Year |
Citation |
Score |
2013 |
Kam H, Chen Y, Liu TJK. Reliable micro-electro-mechanical (MEM) switch design for ultra-low-power logic Ieee International Reliability Physics Symposium Proceedings. 6A.1.1-6A.1.5. DOI: 10.1109/IRPS.2013.6532044 |
0.483 |
|
2012 |
Nathanael R, Jeon J, Chen IR, Chen Y, Chen F, Kam H, Liu TJK. Multi-input/multi-output relay design for more compact and versatile implementation of digital logic with zero leakage International Symposium On Vlsi Technology, Systems, and Applications, Proceedings. DOI: 10.1109/VLSI-TSA.2012.6210115 |
0.765 |
|
2012 |
Kam H, Liu TJK, Alon E. Design requirements for steeply switching logic devices Ieee Transactions On Electron Devices. 59: 326-334. DOI: 10.1109/Ted.2011.2175484 |
0.35 |
|
2011 |
Kam H, Liu TJK, Stojanović V, Marković D, Alon E. Design, optimization, and scaling of MEM relays for ultra-low-power digital logic Ieee Transactions On Electron Devices. 58: 236-250. DOI: 10.1109/Ted.2010.2082545 |
0.506 |
|
2011 |
Spencer M, Chen F, Wang CC, Nathanael R, Fariborzi H, Gupta A, Kam H, Pott V, Jeon J, Liu TJK, Marković D, Alon E, Stojanović V. Demonstration of integrated micro-electro-mechanical relay circuits for VLSI applications Ieee Journal of Solid-State Circuits. 46: 308-320. DOI: 10.1109/Jssc.2010.2074370 |
0.78 |
|
2010 |
Lee D, Pott V, Kam H, Nathanael R, Liu TJK. AFM characterization of adhesion force in micro-relays Proceedings of the Ieee International Conference On Micro Electro Mechanical Systems (Mems). 232-235. DOI: 10.1109/MEMSYS.2010.5442522 |
0.68 |
|
2010 |
Nathanael R, Pott V, Kam H, Jeon J, Alon E, Liu TJK. Four-terminal-relay body-biasing schemes for complementary logic circuits Ieee Electron Device Letters. 31: 890-892. DOI: 10.1109/Led.2010.2050133 |
0.759 |
|
2010 |
Jeon J, Pott V, Kam H, Nathanael R, Alon E, Liu TJK. Perfectly complementary relay design for digital logic applications Ieee Electron Device Letters. 31: 371-373. DOI: 10.1109/Led.2009.2039916 |
0.762 |
|
2010 |
Pott V, Kam H, Nathanael R, Jeon J, Alon E, King Liu TJ. Mechanical computing redux: Relays for integrated circuit applications Proceedings of the Ieee. 98: 2076-2094. DOI: 10.1109/JPROC.2010.2063411 |
0.767 |
|
2010 |
Jeon J, Pott V, Kam H, Nathanael R, Alon E, King Liu TJ. Seesaw relay logic and memory circuits Journal of Microelectromechanical Systems. 19: 1012-1014. DOI: 10.1109/Jmems.2010.2049826 |
0.707 |
|
2010 |
Chen F, Spencer M, Nathanael R, Wang C, Fariborzi H, Gupta A, Kam H, Pott V, Jeon J, King Liu TJ, Markovic D, Stojanovic V, Alon E. Demonstration of integrated micro-electro-mechanical switch circuits for VLSI applications Digest of Technical Papers - Ieee International Solid-State Circuits Conference. 53: 150-151. DOI: 10.1109/ISSCC.2010.5434010 |
0.781 |
|
2010 |
Liu TJK, Jeon J, Nathanael R, Kam H, Pott V, Alon E. Prospects for MEM logic switch technology Technical Digest - International Electron Devices Meeting, Iedm. 18.3.1-18.3.4. DOI: 10.1109/IEDM.2010.5703386 |
0.761 |
|
2010 |
Kam H, Alon E, King Liu TJ. A predictive contact reliability model for MEM logic switches Technical Digest - International Electron Devices Meeting, Iedm. 16.4.1-16.4.4. DOI: 10.1109/IEDM.2010.5703375 |
0.727 |
|
2010 |
Fariborzi H, Spencer M, Karkare V, Jeon J, Nathanael R, Wang C, Chen F, Kam H, Pott V, Liu TJK, Alon E, Stojanović V, Marković D. Analysis and demonstration of MEM-relay power gating Proceedings of the Custom Integrated Circuits Conference. DOI: 10.1109/CICC.2010.5617380 |
0.781 |
|
2009 |
Kam H, Liu TJK. Pull-in and release voltage design for nanoelectromechanical field-effect transistors Ieee Transactions On Electron Devices. 56: 3072-3082. DOI: 10.1109/Ted.2009.2032617 |
0.478 |
|
2009 |
Nathanae R, Pott V, Kam H, Jeon J, Liu TJK. 4-Terminal relay technology for complementary logic Technical Digest - International Electron Devices Meeting, Iedm. 9.4.1-9.4.4. DOI: 10.1109/IEDM.2009.5424383 |
0.428 |
|
2009 |
Kam H, Pott V, Nathanael R, Jeon J, Alon E, Liu TJK. Design and reliability of a micro-relay technology for zero-standby-power digital logic applications Technical Digest - International Electron Devices Meeting, Iedm. 33.7.1-33.7.4. DOI: 10.1109/IEDM.2009.5424218 |
0.8 |
|
2008 |
Kam H, King-Liu TJ, Alon E, Horowitz M. Circuit-level requirements for MOSFET-replacement devices Technical Digest - International Electron Devices Meeting, Iedm. DOI: 10.1109/IEDM.2008.4796715 |
0.351 |
|
2008 |
Chen F, Kam H, Marković D, Liu TJK, Stojanović V, Alon E. Integrated circuit design with NEM relays Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 750-757. DOI: 10.1109/ICCAD.2008.4681660 |
0.398 |
|
2007 |
Woo YC, Kam H, Lee D, Lai J, Liu TJK. Compact nano-electro-mechanical non-volatile memory (NEMory) for 3D integration Technical Digest - International Electron Devices Meeting, Iedm. 603-606. DOI: 10.1109/IEDM.2007.4419011 |
0.329 |
|
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