traps on recombination dc current-voltage lineshape in metal-oxide-silicon transistors Journal of Applied Physics. 104
Chen Z, Jie BB, Sah CT. (2006) Effects of energy distribution of interface traps on recombination dc current-voltage line shape Journal of Applied Physics. 100
Chen Z, Jie BB, Sah CT. (2006) Theoretical accuracy of using Boltzmann and ionized impurity approximations in the analyses of recombination current at interface traps in metal-oxide-silicon structures Journal of Applied Physics. 99
Chen Z, Jie BB, Sah CT. (2006) Temperature dependences of surface recombination DC current-voltage characteristics in MOS structures Solid-State Electronics. 50: 1532-1539
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