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Arthur R. Woll, Ph.D. - Publications

Affiliations: 
2000 Cornell University, Ithaca, NY, United States 
Area:
Condensed Matter Physics
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75 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Agyeman-Budu DN, Brock JD, Woll AR. Efficient high-pass filtering with practical, high-yield X-ray transmission mirror optics Powder Diffraction. 1-5. DOI: 10.1017/S088571562000024X  0.306
2019 Smieska LM, Woll AR, Vanmeert F, Janssens K. Synchrotron-Based High-Energy X-ray MA-XRF and MA-XRD for Art and Archaeology Synchrotron Radiation News. 32: 29-33. DOI: 10.1080/08940886.2019.1680212  0.381
2019 Joress H, Arlington SQ, Weihs TP, Brock JD, Woll AR. X-ray reflectivity with a twist: Quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation Applied Physics Letters. 114: 081904. DOI: 10.1063/1.5085063  0.633
2019 Stromberg JM, Van Loon LL, Gordon R, Woll A, Feng R, Schumann D, Banerjee NR. Applications of synchrotron X-ray techniques to orogenic gold studies; examples from the Timmins gold camp Ore Geology Reviews. 104: 589-602. DOI: 10.1016/J.Oregeorev.2018.11.015  0.35
2019 Smieska LM, Twilley J, Woll AR, Schafer M, Marcereau DeGalan A. Energy-optimized synchrotron XRF mapping of an obscured painting beneath Exit from the Theater, attributed to Honoré Daumier Microchemical Journal. 146: 679-691. DOI: 10.1016/J.Microc.2019.01.058  0.365
2018 Guimarães D, Roberts AA, Tehrani MW, Huang R, Smieska L, Woll AR, Lin S, Parsons PJ. Characterization of Arsenic in dried baby shrimp () using synchrotron-based X-Ray Spectrometry and LC coupled to ICP-MS/MS. Journal of Analytical Atomic Spectrometry. 33: 1616-1630. PMID 32624635 DOI: 10.1039/C8Ja00094H  0.308
2018 Joress H, Brock JD, Woll AR. Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications. Journal of Synchrotron Radiation. 25: 706-716. PMID 29714180 DOI: 10.1107/S1600577518003004  0.636
2018 Genova VJ, Agyeman-Budu DN, Woll AR. Time multiplexed deep reactive ion etching of germanium and silicon-A comparison of mechanisms and application to x-ray optics. Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : Jvst B. 36: 011205. PMID 29333339 DOI: 10.1116/1.4991875  0.348
2018 Ryan CG, Kirkham R, Jonge MDd, Siddons DP, Ent Avd, Pagés A, Boesenberg U, Kuczewski AJ, Dunn P, Jensen M, Liu W, Harris H, Moorhead GF, Paterson DJ, Howard DL, ... ... Woll AR, et al. The Maia detector and event mode Synchrotron Radiation News. 31: 21-27. DOI: 10.1080/08940886.2018.1528430  0.373
2018 Vishwanath S, Sundar A, Liu X, Azcatl A, Lochocki E, Woll AR, Rouvimov S, Hwang WS, Lu N, Peng X, Lien H, Weisenberger J, McDonnell S, Kim MJ, Dobrowolska M, et al. MBE growth of few-layer 2H-MoTe2 on 3D substrates Journal of Crystal Growth. 482: 61-69. DOI: 10.1016/J.Jcrysgro.2017.10.024  0.46
2017 Pouyet E, Devine S, Grafakos T, Kieckhefer R, Salvant J, Smieska L, Woll A, Katsaggelos A, Cossairt O, Walton M. Revealing the biography of a hidden medieval manuscript using synchrotron and conventional imaging techniques. Analytica Chimica Acta. 982: 20-30. PMID 28734360 DOI: 10.1016/J.Aca.2017.06.016  0.31
2017 Favero PA, Mass J, Delaney JK, Woll AR, Hull AM, Dooley KA, Finnefrock AC. Reflectance imaging spectroscopy and synchrotron radiation X-ray fluorescence mapping used in a technical study of The Blue Room by Pablo Picasso Heritage Science. 5. DOI: 10.1186/S40494-017-0126-5  0.363
