Jon F. Ihlefeld, Ph.D. - Publications

Affiliations: 
2002-2006 North Carolina State University, Raleigh, NC 
 2008-2017 Sandia National Laboratories 
 2017- University of Virginia, Charlottesville, VA 
Area:
Ferroelectrics, Thin Film Oxides

118 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2022 Aryana K, Tomko JA, Gao R, Hoglund ER, Mimura T, Makarem S, Salanova A, Hoque MSB, Pfeifer TW, Olson DH, Braun JL, Nag J, Read JC, Howe JM, Opila EJ, ... ... Ihlefeld JF, et al. Observation of solid-state bidirectional thermal conductivity switching in antiferroelectric lead zirconate (PbZrO). Nature Communications. 13: 1573. PMID 35322003 DOI: 10.1038/s41467-022-29023-y  0.76
2021 Jenkins MA, Holden KEK, Smith SW, Brumbach MT, Henry MD, Weiland C, Woicik JC, Jaszewski ST, Ihlefeld JF, Conley JF. Determination of Hafnium Zirconium Oxide Interfacial Band Alignments Using Internal Photoemission Spectroscopy and X-ray Photoelectron Spectroscopy. Acs Applied Materials & Interfaces. PMID 33749229 DOI: 10.1021/acsami.0c17729  0.79
2021 Giri A, Cheaito R, Gaskins JT, Mimura T, Brown-Shaklee HJ, Medlin DL, Ihlefeld JF, Hopkins PE. Thickness-Independent Vibrational Thermal Conductance across Confined Solid-Solution Thin Films. Acs Applied Materials & Interfaces. PMID 33663216 DOI: 10.1021/acsami.0c20608  0.812
2020 Fields SS, Smith SW, Ryan PJ, Jaszewski ST, Brummel IA, Salanova A, Esteves G, Wolfley SL, Henry M, Davids P, Ihlefeld J. Phase Exchange Driven Wake-Up and Fatigue in Ferroelectric Hafnium Zirconium Oxide Films. Acs Applied Materials & Interfaces. PMID 32410447 DOI: 10.1021/Acsami.0C03570  0.729
2020 Ihlefeld JF, Luk TS, Smith SW, Fields SS, Jaszewski ST, Hirt DM, Riffe WT, Bender S, Constantin C, Ayyasamy MV, Balachandran PV, Lu P, Henry MD, Davids PS. Compositional dependence of linear and nonlinear optical response in crystalline hafnium zirconium oxide thin films Journal of Applied Physics. 128: 34101. DOI: 10.1063/5.0012175  0.684
2019 Sharma PA, Brumbach M, Adams DP, Ihlefeld JF, Lima-Sharma AL, Chou S, Sugar JD, Lu P, Michael JR, Ingersoll D. Electrical contact uniformity and surface oxidation of ternary chalcogenide alloys Aip Advances. 9: 15125. DOI: 10.1063/1.5081818  0.34
2019 Henry MD, Smith SW, Lewis RM, Ihlefeld JF. Stabilization of ferroelectric phase of Hf0.58Zr0.42O2 on NbN at 4 K Applied Physics Letters. 114: 92903. DOI: 10.1063/1.5052435  0.687
2018 Foley BM, Wallace M, Gaskins JT, Paisley EA, Johnson-Wilke RL, Kim JW, Ryan PJ, Trolier-McKinstry S, Hopkins PE, Ihlefeld J. Voltage Controlled Bistable Thermal Conductivity in Suspended Ferroelectric Thin Film Membranes. Acs Applied Materials & Interfaces. PMID 29978704 DOI: 10.1021/Acsami.8B04169  0.81
2018 Pan W, Lu P, Ihlefeld JF, Lee SR, Choi ES, Jiang Y, Jia QX. Electrical-current-induced magnetic hysteresis in self-assembled vertically aligned La2/3Sr1/3MnO3:ZnO nanopillar composites Physical Review Materials. 2. DOI: 10.1103/Physrevmaterials.2.021401  0.316
2018 Scott EA, Smith SW, Henry MD, Rost CM, Giri A, Gaskins JT, Fields SS, Jaszewski ST, Ihlefeld JF, Hopkins PE. Thermal resistance and heat capacity in hafnium zirconium oxide (Hf1–xZrxO2) dielectrics and ferroelectric thin films Applied Physics Letters. 113: 192901. DOI: 10.1063/1.5052244  0.807
2018 Smith SW, Henry MD, Brumbach MT, Rodriguez MA, Ihlefeld JF. Thickness scaling of pyroelectric response in thin ferroelectric Hf1−xZrxO2 films Applied Physics Letters. 113: 182904. DOI: 10.1063/1.5045635  0.695
2018 Paisley EA, Brumbach MT, Shelton CT, Allerman AA, Atcitty S, Rost CM, Ohlhausen JA, Doyle BL, Sitar Z, Maria J, Ihlefeld JF. Nitride surface chemistry influence on band offsets at epitaxial oxide/GaN interfaces Applied Physics Letters. 112: 092903. DOI: 10.1063/1.5013605  0.78
