Rolf E. Hummel - Publications

Affiliations: 
University of Florida, Gainesville, Gainesville, FL, United States 
Area:
Condensed Matter Physics, Optics Physics, Materials Science Engineering

116 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Dubroca T, Brown G, Hummel RE. Detection of explosives by differential hyperspectral imaging Optical Engineering. 53. DOI: 10.1117/1.OE.53.2.021112  1
2013 Dubroca T, Moyant K, Hummel RE. Ultra-violet and visible absorption characterization of explosives by differential reflectometry. Spectrochimica Acta. Part a, Molecular and Biomolecular Spectroscopy. 105: 149-55. PMID 23299022 DOI: 10.1016/j.saa.2012.11.090  1
2013 Yuksel SE, Dubroca T, Hummel RE, Gader PD. Diperential reflection spectroscopy: A novel method for explosive detection Acta Physica Polonica A. 123: 263-264. DOI: 10.12693/APhysPolA.123.263  1
2012 Yuksel SE, Dubroca T, Hummel RE, Gader PD. An automatic detection software for differential reflection spectroscopy Proceedings of Spie - the International Society For Optical Engineering. 8390. DOI: 10.1117/12.919431  1
2012 Dubroca T, Guetard G, Hummel RE. Influence of spatial differential reflection parameters on 2,4,6-trinitrotoluene (TNT) absorption spectra Proceedings of Spie - the International Society For Optical Engineering. 8358. DOI: 10.1117/12.918385  1
2011 Dubroca T, Hummel RE. Detection of explosives by hyper-spectral differential reflectometry Materials Research Society Symposium Proceedings. 1405: 127-132. DOI: 10.1557/opl.2012.225  1
2011 Dubroca T, Vishwanathan K, Hummel RE. The limit of detection for explosives in spectroscopic differential reflectometry Proceedings of Spie - the International Society For Optical Engineering. 8018. DOI: 10.1117/12.884154  1
2011 Zare A, Gader P, Bolton J, Yuksel S, Dubroca T, Close R, Hummel R. Sub-pixel target spectra estimation and detection using functions of multiple instances Workshop On Hyperspectral Image and Signal Processing, Evolution in Remote Sensing. DOI: 10.1109/WHISPERS.2011.6080874  1
2008 Dubroca T, Hummel RE, Angerhofer A. Response to "comment on Quasiferromagnetism in semiconductors'" [Appl. Phys. Lett. 93, 036101 (2008)] Applied Physics Letters. 93. DOI: 10.1063/1.2959725  1
2008 Kim K, Hummel RE. Infrared luminescence from spark-processed silicon Journal of Physics and Chemistry of Solids. 69: 199-205. DOI: 10.1016/j.jpcs.2007.08.055  1
2007 Schöllhorn C, Fuller AM, Gratier J, Hummel RE. Developments on standoff detection of explosive materials by differential reflectometry. Applied Optics. 46: 6232-6. PMID 17805355  0.72
2007 Schöllhorn C, Fuller AM, Gratier J, Hummel RE. Developments on standoff detection of explosive materials by differential reflectometry Applied Optics. 46: 6232-6236. DOI: 10.1364/AO.46.006232  1
2007 Schöllhorn C, Fuller AM, Gratier J, Hummel RE. New developments on standoff detection of explosive materials by differential reflectometry Proceedings of Spie - the International Society For Optical Engineering. 6554. DOI: 10.1117/12.722429  1
2007 Kim K, Hummel RE. Infrared electroluminescence from erbium-doped spark-processed silicon Journal of Luminescence. 127: 339-348. DOI: 10.1016/j.jlumin.2006.12.009  1
2006 Fuller AM, Hummel RE, Schöllhorn C, Holloway PH. Stand off detection of explosive materials by differential reflection spectroscopy Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6378. DOI: 10.1117/12.686353  1
2006 Kim K, Hummel RE. Infrared photoluminescence from erbium-doped spark-processed silicon Journal of Applied Physics. 100. DOI: 10.1063/1.2266216  1
2006 Hummel RE, Fuller AM, Schöllhorn C, Holloway PH. Detection of explosive materials by differential reflection spectroscopy Applied Physics Letters. 88. DOI: 10.1063/1.2210077  1
2006 Dubroca T, Hack J, Hummel RE, Angerhofer A. Quasiferromagnetism in semiconductors Applied Physics Letters. 88. DOI: 10.1063/1.2198483  1
2006 Polihronov JG, Hedström M, Cheng HP, Hummel RE. Absorption and emission of light in spark-processed silicon Journal of Physics and Chemistry of Solids. 67: 1543-1549. DOI: 10.1016/j.jpcs.2006.01.121  1
