Year |
Citation |
Score |
2006 |
Moiseev L, Unlü MS, Swan AK, Goldberg BB, Cantor CR. DNA conformation on surfaces measured by fluorescence self-interference. Proceedings of the National Academy of Sciences of the United States of America. 103: 2623-8. PMID 16477000 DOI: 10.1073/Pnas.0511214103 |
0.49 |
|
2004 |
Moiseev L, Cantor CR, Swan AK, Goldberg BB, Ünlü MS. Biological applications of spectral self-interference Proceedings of Spie - the International Society For Optical Engineering. 5331: 36-43. DOI: 10.1117/12.530441 |
0.591 |
|
2004 |
Moiseev L, Cantor CR, Aksun MI, Dogan M, Goldberg BB, Swan AK, Ünlü MS. Spectral self-interference fluorescence microscopy Journal of Applied Physics. 96: 5311-5315. DOI: 10.1063/1.1786665 |
0.558 |
|
2004 |
Moiseev L, Swan AK, Ünlü MS, Goldberg BB, Cantor CC. Spectral self-interference on fluorescently labeled DNA monolayers Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-Leos. 1: 432-433. |
0.483 |
|
2004 |
Goldberg BB, Swan AK, Moiseev L, Dogan M, Karl WC, Davis B, Cantor CR, Ippolito SB, Thorne SA, Eraslan MG, Liu Z, Goldberg MB, Ünlü MS, Leblebici Y. Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures Osa Trends in Optics and Photonics Series. 97: 673-674. |
0.318 |
|
2003 |
Swan AK, Moiseev LA, Cantor CR, Davis B, Ippolito SB, Karl WC, Goldberg BB, Ünlü MS. Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference Ieee Journal On Selected Topics in Quantum Electronics. 9: 294-300. DOI: 10.1109/Jstqe.2003.814191 |
0.535 |
|
2002 |
Swan AK, Moiseev L, Tong Y, Lipoff SH, Karl WC, Goldberg BB, Ünlü MS. High resolution spectral self-interference fluorescence microscopy Proceedings of Spie - the International Society For Optical Engineering. 4621: 77-85. DOI: 10.1117/12.467834 |
0.461 |
|
2001 |
Swan AK, Tong Y, Moiseev L, Ünlü MS, Goldberg BB. Self-Interference Fluorescent Emission Microscopy for Biological Imaging Microscopy and Microanalysis. 7: 36-37. DOI: 10.1017/S1431927600026258 |
0.505 |
|
2001 |
Swan AK, Ünlü MS, Tong Y, Goldberg BB, Moiseev L, Cantor C. Self-interference fluorescent emission microscopy -5nm vertical resolution Conference On Lasers and Electro-Optics Europe - Technical Digest. 360-361. |
0.502 |
|
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