2018 Small LJ, Wheeler JS, Ihlefeld JF, Clem PG, Spoerke ED. Enhanced alkaline stability in a hafnium-substituted NaSICON ion conductor Journal of Materials Chemistry. 6: 9691-9698. DOI: 10.1039/C7Ta09924J  0.412
2018 Lu P, Zhou L, Ihlefeld J, Pan W. Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 24: 66-67. DOI: 10.1017/S143192761800082X  0.374
2018 Beechem TE, Goldflam MD, Sinclair MB, Peters DW, McDonald AE, Paisley EA, Kitahara AR, Drury DE, Burckel DB, Finnegan PS, Kim J, Choi Y, Ryan PJ, Ihlefeld JF. Tunable Infrared Devices via Ferroelectrics: Tunable Infrared Devices via Ferroelectric Domain Reconfiguration (Advanced Optical Materials 24/2018) Advanced Optical Materials. 6: 1870094. DOI: 10.1002/Adom.201870094  0.774
2018 Beechem TE, Goldflam MD, Sinclair MB, Peters DW, McDonald AE, Paisley EA, Kitahara AR, Drury DE, Burckel DB, Finnegan PS, Kim J, Choi Y, Ryan PJ, Ihlefeld JF. Tunable Infrared Devices via Ferroelectric Domain Reconfiguration Advanced Optical Materials. 6: 1800862. DOI: 10.1002/Adom.201800862  0.769
2017 Wood MG, Campione S, Serkland DK, Parameswaran S, Ihlefeld J, Luk TS, Wendt JR, Geib KM, Keeler GA. High-Mobility Transparent Conducting Oxides for Compact Epsilon-Near-Zero Silicon Integrated Optical Modulators Frontiers in Optics. DOI: 10.1364/Fio.2017.Jw3A.46  0.321
2017 Campione S, Wood MG, Serkland DK, Parameswaran S, Ihlefeld J, Luk TS, Wendt JR, Geib KM, Keeler GA. Submicrometer Epsilon-Near-Zero Electroabsorption Modulators Enabled by High-Mobility Cadmium Oxide Ieee Photonics Journal. 9: 1-7. DOI: 10.1109/Jphot.2017.2723299  0.365
2017 Iamsasri T, Guerrier J, Esteves G, Fancher CM, Wilson AG, Smith RC, Paisley EA, Johnson-Wilke R, Ihlefeld JF, Bassiri-Gharb N, Jones JL. A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials Journal of Applied Crystallography. 50: 211-220. DOI: 10.1107/S1600576716020057  0.791
2017 Smith EH, Ihlefeld JF, Heikes CA, Paik H, Nie Y, Adamo C, Heeg T, Liu Z, Schlom DG. Exploiting kinetics and thermodynamics to grow phase-pure complex oxides by molecular-beam epitaxy under continuous codeposition Physical Review Materials. 1. DOI: 10.1103/Physrevmaterials.1.023403  0.457
2017 Shelton CT, Bryan I, Paisley EA, Sachet E, Ihlefeld JF, Lavrik N, Collazo R, Sitar Z, Maria J. Step-free GaN surfaces grown by confined-area metal-organic vapor phase epitaxy Apl Materials. 5: 096109. DOI: 10.1063/1.4993840  0.768
2017 Brewer SJ, Zhou H, Williams SC, Rudy RQ, Rivas M, Polcawich RG, Cress CD, Glaser ER, Paisley EA, Ihlefeld JF, Jones JL, Bassiri-Gharb N. Effect of microstructure on irradiated ferroelectric thin films Journal of Applied Physics. 121: 244102. DOI: 10.1063/1.4987032  0.811
2017 Foley BM, Paisley EA, DiAntonio C, Chavez T, Blea-Kirby M, Brennecka G, Gaskins JT, Ihlefeld JF, Hopkins PE. Phonon scattering mechanisms dictating the thermal conductivity of lead zirconate titanate (PbZr1−xTixO3) thin films across the compositional phase diagram Journal of Applied Physics. 121: 205104. DOI: 10.1063/1.4983356  0.844
2017 Sharma PA, Brown-Shaklee HJ, Ihlefeld JF. Oxygen partial pressure dependence of thermoelectric power factor in polycrystalline n-type SrTiO3: Consequences for long term stability in thermoelectric oxides Applied Physics Letters. 110: 173901. DOI: 10.1063/1.4982239  0.748
2017 Smith SW, Kitahara AR, Rodriguez MA, Henry MD, Brumbach MT, Ihlefeld JF. Pyroelectric response in crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films Applied Physics Letters. 110: 72901. DOI: 10.1063/1.4976519  0.691
2017 Kang X, Shetty S, Garten L, Ihlefeld JF, Trolier-McKinstry S, Maria J. Enhanced dielectric and piezoelectric responses in Zn1-xMgxO thin films near the phase separation boundary Applied Physics Letters. 110: 042903. DOI: 10.1063/1.4973756  0.636