2006 Hummel RE, Fuller AM, Schöllhorn C, Holloway PH. Remote Sensing of Explosive Materials Using Differential Reflection Spectroscopy Trace Chemical Sensing of Explosives. 303-310. DOI: 10.1002/9780470085202.ch15  1
2005 Rowland J, Yoo JS, Kim KH, Hummel RE, Holloway P. The stability of Y 3Al 5O 12:Ce, ZnSrCuAl, Y 2O 2S:Eu, and (Sr 0.98Ba 0.02) 2SiO 4:Eu under UV irradiation Electrochemical and Solid-State Letters. 8. DOI: 10.1149/1.1861897  1
2005 Hummel RE. Understanding materials science: History - Properties - Applications Understanding Materials Science: History - Properties - Applications. 1-440. DOI: 10.1007/b137957  1
2005 Kartopu G, Karavanskii VA, Serincan U, Turan R, Hummel RE, Ekinci Y, Gunnæs A, Finstad TG. Can chemically etched germanium or germanium nanocrystals emit visible photoluminescence? Physica Status Solidi (a) Applications and Materials Science. 202: 1472-1476. DOI: 10.1002/pssa.200461140  1
2004 Kartopu G, Bayliss SC, Hummel RE, Ekinci Y. Simultaneous micro-Raman and photoluminescence study of spark-processed germanium: Report on the origin of the orange photoluminescence emission band Journal of Applied Physics. 95: 3466-3472. DOI: 10.1063/1.1650919  1
2004 Polihronov JG, Dubroca T, Manuel M, Hummel RE. Porosity and density of spark-processed silicon Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 107: 124-133. DOI: 10.1016/j.mseb.2003.10.112  1
2003 Shepherd N, Hummel RE. A model for the electroluminescence of spark-processed Si Journal of Physics and Chemistry of Solids. 64: 967-974. DOI: 10.1016/S0022-3697(02)00456-0  1
2003 Polihronov JG, Hummel RE, Cheng HP. Optical properties and energetics of oxygenated silicon ring-shaped clusters Journal of Luminescence. 101: 55-62. DOI: 10.1016/S0022-2313(02)00388-5  1
2003 Shepherd N, Hummel RE. Improved electroluminescence of spark-processed silicon by an aerosol-assisted technique Physica Status Solidi (a) Applied Research. 197: 222-227. DOI: 10.1002/pssa.200306504  1
2002 Stora ME, Hummel RE. Photoluminescence of spark-processed metals Journal of Physics and Chemistry of Solids. 63: 1867-1872. DOI: 10.1016/S0022-3697(02)00172-5  1
2002 Stora ME, Hummel RE. Variation of spark-processing parameters on the photoluminescence properties of spark-processed silicon Journal of Physics and Chemistry of Solids. 63: 1655-1668. DOI: 10.1016/S0022-3697(01)00250-5  1
2002 Polihronov JG, Hedström M, Hummel RE, Cheng HP. Semi-empirical calculation of the optical spectra of silica clusters in spark-processed silicon Journal of Luminescence. 96: 119-128. DOI: 10.1016/S0022-2313(01)00414-8  1
2001 Hummel RE, Shepherd N, Burton D. Interpretation of photoluminescence spectra obtained for spark-processed Si Applied Physics Letters. 79: 3218-3220. DOI: 10.1063/1.1418264  1
2001 Chang SS, Choi GJ, Park HJ, Stora ME, Hummel RE. UV and green photoluminescence from spark-processed zinc Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 83: 29-34. DOI: 10.1016/S0921-5107(00)00799-6  1
2000 Stora ME, Hummel RE. Novel photoconductive effect in spark-processed silicon with metal contacts Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 69: 118-126. DOI: 10.1016/S0921-5107(99)00229-9  1
2000 Chang SS, Choi GJ, Hummel RE. Optical properties of spark-processed Ge Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 76: 237-240. DOI: 10.1016/S0921-5107(00)00456-6  1
2000 Chang SS, Hummel RE. Comparison of photoluminescence behavior of porous germanium and spark-processed Ge Journal of Luminescence. 86: 33-38. DOI: 10.1016/S0022-2313(99)00179-9  1
2000 Hummel RE, Stora ME, Shepherd N, Yu S, Fajardo F. Electroluminescence and magnetic field quenching of photoluminescence of spark-processed Si Journal of Porous Materials. 7: 131-134.  1
1999 Chang SS, Sakai A, Hummel RE. Luminescence properties of ambient air aged and thermally oxidized porous silicon Materials Science and Engineering B. 64: 118-122.  1
