Peter Grutter - Publications

Affiliations: 
Department of Physics McGill University, Montreal, QC, Canada 
Area:
Condensed Matter Physics

147 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2021 Cowie M, Plougmann R, Benkirane Y, Schué L, Schumacher Z, Grütter P. How high is a MoSemonolayer? Nanotechnology. 33. PMID 34875638 DOI: 10.1088/1361-6528/ac40bd  0.317
2020 Schumacher Z, Rejali R, Pachlatko R, Spielhofer A, Nagler P, Miyahara Y, Cooke DG, Grütter P. Nanoscale force sensing of an ultrafast nonlinear optical response. Proceedings of the National Academy of Sciences of the United States of America. PMID 32753379 DOI: 10.1073/Pnas.2003945117  0.384
2020 Anthonisen M, Zhang Y, Hussain Sangji M, Grütter P. Quantifying bio-filament morphology below the diffraction limit of an optical microscope using out-of-focus images. Applied Optics. 59: 2914-2923. PMID 32225847 DOI: 10.1364/Ao.388265  0.319
2020 St-Denis T, Yazda K, Capaldi X, Bustamante J, Safari M, Miyahara Y, Zhang Y, Grutter P, Reisner W. An apparatus based on an atomic force microscope for implementing tip-controlled local breakdown. The Review of Scientific Instruments. 90: 123703. PMID 31893796 DOI: 10.1063/1.5129665  0.393
2020 Miyahara Y, Griffin H, Roy-Gobeil A, Belyansky R, Bergeron H, Bustamante J, Grutter P. Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements Epj Techniques and Instrumentation. 7. DOI: 10.1140/Epjti/S40485-020-0053-9  0.347
2020 Dagdeviren OE, Acikgoz O, Grütter P, Baykara MZ. Direct imaging, three-dimensional interaction spectroscopy, and friction anisotropy of atomic-scale ripples on MoS2 Arxiv: Applied Physics. 4: 30. DOI: 10.1038/S41699-020-00164-2  0.433
2020 Grutter P. Electrostatic Force Microscopy: Measuring Ion Mobility, Non-linear Optical Signals and Achieving Ultimate Time Resolution Microscopy and Microanalysis. 1-4. DOI: 10.1017/S1431927620023429  0.332
2019 Dagdeviren OE, Miyahara Y, Mascaro A, Enright T, Grütter P. Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy. Sensors (Basel, Switzerland). 19. PMID 31627343 DOI: 10.3390/S19204510  0.353
2019 Roy-Gobeil A, Miyahara Y, Bevan KH, Grutter P. Fully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal Interface. Nano Letters. PMID 31429580 DOI: 10.1021/Acs.Nanolett.9B02032  0.359
2019 Anthonisen M, Rigby M, Sangji MH, Chua XY, Grütter P. Response of mechanically-created neurites to extension. Journal of the Mechanical Behavior of Biomedical Materials. 98: 121-130. PMID 31229904 DOI: 10.1016/J.Jmbbm.2019.06.015  0.366
2019 Mascaro A, Miyahara Y, Enright T, Dagdeviren OE, Grütter P. Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements. Beilstein Journal of Nanotechnology. 10: 617-633. PMID 30873333 DOI: 10.3762/Bjnano.10.62  0.43
2019 Dagdeviren OE, Miyahara Y, Mascaro A, Grütter P. Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors. The Review of Scientific Instruments. 90: 013703. PMID 30709205 DOI: 10.1063/1.5061831  0.388
2018 Shluger AL, Grutter P. Reorganization takes energy. Nature Nanotechnology. PMID 29662242 DOI: 10.1038/S41565-018-0094-2  0.352
2018 Mascaro A, Miyahara Y, Dagdeviren OE, Grütter P. Eliminating the effect of acoustic noise on cantilever spring constant calibration Applied Physics Letters. 113: 233105. DOI: 10.1063/1.5063992  0.398
2017 Mascaro A, Wang Z, Hovington P, Miyahara Y, Paolella A, Gariepy V, Feng Z, Enright T, Aiken C, Zaghib K, Bevan KH, Grutter P. Measuring spatially resolved collective ionic transport on lithium battery cathodes using atomic force microscopy. Nano Letters. PMID 28627889 DOI: 10.1021/Acs.Nanolett.7B01857  0.342
2017 Miyahara Y, Roy-Gobeil A, Grutter P. Quantum state readout of individual quantum dots by electrostatic force detection. Nanotechnology. 28: 064001. PMID 28059061 DOI: 10.1088/1361-6528/Aa5261  0.344
2017 Miyahara Y, Grutter P. Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation Applied Physics Letters. 110: 163103. DOI: 10.1063/1.4981937  0.415
