Burton Lehman Henke

1949-1967 Physics Pomona College, Claremont, CA, United States 
 1967-1984 Physics University of Hawai'i at Manoa, Honolulu, HI 
 1985- Lawrence Berkeley National Laboratory, Berkeley, CA, USA 
physics of low energy x rays and electrons
"Burton Lehman Henke" OR "Burton L. Henke"

Henke, Burton L. (1953) Diffraction of long wavelength x-ray. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/2JGQ-WN90.
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Jesse W. M. Dumond grad student 1953 Caltech
 (Diffraction of long wavelength x-ray)
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Henke BL, Gullikson EM, Kerner J, et al. (1990) Design and Characterization of X-Ray Multilayer Analyzers for the 50-1000 eV Region. Journal of X-Ray Science and Technology. 2: 17-80
Gullikson EM, Henke BL. (1989) X-ray-induced secondary-electron emission from solid xenon. Physical Review. B, Condensed Matter. 39: 1-9
Saloman EB, Pearlman JS, Henke BL. (1980) Evaluation of high efficiency Csl and Cul photocathodes for soft x-ray diagnostics. Applied Optics. 19: 749-53
Perera RCC, Henke BL. (1979) Low energy x‐ray emission spectra and molecular orbital analysis of CH4, CCl4, and CHCl3 Journal of Chemical Physics. 70: 5398-5406
Perera RCC, Henke BL. (1978) C-K and Cl-L Emission Spectra and Molecular Orbital Analysis of CCl4 Japanese Journal of Applied Physics. 17: 112-115
Henke BL, Perera RCC, Urch DS. (1978) Cl‐LII,III fluorescent x‐ray spectra measurement and analysis for the molecular orbital structure of ClO4−, ClO3−, and ClO2− Journal of Chemical Physics. 68: 3692-3704
Henke BL, Perera RCC, Gullikson EM, et al. (1978) High‐efficiency low‐energy x‐ray spectroscopy in the 100–500‐eV region Journal of Applied Physics. 49: 480-494
Henke BL, Smith JA, Attwood DT. (1977) 0.1–10‐keV x‐ray‐induced electron emissions from solids—Models and secondary electron measurements Journal of Applied Physics. 48: 1852-1866
Henke BL, Taniguchi K. (1976) Quantitative low‐energy x‐ray spectroscopy (50–100‐Å region) Journal of Applied Physics. 47: 1027-1037
Henke BL, Smith EN. (1966) Valence electron band analysis by ultrasoft x-ray fluorescence spectroscopy Journal of Applied Physics. 37: 922-923
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