2017 Ihlefeld JF, Michael JR, McKenzie BB, Scrymgeour DA, Maria J, Paisley EA, Kitahara AR. Domain imaging in ferroelectric thin films via channeling-contrast backscattered electron microscopy Journal of Materials Science. 52: 1071-1081. DOI: 10.1007/S10853-016-0402-X  0.791
2016 Ihlefeld JF, Harris DT, Keech R, Jones JL, Maria JP, Trolier-McKinstry S. Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property Relations Journal of the American Ceramic Society. 99: 2537-2557. DOI: 10.1111/Jace.14387  0.787
2016 Ihlefeld JF, Gurniak E, Jones BH, Wheeler DR, Rodriguez MA, McDaniel AH, Dunn B. Scaling Effects in Sodium Zirconium Silicate Phosphate (Na1+xZr2SixP3−xO12) Ion-Conducting Thin Films Journal of the American Ceramic Society. 99: 2729-2736. DOI: 10.1111/Jace.14285  0.413
2016 Wang JJ, Wang Y, Ihlefeld JF, Hopkins PE, Chen LQ. Tunable thermal conductivity via domain structure engineering in ferroelectric thin films: A phase-field simulation Acta Materialia. 111: 220-231. DOI: 10.1016/J.Actamat.2016.03.069  0.468
2016 Meyer KE, Cheaito R, Paisley E, Shelton CT, Braun JL, Maria JP, Ihlefeld JF, Hopkins PE. Crystalline coherence length effects on the thermal conductivity of MgO thin films Journal of Materials Science. 51: 10408-10417. DOI: 10.1007/S10853-016-0261-5  0.827
2015 Ihlefeld JF, Foley BM, Scrymgeour DA, Michael JR, McKenzie BB, Medlin DL, Wallace M, Trolier-McKinstry S, Hopkins PE. Room-temperature voltage tunable phonon thermal conductivity via reconfigurable interfaces in ferroelectric thin films. Nano Letters. 15: 1791-5. PMID 25695423 DOI: 10.1021/Nl504505T  0.603
2015 Sachet E, Shelton CT, Harris JS, Gaddy BE, Irving DL, Curtarolo S, Donovan BF, Hopkins PE, Sharma PA, Sharma AL, Ihlefeld J, Franzen S, Maria JP. Dysprosium-doped cadmium oxide as a gateway material for mid-infrared plasmonics. Nature Materials. 14: 414-20. PMID 25686264 DOI: 10.1038/Nmat4203  0.796
2015 Ihlefeld JF, Kotula PG, Gauntt BD, Gough DV, Brennecka GL, Lu P, Spoerke ED. Solution Chemistry, Substrate, and Processing Effects on Chemical Homogeneity in Lead Zirconate Titanate Thin Films Journal of the American Ceramic Society. 98: 2028-2038. DOI: 10.1111/Jace.13576  0.461
2015 Cheaito R, Gaskins JT, Caplan ME, Donovan BF, Foley BM, Giri A, Duda JC, Szwejkowski CJ, Constantin C, Brown-Shaklee HJ, Ihlefeld JF, Hopkins PE. Thermal boundary conductance accumulation and interfacial phonon transmission: Measurements and theory Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.035432  0.778
2015 Paisley EA, Brumbach M, Allerman AA, Atcitty S, Baca AG, Armstrong AM, Kaplar RJ, Ihlefeld JF. Spectroscopic investigations of band offsets of MgO|AlxGa1-xN epitaxial heterostructures with varying AlN content Applied Physics Letters. 107. DOI: 10.1063/1.4930309  0.782
2015 Cui J, Liang CY, Paisley EA, Sepulveda A, Ihlefeld JF, Carman GP, Lynch CS. Generation of localized strain in a thin film piezoelectric to control individual magnetoelectric heterostructures Applied Physics Letters. 107. DOI: 10.1063/1.4930071  0.813
2015 Landon CD, Wilke RHT, Brumbach MT, Brennecka GL, Blea-Kirby M, Ihlefeld JF, Marinella MJ, Beechem TE. Erratum: “Thermal transport in tantalum oxide films for memristive applications” [Appl. Phys. Lett. 107, 023108 (2015)] Applied Physics Letters. 107: 59902. DOI: 10.1063/1.4928532  0.426
2015 Landon CD, Wilke RHT, Brumbach MT, Brennecka GL, Blea-Kirby M, Ihlefeld JF, Marinella MJ, Beechem TE. Thermal transport in tantalum oxide films for memristive applications Applied Physics Letters. 107. DOI: 10.1063/1.4926921  0.435
2015 Giri A, Gaskins JT, Donovan BF, Szwejkowski C, Warzoha RJ, Rodriguez MA, Ihlefeld J, Hopkins PE. Mechanisms of nonequilibrium electron-phonon coupling and thermal conductance at interfaces Journal of Applied Physics. 117. DOI: 10.1063/1.4914867  0.339
