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Calvin F. Quate - Publications

Affiliations: 
Stanford University, Palo Alto, CA 
Area:
Mechanical Engineering, Electronics and Electrical Engineering, General Physics, General Biophysics, Molecular Biology
Website:
http://ethw.org/Calvin_F._Quate
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150 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2007 Sahin O, Magonov S, Su C, Quate CF, Solgaard O. An atomic force microscope tip designed to measure time-varying nanomechanical forces. Nature Nanotechnology. 2: 507-14. PMID 18654349 DOI: 10.1038/Nnano.2007.226  0.434
2007 Khuri-Yakub BT, Park KK, Lee HJ, Yaralioglu GG, Ergun S, Oralkan O, Kupnik M, Quate CF, Braun T, Lang HP, Hegner M, Ramseyer JP, Gerber C, Gimzewski J. The capactive micromachined ultrasonic transducer (CMUT) as a chem/bio sensor Proceedings - Ieee Ultrasonics Symposium. 472-475. DOI: 10.1109/ULTSYM.2007.127  0.473
2007 Park KK, Lee HJ, Yaralioglu GG, Ergun AS, Oralkan O, Kupnik M, Quate CF, Khuri-Yakub BT, Braun T, Ramseyer JP, Lang HP, Hegner M, Gerber C, Gimzewski JK. Capacitive micromachined ultrasonic transducers for chemical detection in nitrogen Applied Physics Letters. 91. DOI: 10.1063/1.2776348  0.513
2006 Zhang X, Scott MP, Quate CF, Solgaard O. Microoptical characterization of piezoelectric vibratory microinjections in Drosophila embryos for genome-wide RNAi screen Journal of Microelectromechanical Systems. 15: 277-286. DOI: 10.1109/Jmems.2006.872242  0.38
2006 Giessibl FJ, Quate CF. Exploring the nanoworld with atomic force microscopy Physics Today. 59: 44-50. DOI: 10.1063/1.2435681  0.426
2006 Onaran AG, Balantekin M, Lee W, Hughes WL, Buchine BA, Guldiken RO, Parlak Z, Quate CF, Degertekin FL. A new atomic force microscope probe with force sensing integrated readout and active tip Review of Scientific Instruments. 77. DOI: 10.1063/1.2166469  0.477
2005 Hembacher S, Giessibl FJ, Mannhart J, Quate CF. Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite Physical Review Letters. 94. DOI: 10.1103/Physrevlett.94.056101  0.455
2005 Degertekin FL, Onaran AG, Balantekin M, Lee W, Hall NA, Quate CF. Sensor for direct measurement of interaction forces in probe microscopy Applied Physics Letters. 87: 1-3. DOI: 10.1063/1.2136430  0.402
2005 Sahin O, Quate CF, Solgaard O. Mechanical nonlinear generation with coupled torsional harmonic cantilevers for sensitive and quantitative atomic force microscopy of material characteristics 2005 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2005 Technical Proceedings. 663-666.  0.306
2004 Sahin O, Quate CF, Solgaard O, Atalar A. Resonant harmonic response in tapping-mode atomic force microscopy Physical Review B - Condensed Matter and Materials Physics. 69. DOI: 10.1103/Physrevb.69.165416  0.622
2004 Sahin O, Yaralioglu G, Grow R, Zappe SF, Atalar A, Quate C, Solgaard O. High-resolution imaging of elastic properties using harmonic cantilevers Sensors and Actuators, a: Physical. 114: 183-190. DOI: 10.1016/J.Sna.2003.11.031  0.667
2003 Hembacher S, Giessibl FJ, Mannhart J, Quate CF. Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America. 100: 12539-42. PMID 14504395 DOI: 10.1073/Pnas.2134173100  0.418
2003 Crozier KB, Sundaramurthy A, Kino GS, Quate CF. Publisher’s Note: “Optical antennas: Resonators for local field enhancement” [J. Appl. Phys. 94, 4632 (2003)] Journal of Applied Physics. 94: 7950. DOI: 10.1063/1.1626674  0.479
2003 Crozier KB, Sundaramurthy A, Kino GS, Quate CF. Optical antennas: Resonators for local field enhancement Journal of Applied Physics. 94: 4632-4642. DOI: 10.1063/1.1602956  0.521
2003 Crozier KB, Sundaramurthy A, Kino GS, Quate CF, Fromm DP, Moerner WE. Field enhancement and resonance in optical antennas Conference On Quantum Electronics and Laser Science (Qels) - Technical Digest Series. 89: QTUD3/1-QTUD3/2.  0.443
