Jeronimo Segovia-Fernandez

Affiliations: 
Carnegie Mellon University, Pittsburgh, PA 
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"Jeronimo Segovia-Fernandez"
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Nguyen K, Chulukhadze V, Stolt E, et al. (2023) Near Spurious-Free Thickness Shear Mode Lithium Niobate Resonator for Piezoelectric Power Conversion. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control
Zhao X, Kaya O, Pirro M, et al. (2023) Extending the Linearity of AlScN Contour-Mode-Resonators through Acoustic Metamaterials-based Reflectors. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control
Cassella C, Segovia-Fernandez J. (2019) High k Exceeding 6.4% Through Metal Frames in Aluminum Nitride 2-D Mode Resonators. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. 66: 958-964
Vaillant E, Sthal F, Imbaud J, et al. (2018) Phase Noise Measurements of AlN Contour-Mode Resonators With Carrier Suppression Technique. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. 65: 1943-1950
Kim HJ, Jung SI, Segovia-Fernandez J, et al. (2018) The impact of electrode materials on 1/f noise in piezoelectric AlN contour mode resonators Aip Advances. 8: 055009
Segovia-Fernandez J, Piazza G. (2017) Thermoelastic Damping in the Electrodes Determines $Q$ of AlN Contour Mode Resonators Journal of Microelectromechanical Systems. 26: 550-558
Kim HJ, Segovia-Fernandez J, Piazza G. (2017) The Impact of Damping on Flicker Frequency Noise of AlN Piezoelectric MEMS Resonators Journal of Microelectromechanical Systems. 26: 317-324
Xu C, Segovia-Fernandez J, Kim HJ, et al. (2017) Temperature-Stable Piezoelectric MEMS Resonators Using Integrated Ovens and Simple Resistive Feedback Circuits Journal of Microelectromechanical Systems. 26: 187-195
Segovia-Fernandez J, Piazza G. (2016) Analytical and Numerical Methods to Model Anchor Losses in 65-MHz AlN Contour Mode Resonators Journal of Microelectromechanical Systems
Segovia-Fernandez J, Cremonesi M, Cassella C, et al. (2015) Anchor losses in AlN contour mode resonators Journal of Microelectromechanical Systems. 24: 265-275
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