2015 Cheaito R, Hattar K, Gaskins JT, Yadav AK, Duda JC, Beechem TE, Ihlefeld JF, Piekos ES, Baldwin JK, Misra A, Hopkins PE. Thermal flux limited electron Kapitza conductance in copper-niobium multilayers Applied Physics Letters. 106. DOI: 10.1063/1.4913420  0.412
2015 Lu P, Romero E, Ihlefeld J, Pan W, Zhang W, Wang H, Jia Q. Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films Microscopy and Microanalysis. 21: 2249-2250. DOI: 10.1017/S1431927615012027  0.4
2015 Rodriguez MA, Griego JJM, Brown-Shaklee HJ, Blea-Kirby MA, Ihlefeld JF, Spoerke ED. X-ray powder diffraction study of La2LiTaO6 Powder Diffraction. 30: 57-62. DOI: 10.1017/S0885715614001183  0.731
2015 Brown-Shaklee HJ, Sharma PA, Ihlefeld JF. Instrument for stable high temperature Seebeck coefficient and resistivity measurements under controlled oxygen partial pressure Journal of Materials Science. 50: 5005-5013. DOI: 10.1007/S10853-015-9049-2  0.742
2015 Jones JL, LeBeau JM, Nikkel J, Oni AA, Dycus JH, Cozzan C, Lin F, Chernatynskiy A, Nino JC, Sinnott SB, Mhin S, Brennecka GL, Ihlefeld J. Thin Films: Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films (Adv. Mater. Interfaces 10/2015) Advanced Materials Interfaces. 2. DOI: 10.1002/Admi.201570048  0.456
2015 Jones JL, LeBeau JM, Nikkel J, Oni AA, Dycus JH, Cozzan C, Lin FY, Chernatynskiy A, Nino JC, Sinnott SB, Mhin S, Brennecka GL, Ihlefeld J. Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films Advanced Materials Interfaces. 2. DOI: 10.1002/Admi.201500181  0.454
2014 Meier W, Apblett C, Ingersoll D, McDaniel A, Ihlefeld JF. Preparation and Processing Temperature Effects on Ion Conductivity in Solution Derived Sodium Zirconium Phosphate (NaZr2P3O12) Thin Films Journal of the Electrochemical Society. 161. DOI: 10.1149/2.068403Jes  0.388
2014 Foley BM, Brown-Shaklee HJ, Campion MJ, Medlin DL, Clem PG, Ihlefeld JF, Hopkins PE. Glass-like thermal conductivity of (010)-textured lanthanum-doped strontium niobate synthesized with wet chemical deposition Journal of the American Ceramic Society. 98: 624-628. DOI: 10.1111/Jace.13318  0.811
2014 Kirchhofer R, Diercks DR, Gorman BP, Ihlefeld JF, Kotula PG, Shelton CT, Brennecka GL. Quantifying compositional homogeneity in Pb (Zr, Ti) O 3 using atom probe tomography Journal of the American Ceramic Society. 97: 2677-2697. DOI: 10.1111/Jace.13135  0.377
2014 Mhin S, Nittala K, Lee J, Robinson DS, Ihlefeld JF, Brennecka GL, Sanchez LM, Polcawich RG, Jones JL. Phase and texture evolution in chemically derived PZT thin films on Pt substrates Journal of the American Ceramic Society. 97: 2973-2979. DOI: 10.1111/Jace.13007  0.426
2014 Gorham CS, Hattar K, Cheaito R, Duda JC, Gaskins JT, Beechem TE, Ihlefeld JF, Biedermann LB, Piekos ES, Medlin DL, Hopkins PE. Ion irradiation of the native oxide/silicon surface increases the thermal boundary conductance across aluminum/silicon interfaces Physical Review B - Condensed Matter and Materials Physics. 90. DOI: 10.1103/Physrevb.90.024301  0.319
2014 Jahangir S, Cheng X, Huang HH, Ihlefeld J, Nagarajan V. In-situ investigation of thermal instabilities and solid state dewetting in polycrystalline platinum thin films via confocal laser microscopy Journal of Applied Physics. 116: 163511. DOI: 10.1063/1.4898691  0.452
2014 Donovan BF, Foley BM, Ihlefeld JF, Maria JP, Hopkins PE. Spectral phonon scattering effects on the thermal conductivity of nano-grained barium titanate Applied Physics Letters. 105. DOI: 10.1063/1.4893920  0.719
2014 Ihlefeld JF, Brumbach M, Allerman AA, Wheeler DR, Atcitty S. AlGaN composition dependence of the band offsets for epitaxial Gd2O3/AlxGa12xN (0 &lex &le0.67) heterostructures Applied Physics Letters. 105. DOI: 10.1063/1.4889883  0.452
2014 Mily EJ, Oni A, Lebeau JM, Liu Y, Brown-Shaklee HJ, Ihlefeld JF, Maria JP. The role of terminal oxide structure and properties in nanothermite reactions Thin Solid Films. 562: 405-410. DOI: 10.1016/J.Tsf.2014.05.005  0.807