1998 Singh RK, Jung SM, Lee SM, Hummel RE. Novel method for the formation of large-grained, silicon thin films on amorphous substrates Journal of the Electrochemical Society. 145: 3963-3966.  1
1998 Hummel RE. Implantation damage and epitaxial regrowth of silicon studied by differential reflectometry Materials Science and Engineering A. 253: 50-61.  1
1998 Hummel RE, Shepherd N, Ludwig MH, Stora ME. Does the fast, blue photoluminescence from spark-processed silicon originate from tungsten doping? Thin Solid Films. 325: 1-3.  1
1998 Malone DW, Hummel RE. Electromigration failure of integrated circuit metallizations subjected to high-frequency pulsed currents Journal of Applied Physics. 83: 5750-5760.  1
1997 Kurmaev EZ, Shamin SN, Galakhov VR, Sokolov VI, Ludwig MH, Hummel RE. X-ray emission spectra and the effect of oxidation on the local structure of porous and spark-processed silicon Journal of Physics Condensed Matter. 9: 2671-2681. DOI: 10.1088/0953-8984/9/12/013  1
1997 Ludwig MH, Augustin A, Hummel RE. Colour-switching effect of photoluminescent silicon after spark-processing in oxygen Semiconductor Science and Technology. 12: 981-986. DOI: 10.1088/0268-1242/12/8/009  1
1997 Malone DW, Hummel RE. Electromigration in integrated circuits Critical Reviews in Solid State and Materials Sciences. 22: 199-238.  1
1997 Kurmaev EZ, Galakhov VR, Shamin SN, Sokolov VI, Hummel RE, Ludwig MH. Local structure of porous silicon studied by means of X-ray emission spectroscopy Applied Physics a: Materials Science and Processing. 65: 183-189.  1
1997 Rupp S, Quilty J, Trodahl HJ, Ludwig MH, Hummel RE. Raman study of the relationship between nanoparticles and photoluminescence in spark-processed silicon Applied Physics Letters. 70: 723-725.  1
1997 Ludwig MH, Augustin A, Hummel RE. Multicolor-effects of luminescing, nanostructured silicon after spark-processing in pure and composite gases Materials Research Society Symposium - Proceedings. 452: 153-158.  1
1997 Hack J, Ludwig MH, Geerts W, Hummel RE. Ferromagnetic properties of spark-processed photoluminescing silicon Materials Research Society Symposium - Proceedings. 452: 147-152.  1
1996 Hagmann DR, Hummel RE. Characterization of multilayer thin film structures by differential reflection spectroscopy Materials Research Bulletin. 31: 1449-1461. DOI: 10.1016/S0025-5408(96)00153-5  1
1996 Malone DW, Hummel RE. Electromigration in VLSI metallization test structures stressed over range of DC pulse conditions and frequencies up to 133 MHz Materials Research Society Symposium - Proceedings. 428: 115-120.  1
1996 Ludwig MH, Augustin A, Hummel RE, Gross T. On the formation process of luminescing centers in spark-processed silicon Journal of Applied Physics. 80: 5318-5324.  1
1996 Hummel RE, Ludwig MH. Spark-processing - A novel technique to prepare light-emitting, nanocrystalline silicon Journal of Luminescence. 68: 69-76.  1
1995 Ludwig MH, Menniger J, Hummel RE. Cathodoluminescing properties of spark-processed silicon Journal of Physics: Condensed Matter. 7: 9081-9089. DOI: 10.1088/0953-8984/7/47/024  1
1995 Hummel RE, Ludwig M, Chang SS, La Torre G. Comparison of anodically etched porous silicon with spark-processed silicon Thin Solid Films. 255: 219-223. DOI: 10.1016/0040-6090(94)05682-4  1
1995 Ludwig MH, Hummel RE, Stora M. Luminescence of spark-processed materials Thin Solid Films. 255: 103-106. DOI: 10.1016/0040-6090(94)05631-M  1
1995 Hummel RE, Ludwig MH, Hack J, Chang SS. Does the blue/violet photoluminescence of spark-processed silicon originate from hydroxyl groups? Solid State Communications. 96: 683-687. DOI: 10.1016/0038-1098(95)00414-9  1
1995 Hummel RE, Ludwig MH, Chang SS, Fauchet PM, Vandyshev JV, Tsybeskov L. Time-resolved photoluminescence measurements in spark-processed blue and green emitting silicon Solid State Communications. 95: 553-557. DOI: 10.1016/0038-1098(95)00224-3  1
1995 Hummel RE, Ludwig MH, Chang SS. Strong, blue, room-temperature photoluminescence of spark-processed silicon Solid State Communications. 93: 237-241. DOI: 10.1016/0038-1098(94)00644-X  1