2017 Schumacher Z, Spielhofer A, Miyahara Y, Grutter P. The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach Applied Physics Letters. 110: 053111. DOI: 10.1063/1.4975629  0.419
2016 Haag AL, Schumacher Z, Grutter P. Sensitivity measurement of a cantilever-based surface stress sensor. The Journal of Chemical Physics. 145: 154704. PMID 27782459 DOI: 10.1063/1.4964922  0.304
2016 Feldmann M, Dietzel D, Tekiel A, Topple J, Grütter P, Schirmeisen A. Universal Aging Mechanism for Static and Sliding Friction of Metallic Nanoparticles. Physical Review Letters. 117: 025502. PMID 27447515 DOI: 10.1103/Physrevlett.117.025502  0.726
2016 Jia Q, Hu ZX, Ji W, Burke SA, Gao HJ, Grütter P, Guo H. Adsorption of PTCDA and C₆₀ on KBr(001): electrostatic interaction versus electronic hybridization. Physical Chemistry Chemical Physics : Pccp. 18: 11008-16. PMID 27045440 DOI: 10.1039/C5Cp07999C  0.669
2016 Schumacher Z, Miyahara Y, Spielhofer A, Grutter P. Measurement of Surface Photovoltage by Atomic Force Microscopy under Pulsed Illumination Physical Review Applied. 5. DOI: 10.1103/Physrevapplied.5.044018  0.399
2015 Schumacher Z, Miyahara Y, Aeschimann L, Grütter P. Improved atomic force microscopy cantilever performance by partial reflective coating. Beilstein Journal of Nanotechnology. 6: 1450-6. PMID 26199849 DOI: 10.3762/Bjnano.6.150  0.376
2015 Haag AL, Nagai Y, Lennox RB, Grütter P. Characterization of a gold coated cantilever surface for biosensing applications. Epj Techniques and Instrumentation. 2: 1. PMID 26146600 DOI: 10.1140/Epjti/S40485-014-0011-5  0.319
2015 Roy-Gobeil A, Miyahara Y, Grutter P. Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopy. Nano Letters. 15: 2324-8. PMID 25761141 DOI: 10.1021/Nl504468A  0.358
2015 Miyahara Y, Topple J, Schumacher Z, Grutter P. Kelvin probe force microscopy by dissipative electrostatic force modulation Physical Review Applied. 4. DOI: 10.1103/Physrevapplied.4.054011  0.763
2014 Paul W, Oliver D, Grütter P. Indentation-formed nanocontacts: an atomic-scale perspective. Physical Chemistry Chemical Physics : Pccp. 16: 8201-22. PMID 24675876 DOI: 10.1039/C3Cp54869D  0.357
2014 Paul W, Oliver D, Miyahara Y, Grütter P. FIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusion Applied Surface Science. 305: 124-132. DOI: 10.1016/J.Apsusc.2014.03.002  0.369
2013 Paul W, Oliver D, Miyahara Y, Grütter P. Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metals. Nanotechnology. 24: 475704. PMID 24176942 DOI: 10.1088/0957-4484/24/47/475704  0.431
2013 Nagai Y, Carbajal JD, White JH, Sladek R, Grutter P, Lennox RB. An electrochemically controlled microcantilever biosensor. Langmuir : the Acs Journal of Surfaces and Colloids. 29: 9951-7. PMID 23841706 DOI: 10.1021/La400975B  0.3
2013 Tekiel A, Miyahara Y, Topple JM, Grutter P. Room-temperature single-electron charging detected by electrostatic force microscopy. Acs Nano. 7: 4683-90. PMID 23638691 DOI: 10.1021/Nn401840N  0.756
2013 Paul W, Oliver D, Miyahara Y, Grütter PH. Minimum threshold for incipient plasticity in the atomic-scale nanoindentation of Au(111). Physical Review Letters. 110: 135506. PMID 23581339 DOI: 10.1103/PhysRevLett.110.135506  0.323
2013 Bates JR, Miyahara Y, Burgess JA, Iglesias-Freire O, Grütter P. Effect of using stencil masks made by focused ion beam milling on permalloy (Ni81Fe19) nanostructures. Nanotechnology. 24: 115301. PMID 23449320 DOI: 10.1088/0957-4484/24/11/115301  0.376
2013 Labuda A, Kobayashi K, Suzuki K, Yamada H, Grütter P. Monotonic damping in nanoscopic hydration experiments. Physical Review Letters. 110: 066102. PMID 23432279 DOI: 10.1103/Physrevlett.110.066102  0.369
2013 Suarez F, Thostrup P, Colman D, Grutter P. Dynamics of presynaptic protein recruitment induced by local presentation of artificial adhesive contacts. Developmental Neurobiology. 73: 98-106. PMID 22648784 DOI: 10.1002/Dneu.22037  0.344
2013 Schumacher Z, Topple J, Tekiel A, Grütter P. Photovoltaics at the nanoscale Proceedings of Spie. 8811: 881116. DOI: 10.1117/12.2026132  0.771
