Matthew Thomas Simons
Affiliations: | 2008-2014 | physics | College of William and Mary, Williamsburg, VA |
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| Simons MT, Haddab AH, Gordon JA, et al. (2019) Embedding a Rydberg Atom-Based Sensor Into an Antenna for Phase and Amplitude Detection of Radio-Frequency Fields and Modulated Signals Ieee Access. 7: 164975-164985 |
| Gordon JA, Simons MT, Haddab AH, et al. (2019) Weak electric-field detection with sub-1 Hz resolution at radio frequencies using a Rydberg atom-based mixer Aip Advances. 9: 45030 |
| Simons MT, Haddab AH, Gordon JA, et al. (2019) A Rydberg atom-based mixer: Measuring the phase of a radio frequency wave Applied Physics Letters. 114: 114101 |
| Simons MT, Gordon JA, Holloway CL. (2018) Fiber-coupled vapor cell for a portable Rydberg atom-based radio frequency electric field sensor. Applied Optics. 57: 6456-6460 |
| Holloway CL, Simons MT, Kautz MD, et al. (2018) A quantum-based power standard: Using Rydberg atoms for a SI-traceable radio-frequency power measurement technique in rectangular waveguides Applied Physics Letters. 113: 094101 |
| Simons MT, Kautz MD, Holloway CL, et al. (2018) Electromagnetically Induced Transparency (EIT) and Autler-Townes (AT) splitting in the presence of band-limited white Gaussian noise Journal of Applied Physics. 123: 203105-203105 |
| Simons MT, Gordon JA, Holloway CL. (2018) Fiber-coupled Vapor Cell for a Portable Rydberg Atom-based RF Electric Field Sensor Applied Optics. 57 |
| Holloway CL, Simons MT, Gordon JA, et al. (2017) Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging Ieee Transactions On Electromagnetic Compatibility. 59: 717-728 |
| Holloway CL, Simons MT, Gordon JA, et al. (2017) Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor Journal of Applied Physics. 121: 233106-233106 |
| Simons MT, Gordon JA, Holloway CL. (2016) Atom-based RF electric field metrology above 100 GHz Proceedings of Spie - the International Society For Optical Engineering. 9747 |