2017 Singh MA, Saimoto S, Langille MR, Lévesque J, Inal K, Woll AR. Small-angle X-ray scattering investigation of deformation-induced nanovoids in AA6063 aluminium alloy Philosophical Magazine. 97: 2496-2513. DOI: 10.1080/14786435.2017.1340684  0.35
2017 Choudhury S, Agyeman-Budu DN, Woll AR, Swanston T, Varney TL, Cooper DML, Hallin E, George GN, Pickering IJ, Coulthard I. Superior spatial resolution in confocal X-ray techniques using collimating channel array optics: elemental mapping and speciation in archaeological human bone Journal of Analytical Atomic Spectrometry. 32: 527-537. DOI: 10.1039/C6Ja00297H  0.366
2016 Dey S, Tapily K, Consiglio S, Yu K, Clark RD, Wajda CS, Leusink GJ, Woll AR, Diebold AC. Higher-k Tetragonal Phase Stabilization in Atomic Layer Deposited Hf1-xZrxO2 (0Mrs Advances. 1: 269-274. DOI: 10.1557/Adv.2016.65  0.468
2016 Dey S, Tapily K, Consiglio S, Clark RD, Wajda CS, Leusink GJ, Woll AR, Diebold AC. Role of Ge and Si substrates in higher-k tetragonal phase formation and interfacial properties in cyclical atomic layer deposition-anneal Hf1−xZrxO2/Al2O3 thin film stacks Journal of Applied Physics. 120: 125304. DOI: 10.1063/1.4963166  0.448
2016 Kish ER, Nahm RK, Woll AR, Engstrom JR. When the Sequence of Thin Film Deposition Matters: Examination of Organic-on-Organic Heterostructure Formation Using Molecular Beam Techniques and in Situ Real Time X-ray Synchrotron Radiation Journal of Physical Chemistry C. 120: 6165-6179. DOI: 10.1021/Acs.Jpcc.6B01717  0.481
2016 Ellis EA, Chmielus M, Lin MT, Joress H, Visser K, Woll A, Vinci RP, Brown WL, Baker SP. Driving forces for texture transformation in thin Ag films Acta Materialia. 105: 495-504. DOI: 10.1016/J.Actamat.2015.12.020  0.333
2016 Purdum GE, Yao N, Woll A, Gessner T, Weitz RT, Loo YL. Understanding polymorph transformations in core-chlorinated naphthalene diimides and their impact on thin-film transistor performance Advanced Functional Materials. 26: 2357-2364. DOI: 10.1002/Adfm.201502412  0.396
2015 Rawat N, Pan Z, Manning LW, Lamarche CJ, Cour I, Headrick RL, Waterman R, Woll AR, Furis MI. Macroscopic Molecular Ordering and Exciton Delocalization in Crystalline Phthalocyanine Thin Films. The Journal of Physical Chemistry Letters. 6: 1834-40. PMID 26263257 DOI: 10.1021/Acs.Jpclett.5B00714  0.343
2015 Kish ER, Desai TV, Greer DR, Woll AR, Engstrom JR. Nucleation of diindenoperylene and pentacene at thermal and hyperthermal incident kinetic energies Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 33. DOI: 10.1116/1.4916885  0.343
2015 Gutiérrez-Llorente A, Joress H, Woll A, Holtz ME, Ward MJ, Sullivan MC, Muller DA, Brock JD. Epitaxial crystals of Bi2Pt2O7 pyrochlore through the transformation of δ -Bi2O3 fluorite Apl Materials. 3. DOI: 10.1063/1.4908103  0.622
2015 Sullivan MC, Ward MJ, Gutiérrez-Llorente A, Adler ER, Joress H, Woll A, Brock JD. Complex oxide growth using simultaneous in situ reflection high-energy electron diffraction and x-ray reflectivity: When is one layer complete? Applied Physics Letters. 106. DOI: 10.1063/1.4906419  0.63
2015 Choudhury S, Hormes J, Agyeman-Budu DN, Woll AR, George GN, Coulthard I, Pickering IJ. Application of a spoked channel array to confocal X-ray fluorescence imaging and X-ray absorption spectroscopy of medieval stained glass Journal of Analytical Atomic Spectrometry. 30: 759-766. DOI: 10.1039/C4Ja00389F  0.37
