| Year |
Citation |
Score |
| 2008 |
Richards BC, Hendrickson J, Sweet J, Khitrova G, Litvinov D, Gerthsen D, Myer B, Pau S, Sarid D, Wegener M, Ivchenko EL, Poddubny AN, Gibbs HM. Attempts to grow optically coupled Fibonacci-spaced InGaAs/GaAs quantum wells result in surface gratings. Optics Express. 16: 21512-21. PMID 19104581 DOI: 10.1364/Oe.16.021512 |
0.36 |
|
| 2008 |
Sarid D, Khulbe P, Grover R. Effects of sample topography and thermal features in scanning thermal conductivity microscopy Solid State Communications. 145: 389-391. DOI: 10.1016/J.Ssc.2007.11.028 |
0.528 |
|
| 2006 |
Chen T, Milster T, Park SK, McCarthy B, Sarid D, Poweleit C, Menendez J. Near-field solid immersion lens microscope with advanced compact mechanical design Optical Engineering. 45. DOI: 10.1117/1.2361276 |
0.35 |
|
| 2006 |
Grover R, McCarthy B, Sarid D, Guven I. Mapping thermal conductivity using bimetallic atomic force microscopy probes Applied Physics Letters. 88. DOI: 10.1063/1.2210973 |
0.563 |
|
| 2006 |
Sarid D, McCarthy B, Grover R. Scanning thermal-conductivity microscope Review of Scientific Instruments. 77. DOI: 10.1063/1.2168391 |
0.549 |
|
| 2005 |
Chen T, Felix D, Park SK, McCarthy B, Sarid D, Milster T. Near-field solid immersion lens (SIL) microscope Optics Infobase Conference Papers. DOI: 10.1364/Fio.2005.Fwk4 |
0.314 |
|
| 2005 |
McCarthy B, Zhao Y, Grover R, Sarid D. Enhanced Raman scattering for temperature measurement of a laser-heated atomic force microscope tip Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1885178 |
0.635 |
|
| 2004 |
Grover R, McCarthy B, Zhao Y, Jabbour GE, Sarid D, Laws GM, Takulapalli BR, Thornton TJ, Gust D. Kelvin probe force microscopy as a tool for characterizing chemical sensors Applied Physics Letters. 85: 3926-3928. DOI: 10.1063/1.1810209 |
0.531 |
|
| 2003 |
Carthy BM, Yamnitskiy K, Zhao Y, Jabbour GE, Sarid D. Nanoscale organic data storage using atomic force microscopy Frontiers in Optics. DOI: 10.1364/Fio.2003.Thqq6 |
0.501 |
|
| 2003 |
Zhao Y, Carthy BM, Milster TD, Anderson MS, Sarid D. Apertureless Scanning Raman Microscopy Frontiers in Optics. DOI: 10.1364/Fio.2003.Mt25 |
0.544 |
|
| 2001 |
Zhao Y, Fein A, Peterson CA, Sarid D. Comment on "Reversible, nanometer-scale conductance transitions in an organic complex". Physical Review Letters. 87: 179706. PMID 11690327 DOI: 10.1103/Physrevlett.87.179706 |
0.44 |
|
| 2001 |
Fein A, Zhao Y, Peterson CA, Jabbour GE, Sarid D. Individually injected current pulses with conducting-tip, tapping-mode atomic force microscopy Applied Physics Letters. 79: 3935-3937. DOI: 10.1063/1.1424473 |
0.531 |
|
| 2001 |
Hu X, Yu Z, Curless JA, Droopad R, Eisenbeiser K, Edwards JL, Ooms WJ, Sarid D. Comparative study of Sr and Ba adsorption on Si(1 0 0) Applied Surface Science. 181: 103-110. DOI: 10.1016/S0169-4332(01)00379-8 |
0.322 |
|
| 2001 |
Peterson CA, Vermeire B, Sarid D, Parks HG. Reduction of surface roughening due to copper contamination prior to ultra-thin gate oxidation Applied Surface Science. 181: 28-34. DOI: 10.1016/S0169-4332(01)00342-7 |
0.337 |
|
| 2000 |
Hu X, Yao X, Peterson CA, Sarid D, Yu Z, Wang J, Marshall DS, Droopad R, Hallmark JA, Ooms WJ. (3 × 2) phase of Ba adsorption on Si(001)-2 × 1 Surface Science. 445: 256-266. DOI: 10.1016/S0039-6028(99)01079-1 |
0.318 |
|
| 2000 |
