Jae-Ho Han
Affiliations: | Department of Brain and Cognitive Engineering | Korea University, Seoul, South Korea |
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Publications
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Tayebi B, Sharif F, Han JH. (2020) Smart filtering of phase residues in noisy wrapped holograms. Scientific Reports. 10: 16965 |
Ngo L, Cha J, Han JH. (2019) Deep Neural Network Regression for Automated Retinal Layer Segmentation in Optical Coherence Tomography Images. Ieee Transactions On Image Processing : a Publication of the Ieee Signal Processing Society |
Tayebi B, Jeong Y, Han J. (2019) Dual-Wavelength Diffraction Phase Microscopy With 170 Times Larger Image Area Ieee Journal of Selected Topics in Quantum Electronics. 25: 1-6 |
Tayebi B, Kim W, Sharif F, et al. (2019) Single-Shot and Label-Free Refractive Index Dispersion of Single Nerve Fiber by Triple-Wavelength Diffraction Phase Microscopy Ieee Journal of Selected Topics in Quantum Electronics. 25: 1-8 |
Tayebi B, Park JH, Han J. (2019) Super-Bandwidth Two-Step Phase-Shifting Off-Axis Digital Holography by Optimizing Two-Dimensional Spatial Frequency Sampling Scheme Ieee Access. 7: 136836-136841 |
Tayebi B, Kim W, Yoon B, et al. (2018) Real-Time Triple Field of View Interferometry for Scan-Free Monitoring of Multiple Objects Ieee/Asme Transactions On Mechatronics. 23: 160-166 |
Tayebi B, Sharif F, Karimi A, et al. (2018) Stable Extended Imaging Area Sensing Without Mechanical Movement Based on Spatial Frequency Multiplexing Ieee Transactions On Industrial Electronics. 65: 8195-8203 |
Tayebi B, Han JH, Sharif F, et al. (2017) Compact single-shot four-wavelength quantitative phase microscopy with polarization- and frequency-division demultiplexing. Optics Express. 25: 20172-20182 |
Kim J, Togloom A, Han J, et al. (2017) In Vitro Monitoring of a Cultured Human Retinal Pigment Epithelium Using 1375-nm Spectral-Domain Optical Coherence Tomography Journal of Lightwave Technology. 35: 3455-3460 |
Kim JH, Han JH, Jeong J. (2015) Accurate wavelength calibration method for spectrometer using low coherence interferometry Journal of Lightwave Technology. 33: 3413-3418 |