2014 Hiszpanski AM, Baur RM, Kim B, Tremblay NJ, Nuckolls C, Woll AR, Loo YL. Tuning polymorphism and orientation in organic semiconductor thin films via post-deposition processing. Journal of the American Chemical Society. 136: 15749-56. PMID 25317987 DOI: 10.1021/Ja5091035  0.362
2014 Lambert PK, Hustedt CJ, Vecchio KS, Huskins EL, Casem DT, Gruner SM, Tate MW, Philipp HT, Woll AR, Purohit P, Weiss JT, Kannan V, Ramesh KT, Kenesei P, Okasinski JS, et al. Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading. The Review of Scientific Instruments. 85: 093901. PMID 25273733 DOI: 10.1063/1.4893881  0.399
2014 Xie J, Demarteau M, Wagner R, Ruiz-Oses M, Liang X, Ben-Zvi I, Attenkofer K, Schubert S, Smedley J, Wong J, Padmore H, Woll A. Study of bi-alkali photocathode growth on glass by X-ray techniques for fast timing response photomultipliers Proceedings of Spie - the International Society For Optical Engineering. 8982. DOI: 10.1117/12.2037367  0.486
2013 Hwang J, Kim M, Campbell D, Alsalman HA, Kwak JY, Shivaraman S, Woll AR, Singh AK, Hennig RG, Gorantla S, Rümmeli MH, Spencer MG. van der Waals epitaxial growth of graphene on sapphire by chemical vapor deposition without a metal catalyst. Acs Nano. 7: 385-95. PMID 23244231 DOI: 10.1021/Nn305486X  0.343
2013 Hiszpanski AM, Lee SS, Wang H, Woll AR, Nuckolls C, Loo YL. Post-deposition processing methods to induce preferential orientation in contorted hexabenzocoronene thin films. Acs Nano. 7: 294-300. PMID 23228001 DOI: 10.1021/Nn304003U  0.37
2013 Chaudhuri A, Singh MA, Diak BJ, Cuoppolo C, Woll AR. Nanovoid characterization of nominally pure aluminium using synchrotron small angle X-ray Scattering (SAXS) methods Philosophical Magazine. 93: 4392-4411. DOI: 10.1080/14786435.2013.832838  0.399
2012 Meshot ER, Verploegen E, Bedewy M, Tawfick S, Woll AR, Green KS, Hromalik M, Koerner LJ, Philipp HT, Tate MW, Gruner SM, Hart AJ. High-speed in situ X-ray scattering of carbon nanotube film nucleation and self-organization. Acs Nano. 6: 5091-101. PMID 22571676 DOI: 10.1021/Nn300758F  0.405
2012 Lee SS, Tang SB, Smilgies DM, Woll AR, Loth MA, Mativetsky JM, Anthony JE, Loo YL. Guiding crystallization around bends and sharp corners. Advanced Materials (Deerfield Beach, Fla.). 24: 2692-8. PMID 22511330 DOI: 10.1002/Adma.201104619  0.369
2012 Spitler EL, Colson JW, Uribe-Romo FJ, Woll AR, Giovino MR, Saldivar A, Dichtel WR. Lattice expansion of highly oriented 2D phthalocyanine covalent organic framework films. Angewandte Chemie (International Ed. in English). 51: 2623-7. PMID 22223402 DOI: 10.1002/Anie.201107070  0.324
2012 Woll AR, Agyeman-Budu D, Bilderback DH, Dale D, Kazimirov AY, Pfeifer M, Plautz T, Szebenyi T, Untracht G. 3D x-ray uorescence microscopy with 1.7 μm resolution using lithographically fabricated micro-channel arrays Proceedings of Spie - the International Society For Optical Engineering. 8502. DOI: 10.1117/12.944365  0.321
2012 Wang Z, Finkelstein K, Smilgies D, Woll A, Fontes E. Science at the Hard X-ray Diffraction Limit (XDL2011), Part 2 Synchrotron Radiation News. 25: 9-16. DOI: 10.1080/08940886.2012.645417  0.398
2012 Desai TV, Woll AR, Engstrom JR. Thin film growth of pentacene on polymeric dielectrics: Unexpected changes in the evolution of surface morphology with substrate Journal of Physical Chemistry C. 116: 12541-12552. DOI: 10.1021/Jp300635U  0.48