2002 Chow EM, Chandrasekaran V, Partridge A, Nishida T, Sheplak M, Quate CF, Kenny TW. Process compatible polysilicon-based electrical through-wafer interconnects in silicon substrates Journal of Microelectromechanical Systems. 11: 631-640. DOI: 10.1109/Jmems.2002.805206  0.339
2002 Crozier KB, Fletcher DA, Kino GS, Quate CF. Micromachined silicon nitride solid immersion lens Journal of Microelectromechanical Systems. 11: 470-478. DOI: 10.1109/Jmems.2002.803282  0.609
2002 Grow RJ, Minne SC, Manalis SR, Quate CF. Silicon nitride cantilevers with oxidation-sharpened silicon tips for atomic force microscopy Journal of Microelectromechanical Systems. 11: 317-321. DOI: 10.1109/Jmems.2002.800924  0.689
2002 Sulchek T, Yaralioglu GG, Quate CF, Minne SC. Characterization and optimization of scan speed for tapping-mode atomic force microscopy Review of Scientific Instruments. 73: 2928. DOI: 10.1063/1.1488679  0.658
2002 Chow EM, Yaralioglu GG, Quate CF, Kenny TW. Characterization of a two-dimensional cantilever array with through-wafer electrical interconnects Applied Physics Letters. 80: 664-666. DOI: 10.1063/1.1435804  0.468
2002 Onaran AG, Degertekin FL, Hadimioglu B, Sulchek T, Quate CF. Actuation of atomic force microscope cantilevers in fluids using acoustic radiation pressure Proceedings of the Ieee Micro Electro Mechanical Systems (Mems). 356-359.  0.305
2001 Sulchek T, Hsieh R, Minne SC, Quate CF, Manalis SR. Interdigital cantilever as a biological sensor Proceedings of the Ieee Conference On Nanotechnology. 2001: 562-566. DOI: 10.1109/NANO.2001.966485  0.682
2001 Crozier KB, Sundaramurthy A, Fletcher DA, Kino GS, Quate CF. Nearfield optics with solid immersion lenses and sharp metal probes Proceedings of the Ieee Conference On Nanotechnology. 2001: 501-506. DOI: 10.1109/NANO.2001.966474  0.462
2001 Fletcher DA, Crozier KB, Guarini KW, Minne SC, Kino GS, Quate CF, Goodson KE. Microfabricated silicon solid immersion lens Journal of Microelectromechanical Systems. 10: 450-459. DOI: 10.1109/84.946806  0.598
2001 Fletcher DA, Crozier KB, Quate CF, Kino GS, Goodson KE, Simanovskii D, Palanker DV. Refraction contrast imaging with a scanning microlens Applied Physics Letters. 78: 3589-3591. DOI: 10.1063/1.1377318  0.583
2001 Degertekin FL, Hadimioglu B, Sulchek T, Quate CF. Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure Applied Physics Letters. 78: 1628-1630. DOI: 10.1063/1.1354157  0.656
2001 Sulchek T, Grow RJ, Yaralioglu GG, Minne SC, Quate CF, Manalis SR, Kiraz A, Aydine A, Atalar A. Parallel atomic force microscopy with optical interferometric detection Applied Physics Letters. 78: 1787-1789. DOI: 10.1063/1.1352697  0.817
2001 Matsumoto K, Kinosita S, Gotoh Y, Uchiyama T, Manalis S, Quate C. Ultralow biased field emitter using single-wall carbon nanotube directly grown onto silicon tip by thermal chemical vapor deposition Applied Physics Letters. 78: 539-540. DOI: 10.1063/1.1343470  0.604
2001 Onaran AG, Degertekin FL, Hadimioglu B, Sulchek T, Quate CF. Actuation of atomic force microscope cantilevers by acoustic radiation pressure Proceedings of the Ieee Ultrasonics Symposium. 1: 509-512.  0.323
2000 Crozier KB, Yaralioglu GG, Degertekin FL, Adams JD, Minne SC, Quate CF. Non-destructive film thickness measurement using atomic force microscopy at ultrasonic frequencies Proceedings of Spie - the International Society For Optical Engineering. 4099: 48-58. DOI: 10.1117/12.405835  0.523
2000 Gotoh Y, Matsumoto K, Maeda T, Cooper EB, Manalis SR, Fang H, Minne SC, Hunt T, Dai H, Harris J, Quate CF. Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 1321-1325. DOI: 10.1116/1.582347  0.657
2000 Yaralioglu GG, Degertekin FL, Crozier KB, Quate CF. Contact stiffness of layered materials for ultrasonic atomic force microscopy Journal of Applied Physics. 87: 7491-7496. DOI: 10.1063/1.373014  0.559
2000 Fletcher DA, Crozier KB, Quate CF, Kino GS, Goodson KE, Simanovskii D, Palanker DV. Near-field infrared imaging with a microfabricated solid immersion lens Applied Physics Letters. 77: 2109-2111. DOI: 10.1063/1.1313368  0.6