Hu X, Yao X, Peterson CA, Sarid D, Yu Z, Wang J, Marshall DS, Curless JA, Ramdani J, Droopad R, Hallmark JA, Ooms WJ. Barium adsorption on Si(100)-(2 × 1) at room temperature: a bi-polar scanning tunneling microscopy study Surface Science. 457. DOI: 10.1016/S0039-6028(00)00406-4 |
0.348 |
|
| 1999 |
Peterson CA, Workman RK, Sarid D, Vermeire B, Parks HG, Adderton D, Maivald P. Effects of moisture on Fowler-Nordheim characterization of thin silicon-oxide films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 17: 2753-2758. DOI: 10.1116/1.581941 |
0.352 |
|
| 1999 |
Hu X, Sarid D, Von Blanckenhagen P. Nano-patterning and single electron tunnelling using STM Nanotechnology. 10: 209-212. DOI: 10.1088/0957-4484/10/2/317 |
0.337 |
|
| 1999 |
Workman RK, Peterson CA, Sarid D. Current-dependent growth of silicon nitride lines using a conducting tip AFM Surface Science. 423. DOI: 10.1016/S0039-6028(99)00085-0 |
0.331 |
|
| 1998 |
Peterson CA, Workman RK, Yao X, Hunt JP, Sarid D. V-shaped metallic-wire cantilevers for combined atomic force microscopy and Fowler-Nordheim imaging Nanotechnology. 9: 331-336. DOI: 10.1088/0957-4484/9/4/005 |
0.371 |
|
| 1998 |
Hunt JP, Sarid D. Kinetics of lossy grazing impact oscillators Applied Physics Letters. 72: 2969-2971. DOI: 10.1063/1.121510 |
0.321 |
|
| 1998 |
Zhong TX, Workman RK, Yao X, Jabbour GE, Peterson CA, Sarid D, Dirk CW, de la Cruz D, Nagarur A. Stability and superstructure of squarylium dye TSQ Langmuir–Blodgett films Thin Solid Films. 315: 294-300. DOI: 10.1016/S0040-6090(97)00780-3 |
0.305 |
|
| 1998 |
Sarid D, Hunt JP, Workman RK, Yao X, Peterson CA. The role of adhesion in tapping-mode atomic forcemicroscopy Applied Physics a: Materials Science and Processing. 66. DOI: 10.1007/S003390051146 |
0.349 |
|
| 1998 |
Yao X, Workman RK, Peterson CA, Chen D, Sarid D. The bonding nature of individual C60 molecules to Si.(100) surfaces Applied Physics a: Materials Science and Processing. 66. DOI: 10.1007/S003390051110 |
0.322 |
|
| 1997 |
Pyle JL, Ruskell TG, Workman RK, Yao X, Sarid D. Growth of silicon nitride by scanned probe lithography Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 15: 38-39. DOI: 10.1116/1.589251 |
0.349 |
|
| 1996 |
Sarid D. Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operation Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 14: 864. DOI: 10.1116/1.589163 |
0.367 |
|
| 1996 |
Ruskell TG, Workman RK, Chen D, Sarid D, Dahl S, Gilbert S. High resolution Fowler-Nordheim field emission maps of thin silicon oxide layers Applied Physics Letters. 68: 93-95. DOI: 10.1063/1.116782 |
0.321 |
|
| 1996 |
Yao X, Ruskell TG, Workman RK, Sarid D, Chen D. Intramolecular features of individual C60 molecules on Si(100) observed by STM Surface Science. 367. DOI: 10.1016/S0039-6028(96)01090-4 |
0.312 |
|
| 1996 |
Sarid D. Tapping-mode scanning force microscopy: Metallic tips and samples Computational Materials Science. 5: 291-297. DOI: 10.1016/0927-0256(96)00003-1 |
0.334 |
|
| 1996 |
Yao X, Ruskell TG, Workman RK, Sarid D, Chen D. Scanning tunneling microscopy and spectroscopy of individual C60 molecules on Si(100)-(2 × 1) surfaces Surface Science. 366. DOI: 10.1016/0039-6028(96)00938-7 |
0.357 |
|
| 1996 |
Yao X, Chen D, Ruskell TG, Workman RK, Sarid D. Thermally-Induced Changes in Bonding Properties of C60on Si(100)-2×1 Surfaces Israel Journal of Chemistry. 36: 55-58. DOI: 10.1002/Ijch.199600007 |
0.328 |
|
| 1995 |