2012 Lee SS, Muralidharan S, Woll AR, Loth MA, Li Z, Anthony JE, Haataja M, Loo YL. Understanding heterogeneous nucleation in binary, solution-processed, organic semiconductor thin films Chemistry of Materials. 24: 2920-2928. DOI: 10.1021/Cm3010858  0.308
2011 Desai TV, Hong S, Woll AR, Hughes KJ, Kaushik AP, Clancy P, Engstrom JR. Hyperthermal organic thin film growth on surfaces terminated with self-assembled monolayers. I. The dynamics of trapping. The Journal of Chemical Physics. 134: 224702. PMID 21682528 DOI: 10.1063/1.3591965  0.423
2011 Colson JW, Woll AR, Mukherjee A, Levendorf MP, Spitler EL, Shields VB, Spencer MG, Park J, Dichtel WR. Oriented 2D covalent organic framework thin films on single-layer graphene. Science (New York, N.Y.). 332: 228-31. PMID 21474758 DOI: 10.1126/Science.1202747  0.397
2011 Ferguson JD, Kim Y, Kourkoutis LF, Vodnick A, Woll AR, Muller DA, Brock JD. Epitaxial oxygen getter for a brownmillerite phase transformation in manganite films. Advanced Materials (Deerfield Beach, Fla.). 23: 1226-30. PMID 21381119 DOI: 10.1002/Adma.201003581  0.552
2011 Woll AR, Desai TV, Engstrom JR. Quantitative modeling of in situ x-ray reflectivity during organic molecule thin film growth Physical Review B - Condensed Matter and Materials Physics. 84. DOI: 10.1103/Physrevb.84.075479  0.486
2011 Desai TV, Kish ER, Woll AR, Engstrom JR. Hyperthermal growth of N, N′ -ditridecylperylene-3,4,9,10- tetracarboxylic diimide on self-assembled monolayers: Adsorption dynamics and sub- and multilayer thin film growth Journal of Physical Chemistry C. 115: 18221-18234. DOI: 10.1021/Jp204495U  0.41
2010 Hwang J, Shields VB, Thomas CI, Shivaraman S, Hao D, Kim M, Woll AR, Tompa GS, Spencer MG. Epitaxial growth of graphitic carbon on C-face SiC and Sapphire by chemical vapor deposition (CVD). Journal of Crystal Growth. 312: 3219-3224. PMID 20976026 DOI: 10.1016/J.Jcrysgro.2010.07.046  0.431
2010 Meshot ER, Bedewy M, Lyons KM, Woll AR, Juggernauth KA, Tawfick S, Hart AJ. Measuring the lengthening kinetics of aligned nanostructures by spatiotemporal correlation of height and orientation. Nanoscale. 2: 896-900. PMID 20644774 DOI: 10.1039/B9Nr00343F  0.371
2010 Desai TV, Woll AR, Schreiber F, Engstrom JR. Nucleation and growth of perfluoropentacene on self-assembled monolayers: Significant changes in island density and shape with surface termination Journal of Physical Chemistry C. 114: 20120-20129. DOI: 10.1021/Jp107518F  0.436
2010 Brock JD, Ferguson JD, Kim Y, Wang HQ, Woll AR. Nucleation, coarsening, and coalescence during layer-by-layer growth of complex oxides via pulsed laser deposition: Time-resolved, diffuse X-ray scattering studies Materials Science and Engineering A. 528: 72-76. DOI: 10.1016/J.Msea.2010.07.053  0.653
2010 Brock JD, Ferguson JD, Woll AR. X-ray scattering studies of the surface structure of complex oxide films during layer-by-layer growth via pulsed laser deposition Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 41: 1162-1166. DOI: 10.1007/S11661-009-9910-5  0.678
2009 Ferguson JD, Arikan G, Dale DS, Woll AR, Brock JD. Measurements of surface diffusivity and coarsening during pulsed laser deposition. Physical Review Letters. 103: 256103. PMID 20366266 DOI: 10.1103/Physrevlett.103.256103  0.636