2014 Schaefer BT, Cheung J, Ihlefeld JF, Jones JL, Nagarajan V. Erratum to “Stability and dewetting kinetics of thin gold films on Ti, TiOx and ZnO adhesion layers” [Acta Mater. 61 (2013) 7841–7848] Acta Materialia. 70: 316-317. DOI: 10.1016/J.Actamat.2013.12.024  0.452
2013 Wen H, Chen P, Cosgriff MP, Walko DA, Lee JH, Adamo C, Schaller RD, Ihlefeld JF, Dufresne EM, Schlom DG, Evans PG, Freeland JW, Li Y. Electronic origin of ultrafast photoinduced strain in BiFeO3. Physical Review Letters. 110: 037601. PMID 23373952 DOI: 10.1103/Physrevlett.110.037601  0.476
2013 Small L, Brumbach M, Apblett C, Ihlefeld JF, Brennecka G, Duquette D. On the degradation processes of thin film PZT in 0.1 N H2SO4 Journal of the Electrochemical Society. 160: C128-C135. DOI: 10.1149/2.005304Jes  0.408
2013 Mhin S, Cozzan C, Nittala K, Wanninkhof P, Ihlefeld JF, Brennecka GL, Jones JL. Effect of switching atmospheric conditions during crystallization on the phase evolution of solution-derived lead zirconate titanate thin films Journal of the American Ceramic Society. 96: 2706-2709. DOI: 10.1111/Jace.12522  0.461
2013 Campion MJ, Brown-Shaklee HJ, Rodriguez MA, Richardson JJ, Clem PG, Ihlefeld JF. Crystallization atmosphere and substrate effects on the phase and texture of chemical solution deposited strontium niobate thin films Journal of the American Ceramic Society. 96: 743-749. DOI: 10.1111/Jace.12193  0.796
2013 Harris DT, Burch MJ, Ihlefeld JF, Lam PG, Li J, Dickey EC, Maria JP. Realizing strain enhanced dielectric properties in BaTiO3 films by liquid phase assisted growth Applied Physics Letters. 103. DOI: 10.1063/1.4813270  0.834
2013 Nittala K, Mhin S, Dunnigan KM, Robinson DS, Ihlefeld JF, Kotula PG, Brennecka GL, Jones JL. Phase and texture evolution in solution deposited lead zirconate titanate thin films: Formation and role of the Pt3Pb intermetallic phase Journal of Applied Physics. 113. DOI: 10.1063/1.4811687  0.482
2013 Ihlefeld JF, Brumbach M, Atcitty S. Band offsets of La2O3 on (0001) GaN grown by reactive molecular-beam epitaxy Applied Physics Letters. 102. DOI: 10.1063/1.4803091  0.469
2013 Liu S, Ihlefeld JF, Dominguez J, Gonzales EF, Bower JE, Burckel BD, Sinclair MB, Brener I. Realization of tellurium-based all dielectric optical metamaterials using a multi-cycle deposition-etch process Cleo: Science and Innovations, Cleo_si 2013. CW3O.2. DOI: 10.1063/1.4803019  0.311
2013 Hopkins PE, Adamo C, Ye L, Huey BD, Lee SR, Schlom DG, Ihlefeld JF. Effects of coherent ferroelastic domain walls on the thermal conductivity and Kapitza conductance in bismuth ferrite Applied Physics Letters. 102. DOI: 10.1063/1.4798497  0.518
2013 Graham JT, Brennecka GL, Ferreira P, Small L, Duquette D, Apblett C, Landsberger S, Ihlefeld JF. Neutron irradiation effects on domain wall mobility and reversibility in lead zirconate titanate thin films Journal of Applied Physics. 113. DOI: 10.1063/1.4795869  0.453
2013 Schaefer BT, Cheung J, Ihlefeld JF, Jones JL, Nagarajan V. Stability and dewetting kinetics of thin gold films on Ti, TiOx and ZnO adhesion layers Acta Materialia. 61: 7841-7848. DOI: 10.1016/J.Actamat.2013.09.022  0.388
2013 Ihlefeld JF, Losego MD, Maria JP. Base metal bottom electrodes Chemical Solution Deposition of Functional Oxide Thin Films. 571-592. DOI: 10.1007/978-3-211-99311-8_23  0.728
2012 Cheaito R, Duda JC, Beechem TE, Hattar K, Ihlefeld JF, Medlin DL, Rodriguez MA, Campion MJ, Piekos ES, Hopkins PE. Experimental investigation of size effects on the thermal conductivity of silicon-germanium alloy thin films. Physical Review Letters. 109: 195901. PMID 23215405 DOI: 10.1103/Physrevlett.109.195901  0.465