2000 Cooper EB, Post ER, Griffith S, Levitan J, Manalis SR, Schmidt MA, Quate CF. High-resolution micromachined interferometric accelerometer Applied Physics Letters. 76: 3316-3318. DOI: 10.1063/1.126637  0.619
2000 Crozier KB, Yaralioglu GG, Degertekin FL, Adams JD, Minne SC, Quate CF. Thin film characterization by atomic force microscopy at ultrasonic frequencies Applied Physics Letters. 76: 1950-1952. DOI: 10.1063/1.126222  0.588
2000 Sulchek T, Hsieh R, Adams JD, Yaralioglu GG, Minne SC, Quate CF, Cleveland JP, Atalar A, Adderton DM. High-speed tapping mode imaging with active Q control for atomic force microscopy Applied Physics Letters. 76: 1473-1475. DOI: 10.1063/1.126071  0.759
2000 Manalis SR, Cooper EB, Indermuhle PF, Kernen P, Wagner P, Hafeman DG, Minne SC, Quate CF. Microvolume field-effect pH sensor for the scanning probe microscope Applied Physics Letters. 76: 1072-1074. DOI: 10.1063/1.125942  0.611
2000 Sulchek T, Hsieh R, Adams JD, Minne SC, Quate CF, Adderton DM. High-speed atomic force microscopy in liquid Review of Scientific Instruments. 71: 2097-2099. DOI: 10.1063/1.1150586  0.679
2000 Chow EM, Soh HT, Lee HC, Adams JD, Minne SC, Yaralioglu G, Atalar A, Quate CF, Kenny TW. Integration of through-wafer interconnects with a two-dimensional cantilever array Sensors and Actuators, a: Physical. 83: 118-123. DOI: 10.1016/S0924-4247(99)00381-7  0.724
2000 Sulchek T, Hsieh R, Adams JD, Minne SC, Quate CF, Adderton DM. High-speed atomic force microscopy in liquid Review of Scientific Instruments. 71: 2097-2099.  0.354
2000 Sulchek T, Hsieh R, Adams JD, Yaralioglu GG, Minne SC, Quate CF, Cleveland JP, Atalar A, Adderton DM. High-speed tapping mode imaging with active Q control for atomic force microscopy Applied Physics Letters. 76: 1473-1475.  0.328
2000 Fletcher DA, Crozier KB, Goodson KE, Quate CF, Kino GS. Optical characterization of microfabricated solid immersion lenses Proceedings of Spie - the International Society For Optical Engineering. 3919: 100-108.  0.457
1999 Soh HT, Yue CP, McCarthy A, Ryu C, Lee TH, Wong SS, Quate CF. Ultra-Low Resistance, Through-Wafer Via (TWV) Technology and Its Applications in Three Dimensional Structures on Silicon Japanese Journal of Applied Physics. 38: 2393-2396. DOI: 10.1143/Jjap.38.2393  0.608
1999 Wilder K, Quate CF. Scanning probe lithography using a cantilever with integrated transistor for on-chip control of the exposing current Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 17: 3256-3261. DOI: 10.1116/1.590992  0.348
1999 Cooper EB, Manalis SR, Fang H, Dai H, Matsumoto K, Minne SC, Hunt T, Quate CF. Terabit-per-square-inch data storage with the atomic force microscope Applied Physics Letters. 75: 3566-3568. DOI: 10.1063/1.125390  0.433
1999 Sulchek T, Minne SC, Adams JD, Fletcher DA, Atalar A, Quate CF, Adderton DM. Dual integrated actuators for extended range high speed atomic force microscopy Applied Physics Letters. 75: 1637-1639. DOI: 10.1063/1.124779  0.762
1999 Soh HT, Quate CF, Morpurgo AF, Marcus CM, Kong J, Dai H. Integrated nanotube circuits: Controlled growth and ohmic contacting of single-walled carbon nanotubes Applied Physics Letters. 75: 627-629. DOI: 10.1063/1.124462  0.602
1999 Ghislain LP, Elings VB, Crozier KB, Manalis SR, Minne SC, Wilder K, Kino GS, Quate CF. Near-field photolithography with a solid immersion lens Applied Physics Letters. 74: 501-503. DOI: 10.1063/1.123168  0.601
1999 Ghislain LP, Elings VB, Crozier KB, Manalis SR, Minne SC, Wilder K, Kino GS, Quate CF. Near-field photolithography with a solid immersion lens Applied Physics Letters. 74: 501-503. DOI: 10.1063/1.123168  0.631
1999 Wilder K, Soh HT, Atalar A, Quate CF. Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes Review of Scientific Instruments. 70: 2822-2827. DOI: 10.1063/1.1149802  0.592