2009 Amassian A, Desai TV, Kowarik S, Hong S, Woll AR, Malliaras GG, Schreiber F, Engstrom JR. Coverage dependent adsorption dynamics in hyperthermal organic thin film growth Journal of Chemical Physics. 130. PMID 19334866 DOI: 10.1063/1.3088835  0.379
2009 Amassian A, Pozdin VA, Desai TV, Hong S, Woll AR, Ferguson JD, Brock JD, Malliaras GG, Engstrom JR. Post-deposition reorganization of pentacene films deposited on low-energy surfaces Journal of Materials Chemistry. 19: 5580-5592. DOI: 10.1039/B907947E  0.629
2008 Mass JL, Woll AR, Ocon N, Bisulca C, Wazny T, Griggs CB, Cushman M. Collaboration or appropriation? Examining a 17th c. panel by David Teniers the Younger and Jan Brueghel the Younger Using Confocal X-ray fluorescence microscopy Materials Research Society Symposium Proceedings. 1047: 3-17. DOI: 10.1557/Proc-1047-Y07-01  0.36
2008 Ferguson JD, Woll AR, Arikan G, Dale DS, Amassian A, Tate MW, Brock JD. Time resolved in-situ diffuse x-ray scattering measurements of the surface morphology of homoepitaxial SrTiO3 films during pulsed laser deposition Materials Research Society Symposium Proceedings. 1034: 7-13. DOI: 10.1557/Proc-1034-K10-20  0.508
2008 Woll AR, Mass J, Bisulca C, Cushman M, Griggs C, Wazny T, Ocon N. The unique history of The Armorer's Shop: An application of confocal x-ray fluorescence microscopy Studies in Conservation. 53: 93-109. DOI: 10.1179/Sic.2008.53.2.93  0.373
2008 Hong S, Amassian A, Woll AR, Bhargava S, Ferguson JD, Malliaras GG, Brock JD, Engstrom JR. Real time monitoring of pentacene growth on Si O2 from a supersonic source Applied Physics Letters. 92. DOI: 10.1063/1.2946497  0.646
2007 Ferguson JD, Woll AR, Arikan G, Dale DS, Amassian A, Tate MW, Brock JD. Time Resolved In-Situ Diffuse X-ray Scattering Measurements of the Surface Morphology of Homoepitaxial SrTiO3 Films During Pulsed Laser Deposition Mrs Proceedings. 1034. DOI: 10.1557/PROC-1034-K10-20  0.639
2007 Dale D, Fleet A, Woll A, Suzuki Y, Brock JD. Technical Report:In-situStudies of Pulsed Laser Deposition Growth at CHESS Synchrotron Radiation News. 20: 32-37. DOI: 10.1080/08940880701401151  0.715
2006 Fleet A, Dale D, Woll AR, Suzuki Y, Brock JD. Multiple time scales in diffraction measurements of diffusive surface relaxation. Physical Review Letters. 96: 055508. PMID 16486952 DOI: 10.1103/Physrevlett.96.055508  0.733
2006 Woll AR, Mass J, Bisulca C, Huang R, Bilderback DH, Gruner S, Gao N. Development of confocal X-ray fluorescence (XRF) microscopy at the Cornell high energy synchrotron source Applied Physics a: Materials Science and Processing. 83: 235-238. DOI: 10.1007/S00339-006-3513-4  0.417
2006 Ferguson JD, Arikan G, Amassian A, Dale D, Woll AR, Brock JD. Determining the growth mode of SrTiO3 (001) via pulsed laser deposition using in-situ X-ray reflectivity Materials Research Society Symposium Proceedings. 967: 463-477.  0.303
2005 Woll AR, Bilderback DH, Gruner S, Gao N, Huang R, Bisulca C, Mass J. Confoeal X-ray Fluorescence (XRF) microscopy: A new technique for the nondestructive compositional depth profiling of paintings Materials Research Society Symposium Proceedings. 852: 281-290.  0.311
2004 Woll AR, Bilderback DH, Gruner S, Gao N, Huang R, Bisulca C, Mass J. Confocal X-ray Fluorescence (XRF) Microscopy: A New Technique for the Nondestructive Compositional Depth Profiling of Paintings Mrs Proceedings. 852. DOI: 10.1557/Proc-852-Oo2.5  0.418