Sarid D, Chen J, Workman RK. Numerical simulations of a tapping-mode scanning force microscope operating in a liquid Computational Materials Science. 3: 475-480. DOI: 10.1016/0927-0256(95)00007-D |
0.311 |
|
| 1995 |
Chen D, Workman R, Sarid D. Growth mechanism of silicon carbide films on silicon substrates using C60 carbonization Surface Science. 344: 23-32. DOI: 10.1016/0039-6028(95)00840-3 |
0.344 |
|
| 1995 |
Chen D, Sarid D. An STM study of C60 adsorption on Si(100)-(2 × 1) surfaces: from physisorption to chemisorption Surface Science. 329: 206-218. DOI: 10.1016/0039-6028(95)00051-8 |
0.335 |
|
| 1994 |
Chen D, Gallagher MJ, Sarid D. Scanning tunneling microscopy study of the adsorption of C60 molecules on Si(100)‐(2×1) surfaces Journal of Vacuum Science & Technology B. 12: 1947-1951. DOI: 10.1116/1.587677 |
0.325 |
|
| 1994 |
Chen T, Sarid D. Scanning tunneling microscopy study of C60 adsorption on 2H–MoS2 (0001) surface Journal of Vacuum Science & Technology B. 12: 1918-1922. DOI: 10.1116/1.587670 |
0.323 |
|
| 1994 |
Chen J, Workman RK, Sarid D, Hoper R. Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever Nanotechnology. 5: 199-204. DOI: 10.1088/0957-4484/5/4/003 |
0.328 |
|
| 1994 |
Gallagher MJ, Ruskell TG, Chen D, Sarid D, Jenkinson H. Nanosecond time-scale semiconductor photoexcitations probed by a scanning tunneling microscope Applied Physics Letters. 64: 256-258. DOI: 10.1063/1.111521 |
0.302 |
|
| 1994 |
Chen D, Workman R, Sarid D. Fabrication of SiC films on Si(100) using a C60 molecular source Electronics Letters. 30: 1007-1008. DOI: 10.1049/El:19940683 |
0.337 |
|
| 1994 |
Höper R, Workman RK, Chen D, Sarid D, Yadav T, Withers JC, Loutfy RO. Single-shell carbon nanotubes imaged by atomic force microscopy Surface Science. 311. DOI: 10.1016/0039-6028(94)91417-6 |
0.367 |
|
| 1994 |
Chen D, Sarid D. Growth of C60 films on silicon surfaces Surface Science. 318: 74-82. DOI: 10.1016/0039-6028(94)90342-5 |
0.361 |
|
| 1994 |
Chen D, Chen J, Sarid D. Si-C60-Si (111)-(7 × 7) interactions: a scanning tunneling microscopy study Surface Science. 321: 190-194. DOI: 10.1016/0039-6028(94)90039-6 |
0.354 |
|
| 1993 |
Gallagher MJ, Chen D, Jacobsen BP, Sarid D, Lamb LD, Tinker FA, Jiao J, Huffman DR, Seraphin S, Zhou D. Characterization of carbon nanotubes by scanning probe microscopy Surface Science. 281. DOI: 10.1016/0039-6028(93)90632-T |
0.345 |
|
| 1992 |
Chen T, Sarid D. From "Soccer-Ball" And "Rugby-Ball" To Giant Fullerene Molecules: A Scanning Tunneling Microscopy And Spectroscopy Study Modern Physics Letters B. 6: 967-999. DOI: 10.1142/S0217984992001812 |
0.386 |
|
| 1992 |
Sarid D, Pax P, Yi L, Howells S, Gallagher M, Chen T, Elings V, Bocek D. Improved atomic force microscope using a laser diode interferometer Review of Scientific Instruments. 63: 3905-3908. DOI: 10.1063/1.1143289 |
0.354 |
|
| 1992 |
Howells S, Gallagher MJ, Chen T, Pax P, Sarid D. Oxidation effects on cleaved multiple quantum well surfaces in air observed by scanning probe microscopy Applied Physics Letters. 61: 801-803. DOI: 10.1063/1.107806 |
0.352 |
|
| 1992 |
Sarid D, Chen T, Howells S, Gallagher M, Yi L, Lichtenberger DL, Nebesney KW, Ray CD, Huffman DR, Lamb LD. Buckyball-substrate interactions probed by STM and AFM Ultramicroscopy. 42: 610-615. DOI: 10.1016/0304-3991(92)90331-D |
0.358 |
|
| 1992 |