1999 Wilder K, Soh HT, Atalar A, Quate CF. Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes Review of Scientific Instruments. 70: 2822-2827. DOI: 10.1063/1.1149802  0.68
1999 Tully DC, Trimble AR, Fréchet JMJ, Wilder K, Quate CF. Synthesis and preparation of ionically bound dendrimer monolayers and application toward scanning probe lithography Chemistry of Materials. 11: 2892-2898. DOI: 10.1021/Cm990255F  0.333
1999 Lutwyche M, Andreoli C, Binnig G, Brugger J, Drechsler U, Häberle W, Rohrer H, Rothuizen H, Vettiger P, Yaralioglu G, Quate C. 5×5 2D AFM cantilever arrays a first step towards a Terabit storage device Sensors and Actuators, a: Physical. 73: 89-94. DOI: 10.1016/S0924-4247(98)00259-3  0.403
1999 Kong J, Zhou C, Morpurgo A, Soh HT, Quate CF, Marcus C, Dai H. Synthesis, integration, and electrical properties of individual single-walled carbon nanotubes Applied Physics a: Materials Science and Processing. 69: 305-308. DOI: 10.1007/S003390051005  0.605
1999 Cooper EB, Manalis SR, Fang H, Dai H, Matsumoto K, Minne SC, Hunt T, Quate CF. Terabit-per-square-inch data storage with the atomic force microscope Applied Physics Letters. 75: 3566-3568.  0.634
1998 Wilder K, Quate CF, Singh B, Kyser DF. Electron beam and scanning probe lithography: A comparison Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 16: 3864-3873. DOI: 10.1116/1.590425  0.3
1998 Yaralioglu GG, Atalar A, Manalis SR, Quate CF. Analysis and design of an interdigital cantilever as a displacement sensor Journal of Applied Physics. 83: 7405-7415. DOI: 10.1063/1.367984  0.74
1998 Wilder K, Quate CF, Adderton D, Bernstein R, Elings V. Noncontact nanolithography using the atomic force microscope Applied Physics Letters. 73: 2527-2529. DOI: 10.1063/1.122504  0.464
1998 Minne SC, Adams JD, Yaralioglu G, Manalis SR, Atalar A, Quate CF. Centimeter scale atomic force microscope imaging and lithography Applied Physics Letters. 73: 1742-1744. DOI: 10.1063/1.122263  0.771
1998 Minne SC, Yaralioglu G, Manalis SR, Adams JD, Zesch J, Atalar A, Quate CF. Automated parallel high-speed atomic force microscopy Applied Physics Letters. 72: 2340-2342. DOI: 10.1063/1.121353  0.763
1998 Kong J, Soh HT, Cassell AM, Quate CF, Dai H. Synthesis of individual single-walled carbon nanotubes on patterned silicon wafers Nature. 395: 878-881. DOI: 10.1038/27632  0.633
1997 Wilder K, Soh HT, Atalar A, Quate CF. Hybrid atomic force/scanning tunneling lithography Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 15: 1811-1817. DOI: 10.1116/1.589530  0.683
1997 Manalis SR, Minne SC, Quate CF, Yaralioglu GG, Atalar A. Two-dimensional micromechanical bimorph arrays for detection of thermal radiation Applied Physics Letters. 70: 3311-3313. DOI: 10.1063/1.119147  0.721
1997 Quate CF. Scanning probes as a lithography tool for nanostructures Surface Science. 386: 259-264. DOI: 10.1016/S0039-6028(97)00305-1  0.344
1996 Wilder K, Quate CF, Singh B, Alvis R, Arnold WH. Atomic force microscopy for cross section inspection and metrology Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 14: 4004-4008. DOI: 10.1116/1.588632  0.424
1996 Manalis SR, Minne SC, Atalar A, Quate CF. Interdigital cantilevers for atomic force microscopy Applied Physics Letters. 69: 3944-3946. DOI: 10.1063/1.117578  0.776
1996 Soh HT, Ladabaum I, Atalar A, Quate CF, Khuri-Yakub BT. Silicon micromachined ultrasonic immersion transducers Applied Physics Letters. 69: 3674-3676. DOI: 10.1063/1.117185  0.626
1996 Soh HT, Ladabaum I, Atalar A, Quate CF, Khuri‐Yakub BT. Silicon micromachined ultrasonic immersion transducers Applied Physics Letters. 69: 3674-3676. DOI: 10.1063/1.117185  0.705
1996 Manalis SR, Minne SC, Quate CF. Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor Applied Physics Letters. 68: 871-873. DOI: 10.1063/1.116528  0.686
1996 Minne SC, Manalis SR, Atalar A, Quate CF. Contact imaging in the atomic force microscope using a higher order flexural mode combined with a new sensor Applied Physics Letters. 68: 1427-1429. DOI: 10.1063/1.116102  0.76
