Archibald Howie
Affiliations: | 1960-2001 | University of Cambridge, Cambridge, England, United Kingdom |
Area:
Scanning transmission electron microscopyWebsite:
https://prabook.com/web/archibald.howie/643245Google:
"Archibald Howie"Bio:
http://www.emag-iop.org/speakers After graduating in physics from the University of Edinburgh (B.Sc., 1956) and spending a year at the feet of Feynman and Gell-Mann in Cal. Tech. (M.S., 1957), Archie Howie joined Peter Hirsch and Mike Whelan in Cambridge to develop diffraction contrast electron microscopy (Ph.D., 1961).
http://id.ndl.go.jp/bib/000003379758
Mean distance: (not calculated yet)
Parents
Sign in to add mentor| Richard P. Feynman | grad student | 1957 | Caltech | |
| (M.S.) | ||||
| Murray Gell-Mann | grad student | 1957 | Caltech | |
| (M.S.) | ||||
| Peter B. Hirsch | grad student | 1961 | Cambridge | |
| (Electron microscope transmission studies of single metal crystals.) | ||||
| Michael John Whelan | grad student | 1961 | Cambridge | |
Children
Sign in to add trainee| Stephen John Pennycook | grad student | Cambridge (Chemistry Tree) | |
| Colin J. Humphreys | grad student | 1969 | Cambridge (E-Tree) |
| Laurence D. Marks | grad student | 1980 | Cambridge (E-Tree) |
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Publications
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| Howie A. (2017) New instrumentation and cutting edge research. Ultramicroscopy. 180: 52-58 |
| Howie A. (2015) Stimulated excitation electron microscopy and spectroscopy. Ultramicroscopy. 151: 116-21 |
| Howie A. (2013) Near field and exit wave computations for electron microscopy. Ultramicroscopy. 134: 62-7 |
| Howie A. (2011) Mechanisms of decoherence in electron microscopy. Ultramicroscopy. 111: 761-7 |
| Howie A. (2009) Aberration correction: zooming out to overview. Philosophical Transactions. Series a, Mathematical, Physical, and Engineering Sciences. 367: 3859-70 |
| Howie A. (2009) Photon-assisted electron energy loss spectroscopy and ultrafast imaging. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 15: 314-22 |
| Howie A. (2004) Hunting the Stobbs factor. Ultramicroscopy. 98: 73-9 |
| Howie A. (2000) Threshold Energy Effects in Secondary Electron Emission. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 6: 291-296 |
| McGibbon AJ, Brown LM, Bleloch AL, et al. (1993) Microscopy in solid state science Microscopy Research and Technique. 24: 299-315 |
| Howie A. (1963) Inelastic Scattering Of Electrons By Crystals. I. The Theory Of Small- Angle Inelastic Scattering Proceedings of the Royal Society a: Mathematical, Physical and Engineering Sciences. 271: 268-287 |