Sign in to add mentor
Otto Scherzer grad student 1965 Technische Hochschule Darmstadt
 (Allgemeine Abbildungs-Eigenschaften unrunder Elektronenlinsen mit gerader optischer Achse.)
BETA: Related publications


You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Li Z, Biskupek J, Kaiser U, et al. (2022) Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick Samples. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-11
Rose H. (2022) Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector. Ultramicroscopy. 235: 113484
Mohn MJ, Biskupek J, Lee Z, et al. (2020) Lattice contrast in the core-loss EFTEM signal of graphene. Ultramicroscopy. 219: 113119
Lee Z, Lehnert T, Kaiser U, et al. (2019) Comparison of different imaging models handling partial coherence for aberration-corrected HRTEM at 40-80 kV. Ultramicroscopy
Rose H, Nejati A, Müller H. (2019) Magnetic Cc/Cs-corrector compensating for the chromatic aberration and the spherical aberration of electron lenses. Ultramicroscopy. 203: 139-144
Lee Z, Kaiser U, Rose H. (2018) Prospects of annular differential phase contrast applied for optical sectioning in STEM. Ultramicroscopy. 196: 58-66
Lee Z, Hambach R, Kaiser U, et al. (2016) Significance of matrix diagonalization in modelling inelastic electron scattering. Ultramicroscopy. 175: 58-66
Linck M, Hartel P, Uhlemann S, et al. (2016) Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV. Physical Review Letters. 117: 076101
Ophus C, Ciston J, Pierce J, et al. (2016) Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry. Nature Communications. 7: 10719
Lee Z, Biskupek J, Lehnert T, et al. (2016) Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations Microscopy and Microanalysis. 22: 894-895
See more...