2013 Tekiel A, Fostner S, Topple J, Miyahara Y, Grütter P. Reactive growth of MgO overlayers on Fe(001) surfaces studied by low-energy electron diffraction and atomic force microscopy Applied Surface Science. 273: 247-252. DOI: 10.1016/J.Apsusc.2013.02.024  0.763
2012 Tekiel A, Topple J, Miyahara Y, Grütter P. Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surface. Nanotechnology. 23: 505602. PMID 23186996 DOI: 10.1088/0957-4484/23/50/505602  0.75
2012 Oliver DJ, Maassen J, El Ouali M, Paul W, Hagedorn T, Miyahara Y, Qi Y, Guo H, Grütter P. Conductivity of an atomically defined metallic interface. Proceedings of the National Academy of Sciences of the United States of America. 109: 19097-102. PMID 23129661 DOI: 10.1073/Pnas.1208699109  0.35
2012 Labuda A, Lysy M, Paul W, Miyahara Y, Grütter P, Bennewitz R, Sutton M. Stochastic noise in atomic force microscopy. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 86: 031104. PMID 23030863 DOI: 10.1103/Physreve.86.031104  0.33
2012 Paul W, Miyahara Y, Grütter P. Implementation of atomically defined field ion microscopy tips in scanning probe microscopy. Nanotechnology. 23: 335702. PMID 22863750 DOI: 10.1088/0957-4484/23/33/335702  0.409
2012 Labuda A, Kobayashi K, Miyahara Y, Grütter P. Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments. The Review of Scientific Instruments. 83: 053703. PMID 22667621 DOI: 10.1063/1.4712286  0.357
2012 Labuda A, Grütter P. Atomic force microscopy in viscous ionic liquids. Langmuir : the Acs Journal of Surfaces and Colloids. 28: 5319-22. PMID 22384786 DOI: 10.1021/La300557U  0.359
2012 Cockins L, Miyahara Y, Bennett SD, Clerk AA, Grutter P. Excited-state spectroscopy on an individual quantum dot using atomic force microscopy. Nano Letters. 12: 709-13. PMID 22200076 DOI: 10.1021/Nl2036222  0.346
2012 Stöffler D, Fostner S, Grütter P, Hoffmann-Vogel R. Scanning probe microscopy imaging of metallic nanocontacts Physical Review B. 85. DOI: 10.1103/Physrevb.85.033404  0.365
2012 Labuda A, Lysy M, Grütter P. Stochastic simulation of tip-sample interactions in atomic force microscopy Applied Physics Letters. 101. DOI: 10.1063/1.4745781  0.386
2011 Hagedorn T, El Ouali M, Paul W, Oliver D, Miyahara Y, Grütter P. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope. The Review of Scientific Instruments. 82: 113903. PMID 22128992 DOI: 10.1063/1.3660279  0.422
2011 Fostner S, Tekiel A, Topple JM, Miyahara Y, Grütter P. Field deposition from metallic tips onto insulating substrates. Nanotechnology. 22: 465301. PMID 22032930 DOI: 10.1088/0957-4484/22/46/465301  0.752
2011 Topple JM, Burke SA, Ji W, Fostner S, Tekiel A, Grütter P. Tailoring the morphology and dewetting of an organic thin film Journal of Physical Chemistry C. 115: 217-224. DOI: 10.1021/Jp107644U  0.797
2010 Labuda A, Paul W, Pietrobon B, Lennox RB, Grütter PH, Bennewitz R. High-resolution friction force microscopy under electrochemical control. The Review of Scientific Instruments. 81: 083701. PMID 20815607 DOI: 10.1063/1.3470107  0.304
2010 Cockins L, Miyahara Y, Bennett SD, Clerk AA, Studenikin S, Poole P, Sachrajda A, Grutter P. Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America. 107: 9496-501. PMID 20457938 DOI: 10.1073/Pnas.0912716107  0.353
2010 Bennett SD, Cockins L, Miyahara Y, Grütter P, Clerk AA. Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot. Physical Review Letters. 104: 017203. PMID 20366389 DOI: 10.1103/Physrevlett.104.017203  0.348
2010 Godin M, Tabard-Cossa V, Miyahara Y, Monga T, Williams PJ, Beaulieu LY, Bruce Lennox R, Grutter P. Cantilever-based sensing: the origin of surface stress and optimization strategies. Nanotechnology. 21: 75501. PMID 20081290 DOI: 10.1088/0957-4484/21/7/075501  0.548
2010 LeDue JM, Lopez-Ayon M, Miyahara Y, Burke SA, Grütter P. Noise in combined optical microscopy and dynamic force spectroscopy: Toward in vivo hydration measurements Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28: C4C15-C4C20. DOI: 10.1116/1.3368462  0.711
