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Michelle D. Chabot, Ph.D. - Publications

Affiliations: 
2001 University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Condensed Matter Physics
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2009 Miller CW, Chabot MD, Messina TC. A student's guide to searching the literature using online databases American Journal of Physics. 77: 1112-1117. DOI: 10.1119/1.3213525  0.535
2006 Yuan L, Gao L, Sabirianov R, Liou SH, Chabot MD, Min DH, Moreland J, Han BS. Microcantilever torque magnetometry study of patterned magnetic films Ieee Transactions On Magnetics. 42: 3234-3236. DOI: 10.1109/TMAG.2006.878424  0.339
2005 Chabot MD, Moreland JM, Gao L, Liou SH, Miller CW. Novel fabrication of micromechanical oscillators with nanoscale sensitivity at room temperature Journal of Microelectromechanical Systems. 14: 1118-1126. DOI: 10.1109/Jmems.2005.851869  0.51
2004 Choi JH, Mirsaidov UM, Miller CW, Lee YJ, Guchhait S, Chabot MD, Lu W, Markert JT. Oscillator microfabrication, micromagnets, and magnetic resonance force microscopy Proceedings of Spie - the International Society For Optical Engineering. 5389: 399-410. DOI: 10.1117/12.539572  0.601
2003 Chabot MD, Moreland J. Micrometer-scale magnetometry of thin Ni80Fe20 films using ultrasensitive microcantilevers Journal of Applied Physics. 93: 7897-7899. DOI: 10.1063/1.1557759  0.317
2001 Chabot MD, Markert JT. Evidence for Successive Doping-Induced Dimensionality Transitions in the Spin-Chain Compound Ca2+xY2-xCu5O10. Physical Review Letters. 86: 163-166. PMID 11136119 DOI: 10.1103/Physrevlett.86.163  0.513
2001 Chabot MD, Messina TC, Mancevski V, Miller CW, Markert JT. Single-crystal silicon triple-torsional micro-oscillators for use in magnetic resonance force microscopy Proceedings of Spie - the International Society For Optical Engineering. 4559: 24-35. DOI: 10.1117/12.443037  0.586
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