Year |
Citation |
Score |
2009 |
Luo H, Lin Y, Wang H, Lee JH, Suvorova NA, Mueller AH, Burrell AK, McCleskey TM, Bauer E, Usov IO, Hawley ME, Holesinger TG, Jia Q. A chemical solution approach to epitaxial metal nitride thin films Advanced Materials. 21: 193-197. DOI: 10.1002/Adma.200801959 |
0.728 |
|
2008 |
Luo H, Lin Y, Wang H, Chou CY, Suvorova NA, Hawley ME, Mueller AH, Ronning F, Bauer E, Burrell AK, McCIeskey M, Jia QX. Epitaxial GaN thin films prepared by polymer-assisted deposition Journal of Physical Chemistry C. 112: 20535-20538. DOI: 10.1021/Jp807793P |
0.753 |
|
2008 |
Luo H, Mueller AH, McCleskey TM, Burrell AK, Bauer E, Jia QX. Structural and photoelectrochemical properties of BiVO4 thin films Journal of Physical Chemistry C. 112: 6099-6102. DOI: 10.1021/Jp7113187 |
0.524 |
|
2008 |
Bauer E, Mueller AH, Usov I, Suvorova N, Janicke MT, Waterhouse GIN, Waterland MR, Jia QX, Burrell AK, McCleskey TM. Chemical solution route to conformal phosphor coatings on nanostructures Advanced Materials. 20: 4704-4707. DOI: 10.1002/adma.200800798 |
0.631 |
|
2006 |
Mueller AH, Akhadov EA, Hoffbauer MA. Low-temperature growth of crystalline GaN films using energetic neutral atomic-beam lithography/epitaxy Applied Physics Letters. 88: 1-3. DOI: 10.1063/1.2166485 |
0.487 |
|
2005 |
Akhadov EA, Read DE, Mueller AH, Murray J, Hoffbauer MA. Innovative approach to nanoscale device fabrication and low-temperature nitride film growth Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 3116-3119. DOI: 10.1116/1.2130346 |
0.433 |
|
2003 |
Mueller AH, Suvorova NA, Irene EA, Auciello O, Schultz JA. Model for interface formation and the resulting electrical properties for barium-strontium-titanate films on silicon Journal of Applied Physics. 93: 3866-3872. DOI: 10.1063/1.1556195 |
0.762 |
|
2003 |
Suvorova NA, Mueller AH, Suvorova AA, Saunders M, Irene EA. Study of interface formation of (Ba,Sr)TiO3 thin films grown by rf sputter deposition on bare Si and thermal SiO2/Si substrates Materials Research Society Symposium - Proceedings. 747: 183-188. |
0.772 |
|
2003 |
Suvorova NA, Mueller AH, Suvorova AA, Saunders M, Irene EA. Study of interface formation of (Ba,Sr)TiO3 thin films grown by rf sputter deposition on bare Si and thermal SiO2/Si substrates Materials Research Society Symposium - Proceedings. 747: 183-188. |
0.772 |
|
2002 |
Auciello O, Dhote AM, Ramesh R, Liu BT, Aggarwal S, Mueller AH, Suvarova NA, Irene EA. Development of materials integration strategies for electroceramic film-based devices via complementary in situ and ex situ studies of film growth and interface processes Integrated Ferroelectrics. 46: 295-306. DOI: 10.1080/10584580215376 |
0.697 |
|
2002 |
Mueller AH, Suvorova NA, Irene EA, Auciello O, Schultz JA. Real-time observations of interface formation for barium strontium titanate films on silicon Applied Physics Letters. 80: 3796-3798. DOI: 10.1063/1.1479451 |
0.78 |
|
2002 |
Mueller AH, Suvorova NA, Irene EA. Sensitivity in extracting static dielectric constants from multiple film stacks Applied Physics Letters. 80: 3596-3598. DOI: 10.1063/1.1478159 |
0.744 |
|
2001 |
Krauss AR, Auciello O, Dhote AM, Im J, Aggarwal S, Ramesh R, Irene EA, Gao Y, Mueller AH. Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties Integrated Ferroelectrics. 32: 813/121-823/131. |
0.696 |
|
2000 |
Mueller AH, Gao Y, Irene EA, Auciello O, Krauss AR, Schultz JA. In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry Materials Research Society Symposium - Proceedings. 619: 141-145. DOI: 10.1557/Proc-619-141 |
0.588 |
|
2000 |
Gao Y, Mueller AH, Irene EA, Auciello O, Krauss AR, Schultz JA. In situ study of barrier layers using spectroscopic ellipsometry and mass spectroscopy of recoiled ions Materials Research Society Symposium - Proceedings. 619: 135-140. DOI: 10.1557/Proc-619-135 |
0.629 |
|
2000 |
Auciello O, Krauss AR, Im J, Dhote A, Gruen DM, Irene EA, Gao Y, Mueller AH, Ramesh R. Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques Integrated Ferroelectrics. 28: 1-12. DOI: 10.1080/10584580008222216 |
0.681 |
|
1999 |
Gao Y, Mueller AH, Irene EA, Auciello O, Krauss AR, Schultz JA. In-situ real-time ellipsometry study of dynamic processes of YBa2Cu3O7-x, thin films Materials Research Society Symposium - Proceedings. 569: 77-82. DOI: 10.1557/Proc-569-77 |
0.685 |
|
1999 |
Mueller AH, Gao Y, Irene EA, Auciello O, Krauss AR, Schultz JA. Combined spectroscopic ellipsometry and ion beam surface analysis for in-situ real-time characterization of complex oxide film growth Materials Research Society Symposium - Proceedings. 569: 15-20. DOI: 10.1557/Proc-569-15 |
0.685 |
|
1999 |
Gao Y, Mueller AH, Irene EA, Auciello O, Krauss A, Schultz JA. In situ study of interface reactions of ion beam sputter deposited (Ba 0.5Sr0.5)TiO3 films on Si, SiO2, and Ir Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 17: 1881-1886. DOI: 10.1116/1.582099 |
0.709 |
|
1999 |
Auciello O, Krauss AR, Jaemo IM, Dhote A, Gruen DM, Aggarwal S, Ramesh R, Irene EA, Gao Y, Mueller AH. Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques Integrated Ferroelectrics. 27: 103-118. DOI: 10.1080/10584589908228460 |
0.65 |
|
1999 |
Gao Y, Mueller AH, Irene EA, Auciello O, Krauss AR, Schultz JA. Real-time study of oxygen in c-axis oriented YBa2Cu3O7 - δ thin films using in situ spectroscopic ellipsometry Journal of Applied Physics. 86: 6979-6984. DOI: 10.1063/1.371782 |
0.638 |
|
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