Øystein Prytz, Ph.D.

Affiliations: 
Department of Physics University of Oslo, Norway, Oslo, Oslo, Norway 
Area:
Transmission electron microscopy, EELS, diffraction, solid state physics, materials science
Website:
https://folk.universitetetioslo.no/oysteinp/group/
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"Øystein Prytz"
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Cross-listing: Materials Tree

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Publications

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Thøgersen A, Reinertsen VM, Kepaptsoglou D, et al. (2022) Plasmonic properties of aluminium nanowires in amorphous silicon. Journal of Physics. Condensed Matter : An Institute of Physics Journal
Kang X, Reinertsen VM, Both KG, et al. (2022) Galvanic Restructuring of Exsolved Nanoparticles for Plasmonic and Electrocatalytic Energy Conversion. Small (Weinheim An Der Bergstrasse, Germany). e2201106
Gogova D, Olsen VS, Bazioti C, et al. (2020) High electron mobility single-crystalline ZnSnN2 on ZnO (0001) substrates Crystengcomm
Aarholt T, Frodason YK, Prytz Ø. (2019) Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations. Ultramicroscopy. 209: 112884
Bazioti C, Azarov A, Johansen KM, et al. (2019) Role of Nitrogen in Defect Evolution in Zinc Oxide: STEM-EELS Nanoscale Investigations. The Journal of Physical Chemistry Letters. 4725-4730
Bondevik T, Ness HH, Bazioti C, et al. (2019) Investigation of the electrostatic potential of a grain boundary in Y-substituted BaZrO using inline electron holography. Physical Chemistry Chemical Physics : Pccp
Zhan W, Kosinskiy AY, Vines L, et al. (2019) ZnCr₂O₄ Inclusions in ZnO Matrix Investigated by Probe-Corrected STEM-EELS. Materials (Basel, Switzerland). 12
Liu X, Bjørheim TS, Vines L, et al. (2019) Highly correlated hydride ion tracer diffusion in SrTiO3-xHx oxyhydrides. Journal of the American Chemical Society
Granerød CS, Aarseth BL, Nguyen DP, et al. (2019) Structural and optical properties of individual Zn2GeO4 particles embedded in ZnO. Nanotechnology
Olsen VS, Bazioti C, Azarov A, et al. (2019) Bandgap bowing in crystalline (ZnO)1−x (GaN) x thin films; influence of composition and structural properties Semiconductor Science and Technology. 34: 15001
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