2010 Hedberg JA, Lal A, Miyahara Y, Grütter P, Gervais G, Hilke M, Pfeiffer L, West KW. Low temperature electrostatic force microscopy of a deep two-dimensional electron gas using a quartz tuning fork Applied Physics Letters. 97. DOI: 10.1063/1.3499293  0.407
2010 Fostner S, Burke SA, Topple J, Mativetsky JM, Beerens J, Grutter P. Silicon nanostencils with integrated support structures Microelectronic Engineering. 87: 652-657. DOI: 10.1016/J.Mee.2009.09.004  0.777
2009 Burke SA, Topple JM, Grütter P. Molecular dewetting on insulators. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 21: 423101. PMID 21715835 DOI: 10.1088/0953-8984/21/42/423101  0.787
2009 Lucido AL, Suarez Sanchez F, Thostrup P, Kwiatkowski AV, Leal-Ortiz S, Gopalakrishnan G, Liazoghli D, Belkaid W, Lennox RB, Grutter P, Garner CC, Colman DR. Rapid assembly of functional presynaptic boutons triggered by adhesive contacts. The Journal of Neuroscience : the Official Journal of the Society For Neuroscience. 29: 12449-66. PMID 19812321 DOI: 10.1523/Jneurosci.1381-09.2009  0.31
2009 Burke SA, LeDue JM, Miyahara Y, Topple JM, Fostner S, Grütter P. Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques. Nanotechnology. 20: 264012. PMID 19509452 DOI: 10.1088/0957-4484/20/26/264012  0.789
2009 LeDue JM, Lopez-Ayon M, Burke SA, Miyahara Y, Grütter P. High Q optical fiber tips for NC-AFM in liquid. Nanotechnology. 20: 264018. PMID 19509445 DOI: 10.1088/0957-4484/20/26/264018  0.694
2009 Pakarinen OH, Mativetsky JM, Gulans A, Puska MJ, Foster AS, Grutter P. Role of van der Waals forces in the adsorption and diffusion of organic molecules on an insulating surface Physical Review B - Condensed Matter and Materials Physics. 80. DOI: 10.1103/Physrevb.80.085401  0.37
2009 Mativetsky JM, Fostner S, Burke SA, Grutter P. High-resolution investigation of metal nanoparticle growth on an insulating surface Physical Review B - Condensed Matter and Materials Physics. 80. DOI: 10.1103/Physrevb.80.045430  0.681
2009 Topple JM, Burke SA, Fostner S, Grütter P. Thin film evolution: Dewetting dynamics of a bimodal molecular system Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.205414  0.796
2009 Cockins L, Miyahara Y, Grutter P. Spatially resolved low-frequency noise measured by atomic force microscopy Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.121309  0.308
2009 Burke SA, LeDue JM, Topple JM, Fostner S, Grütter P. Organic Semiconductors: Relating the Functional Properties of an Organic Semiconductor to Molecular Structure by nc-AFM (Adv. Mater. 20/2009) Advanced Materials. 21: NA-NA. DOI: 10.1002/Adma.200990071  0.761
2009 Burke SA, Ledue JM, Topple JM, Fostner S, Grütter P. Relating the functional properties of an organic semiconductor to molecular structure by nc-AFM Advanced Materials. 21: 2029-2033. DOI: 10.1002/Adma.200802947  0.795
2008 Burke SA, Grütter P. Comment on 'Temperature dependence of the energy dissipation in dynamic force microscopy'. Nanotechnology. 19: 398001. PMID 21832607 DOI: 10.1088/0957-4484/19/39/398001  0.678
2008 Burke SA, Ji W, Mativetsky JM, Topple JM, Fostner S, Gao HJ, Guo H, Grütter P. Strain induced dewetting of a molecular system: bimodal growth of PTCDA on NaCl. Physical Review Letters. 100: 186104. PMID 18518395 DOI: 10.1103/Physrevlett.100.186104  0.799
2008 Mativetsky JM, Fostner S, Burke SA, Grutter P. The role of charge-induced defects in the growth of gold on an alkali halide surface Surface Science. 602. DOI: 10.1016/J.Susc.2007.12.015  0.673
2007 Cockins L, Miyahara Y, Stomp R, Grutter P. High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy. The Review of Scientific Instruments. 78: 113706. PMID 18052479 DOI: 10.1063/1.2805513  0.4
2007 Tabard-Cossa V, Godin M, Burgess IJ, Monga T, Lennox RB, Grütter P. Microcantilever-based sensors: effect of morphology, adhesion, and cleanliness of the sensing surface on surface stress. Analytical Chemistry. 79: 8136-43. PMID 17914755 DOI: 10.1021/Ac071243D  0.31
2007 Mativetsky JM, Burke SA, Fostner S, Grutter P. Nanoscale pits as templates for building a molecular device. Small (Weinheim An Der Bergstrasse, Germany). 3: 818-21. PMID 17351992 DOI: 10.1002/Smll.200600699  0.678