1996 Manalis SR, Minne SC, Atalar A, Quate CF. High-speed atomic force microscopy using an integrated actuator and optical lever detection Review of Scientific Instruments. 67: 3294-3297. DOI: 10.1063/1.1147410  0.777
1995 Minne SC, Flueckiger P, Soh HT, Quate CF. Atomic force microscope lithography using amorphous silicon as a resist and advances in parallel operation Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 13: 1380-1385. DOI: 10.1116/1.587857  0.685
1995 Minne SC, Manalis SR, Quate CF. Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators Applied Physics Letters. 67: 3918. DOI: 10.1063/1.115317  0.681
1995 Park SW, Soh HT, Quate CF, Park SI. Nanometer scale lithography at high scanning speeds with the atomic force microscope using spin on glass Applied Physics Letters. 67: 2415. DOI: 10.1063/1.114565  0.659
1995 Minne SC, Soh HT, Flueckiger P, Quate CF. Fabrication of 0.1 μm metal oxide semiconductor field-effect transistors with the atomic force microscope Applied Physics Letters. 703. DOI: 10.1063/1.114105  0.647
1994 Quate CF. The AFM as a tool for surface imaging Surface Science. 299: 980-995. DOI: 10.1016/0039-6028(94)90711-0  0.408
1994 Yoshikawa SA, Nogami J, Quate CF, Pianetta P. Behavior of tellurium on silicon (100) Surface Science. 321. DOI: 10.1016/0039-6028(94)90172-4  0.374
1993 Wigren C, Andersen JN, Nyholm R, Karlsson UO, Nogami J, Baski AA, Quate CF. Adsorption-site determination of ordered Yb on Si(111) surfaces. Physical Review. B, Condensed Matter. 47: 9663-9668. PMID 10005036 DOI: 10.1103/Physrevb.47.9663  0.329
1993 Tortonese M, Barrett RC, Quate CF. Atomic resolution with an atomic force microscope using piezoresistive detection Applied Physics Letters. 62: 834-836. DOI: 10.1063/1.108593  0.444
1992 Khuri-Yakub BT, Akamine S, Hadimioglu B, Yamada H, Quate CF. Near-field acoustic microscopy (Invited Paper) Proceedings of Spie. 1556: 30-39. DOI: 10.1117/12.134885  0.397
1991 Richter M, Woicik JC, Nogami J, Pianetta P, Miyano KE, Baski AA, Kendelewicz T, Bouldin CE, Spicer WE, Quate CF, Lindau I. Erratum: ``Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb'' [Phys. Rev. Lett. 65, 3417 (1990)] Physical Review Letters. 66: 2836. DOI: 10.1103/Physrevlett.66.2836  0.313
1991 Barrett RC, Quate CF. Optical scan-correction system applied to atomic force microscopy Review of Scientific Instruments. 62: 1393-1399. DOI: 10.1063/1.1142506  0.309
1991 Prater CB, Hansma PK, Tortonese M, Quate CF. Improved scanning ion-conductance microscope using microfabricated probes Review of Scientific Instruments. 62: 2634-2638. DOI: 10.1063/1.1142244  0.425
1991 Lang CA, Quate CF, Nogami J. Initial stages of sputtering on Au(111) as seen by scanning tunneling microscopy Applied Physics Letters. 59: 1696-1698. DOI: 10.1063/1.106221  0.35
1991 Nogami J, Baski AA, Quate CF. Structure of the Sb-terminated Si(100) surface Applied Physics Letters. 58: 475-477. DOI: 10.1063/1.104612  0.344
1991 Penner RM, Heben MJ, Lewis NS, Quate CF. Mechanistic investigations of nanometer-scale lithography at liquid-covered graphite surfaces Applied Physics Letters. 58: 1389-1391. DOI: 10.1063/1.104317  0.325
1991 Quate CF. Switch to atom control Nature. 352: 571. DOI: 10.1038/352571A0  0.306
1991 Tortonese M, Yamada H, Barrett RC, Quate CF. Atomic force microscopy using a piezoresistive cantilever Transducers '91. 448-451.  0.363
1990 Richter M, Woicik JC, Nogami J, Pianetta P, Miyano KE, Baski AA, Kendelewicz T, Bouldin CE, Spicer WE, Quate CF, Lindau I. Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2 x 1-Sb. Physical Review Letters. 65: 3417-3420. PMID 10042866 DOI: 10.1103/Physrevlett.65.3417  0.33
1990 Baski AA, Nogami J, Quate CF. Si(111)-5 x 1-Au reconstruction as studied by scanning tunneling microscopy. Physical Review. B, Condensed Matter. 41: 10247-10249. PMID 9993426 DOI: 10.1103/Physrevb.41.10247  0.335
