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Karen M. Siegrist, Ph.D. - Publications

Affiliations: 
University of Maryland, College Park, College Park, MD 
Area:
Nanostructures
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4 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2010 Sangwan VK, Ballarotto VW, Siegrist K, Williams ED. Characterizing voltage contrast in photoelectron emission microscopy. Journal of Microscopy. 238: 210-7. PMID 20579259 DOI: 10.1111/J.1365-2818.2009.03342.X  0.582
2004 Siegrist K, Ballarotto VW, Breban M, Yongsunthon R, Williams ED. Imaging buried structures with photoelectron emission microscopy Applied Physics Letters. 84: 1419-1421. DOI: 10.1063/1.1650914  0.514
2003 Siegrist K, Williams ED, Ballarotto VW. Characterizing topography-induced contrast in photoelectron emission microscopy Journal of Vacuum Science and Technology. 21: 1098-1102. DOI: 10.1116/1.1562185  0.62
2003 Yongsunthon R, Rous PJ, Stanishevsky A, Siegrist K, Williams ED. Phase imaging of buried structures Applied Surface Science. 210: 6-11. DOI: 10.1016/S0169-4332(02)01470-8  0.577
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