Sarah P. Formica, Ph.D. - Publications
Affiliations: | 2006 | State University of New York, Albany, Albany, NY, United States |
Area:
Optics PhysicsYear | Citation | Score | |||
---|---|---|---|---|---|
2005 | Schmidt J, Formica SP, Lee SM. Polycapillary optic-enhanced x-ray diffraction and fluorescence for rapid materials analysis Proceedings of Spie - the International Society For Optical Engineering. 5918: 1-9. DOI: 10.1117/12.625191 | 0.434 | |||
2005 | Formica SP, Lee SM. An in situ XRF system for composition mapping of thin film IR sensors Proceedings of Spie - the International Society For Optical Engineering. 5726: 1-9. DOI: 10.1117/12.588419 | 0.664 | |||
2005 | Formica SP, Lee SM. X-ray fluorescence system for thin film composition analysis during deposition Thin Solid Films. 491: 71-77. DOI: 10.1016/J.Tsf.2005.05.023 | 0.435 | |||
2005 | Lee SM, Formica SP. Comparing X-ray optics: Performance standards Journal of X-Ray Science and Technology. 13: 37-47. | 0.359 | |||
2002 | Formica SP, Lee SM. Physical analysis of high intensity focusing X-ray optics: Doubly curved crystals vs. highly focusing polycapillaries Proceedings of Spie - the International Society For Optical Engineering. 4781: 77-86. DOI: 10.1117/12.453743 | 0.487 | |||
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