Aycan Yurtsever, Ph.D.
Affiliations: | 2008 | Cornell University, Ithaca, NY, United States |
Area:
Condensed Matter Physics, Optics Physics, Materials Science EngineeringGoogle:
"Aycan Yurtsever"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| David A Muller | grad student | 2008 | Cornell | |
| (Three-dimensional plasmon imaging and photonic states of silicon nano-composites by fast electrons.) | ||||
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Publications
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| Yurtsever A. (2015) Nanoscale Probes in Ultrafast Transmission Electron Microscopy Microscopy and Microanalysis. 21: 1413-1414 |
| Yurtsever A, Couillard M, Hyun JK, et al. (2014) Thickness measurements using photonic modes in monochromated electron energy-loss spectroscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 723-30 |
| Yurtsever A. (2014) Visualizing the Optically Induced Near-fields of Nanoplasmonics with Ultrafast Transmission Electron Microscopy Microscopy and Microanalysis. 20: 1586-1587 |
| Yurtsever A, van der Veen RM, Zewail AH. (2012) Subparticle ultrafast spectrum imaging in 4D electron microscopy. Science (New York, N.Y.). 335: 59-64 |
| Couillard M, Yurtsever A, Muller DA. (2010) Interference effects on guided Cherenkov emission in silicon from perpendicular, oblique, and parallel boundaries Physical Review B - Condensed Matter and Materials Physics. 81 |
| Yurtsever A, Couillard M, Muller DA. (2008) Formation of guided Cherenkov radiation in silicon-based nanocomposites. Physical Review Letters. 100: 217402 |
| Couillard M, Yurtsever A, Muller DA. (2008) Competition between bulk and interface plasmonic modes in valence electron energy-loss spectroscopy of ultrathinSiO2gate stacks Physical Review B. 77 |
| Yurtsever A, Couillard M, Muller D. (2007) Surface Guided Modes and Accurate Thickness Measurements by Monochromated Fast Electrons Microscopy and Microanalysis. 13 |
| Couillard M, Yurtsever A, Muller D. (2007) Competition between Interface and Bulk Modes in Valence EELS of Thin Films Microscopy and Microanalysis. 13 |
| Yurtsever A, Weyland M, Muller DA. (2006) Three-dimensional imaging of nonspherical silicon nanoparticles embedded in silicon oxide by plasmon tomography Applied Physics Letters. 89: 151920 |