2012 Small L, Apblett C, Ihlefeld JF, Brennecka G, Duquette DJ. Electrochemical Response of Ferroelectric PbZr0.52Ti0.48O3 Thin Films Journal of the Electrochemical Society. 159. DOI: 10.1149/2.031208Jes  0.409
2012 Small L, Cook A, Apblett C, Ihlefeld JF, Brennecka G, Duquette D. An automated electrochemical probe for evaluation of thin films Journal of the Electrochemical Society. 159: F87-F90. DOI: 10.1149/2.007205Jes  0.431
2012 Foley BM, Brown-Shaklee HJ, Duda JC, Cheaito R, Gibbons BJ, Medlin D, Ihlefeld JF, Hopkins PE. Thermal conductivity of nano-grained SrTiO3 thin films Applied Physics Letters. 101. DOI: 10.1063/1.4769448  0.798
2012 Nittala K, Mhin S, Jones JL, Robinson DS, Ihlefeld JF, Brennecka GL. In situ x-ray diffraction of solution-derived ferroelectric thin films for quantitative phase and texture evolution measurement Journal of Applied Physics. 112. DOI: 10.1063/1.4766387  0.445
2012 Dongmo P, Zhong Y, Attia P, Bomberger C, Cheaito R, Ihlefeld JF, Hopkins PE, Zide J. Enhanced room temperature electronic and thermoelectric properties of the dilute bismuthide InGaBiAs Journal of Applied Physics. 112. DOI: 10.1063/1.4761996  0.396
2012 Ihlefeld JF, Shelton CT. Chemical homogeneity effects on the nonlinear dielectric response of lead zirconate titanate thin films Applied Physics Letters. 101. DOI: 10.1063/1.4742171  0.486
2012 Shelton CT, Kotula PG, Brennecka GL, Lam PG, Meyer KE, Maria J, Gibbons BJ, Ihlefeld JF. Functional Coatings: Chemically Homogeneous Complex Oxide Thin Films Via Improved Substrate Metallization (Adv. Funct. Mater. 11/2012) Advanced Functional Materials. 22: 2214-2214. DOI: 10.1002/Adfm.201290066  0.811
2012 Shelton CT, Kotula PG, Brennecka GL, Lam PG, Meyer KE, Maria JP, Gibbons BJ, Ihlefeld JF. Chemically homogeneous complex oxide thin films via improved substrate metallization Advanced Functional Materials. 22: 2295-2302. DOI: 10.1002/Adfm.201103077  0.803
2011 Ihlefeld JF, Clem PG, Doyle BL, Kotula PG, Fenton KR, Apblett CA. Fast lithium-ion conducting thin-film electrolytes integrated directly on flexible substrates for high-power solid-state batteries. Advanced Materials (Deerfield Beach, Fla.). 23: 5663-7. PMID 22057430 DOI: 10.1002/Adma.201102980  0.377
2011 Hopkins PE, Beechem T, Duda JC, Hattar K, Ihlefeld JF, Rodriguez MA, Piekos ES. Influence of anisotropy on thermal boundary conductance at solid interfaces Physical Review B - Condensed Matter and Materials Physics. 84. DOI: 10.1103/Physrevb.84.125408  0.349
2011 Desmarais J, Ihlefeld JF, Heeg T, Schubert J, Schlom DG, Huey BD. Mapping and statistics of ferroelectric domain boundary angles and types Applied Physics Letters. 99. DOI: 10.1063/1.3643155  0.486
2011 Hopkins PE, Hattar K, Beechem T, Ihlefeld JF, Medlin DL, Piekos ES. Reduction in thermal boundary conductance due to proton implantation in silicon and sapphire Applied Physics Letters. 98. DOI: 10.1063/1.3592822  0.314
2011 Sheehan C, Jung Y, Holesinger T, Feldmann DM, Edney C, Ihlefeld JF, Clem PG, Matias V. Solution deposition planarization of long-length flexible substrates Applied Physics Letters. 98. DOI: 10.1063/1.3554754  0.431
2011 Aygün SM, Ihlefeld JF, Borland WJ, Maria JP. Permittivity scaling in Ba1-xSrxTiO3 thin films and ceramics Journal of Applied Physics. 109. DOI: 10.1063/1.3514127  0.831
2010 Ihlefeld JF, Daniels PR, Aygiin SM, Borland WJ, Maria JP. Property engineering In BaTIO3 films by stoichiometry control Journal of Materials Research. 25: 1064-1071. DOI: 10.1557/Jmr.2010.0151  0.725
2010 Brennecka GL, Ihlefeld JF, Maria JP, Tuttle BA, Clem PG. Processing technologies for high-permittivity thin films in capacitor applications Journal of the American Ceramic Society. 93: 3935-3954. DOI: 10.1111/J.1551-2916.2010.04211.X  0.716