1990 Albrecht TR, Akamine S, Zdeblick MJ, Quate CF. Microfabrication of integrated scanning tunneling microscope Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 317-318. DOI: 10.1116/1.577096  0.42
1990 Albrecht TR, Akamine S, Carver TE, Quate CF. Microfabrication of cantilever styli for the atomic force microscope Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 3386-3396. DOI: 10.1116/1.576520  0.457
1990 Nogami J, Baski AA, Quate CF. Behavior of gallium on vicinal Si(100) surfaces Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 3520-3523. DOI: 10.1116/1.576500  0.331
1990 Barrett RC, Quate CF. Imaging polished sapphire with atomic force microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 400-402. DOI: 10.1116/1.576406  0.349
1990 Gould SAC, Massie J, Northern BD, Stoeckenius W, Albrecht TR, Drake B, Longmire M, Mukergee B, Quate CF, Prater CB, Elings V, Peterson CM, Weisenhorn AL, Manne S, Hansma HG, et al. From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 369-373. DOI: 10.1116/1.576398  0.446
1990 Akamine S, Barrett RC, Quate CF. Improved atomic force microscope images using microcantilevers with sharp tips Applied Physics Letters. 57: 316-318. DOI: 10.1063/1.103677  0.485
1990 Barrett RC, Nogami J, Quate CF. Charge density waves of 1T-TaS2 imaged by atomic force microscopy Applied Physics Letters. 57: 992-994. DOI: 10.1063/1.103535  0.43
1990 Akamine S, Albrecht TR, Zdeblick MJ, Quate CF. A planar process for microfabrication of a scanning tunneling microscope Sensors and Actuators: a. Physical. 23: 964-970. DOI: 10.1016/0924-4247(90)87070-Y  0.439
1990 Quate CF. Imaging with the tunneling and force microscopes Proceedings. Ieee Micro Electro Mechanical Systems-An Investigation of Micro Structures, Sensors, Actuators, Machines. 188-191.  0.32
1989 Drake B, Prater CB, Weisenhorn AL, Gould SA, Albrecht TR, Quate CF, Cannell DS, Hansma HG, Hansma PK. Imaging crystals, polymers, and processes in water with the atomic force microscope. Science (New York, N.Y.). 243: 1586-9. PMID 2928794 DOI: 10.1126/Science.2928794  0.314
1989 Nogami J, Park SI, Quate CF. Structure of submonolayers of tin on Si(111) studied by scanning tunneling microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 7: 1919-1921. DOI: 10.1116/1.576029  0.323
1989 Akamine S, Albrecht TR, Zdeblick MJ, Quate CF. Microfabricated Scanning Tunneling Microscope Ieee Electron Device Letters. 10: 490-492. DOI: 10.1109/55.43113  0.413
1989 Emch R, Nogami J, Dovek MM, Lang CA, Quate CF. Characterization of gold surfaces for use as substrates in scanning tunneling microscopy studies Journal of Applied Physics. 65: 79-84. DOI: 10.1063/1.343379  0.338
1989 Elrod SA, Hadimioglu B, Khuri-Yakub BT, Rawson EG, Richley E, Quate CF, Mansour NN, Lundgren TS. Nozzleless droplet formation with focused acoustic beams Journal of Applied Physics. 65: 3441-3447. DOI: 10.1063/1.342663  0.513
1989 Albrecht TR, Dovek MM, Kirk MD, Lang CA, Quate CF, Smith DPE. Nanometer-scale hole formation on graphite using a scanning tunneling microscope Applied Physics Letters. 55: 1727-1729. DOI: 10.1063/1.102201  0.334
1989 Heben MJ, Penner RM, Lewis NS, Dovek MM, Quate CF. Atomic resolution imaging of electrode surfaces in solutions containing reversible redox species Applied Physics Letters. 54: 1421-1423. DOI: 10.1063/1.100686  0.346
1989 Lang CA, Dovek MM, Nogami J, Quate CF. Au(111) Autoepitaxy studied by scanning tunneling microscopy Surface Science. 224: L947-L955. DOI: 10.1016/0039-6028(89)90889-3  0.301
1988 Kirk MD, Nogami J, Baski AA, Mitzi DB, Kapitulnik A, Geballe TH, Quate CF. The Origin of the Superstructure in Bi2Sr2CaCu2O8+dgr as Revealed by Scanning Tunneling Microscopy. Science (New York, N.Y.). 242: 1673-5. PMID 17730577 DOI: 10.1126/Science.242.4886.1673  0.408
1988 Park Si, Nogami J, Mizes HA, Quate CF. Chemical dependence of the multiple-tip effect in scanning tunneling microscopy. Physical Review. B, Condensed Matter. 38: 4269-4272. PMID 9946802 DOI: 10.1103/Physrevb.38.4269  0.35
