Year |
Citation |
Score |
2020 |
Aydemir G, Paynabar K. Image-Based Prognostics Using Deep Learning Approach Ieee Transactions On Industrial Informatics. 16: 5956-5964. DOI: 10.1109/Tii.2019.2956220 |
0.323 |
|
2020 |
Gahrooei MR, Paynabar K, Pacella M, Shi J. Process Modeling and Prediction With Large Number of High-Dimensional Variables Using Functional Regression Ieee Transactions On Automation Science and Engineering. 17: 684-696. DOI: 10.1109/Tase.2019.2941167 |
0.53 |
|
2020 |
Gahrooei MR, Yan H, Paynabar K, Shi J. Multiple Tensor-on-Tensor Regression: An Approach for Modeling Processes With Heterogeneous Sources of Data Technometrics. 1-23. DOI: 10.1080/00401706.2019.1708463 |
0.492 |
|
2020 |
Peters B, Yildirim M, Gebraeel N, Paynabar K. Severity-based diagnosis for vehicular electric systems with multiple, interacting fault modes Reliability Engineering & System Safety. 195: 106605. DOI: 10.1016/J.Ress.2019.106605 |
0.304 |
|
2019 |
Yan H, Paynabar K, Pacella M. Structured Point Cloud Data Analysis Via Regularized Tensor Regression for Process Modeling and Optimization Technometrics. 61: 385-395. DOI: 10.1080/00401706.2018.1529628 |
0.321 |
|
2019 |
Gorgannejad S, Reisi Gahrooei M, Paynabar K, Neu R. Quantitative prediction of the aged state of Ni-base superalloys using PCA and tensor regression Acta Materialia. 165: 259-269. DOI: 10.1016/J.Actamat.2018.11.047 |
0.316 |
|
2018 |
Wang Y, Mei Y, Paynabar K. Thresholded Multivariate Principal Component Analysis for Phase I Multichannel Profile Monitoring Technometrics. 60: 360-372. DOI: 10.1080/00401706.2017.1375993 |
0.322 |
|
2018 |
Yan H, Paynabar K, Shi J. Real-Time Monitoring of High-Dimensional Functional Data Streams via Spatio-Temporal Smooth Sparse Decomposition Technometrics. 60: 181-197. DOI: 10.1080/00401706.2017.1346522 |
0.49 |
|
2017 |
Rahmandad H, Jalali MS, Paynabar K. A flexible method for aggregation of prior statistical findings. Plos One. 12: e0175111. PMID 28384282 DOI: 10.1371/Journal.Pone.0175111 |
0.323 |
|
2017 |
Yan H, Paynabar K, Shi J. Anomaly Detection in Images With Smooth Background via Smooth-Sparse Decomposition Technometrics. 59: 102-114. DOI: 10.1080/00401706.2015.1102764 |
0.459 |
|
2017 |
Fang X, Paynabar K, Gebraeel N. Multistream sensor fusion-based prognostics model for systems with single failure modes Reliability Engineering & System Safety. 159: 322-331. DOI: 10.1016/J.Ress.2016.11.008 |
0.308 |
|
2016 |
Mesnil O, Yan H, Ruzzene M, Paynabar K, Shi J. Fast wavenumber measurement for accurate and automatic location and quantification of defect in composite Structural Health Monitoring. 15: 223-234. DOI: 10.1177/1475921716636375 |
0.487 |
|
2016 |
Masoud HI, Reed MP, Paynabar K, Wang N, Jin JJ, Wan J, Kozak KK, Gomez-Levi G. Predicting subjective responses from human motion: Application to vehicle ingress assessment Journal of Manufacturing Science and Engineering, Transactions of the Asme. 138. DOI: 10.1115/1.4032191 |
0.526 |
|
2016 |
Paynabar K, Zou C, Qiu P. A Change-Point Approach for Phase-I Analysis in Multivariate Profile Monitoring and Diagnosis Technometrics. 58: 191-204. DOI: 10.1080/00401706.2015.1042168 |
0.397 |
|
2015 |
Mesnil O, Yan H, Ruzzene M, Paynabar K, Shi J. Guided Wavefield Reconstruction from Sparse Measurements Using Compressed Sensing Structural Health Monitoring-An International Journal. DOI: 10.12783/Shm2015/232 |
0.456 |
|
2015 |
Yan H, Paynabar K, Shi J. Image-based process monitoring using low-rank tensor decomposition Ieee Transactions On Automation Science and Engineering. 12: 216-227. DOI: 10.1109/Tase.2014.2327029 |
0.562 |
|
2015 |
Guo W, Jin J(, Paynabar K, Miller B, Carpenter J. A decision support system on surgical treatments for rotator cuff tears Iie Transactions On Healthcare Systems Engineering. 5: 197-210. DOI: 10.1080/19488300.2015.1065935 |
0.511 |
|
2014 |
Masoud HI, Reed MP, Paynabar K, Wang N, Jin J, Wan J, Kozak KK, Gomez-Levi G. Predicting subjective responses from human motion: Application to vehicle ingress assessment Asme 2014 International Manufacturing Science and Engineering Conference, Msec 2014 Collocated With the Jsme 2014 International Conference On Materials and Processing and the 42nd North American Manufacturing Research Conference. 1. DOI: 10.1115/1.4032191 |
0.331 |
|
2013 |
Paynabar K, Jin JJ, Pacella M. Monitoring and diagnosis of multichannel nonlinear profile variations using uncorrelated multilinear principal component analysis Iie Transactions (Institute of Industrial Engineers). 45: 1235-1247. DOI: 10.1080/0740817X.2013.770187 |
0.366 |
|
2013 |
Shao C, Paynabar K, Kim TH, Jin J, Hu SJ, Spicer JP, Wang H, Abell JA. Feature selection for manufacturing process monitoring using cross-validation Transactions of the North American Manufacturing Research Institution of Sme. 41: 442-448. DOI: 10.1016/J.Jmsy.2013.05.006 |
0.664 |
|
2012 |
Guo H, Paynabar K, Jin J. Multiscale monitoring of autocorrelated processes using wavelets analysis Iie Transactions (Institute of Industrial Engineers). 44: 312-326. DOI: 10.1080/0740817X.2011.609872 |
0.569 |
|
2012 |
Paynabar K, Jin J, Yeh AB. Phase I Risk-Adjusted Control Charts for Monitoring Surgical Performance Journal of Quality Technology. 44: 39-53. DOI: 10.1080/00224065.2012.11917880 |
0.499 |
|
2011 |
Abad AG, Paynabar K, Jin JJ. Modeling and analysis of operator effects on process quality and throughput in mixed model assembly systems Journal of Manufacturing Science and Engineering, Transactions of the Asme. 133. DOI: 10.1115/1.4003793 |
0.656 |
|
2011 |
Paynabar K, Jin J. Characterization of non-linear profiles variations using mixed-effect models and wavelets Iie Transactions (Institute of Industrial Engineers). 43: 275-290. DOI: 10.1080/0740817X.2010.521807 |
0.332 |
|
2009 |
Noorossana R, Saghaei A, Paynabar K, Abdi S. Identifying the period of a step change in high-yield processes Quality and Reliability Engineering International. 25: 875-883. DOI: 10.1002/Qre.1007 |
0.38 |
|
2007 |
Noorossana R, Saghaei A, Paynabar K, Samimi Y. On the conditional decision procedure for high yield processes Computers and Industrial Engineering. 53: 469-477. DOI: 10.1016/J.Cie.2007.05.005 |
0.313 |
|
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