James W. Corbett
Affiliations: | 1968- | State University of New York, Albany, Albany, NY, United States |
Area:
Solid-state physicsWebsite:
https://doi.org/10.1063/1.2808764Google:
"James W. Corbett"Bio:
(1928 - 1994)
https://www.gf.org/fellows/all-fellows/james-w-corbett/
https://en.wikipedia.org/wiki/James_W._Corbett
https://ui.adsabs.harvard.edu/abs/1955PhDT........21C/abstract
DOI: 10.1103/PhysRev.101.519
DOI: 10.1063/1.1742930
Mean distance: (not calculated yet)
Parents
Sign in to add mentor| William Weldon Watson | grad student | 1955 | Yale | |
| (Thermal Diffusion in Isotopic Gas Mixtures) | ||||
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Publications
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| Corbett JW, Shereshevskii DI, Verner IV. (1995) Changes in the Creation of Point Defects Related to the Formation of Porous Silicon Physica Status Solidi (a). 147: 81-89 |
| Myakenkaya GS, Gutsev GL, Gerasimenko NN, et al. (1994) Self-interstitial complexes in silicon Radiation Effects and Defects in Solids. 129: 199-216 |
| Henry A, Monemar B, Bergman JP, et al. (1993) Mercury-related luminescent center in silicon. Physical Review. B, Condensed Matter. 47: 13309-13313 |
| Roberson, Estreicher SK, Korpás L, et al. (1993) Vacancies and {V,Hn} Complexes in Si: Stable Structures, Relative Stability, and Diffusion Properties Materials Science Forum. 1227-1232 |
| Henry A, Monemar B, Bergman JP, et al. (1993) A New Photoluminescent Center in Mercury-Doped Silicon Materials Science Forum. 117-122 |
| Henry A, Monemar B, LindstrÖm JL, et al. (1993) Photoluminescence Study of Hydrogen-Related Defects in Silicon Mrs Proceedings. 324 |
| Liu J, Barbero CJ, Corbett JW, et al. (1993) Electron Irradiation Induced Crystallization of Amorphous Al 2 O 3 Films on Silicon Substrates Mrs Proceedings. 311: 239 |
| Zhang Y, Corbett JW, Oehrlein GS, et al. (1993) Reactive Ion Etching of Sige Alloys using Fluorine-Containing Plasmas * Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 11: 2492-2495 |
| Yuan J, Corbett JW, Voronkov SN, et al. (1993) Studies of disorder induced by ion implantation into silicon using in situ stress measurement technique Radiation Effects and Defects in Solids. 125: 275-287 |
| Liu J, Barbero CJ, Corbett JW, et al. (1993) An in situ transmission electron microscopy study of electron‐beam‐induced amorphous‐to‐crystalline transformation of Al2O3 films on silicon Journal of Applied Physics. 73: 5272-5273 |