1988 Marti O, Ribi HO, Drake B, Albrecht TR, Quate CF, Hansma PK. Atomic force microscopy of an organic monolayer. Science (New York, N.Y.). 239: 50-2. PMID 3336773 DOI: 10.1126/Science.3336773  0.316
1988 Albrecht TR, Quate CF. Atomic resolution with the atomic force microscope on conductors and nonconductors Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 6: 271-274. DOI: 10.1116/1.575441  0.449
1988 Park S‐, Nogami J, Quate CF. Metal‐induced reconstructions of the silicon(111) surface Journal of Microscopy. 152: 727-734. DOI: 10.1111/J.1365-2818.1988.Tb01443.X  0.328
1988 Heben MJ, Dovek MM, Lewis NS, Penner RM, Quate CF. Preparation of STM tips for in‐situ characterization of electrode surfaces Journal of Microscopy. 152: 651-661. DOI: 10.1111/J.1365-2818.1988.Tb01434.X  0.359
1988 Emch R, Nogami J, Dovek MM, Lang CA, Quate CF. Characterization and local modification of atomically flat gold surfaces by STM Journal of Microscopy. 152: 129-135. DOI: 10.1111/J.1365-2818.1988.Tb01370.X  0.373
1988 Kirk MD, Eom CB, Oh B, Spielman SR, Beasley MR, Kapitulnik A, Geballe TH, Quate CF. Scanning tunneling microscopy of the a-b planes of Bi2(Ca,Sr) 3Cu2O8+δ single crystal and thin film Applied Physics Letters. 52: 2071-2073. DOI: 10.1063/1.99750  0.324
1988 Albrecht TR, Mizes HA, Nogami J, Park SI, Quate CF. Observation of tilt boundaries in graphite by scanning tunneling microscopy and associated multiple tip effects Applied Physics Letters. 52: 362-364. DOI: 10.1063/1.99465  0.313
1988 Albrecht TR, Dovek MM, Lang CA, Grütter P, Quate CF, Kuan SWJ, Frank CW, Pease RFW. Imaging and modification of polymers by scanning tunneling and atomic force microscopy Journal of Applied Physics. 64: 1178-1184. DOI: 10.1063/1.341881  0.618
1988 La Comb LJ, Quate CF. Piezodriven scanner for cryogenic applications Review of Scientific Instruments. 59: 1906-1910. DOI: 10.1063/1.1140049  0.306
1988 Dovek MM, Heben MJ, Lang CA, Lewis NS, Quate CF. Design of a scanning tunneling microscope for electrochemical applications Review of Scientific Instruments. 59: 2333-2336. DOI: 10.1063/1.1139957  0.377
1988 Kirk MD, Albrecht TR, Quate CF. Low-temperature atomic force microscopy Review of Scientific Instruments. 59: 833-835. DOI: 10.1063/1.1139788  0.414
1988 Nogami J, Park SI, Quate CF. Behavior of Ga on Si(100) as studied by scanning tunneling microscopy Applied Physics Letters. 53: 2086-2088. DOI: 10.1063/1.100289  0.331
1988 Nogami J, Park Si, Quate CF. An STM study of the gallium induced 3 × 3 reconstruction of Si(111) Surface Science. 203. DOI: 10.1016/0039-6028(88)90182-3  0.334
1987 Park Si, Nogami J, Quate CF. Effect of tip morphology on images obtained by scanning tunneling microscopy. Physical Review. B, Condensed Matter. 36: 2863-2866. PMID 9943172 DOI: 10.1103/Physrevb.36.2863  0.385
1987 Nogami J, Park Si, Quate CF. Indium-induced reconstructions of the Si(111) surface studied by scanning tunneling microscopy. Physical Review. B, Condensed Matter. 36: 6221-6224. PMID 9942323 DOI: 10.1103/Physrevb.36.6221  0.325
1987 Smith DPE, Bryant A, Quate CF, Rabe JP, Gerber C, Swalen JD. Images of a lipid bilayer at molecular resolution by scanning tunneling microscopy Proceedings of the National Academy of Sciences of the United States of America. 84: 969-972. PMID 3103128 DOI: 10.1073/Pnas.84.4.969  0.332
1987 Carim AH, Dovek MM, Quate CF, Sinclair R, Vorst C. High-resolution electron microscopy and scanning tunneling microscopy of native oxides on silicon Science. 237: 630-633. DOI: 10.1126/Science.237.4815.630  0.369
1987 Hadimioglu B, La Comb LJ, Wright DR, Khuri-Yakub BT, Quate CF. High efficiency, multiple layer ZnO acoustic transducers at millimeter-wave frequencies Applied Physics Letters. 50: 1642-1644. DOI: 10.1063/1.97754  0.524