2007 Beaulieu LY, Godin M, Laroche O, Tabard-Cossa V, Grütter P. A complete analysis of the laser beam deflection systems used in cantilever-based systems. Ultramicroscopy. 107: 422-30. PMID 17174033 DOI: 10.1016/J.Ultramic.2006.11.001  0.556
2007 Burke SA, Mativetsky JM, Fostner S, Grütter P. C60on alkali halides: Epitaxy and morphology studied by noncontact AFM Physical Review B. 76. DOI: 10.1103/Physrevb.76.035419  0.711
2007 Mativetsky JM, Burke SA, Fostner S, Grutter P. Templated growth of 3,4,9,10-perylenetetracarboxylic dianhydride molecules on a nanostructured insulator Nanotechnology. 18. DOI: 10.1088/0957-4484/18/10/105303  0.703
2006 Cross GL, Schirmeisen A, Grütter P, Dürig UT. Plasticity, healing and shakedown in sharp-asperity nanoindentation. Nature Materials. 5: 370-6. PMID 16617347 DOI: 10.1038/Nmat1632  0.33
2006 Mativetsky JM, Miyahara Y, Fostner S, Burke SA, Grutter P. Use of an electron-beam evaporator for the creation of nanostructured pits in an insulating surface Applied Physics Letters. 88. DOI: 10.1063/1.2210288  0.694
2006 Beaulieu LY, Godin M, Laroche O, Tabard-Cossa V, Grütter P. Calibrating laser beam deflection systems for use in atomic force microscopes and cantilever sensors Applied Physics Letters. 88: 083108. DOI: 10.1063/1.2177542  0.559
2006 Tabard-Cossa V, Godin M, Beaulieu L, Grütter P. Erratum to: “A differential microcantilever-based system for measuring surface stress changes induced by electrochemical reactions” [Sensors and Actuators B 107 (2005) 233–241] Sensors and Actuators B: Chemical. 119: 352-354. DOI: 10.1016/J.Snb.2006.07.012  0.521
2005 Tabard-Cossa V, Godin M, Grütter P, Burgess I, Lennox RB. Redox-induced surface stress of polypyrrole-based actuators. The Journal of Physical Chemistry. B. 109: 17531-7. PMID 16853242 DOI: 10.1021/Jp052630Z  0.326
2005 Stomp R, Miyahara Y, Schaer S, Sun Q, Guo H, Grutter P, Studenikin S, Poole P, Sachrajda A. Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy. Physical Review Letters. 94: 056802. PMID 15783674 DOI: 10.1103/Physrevlett.94.056802  0.396
2005 Lucier A, Mortensen H, Sun Y, Grütter P. Determination of the atomic structure of scanning probe microscopy tungsten tips by field ion microscopy Physical Review B. 72: 235420. DOI: 10.1103/Physrevb.72.235420  0.372
2005 Sun Y, Mortensen H, Schär S, Lucier A, Miyahara Y, Grütter P, Hofer W. From tunneling to point contact: Correlation between forces and current Physical Review B. 71: 193407. DOI: 10.1103/Physrevb.71.193407  0.41
2005 Zhu X, Liu Z, Metlushko V, Grütter P, Freeman MR. Broadband spin dynamics of the magnetic vortex state: Effect of the pulsed field direction Physical Review B - Condensed Matter and Materials Physics. 71. DOI: 10.1103/Physrevb.71.180408  0.498
2005 Pumarol ME, Miyahara Y, Gagnon R, Grütter P. Controlled deposition of gold nanodots using non-contact atomic force microscopy Nanotechnology. 16: 1083-1088. DOI: 10.1088/0957-4484/16/8/015  0.427
2005 Zhu X, Allwood DA, Xiong G, Cowburn RP, Grütter P. Spatially resolved observation of domain-wall propagation in a submicron ferromagnetic NOT-gate Applied Physics Letters. 87: 062503. DOI: 10.1063/1.2009050  0.52
2005 Tabard-Cossa V, Godin M, Beaulieu L, Grütter P. A differential microcantilever-based system for measuring surface stress changes induced by electrochemical reactions Sensors and Actuators B: Chemical. 107: 233-241. DOI: 10.1016/J.Snb.2004.10.007  0.567
2004 Godin M, Williams PJ, Tabard-Cossa V, Laroche O, Beaulieu LY, Lennox RB, Grütter P. Surface stress, kinetics, and structure of alkanethiol self-assembled monolayers. Langmuir : the Acs Journal of Surfaces and Colloids. 20: 7090-6. PMID 15301492 DOI: 10.1021/La030257L  0.576
2004 Mativetsky JM, Burke SA, Hoffmann R, Sun Y, Grutter P. Molecular resolution imaging of C60 on Au(111) by non-contact atomic force microscopy Nanotechnology. 15. DOI: 10.1088/0957-4484/15/2/009  0.708
