Year |
Citation |
Score |
2011 |
Thacker HD, Ogunsola OO, Muler AV, Meindl JD. Wafer-testing of optoelectonic - Gigascale CMOS integrated circuits Ieee Journal On Selected Topics in Quantum Electronics. 17: 659-670. DOI: 10.1109/Jstqe.2010.2089431 |
0.762 |
|
2007 |
Thacker H, Ogunsola O, Carson A, Bakir M, Meindl J. Optical through-wafer interconnects for 3D hyper-integration Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-Leos. 28-29. DOI: 10.1109/LEOS.2006.278802 |
0.728 |
|
2007 |
Bakir MS, Dang B, Ogunsola OO, Meindl JD. 'Trimodal' wafer-level package: Fully compatible electrical, optical, and fluidic chip I/O interconnects Proceedings - Electronic Components and Technology Conference. 585-592. DOI: 10.1109/ECTC.2007.373855 |
0.753 |
|
2006 |
Ogunsola OO, Thacker HD, Bachim BL, Bakir MS, Pikarsky J, Gaylord TK, Meindl JD. Chip-level waveguide-mirror-pillar optical interconnect structure Ieee Photonics Technology Letters. 18: 1672-1674. DOI: 10.1109/Lpt.2006.879533 |
0.753 |
|
2006 |
Ogunsola OO, Thacker HD, Bachim BL, Bakir MS, Gaylord TK, Meindl JD. Polymer pillars as optical I/O for gigascale chips using mirror-terminated waveguides 2006 International Interconnect Technology Conference, Iitc. 170-172. DOI: 10.1109/IITC.2006.1648679 |
0.778 |
|
2006 |
Bakir MS, Dang B, Thacker HD, Ogunsola OO, Ogra R, Meindl JD. Dual-mode electrical-optical flip-chip I/O interconnects and a compatible probe substrate for wafer-level testing Proceedings - Electronic Components and Technology Conference. 2006: 768-775. DOI: 10.1109/ECTC.2006.1645744 |
0.758 |
|
2005 |
Bachim BL, Ogunsola OO, Gaylord TK. Optical-fiber-to-waveguide coupling using carbon-dioxide-laser-induced long-period fiber gratings. Optics Letters. 30: 2080-2. PMID 16127916 DOI: 10.1364/Ol.30.002080 |
0.476 |
|
2005 |
Thacker HD, Ogunsola OO, Bakir MS, Meindl JD. High-density probe substrate for testing optical interconnects Proceedings of the Ieee 2005 International Interconnect Technology Conference, Iitc. 159-161. |
0.738 |
|
2005 |
Thacker H, Ogunsola O, Bakir M, Meindl J. Probe module for wafer-level testing of gigascale chips with electrical and optical I/O interconnects Proceedings of the Asme/Pacific Rim Technical Conference and Exhibition On Integration and Packaging of Mems, Nems, and Electronic Systems: Advances in Electronic Packaging 2005. 1593-1599. |
0.784 |
|
2004 |
Ogunsola OO, Dang B, Bakir MS, Villalaz RA, Gaylord TK, Meindl JD. Polymer pillar optical transmittance analysis Frontiers in Optics. DOI: 10.1364/Fio.2004.Fthm5 |
0.758 |
|
2004 |
Bakir MS, Gaylord TK, Ogunsola OO, Glytsis EN, Meindl JD. Optical Transmission of Polymer Pillars for Chip I/O Optical Interconnections Ieee Photonics Technology Letters. 16: 117-119. DOI: 10.1109/Lpt.2003.819398 |
0.796 |
|
2003 |
Bakir MS, Villalaz RA, Ogunsola OO, Gaylord TK, Kohl PA, Martin KP, Meindl JD. Sea of polymer pillars: Dual-mode electrical-optical Input/Output interconnections Proceedings of the Ieee 2003 International Interconnect Technology Conference, Iitc 2003. 77-79. DOI: 10.1109/IITC.2003.1219718 |
0.757 |
|
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