Jianxin Fang, Ph.D. - Publications
Affiliations: | 2012 | Electrical Engineering | University of Minnesota, Twin Cities, Minneapolis, MN |
Area:
Electronics and Electrical EngineeringYear | Citation | Score | |||
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2014 | Fang J, Sapatnekar SS. Incorporating hot-carrier injection effects into timing analysis for large circuits Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 22: 2738-2751. DOI: 10.1109/Tvlsi.2013.2296499 | 0.521 | |||
2013 | Fang J, Sapatnekar SS. The impact of BTI variations on timing in digital logic circuits Ieee Transactions On Device and Materials Reliability. 13: 277-286. DOI: 10.1109/Tdmr.2013.2237910 | 0.52 | |||
2012 | Fang J, Sapatnekar SS. Scalable methods for analyzing the circuit failure probability due to gate oxide breakdown Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 1960-1973. DOI: 10.1109/Tvlsi.2011.2166568 | 0.517 | |||
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