2003 Zhu X, Grütter P, Metlushko V, Hao Y, Castano FJ, Ross CA, Ilic B, Smith HI. Imaging, manipulation, and spectroscopic measurements of nanomagnets by magnetic force microscopy Digests of the Intermag Conference. DC03. DOI: 10.1557/Mrs2004.139  0.586
2003 Zhu X, Grutter P. Magnetic Force Microscopy Studies of Patterned Magnetic Structures Ieee Transactions On Magnetics. 39: 3420-3425. DOI: 10.1109/Tmag.2003.816170  0.56
2003 Zhu X, Metlushko V, Ilic B, Grutter P. Direct Observation of Magnetostatic Coupling of Chain Arrays of Magnetic Disks Ieee Transactions On Magnetics. 39: 2744-2746. DOI: 10.1109/Tmag.2003.815586  0.509
2003 Zhu X, Metlushko V, Ilic B, Grutter P. Direct observation of magnetostatic coupling of permalloy chain arrays Intermag 2003 - Program of the 2003 Ieee International Magnetics Conference. DOI: 10.1109/INTMAG.2003.1230792  0.415
2003 Godin M, Laroche O, Tabard-Cossa V, Beaulieu LY, Grütter P, Williams PJ. Combined in situ micromechanical cantilever-based sensing and ellipsometry Review of Scientific Instruments. 74: 4902-4907. DOI: 10.1063/1.1614859  0.594
2003 Castaño FJ, Hao Y, Haratani S, Ross CA, Vögeli B, Smith HI, Sánchez-Hanke C, Kao CC, Zhu X, Grütter P. Magnetic force microscopy and x-ray scattering study of 70×550 nm2 pseudo-spin-valve nanomagnets Journal of Applied Physics. 93: 7927-7929. DOI: 10.1063/1.1558076  0.554
2003 Zhu X, Grütter P, Metlushko V, Ilic B. Control of domain patterns in square shaped nickel rings Journal of Applied Physics. 93: 7059-7061. DOI: 10.1063/1.1557392  0.491
2003 Zhu X, Grütter P, Metlushko V, Hao Y, Castaño FJ, Ross CA, Ilic B, Smith HI. Construction of hysteresis loops of single domain elements and coupled permalloy ring arrays by magnetic force microscopy Journal of Applied Physics. 93: 8540-8542. DOI: 10.1063/1.1540129  0.539
2003 Zhu X, Grütter P, Hao Y, Castaño FJ, Haratani S, Ross CA, Vögeli B, Smith HI. Magnetization switching in 70-nm-wide pseudo-spin-valve nanoelements Journal of Applied Physics. 93: 1132-1136. DOI: 10.1063/1.1531229  0.528
2002 Zhu X, Grütter P, Metlushko V, Ilic B. Magnetic force microscopy study of electron-beam-patterned soft permalloy particles: Technique and magnetization behavior Physical Review B. 66. DOI: 10.1103/Physrevb.66.024423  0.54
2002 Mehrez H, Wlasenko A, Larade B, Taylor J, Grütter P, Guo H. I−Vcharacteristics and differential conductance fluctuations of Au nanowires Physical Review B. 65. DOI: 10.1103/Physrevb.65.195419  0.342
2002 Pfeiffer O, Bennewitz R, Baratoff A, Meyer E, Grutter P. Lateral-force measurements in dynamic force microscopy Physical Review B. 65: 161403. DOI: 10.1103/Physrevb.65.161403  0.437
2002 Liang KF, Grütter P. Properties of amorphous Al–Yb alloy coating for scanning near-field optical microscopy tips Journal of Applied Physics. 92: 6895-6899. DOI: 10.1063/1.1518762  0.354
2002 Wlasenko A, Grütter P. Data analysis of nonlinear systems: Application to Au nanowires Review of Scientific Instruments. 73: 3324-3328. DOI: 10.1063/1.1498908  0.331
2002 Zhu X, Grütter P, Metlushko V, Ilic B. Magnetization reversal and configurational anisotropy of dense permalloy dot arrays Applied Physics Letters. 80: 4789-4791. DOI: 10.1063/1.1489720  0.555
2002 Roseman M, Grütter P. Determination of Tc, vortex creation and vortex imaging of a superconducting Nb film using low-temperature magnetic force microscopy Journal of Applied Physics. 91: 8840-8842. DOI: 10.1063/1.1456055  0.391
2002 Zhu X, Grütter P, Metlushko V, Ilic B. Systematic study of magnetic tip induced magnetization reversal of e-beam patterned permalloy particles Journal of Applied Physics. 91: 7340-7342. DOI: 10.1063/1.1452683  0.53
2002 Roseman M, Grutter P. Low temperature magnetic force microscopy studies of a superconducting Nb film Microscopy and Microanalysis. 8: 1338-1339. DOI: 10.1017/S143192760210331X  0.404
2002 Roseman M, Grütter P. Magnetic imaging and dissipation force microscopy of vortices on superconducting Nb films Applied Surface Science. 188: 416-420. DOI: 10.1016/S0169-4332(01)00960-6  0.39