2001 Woll AR, Moran P, Rehder EM, Yang B, Kuech TF, Lagally MG. Strain Relaxation in SiGe Thin Films Studied by Low-Energy Electron Microscopy Mrs Proceedings. 696. DOI: 10.1557/Proc-696-N4.2  0.325
2000 Ramana Murty MV, Couture AJ, Cooper BH, Woll AR, Brock JD, Headrick RL. Persistent layer-by-layer sputtering of Au(111) Journal of Applied Physics. 88: 597-599. DOI: 10.1063/1.373703  0.399
2000 Maxson JB, Perkins N, Savage DE, Woll AR, Zhang L, Kuech TF, Lagally MG. Novel dark-field imaging of GaN {0001} surfaces with low-energy electron microscopy Surface Science. 464: 217-222. DOI: 10.1016/S0039-6028(00)00672-5  0.331
1999 Judy A, Murty MR, Butler E, Pomeroy J, Cooper B, Woll A, Brock J, Kycia S, Headrick R. Roughening of Au(111) Surfaces During Ion Beam Erosion: A Scanning Tunneling Microscope and X-Ray Diffraction Study Mrs Proceedings. 570. DOI: 10.1557/Proc-570-61  0.729
1999 Woll AR, Headrick RL, Kycia S, Brock JD. GaN Nucleation and Growth on Sapphire (0001): Incorporation and Interlayer Transport Physical Review Letters. 83: 4349-4352. DOI: 10.1103/Physrevlett.83.4349  0.373
1999 Murty MVR, Curcic T, Judy A, Cooper BH, Woll AR, Brock JD, Kycia S, Headrick RL. Real-time x-ray scattering study of surface morphology evolution during ion erosion and epitaxial growth of Au(111) Physical Review B - Condensed Matter and Materials Physics. 60: 16956-16964. DOI: 10.1103/Physrevb.60.16956  0.447
1999 Judy A, Ramana Murty MV, Butler E, Pomeroy J, Cooper BH, Woll AR, Brock JD, Kycia S, Headrick RL. Roughening of Au(lll)surfaces during ion beam erosion: A scanning tunneling microscope and X-ray diffraction study Materials Research Society Symposium - Proceedings. 570: 61-66.  0.352
1998 Murty MVR, Curcic T, Judy A, Cooper BH, Woll AR, Brock JD, Kycia S, Headrick RL. Real-time X-ray scattering study of surface dynamics on Au(111) during Ar+ ion irradiation Materials Research Society Symposium - Proceedings. 528: 195-202. DOI: 10.1557/Proc-528-195  0.426
1998 Murty MVR, Curcic T, Judy A, Cooper BH, Woll AR, Brock JD, Kycia S, Headrick RL. X-Ray Scattering Study of the Surface Morphology of Au(111) duringAr+Ion Irradiation Physical Review Letters. 80: 4713-4716. DOI: 10.1103/Physrevlett.80.4713  0.638
1998 Headrick RL, Kycia S, Woll AR, Brock JD, Ramana Murty MV. Ion-assisted nucleation and growth of GaN on sapphire(0001) Physical Review B - Condensed Matter and Materials Physics. 58: 4818-4824. DOI: 10.1103/Physrevb.58.4818  0.36
1998 Headrick RL, Kycia S, Woll AR, Brock JD, Ramana Murty MV. Ion-assisted nucleation and growth of GaN on sapphire(0001) Physical Review B. 58: 4818-4824. DOI: 10.1103/PhysRevB.58.4818  0.492
1998 Ramana Murty MV, Curcic T, Judy A, Cooper BH, Woll AR, Brock JD, Kycia S, Headrick RL. X-Ray scattering study of the surface morphology of Au(111) during Ar+ ion irradiation Physical Review Letters. 80: 4713-4716.  0.337
1996 Headrick RL, Kycia S, Park YK, Woll AR, Brock JD. Real-time x-ray-scattering measurement of the nucleation kinetics of cubic gallium nitride on beta -SiC(001). Physical Review. B, Condensed Matter. 54: 14686-14691. PMID 9985477  0.563
1996 Headrick RL, Kycia S, Park YK, Woll AR, Brock JD. Real-time x-ray-scattering measurement of the nucleation kinetics of cubic gallium nitride on β-SiC(001) Physical Review B - Condensed Matter and Materials Physics. 54: 14686-14691.  0.377
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