Howells S, Chen T, Gallagher M, Sarid D, Lichtenberger DL, Wright LL, Ray CD, Huffman DR, Lamb LD. High resolution images of single C60 molecules on gold (111) using scanning tunneling microscopy Surface Science. 274: 141-146. DOI: 10.1016/0039-6028(92)90108-I |
0.328 |
|
| 1991 |
Chen T, Howells S, Gallagher M, Yi L, Sarid D, Lichtenberger DL, Nebesny KW, Ray CD. Internal structure and two‐dimensional order of monolayer C60 molecules on gold substrate Journal of Vacuum Science & Technology B. 10: 170-174. DOI: 10.1116/1.586293 |
0.346 |
|
| 1991 |
Sarid D, Elings V. Review of scanning force microscopy Journal of Vacuum Science & Technology B. 9: 431-437. DOI: 10.1116/1.585585 |
0.356 |
|
| 1991 |
Howells S, Chen T, Gallagher M, Yi L, Sarid D. Enhanced effects with scanning force microscopy Journal of Applied Physics. 69: 7330-7332. DOI: 10.1063/1.347586 |
0.381 |
|
| 1990 |
Sarid D, lams DA, Ingle JT, Weissenberger V, Ploetz J. Performance of a scanning force microscope using a laser diode Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 378-382. DOI: 10.1116/1.576400 |
0.323 |
|
| 1989 |
Sarid D, Weissenberger V, Iams DA, Ingle JT. Theory of the Laser Diode Interaction in Scanning Force Microscopy Ieee Journal of Quantum Electronics. 25: 1968-1972. DOI: 10.1109/3.34059 |
0.313 |
|
| 1988 |
Sarid D, Iams D, Weissenberger V, Bell LS. Compact scanning-force microscope using a laser diode. Optics Letters. 13: 1057-9. PMID 19746123 DOI: 10.1364/Ol.13.001057 |
0.336 |
|
| 1988 |
Sarid D, Henson T, Bell LS, Sandroff CJ. Scanning tunneling microscopy of semiconductor clusters Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 6: 424-427. DOI: 10.1116/1.575387 |
0.338 |
|
| 1988 |
Sarid D, Henson TD, Armstrong NR, Bell LS. Probing of basal planes of MoS2 by scanning tunneling microscopy Applied Physics Letters. 52: 2252-2254. DOI: 10.1063/1.99769 |
0.35 |
|
| 1987 |
Hickernell RK, Sarid D. Long-range surface magnetoplasmons in thin nickel films. Optics Letters. 12: 570-2. PMID 19741801 DOI: 10.1364/Ol.12.000570 |
0.312 |
|
| 1986 |
Booman RA, Olson GA, Sarid D. Determination of loss coefficients of long-range surface plasmons. Applied Optics. 25: 2729. PMID 18231551 DOI: 10.1364/Ao.25.002729 |
0.305 |
|
| 1986 |
Hickernell RK, Sarid D. Optical bistability using prism-coupled, long-range surface plasmons Journal of the Optical Society of America B: Optical Physics. 3: 1059-1069. DOI: 10.1364/Josab.3.001059 |
0.323 |
|
| 1984 |
Sarid D. Enhanced surface-magnetoplasma interactions in a semiconductor Physical Review B. 29: 2344-2346. DOI: 10.1103/Physrevb.29.2344 |
0.313 |
|
| 1983 |
Craig AE, Olson GA, Sarid D. Experimental observation of the long-range surface-plasmon polariton. Optics Letters. 8: 380-2. PMID 19718121 DOI: 10.1364/Ol.8.000380 |
0.309 |
|
| 1983 |
Deck RT, Sarid D, Olson GA, Elson JM. Coupling between finite electromagnetic beam and long-range surface-plasmon mode. Applied Optics. 22: 3397. PMID 18200210 DOI: 10.1364/Ao.22.003397 |
0.304 |
|
| 1982 |
Deck RT, Sarid D. Enhancement of second-harmonic generation by coupling to long-range surface plasmons Journal of the Optical Society of America. 72: 1613. DOI: 10.1364/Josa.72.001613 |
0.321 |
|
| 1870 |
Henson TD, Sarid D, Bell LS. STM of layered-structure semiconductors Journal of Microscopy. 152: 467-472. DOI: 10.1111/J.1365-2818.1870.Tb06069.X |
0.321 |
|
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