2001 Hofer WA, Fisher AJ, Wolkow RA, Grütter P. Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy. Physical Review Letters. 87: 236104. PMID 11736463 DOI: 10.1103/Physrevlett.87.236104  0.418
2001 Roseman M, Grütter P, Badía A, Metlushko V. Flux lattice imaging of a patterned niobium thin film Journal of Applied Physics. 89: 6787-6789. DOI: 10.1063/1.1355327  0.411
2000 Schirmeisen A, Cross G, Stalder A, Grütter P, Dürig U. Metallic adhesion and tunnelling at the atomic scale New Journal of Physics. 2: 29-29. DOI: 10.1088/1367-2630/2/1/329  0.424
2000 Roseman M, Grütter P. Cryogenic magnetic force microscope Review of Scientific Instruments. 71: 3782-3787. DOI: 10.1063/1.1290039  0.352
2000 Schirmeisen A, Cross G, Stalder A, Grütter P, Dürig U. Metallic adhesion forces and tunneling between atomically defined tip and sample Applied Surface Science. 157: 274-279. DOI: 10.1016/S0169-4332(99)00539-5  0.441
1998 Cross G, Schirmeisen A, Stalder A, Grütter P, Tschudy M, Dürig U. Adhesion interaction between atomically defined tip and sample Physical Review Letters. 80: 4685-4688. DOI: 10.1103/Physrevlett.80.4685  0.427
1997 Liu Y, LeBlanc P, Grütter P, Dürig U. Magnetic dissipation imaging (abstract) Journal of Applied Physics. 81: 5024-5024. DOI: 10.1063/1.364497  0.387
1997 Liu Y, Ellman B, Grütter P. Theory of magnetic dissipation imaging Applied Physics Letters. 71: 1418-1420. DOI: 10.1063/1.119911  0.351
1997 Grütter P, Liu Y, LeBlanc P, Dürig U. Magnetic dissipation force microscopy Applied Physics Letters. 71: 279-281. DOI: 10.1063/1.119519  0.404
1995 Grütter P, Dürig U. Quasidendritic growth of Co induced by localized reconstruction of Pt(111) Surface Science. 337: 147-152. DOI: 10.1016/0039-6028(95)00541-2  0.335
1994 Rüetschi M, Grütter P, Fünfschilling J, Güntherodt H-. Creation of liquid crystal waveguides with scanning force microscopy. Science. 265: 512-514. PMID 17781310 DOI: 10.1126/Science.265.5171.512  0.353
1994 Grütter P, Dürig UT. Growth of vapor-deposited cobalt films on Pt(111) studied by scanning tunneling microscopy Physical Review B. 49: 2021-2029. PMID 10011006 DOI: 10.1103/Physrevb.49.2021  0.353
1992 Grütter P, Zimmermann‐Edling W, Brodbeck D. Tip artifacts of microfabricated force sensors for atomic force microscopy Applied Physics Letters. 60: 2741-2743. DOI: 10.1063/1.106862  0.442
1992 Albrecht TR, Grütter P, Rugar D, Smith DPE. Low-temperature force microscope with all-fiber interferometer Ultramicroscopy. 1638-1646. DOI: 10.1016/0304-3991(92)90498-9  0.615
1992 Grütter P, Rugar D, Mamin H. Magnetic force microscopy of magnetic materials Ultramicroscopy. 47: 393-399. DOI: 10.1016/0304-3991(92)90170-O  0.618
1991 Rugar D, Grütter P. Mechanical parametric amplification and thermomechanical noise squeezing. Physical Review Letters. 67: 699-702. PMID 10044966 DOI: 10.1103/Physrevlett.67.699  0.587
1991 GRÜTTER P, RUGAR D, ALBRECHT T, MAMIN H. MAGNETIC FORCE MICROSCOPY-RECENT ADVANCES AND APPLICATIONS TO MAGNETO-OPTIC RECORDING Journal of the Magnetics Society of Japan. 15: S1_243-244. DOI: 10.3379/Jmsjmag.15.S1_243  0.625
1991 Grütter P, Rugar D, Mamin HJ, Castillo G, Lin C, McFadyen IR, Valletta RM, Wolter O, Bayer T, Greschner J. Magnetic force microscopy with batch‐fabricated force sensors Journal of Applied Physics. 69: 5883-5885. DOI: 10.1063/1.347856  0.655
1991 Albrecht TR, Grütter P, Horne D, Rugar D. Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity Journal of Applied Physics. 69: 668-673. DOI: 10.1063/1.347347  0.616
1990 Wadas A, Grutter P, Guntherodt HJ. Analysis of magnetic bit pattern by magnetic force microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 416-420. DOI: 10.1116/1.576410  0.419
1990 Grutter P, Wadas A, Meyer E, Heinzelmann H, Hidber HR, Guntherodt HJ. High resolution magnetic force microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 406-410. DOI: 10.1116/1.576408  0.371
1990 Grütter P, Wadas A, Meyer E, Heinzelmann H, Hidber H‐, Güntherodt H‐. High‐resolution magnetic force microscopy (abstract) Journal of Applied Physics. 67: 5953-5953. DOI: 10.1063/1.346023  0.432