2010 Ihlefeld JF, Folkman CM, Baek SH, Brennecka GL, George MC, Carroll JF, Eom CB. Effect of domain structure on dielectric nonlinearity in epitaxial BiFeO3 films Applied Physics Letters. 97. DOI: 10.1063/1.3533017  0.374
2010 Ihlefeld JF, Ginn JC, Shelton DJ, Matias V, Rodriguez MA, Kotula PG, Carroll JF, Boreman GD, Clem PG, Sinclair MB. Crystal coherence length effects on the infrared optical response of MgO thin films Applied Physics Letters. 97. DOI: 10.1063/1.3515901  0.465
2010 Lee JH, Ke X, Misra R, Ihlefeld JF, Xu XS, Mei ZG, Heeg T, Roeckerath M, Schubert J, Liu ZK, Musfeldt JL, Schiffer P, Schlom DG. Adsorption-controlled growth of BiMnO3 films by molecular-beam epitaxy Applied Physics Letters. 96. DOI: 10.1063/1.3457786  0.605
2010 Xu XS, Ihlefeld JF, Lee JH, Ezekoye OK, Vlahos E, Ramesh R, Gopalan V, Pan XQ, Schlom DG, Musfeldt JL. Tunable band gap in Bi (Fe1-x Mnx) O3 films Applied Physics Letters. 96. DOI: 10.1063/1.3427499  0.554
2009 Zeches RJ, Rossell MD, Zhang JX, Hatt AJ, He Q, Yang CH, Kumar A, Wang CH, Melville A, Adamo C, Sheng G, Chu YH, Ihlefeld JF, Erni R, Ederer C, et al. A strain-driven morphotropic phase boundary in BiFeO3. Science (New York, N.Y.). 326: 977-80. PMID 19965507 DOI: 10.1126/Science.1177046  0.54
2009 Ihlefeld JF, Tian W, Liu ZK, Doolittle WA, Bernhagen M, Reiche P, Uecker R, Ramesh R, Schlom DG. Adsorption-controlled growth of BiFeO3 by MBE and integration with wide band gap semiconductors. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. 56: 1528-33. PMID 19686967 DOI: 10.1109/TUFFC.2009.1216  0.561
2009 Zhang J, Rutkowski M, Martin LW, Conry T, Ramesh R, Ihlefeld JF, Melville A, Schlom DG, Brillson LJ. Surface, bulk, and interface electronic states of epitaxial BiFeO 3 films Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27: 2012-2014. DOI: 10.1116/1.3130152  0.528
2009 Ramirez MO, Kumar A, Denev SA, Podraza NJ, Xu XS, Rai RC, Chu YH, Seidel J, Martin LW, Yang SY, Saiz E, Ihlefeld JF, Lee S, Klug J, Cheong SW, et al. Magnon sidebands and spin-charge coupling in bismuth ferrite probed by nonlinear optical spectroscopy Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.224106  0.461
2009 Yang SY, Martin LW, Byrnes SJ, Conry TE, Basu SR, Paran D, Reichertz L, Ihlefeld J, Adamo C, Melville A, Chu YH, Yang CH, Musfeldt JL, Schlom DG, Ager JW, et al. Photovoltaic effects in BiFeO3 Applied Physics Letters. 95. DOI: 10.1063/1.3204695  0.568
2009 Ramirez MO, Kumar A, Denev SA, Chu YH, Seidel J, Martin LW, Yang SY, Rai RC, Xue XS, Ihlefeld JF, Podraza NJ, Saiz E, Lee S, Klug J, Cheong SW, et al. Spin-charge-lattice coupling through resonant multimagnon excitations in multiferroic BiFe O3 Applied Physics Letters. 94. DOI: 10.1063/1.3118576  0.418
2008 Daniels PR, Aygun S, Ihlefeld JF, Borland W, Maria JP. TF022 - Grain size effects of A:B site ratio in BaTiO3 thin films Ieee International Symposium On Applications of Ferroelectrics. 2. DOI: 10.1109/ISAF.2008.4693862  0.691
2008 Ihlefeld JF, Vodnick AM, Baker SP, Borland WJ, Maria JP. Extrinsic scaling effects on the dielectric response of ferroelectric thin films Journal of Applied Physics. 103. DOI: 10.1063/1.2903211  0.769
2008 Kumar A, Rai RC, Podraza NJ, Denev S, Ramirez M, Chu YH, Martin LW, Ihlefeld J, Heeg T, Schubert J, Schlom DG, Orenstein J, Ramesh R, Collins RW, Musfeldt JL, et al. Linear and nonlinear optical properties of BiFeO3 Applied Physics Letters. 92. DOI: 10.1063/1.2901168  0.421
2008 Ihlefeld JF, Podraza NJ, Liu ZK, Rai RC, Xu X, Heeg T, Chen YB, Li J, Collins RW, Musfeldt JL, Pan XQ, Schubert J, Ramesh R, Schlom DG. Optical band gap of BiFe O3 grown by molecular-beam epitaxy Applied Physics Letters. 92. DOI: 10.1063/1.2901160  0.607
2008 Losego MD, Ihlefeld JF, Maria JP. Importance of solution chemistry in preparing sol-gel PZT thin films directly on copper surfaces Chemistry of Materials. 20: 303-307. DOI: 10.1021/Cm070999Q  0.812
