Kristen M. Burson, Ph.D. - Publications

Affiliations: 
2013 Physics University of Maryland, College Park, College Park, MD 
Area:
Two-dimensional Materials

7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Büchner C, Liu L, Stuckenholz S, Burson KM, Lichtenstein L, Heyde M, Gao HJ, Freund HJ. Building block analysis of 2D amorphous networks reveals medium range correlation Journal of Non-Crystalline Solids. 435: 40-47. DOI: 10.1016/j.jnoncrysol.2015.12.020  0.36
2015 Burson KM, Schlexer P, Büchner C, Lichtenstein L, Heyde M, Freund HJ. Characterizing Crystalline-Vitreous Structures: From Atomically Resolved Silica to Macroscopic Bubble Rafts Journal of Chemical Education. 92: 1896-1902. DOI: 10.1021/acs.jchemed.5b00056  0.36
2013 Burson KM, Cullen WG, Adam S, Dean CR, Watanabe K, Taniguchi T, Kim P, Fuhrer MS. Direct imaging of charged impurity density in common graphene substrates. Nano Letters. 13: 3576-80. PMID 23879288 DOI: 10.1021/nl4012529  0.36
2012 Burson KM, Wei Y, Cullen WG, Fuhrer MS, Reutt-Robey JE. Potential steps at C₆₀-TiOPc-Ag(111) interfaces: ultrahigh-vacuum-noncontact scanning probe metrology. Nano Letters. 12: 2859-64. PMID 22563861 DOI: 10.1021/nl3004607  0.36
2012 Burson KM, Yamamoto M, Cullen WG. Modeling noncontact atomic force microscopy resolution on corrugated surfaces. Beilstein Journal of Nanotechnology. 3: 230-7. PMID 22496996 DOI: 10.3762/bjnano.3.26  0.36
2011 Burson KM, Yamamoto M, Cullen WG. High resolution microscopy of SIO2 and the structure of SIO 2-supported graphene Proceedings of the Asme Design Engineering Technical Conference. 7: 551-555. DOI: 10.1115/DETC2011-48737  0.36
2010 Cullen WG, Yamamoto M, Burson KM, Chen JH, Jang C, Li L, Fuhrer MS, Williams ED. High-fidelity conformation of graphene to SiO2 topographic features. Physical Review Letters. 105: 215504. PMID 21231322 DOI: 10.1103/PhysRevLett.105.215504  0.36
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