1990 Grütter P, Jung T, Heinzelmann H, Wadas A, Meyer E, Hidber H‐, Güntherodt H‐. 10‐nm resolution by magnetic force microscopy on FeNdB Journal of Applied Physics. 67: 1437-1441. DOI: 10.1063/1.345675  0.428
1990 Wadas A, Grütter P, Güntherodt H‐. Analysis of in-plane bit structure by magnetic force microscopy Journal of Applied Physics. 67: 3462-3467. DOI: 10.1063/1.345335  0.42
1990 Grütter P, Rugar D, Mamin HJ, Castillo G, Lambert SE, Lin C, Valletta RM, Wolter O, Bayer T, Greschner J. Batch fabricated sensors for magnetic force microscopy Applied Physics Letters. 57: 1820-1822. DOI: 10.1063/1.104030  0.648
1989 Wadas A, Grütter P. Theoretical approach to magnetic force microscopy. Physical Review B. 39: 12013-12017. PMID 9948037 DOI: 10.1103/Physrevb.39.12013  0.374
1989 Meyer E, Heinzelmann H, Grütter P, Hidber H‐, Güntherodt H‐, Steiger R. A study of the AgBr(111) and AgBr(100) surface by means of atomic force microscopy Journal of Applied Physics. 66: 4243-4247. DOI: 10.1063/1.343964  0.392
1989 Grütter P, Wadas A, Meyer E, Hidber H‐, Güntherodt H‐. Magnetic force microscopy of a CoCr thin film Journal of Applied Physics. 66: 6001-6006. DOI: 10.1063/1.343628  0.438
1989 Meyer E, Heinzelmann H, Grütter P, Jung T, Scandella L, Hidber H‐, Rudin H, Güntherodt H‐, Schmidt C. Investigation of hydrogenated amorphous carbon coatings for magnetic data storage media by atomic force microscopy Applied Physics Letters. 55: 1624-1626. DOI: 10.1063/1.102218  0.414
1989 Heinzelmann H, Meyer E, Scandella L, Grütter P, Jung T, Hug H, Hidber HR, Güntherodt HJ, Schmidt C. Topography and correlation to wear of hydrogenated amorphous carbon coatings: An atomic force microscopy study Wear. 135: 109-117. DOI: 10.1016/0043-1648(89)90099-9  0.411
1989 Meyer E, Heinzelmann H, Grütter P, Jung T, Hidber H-, Rudin H, Güntherodt H-. Atomic force microscopy for the study of tribology and adhesion Thin Solid Films. 181: 527-544. DOI: 10.1016/0040-6090(89)90522-1  0.444
1988 Grütter P, Meyer E, Heinzelmann H, Rosenthaler L, Hidber H‐, Güntherodt H‐. Application of atomic force microscopy to magnetic materials Journal of Vacuum Science and Technology. 6: 279-282. DOI: 10.1116/1.575425  0.452
1988 Heinzelmann H, Meyer E, Grütter P, Hidber H‐, Rosenthaler L, Güntherodt H‐. Atomic force microscopy : general aspects and application to insulators Journal of Vacuum Science and Technology. 6: 275-278. DOI: 10.1116/1.575424  0.452
1988 Albrecht TR, Dovek MM, Lang CA, Grütter P, Quate CF, Kuan SWJ, Frank CW, Pease RFW. Imaging and modification of polymers by scanning tunneling and atomic force microscopy Journal of Applied Physics. 64: 1178-1184. DOI: 10.1063/1.341881  0.618
1988 Grütter P, Meyer E, Heinzelmann H, Rosenthaler L, Hidber HR, Güntherodt H‐. Magnetic imaging by atomic force microscope (invited) (abstract) Journal of Applied Physics. 63: 2947-2947. DOI: 10.1063/1.340936  0.443
1987 Sáenz JJ, García N, Grütter P, Meyer E, Heinzelmann H, Wiesendanger R, Rosenthaler L, Hidber HR, Güntherodt H‐. Observation of magnetic forces by the atomic force microscope Journal of Applied Physics. 62: 4293-4295. DOI: 10.1063/1.339105  0.412
1987 Heinzelmann H, Grütter P, Meyer E, Hidber H, Rosenthaler L, Ringger M, Güntherodt H-. Design of an atomic force microscope and first results Surface Science. 29-35. DOI: 10.1016/S0039-6028(87)80411-9  0.435
1987 Bretscher H, Grütter P, Indlekofer G, Jenny H, Lapka R, Oelhafen P, Wiesendanger R, Zingg T, Güntherodt HJ. Physical properties of icosahedral and glassy Pd-U-Si alloys Zeitschrift FüR Physik B Condensed Matter. 68: 313-324. DOI: 10.1007/Bf01304246  0.331
1870 Meyer E, Heinzelmann H, Grütter P, Jung T, Weisskopf T, Hidber H-, Lapka R, Rudin H, Güntherodt H-. Comparative study of lithium fluoride and graphite by atomic force microscopy (AFM) Journal of Microscopy. 152: 269-280. DOI: 10.1111/J.1365-2818.1988.Tb01388.X  0.443
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