2008 Ihlefeld JF, Borland WJ, Maria JP. Dielectric and microstructural properties of barium titanate hafnate thin films Thin Solid Films. 516: 3162-3166. DOI: 10.1016/J.Tsf.2007.08.096  0.766
2008 Laughlin B, Ihlefeld JF, Daniels P, Maria JP. Flexible and lithography-compatible copper foil substrates for ferroelectric thin films Thin Solid Films. 516: 3294-3297. DOI: 10.1016/J.Tsf.2007.08.093  0.8
2008 Ihlefeld JF, Borland WJ, Maria JP. Enhanced dielectric tunability in barium titanate thin films with boron additions Scripta Materialia. 58: 549-552. DOI: 10.1016/J.Scriptamat.2007.11.008  0.763
2008 Ihlefeld JF, Borland WJ, Maria JP. Synthesis and properties of barium titanate stannate thin films by chemical solution deposition Journal of Materials Science. 43: 4264-4270. DOI: 10.1007/S10853-008-2618-X  0.769
2008 Ihlefeld JF, Losego MD, Collazo R, Borland WJ, Maria JP. Defect chemistry of nano-grained barium titanate films Journal of Materials Science. 43: 38-42. DOI: 10.1007/S10853-007-2135-3  0.818
2007 Daniels P, Ihlefeld J, Borland W, Maria JP. Smart electrodes for ultralarge-area thin film capacitors Journal of Materials Research. 22: 1763-1766. DOI: 10.1557/Jmr.2007.0272  0.723
2007 Ihlefeld JF, Kumar A, Gopalan V, Schlom DG, Chen YB, Pan XQ, Heeg T, Schubert J, Ke X, Schiffer P, Orenstein J, Martin LW, Chu YH, Ramesh R. Adsorption-controlled molecular-beam epitaxial growth of BiFe O3 Applied Physics Letters. 91. DOI: 10.1063/1.2767771  0.59
2007 Ihlefeld JF, Borland WJ, Maria JP. Enhanced dielectric and crystalline properties in ferroelectric barium titanate thin films Advanced Functional Materials. 17: 1199-1203. DOI: 10.1002/Adfm.200601159  0.772
2006 Craft HS, Ihlefeld JF, Losego MD, Collazo R, Sitar Z, Maria JP. MgO epitaxy on GaN (0002) surfaces by molecular beam epitaxy Applied Physics Letters. 88. DOI: 10.1063/1.2201041  0.818
2005 Ihlefeld J, Borland W, Maria J. Synthesis and Properties of Barium Titanate Thin Films Deposited on Copper Foil Substrates Mrs Proceedings. 902. DOI: 10.1557/Proc-0902-T02-03  0.742
2005 Ihlefeld JF, Maria JP, Borland W. Dielectric and microstructural properties of barium titanate zirconate thin films on copper substrates Journal of Materials Research. 20: 2838-2844. DOI: 10.1557/Jmr.2005.0342  0.484
2005 Laughlin B, Ihlefeld J, Maria JP. Preparation of sputtered (Ba x′Sr 1-x)TiO 3 thin films directly on copper Journal of the American Ceramic Society. 88: 2652-2654. DOI: 10.1111/J.1551-2916.2005.00488.X  0.832
2005 Losego MD, Jimison LH, Ihlefeld JF, Maria JP. Ferroelectric response from lead zirconate titanate thin films prepared directly on low-resistivity copper substrates Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1919388  0.828
2005 Ihlefeld J, Laughlin B, Hunt-Lowery A, Borland W, Kingon A, Maria JP. Copper compatible barium titanate thin films for embedded passives Journal of Electroceramics. 14: 95-102. DOI: 10.1007/S10832-005-0866-6  0.834
2005 Ihlefeld JF, Maria JP, Borland W. Dielectric and microstructural properties of Ba(Ti 1-xZr x)O 3 thin films on copper substrates Ceramic Engineering and Science Proceedings. 26: 109-116.  0.343
2005 Ihlefeld JF, Borland W, Maria JP. Synthesis and properties of barium titanate thin films on copper substrates Materials Research Society Symposium Proceedings. 902: 7-14.  0.349
2003 Laughlin B, Ihlefeld J, Maria J. TEM and Electrical Analysis of Sputtered Barium Strontium Titanate (BST) Thin Films on Flexible Copper Substrates Mrs Proceedings. 784. DOI: 10.1557/Proc-784-C5.3  0.817
2003 Ihlefeld JF, Kingon AI, Borland W, Maria J. Cu-Compatible Ultra-High Permittivity Dielectrics for Embedded Passive Components Mrs Proceedings. 783. DOI: 10.1557/Proc-783-B3.2  0.776
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