Year |
Citation |
Score |
2018 |
Zhang S, Yu E, Gates S, Cassata WS, Makel J, Thron AM, Bartel C, Weimer AW, Faller R, Stroeve P, Tringe JW. Helium interactions with alumina formed by atomic layer deposition show potential for mitigating problems with excess helium in spent nuclear fuel Journal of Nuclear Materials. 499: 301-311. DOI: 10.1016/J.Jnucmat.2017.11.029 |
0.351 |
|
2017 |
Qin W, Yun J, Thron AM, Benthem Kv. Temperature gradient and microstructure evolution in AC flash sintering of 3 mol% yttria-stabilized zirconia Materials and Manufacturing Processes. 32: 549-556. DOI: 10.1080/10426914.2016.1232814 |
0.31 |
|
2017 |
Cen X, Thron AM, Benthem Kv. In-situ study of the dewetting behavior of Au/Ni bilayer films supported by a SiO2/Si substrate Acta Materialia. 140: 149-156. DOI: 10.1016/J.Actamat.2017.08.027 |
0.465 |
|
2016 |
Cen X, Thron AM, Zhang X, van Benthem K. Cross-sectional characterization of the dewetting of a Au/Ni bilayer film. Ultramicroscopy. PMID 27324837 DOI: 10.1016/J.Ultramic.2016.06.004 |
0.7 |
|
2016 |
Cen X, Thron A, Zhang X, Benthem Kv. Dewetting Transitions of Au/Ni Bilayer Films Microscopy and Microanalysis. 22: 1628-1629. DOI: 10.1017/S1431927616008989 |
0.373 |
|
2016 |
Cen X, Zhang X, Thron AM, van Benthem K. Agglomeration and long-range edge retraction for Au/Ni bilayer films during thermal annealing Acta Materialia. 119: 167-176. DOI: 10.1016/J.Actamat.2016.08.021 |
0.446 |
|
2014 |
Thron AM, Greene P, Liu K, van Benthem K. In-situ observation of equilibrium transitions in Ni films; agglomeration and impurity effects. Ultramicroscopy. 137: 55-65. PMID 24321382 DOI: 10.1016/J.Ultramic.2013.11.004 |
0.697 |
|
2013 |
Chan J, Balakchiev M, Thron AM, Chapman RA, Riley D, Song SC, Jain A, Blatchford J, Shaw JB, Van Benthem K, Vogel EM, Hinkle CL. PtSi dominated Schottky barrier heights of Ni(Pt)Si contacts due to Pt segregation Applied Physics Letters. 102. DOI: 10.1063/1.4799277 |
0.336 |
|
2013 |
Hihath S, Riechers P, Thron A, van Benthem K, Kiehl R, Murray C, Chen J. Characterization of the Interface Between Fe3O4 Nanoparticles and a GaAs Substrate As a Platform For Next Generation Spintronic Devices Microscopy and Microanalysis. 19: 1650-1651. DOI: 10.1017/S1431927613010246 |
0.304 |
|
2013 |
Thron AM, Greene P, Liu K, Benthem Kv. In-situ Heating Investigations of Dewetting Transtions in Ultra-Thin Ni films on SiO2 Layers Microscopy and Microanalysis. 19: 450-451. DOI: 10.1017/S1431927613004248 |
0.413 |
|
2013 |
Thron AM, Pennycook TJ, Chan J, Luo W, Jain A, Riley D, Blatchford J, Shaw J, Vogel EM, Hinkle CL, Van Benthem K. Formation of pre-silicide layers below Ni1-xPt xSi/Si interfaces Acta Materialia. 61: 2481-2488. DOI: 10.1016/J.Actamat.2013.01.022 |
0.406 |
|
2012 |
Matsuno M, Bonifacio CS, Rufner JF, Thron AM, Holland TB, Mukherjee AK, Van Benthem K. In situ transmission electron microscopic investigations of reduction-oxidation reactions during densification of nickel nanoparticles Journal of Materials Research. 27: 2431-2440. DOI: 10.1557/Jmr.2012.256 |
0.638 |
|
2012 |
Schwarz S, Thron AM, Rufner J, Van Benthem K, Guillon O. Low temperature sintering of nanocrystalline zinc oxide: Effect of heating rate achieved by field assisted sintering/spark plasma sintering Journal of the American Ceramic Society. 95: 2451-2457. DOI: 10.1111/J.1551-2916.2012.05205.X |
0.31 |
|
2012 |
Thron A, van Benthem K, Chan J, Hinkle C, Pennycook T, Pennycook S, Jain A. Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface Microscopy and Microanalysis. 18: 344-345. DOI: 10.1017/S1431927612003571 |
0.318 |
|
2012 |
Thron AM, Greene PK, Liu K, Benthem KV. Structural changes during the reaction of Ni thin films with (1 0 0) silicon substrates Acta Materialia. 60: 2668-2678. DOI: 10.1016/J.Actamat.2012.01.033 |
0.45 |
|
2011 |
Thron A, Greene P, Liu K, Benthem Kv. Wetting-Dewetting Transitions of Ultrathin Nickel Films Deposited on Silicon (100) Substrates Microscopy and Microanalysis. 17: 1328-1329. DOI: 10.1017/S1431927611007513 |
0.344 |
|
2011 |
Matsuno M, Bonifacio C, Thron A, Rufner J, Holland T, Benthem Kv. In situ Sintering of Ni Nanoparticles by Controlled Heating Microscopy and Microanalysis. 17: 524-525. DOI: 10.1017/S1431927611003497 |
0.611 |
|
2010 |
Holland TB, Thron AM, Bonifacio CS, Mukherjee AK, Van Benthem K. Field assisted sintering of nickel nanoparticles during in situ transmission electron microscopy Applied Physics Letters. 96. DOI: 10.1063/1.3452327 |
0.636 |
|
2010 |
Thron A, Greene P, Liu K, Benthem Kv. Atomic Level Mechanisms of Solid-State Dewetting in Thin Metal Films Deposited on Silicon (100) Substrates Microscopy and Microanalysis. 16: 1462-1463. DOI: 10.1017/S1431927610061258 |
0.366 |
|
2010 |
Benthem Kv, Bonifacio C, Thron A, Weil S, Holland T. Investigation of Dielectric Breakdown on the Atomic Length-Scale Using In Situ STM-TEM Microscopy and Microanalysis. 16: 1750-1751. DOI: 10.1017/S1431927610061106 |
0.596 |
|
2010 |
Bonifacio C, Thron A, Bersuker G, Benthem Kv. In Situ Investigation of Dielectric Breakdown in Field Effect Transistors Microscopy and Microanalysis. 16: 1298-1299. DOI: 10.1017/S1431927610058666 |
0.588 |
|
2009 |
Bonifacio CS, Thron AM, Pennycook SJ, Contescu CI, Gallego NC, Van Benthem K. Atomic Resolution Investigation of Metal-Assisted Hydrogen Storage Mechanisms in Activated Carbon Fibers Microscopy and Microanalysis. 15: 1426-1427. DOI: 10.1017/S1431927609099073 |
0.591 |
|
2009 |
Thron AM, Bonifacio CS, Erdman N, Harrison MA, Somarajan S, Dickerson JH, Van Benthem K. Characterization of EuS nanotubes in quantum confinement Microscopy and Microanalysis. 15: 1178-1179. DOI: 10.1017/S1431927609098778 |
0.561 |
|
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