Robert Balsano
Affiliations: | 2014 | Nanoscale Science and Engineering-Nanoscale Science | State University of New York, Albany, Albany, NY, United States |
Google:
"Robert Balsano"Mean distance: 16.32 | S | N | B | C | P |
Parents
Sign in to add mentor| Vincent P. LaBella | grad student | 2014 | SUNY Albany | |
| (Towards a fundamental understanding of inhomogeneous interfaces utilizing ballistic electron emission microscopy.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Nolting W, Durcan C, Gassner S, et al. (2018) Nanoscale Schottky barrier visualization utilizing computational modeling and ballistic electron emission microscopy Journal of Applied Physics. 123: 245302 |
| Balsano R, Durcan C, Matsubayashi A, et al. (2016) Relating spatially resolved maps of the Schottky barrier height to metal/semiconductor interface composition Journal of Applied Physics. 119 |
| Durcan CA, Balsano R, LaBella VP. (2015) Time dependent changes in Schottky barrier mapping of the W/Si(001) interface utilizing ballistic electron emission microscopy Journal of Applied Physics. 117: 245306 |
| Durcan CA, Balsano R, Labella VP. (2014) Nanoscale mapping of the W/Si(001) Schottky barrier Journal of Applied Physics. 116 |
| Balsano R, Matsubayashi A, Labella VP. (2013) Schottky barrier height measurements of Cu/Si(001), Ag/Si(001), and Au/Si(001) interfaces utilizing ballistic electron emission microscopy and ballistic hole emission microscopy Aip Advances. 3 |