1987 Smith DPE, Kirk MD, Quate CF. Molecular images and vibrational spectroscopy of sorbic acid with the scanning tunneling microscope The Journal of Chemical Physics. 86: 6034-6038. DOI: 10.1063/1.452491  0.347
1987 Albrecht TR, Quate CF. Atomic resolution imaging of a nonconductor by atomic force microscopy Journal of Applied Physics. 62: 2599-2602. DOI: 10.1063/1.339435  0.332
1987 Binnig G, Gerber C, Stoll E, Albrecht TR, Quate CF. Atomic resolution with atomic force microscope Surface Science. 189: 1-6. DOI: 10.1007/978-94-011-1812-5_33  0.411
1986 Bryant A, Smith DPE, Binnig G, Harrison WA, Quate CF. Anomalous distance dependence in scanning tunneling microscopy Applied Physics Letters. 49: 936-938. DOI: 10.1063/1.97489  0.397
1986 Smith DPE, Binnig G, Quate CF. Atomic point-contact imaging Applied Physics Letters. 49: 1166-1168. DOI: 10.1063/1.97403  0.401
1986 Smith DPE, Binnig G, Quate CF. Detection of phonons with a scanning tunneling microscope Applied Physics Letters. 49: 1641-1643. DOI: 10.1063/1.97252  0.363
1986 Park SI, Quate CF. Tunneling microscopy of graphite in air Applied Physics Letters. 48: 112-114. DOI: 10.1063/1.96968  0.357
1986 Bryant A, Smith DPE, Quate CF. Imaging in real time with the tunneling microscope Applied Physics Letters. 48: 832-834. DOI: 10.1063/1.96682  0.387
1986 Quate CF. Vacuum Tunneling: A New Technique for Microscopy Physics Today. 39: 26-33. DOI: 10.1063/1.881071  0.396
1985 de Lozanne AL, Elrod SA, Quate CF. Spatial variations in the superconductivity of Nb3Sn measured by low-temperature tunneling microscopy. Physical Review Letters. 54: 2433-2436. PMID 10031341 DOI: 10.1103/Physrevlett.54.2433  0.77
1985 Elrod SA, Bryant A, de Lozanne AL, Park S, Smith D, Quate CF. TUNNELING MICROSCOPY FROM 300 TO 4. 2 K Ibm Journal of Research and Development. 30: 387-395. DOI: 10.1147/Rd.304.0387  0.361
1984 Elrod SA, De Lozanne AL, Quate CF. Low-temperature vacuum tunneling microscopy Applied Physics Letters. 45: 1240-1242. DOI: 10.1063/1.95077  0.325
1981 Hildebrand JA, Rugar D, Johnston RN, Quate CF. Acoustic microscopy of living cells. Proceedings of the National Academy of Sciences of the United States of America. 78: 1656-60. PMID 6940179 DOI: 10.1073/Pnas.78.3.1656  0.655
1980 Rugar D, Heiserman J, Minden S, Quate CF. Acoustic microscopy of human metaphase chromosomes Journal of Microscopy. 120: 193-199. PMID 7218342 DOI: 10.1111/J.1365-2818.1980.Tb04135.X  0.57
1980 Heiserman J, Rugar D, Quate CF. Cryogenic acoustic microscopy Journal of the Acoustical Society of America. 67: 1629-1637. DOI: 10.1121/1.384285  0.571
1979 Johnston RN, Atalar A, Heiserman J, Jipson V, Quate CF. Acoustic microscopy: Resolution of subcellular detail Proceedings of the National Academy of Sciences of the United States of America. 76: 3325-3329. PMID 291006 DOI: 10.1073/Pnas.76.7.3325  0.632
1979 Atalar A, Jipson V, Koch R, Quate CF. Acoustic Microscopy with Microwave Frequencies Annual Review of Materials Science. 9: 255-281. DOI: 10.1146/Annurev.Ms.09.080179.001351  0.609
1979 Quate CF, Atalar A, Wickramasinghe HK. Acoustic microscopy with mechanical scanning—a review Proceedings of the Ieee. 67: 1092-1114. DOI: 10.1109/PROC.1979.11406  0.608
1979 Lemons RA, Quate CF. 1 - Acoustic Microscopy Physical Acoustics. 14: 1-92. DOI: 10.1016/B978-0-12-477914-3.50006-2  0.317
1978 Wickramasinghe HK, Bray RC, Jipson V, Quate CF, Salcedo JR. Photoacoustics on a microscopic scale Applied Physics Letters. 33: 923-925. DOI: 10.1063/1.90219  0.374
1977 Atalar A, Quate CF, Wickramasinghe HK. Phase imaging in reflection with the acoustic microscope Applied Physics Letters. 31: 791-793. DOI: 10.1063/1.89551  0.612
1974 Lemons RA, Quate CF. Acoustic microscope - Scanning version Applied Physics Letters. 24: 163-165. DOI: 10.1063/1.1655136  0.391
1973 Havlice JF, Kino GS, Quate CF. Electronically focused acoustic imaging device Applied Physics Letters. 23: 581-583. DOI: 10.1063/1.1654755  0.349
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