1995 Ludwig MH, Hummel RE, Augustin A, Hack J, Menniger J. Position- and temperature-dependent optical properties of spark-processed silicon Applied Physics Letters. 67: 2542.  1
1995 Hummel RE, Ludwig MH, Chang SS. Possible mechanisms for photoluminescence in spark-processed Si Materials Research Society Symposium - Proceedings. 358: 151-156.  1
1994 Takaoka GH, Sugahara G, Hummel RE, Northby JA, Sosnowski M, Yamada I. Irradiation effects of Ar-cluster ion beams on Si surfaces Materials Research Society Symposium Proceedings. 316: 1005-1010.  1
1993 Hummel RE, Morrone A, Ludwig M, Chang SS. On the origin of photoluminescence in spark-eroded (porous) silicon Applied Physics Letters. 63: 2771-2773. DOI: 10.1063/1.110792  1
1993 Feng SW, Hummel RE, Hagmann DR. Solid phase epitaxial regrowth of ion-implanted amorphous silicon characterized by differential reflectometry Nuclear Inst. and Methods in Physics Research, B. 74: 151-155. DOI: 10.1016/0168-583X(93)95034-3  1
1993 Ludwig MH, Hummel RE. Differential reflectance studies of structural changes in GaAs caused by ArPLU ion bombardment Materials Research Society Symposium Proceedings. 300: 345-350.  1
1993 Hummel RE, Chang SS, Ludwig M, Morrone A. Composition and structure of spark eroded porous silicon Materials Research Society Symposium Proceedings. 283: 45-50.  1
1992 Puga MMS, Hummel RE, Burk DE. The effect of Fe, Cr and Mo on the resistivity of the top silicon layer of buried oxide silicon-on-insulator structures Semiconductor Science and Technology. 7: 1067-1071. DOI: 10.1088/0268-1242/7/8/007  1
1992 Puga MMS, Hummel RE, Burk DE. Redistributed of Fe, Cr and Mo in buried oxide silicon-on-insulator structures during high-temperature furnace annealing Semiconductor Science and Technology. 7: 1058-1066. DOI: 10.1088/0268-1242/7/8/006  1
1992 Hummel RE, Chang SS. Novel technique for preparing porous silicon Applied Physics Letters. 61: 1965-1967. DOI: 10.1063/1.108331  1
1991 Hummel RE, Malone D, Kawasaki H. Electromigration and contact filling of aluminum films deposited by ion-enhanced processes Nuclear Inst. and Methods in Physics Research, B. 59: 297-301. DOI: 10.1016/0168-583X(91)95227-5  1
1991 Hagmann DR, Xi W, Hummel RE. A study of the solid phase epitaxial regrowth of amorphous silicon utilizing differential reflectometry Nuclear Inst. and Methods in Physics Research, B. 59: 110-115. DOI: 10.1016/0168-583X(91)95187-I  1
1991 Kim JY, Hummel RE. The Effects of Tin Underlays on the Stability of Gold Thin Films during Isothermal Annealing Physica Status Solidi (a). 124: 211-219. DOI: 10.1002/pssa.2211240120  1
1990 Hummel RE, Xi W, Hagmann DR. Ion Implantation Damage and Annealing of Silicon as Characterized by Differential Reflectometry Journal of the Electrochemical Society. 137: 3583-3588. DOI: 10.1149/1.2086272  1
1990 Hummel RE, Smith RJ. The passivation of nickel in aqueous solutions-IV. Optical and electrochemical investigations of the anodic behavior of nickel in chloride-containing solutions Corrosion Science. 30: 849-854. DOI: 10.1016/0010-938X(90)90008-S  1
1990 Kim JY, Hummel RE. Hole and Hillock Formation in Gold Metallizations at Elevated Temperatures Deposited on Titanium, Vanadium, and Other Barrier Layers Physica Status Solidi (a). 122: 255-273. DOI: 10.1002/pssa.2211220125  1
1989 Hummel RE, Hoang HH. On the electromigration failure under pulsed conditions Journal of Applied Physics. 65: 1929-1931. DOI: 10.1063/1.342879  1
1989 Hummel RE, Yamada I. Electromigration behavior of aluminum films deposited on silicon by ionized cluster beam and other techniques Applied Physics Letters. 54: 18-20. DOI: 10.1063/1.100823  1
1989 Hummel RE. Electromigration of ionized cluster beam deposited aluminum metallizations . 207-209.  1
1988 Hummel RE, Xi W, Holloway PH, Jones KA. Optical investigations of ion implant damage in silicon Journal of Applied Physics. 63: 2591-2594. DOI: 10.1063/1.340996  1
1988 Hummel RE, Yamada I. Electromigration behavior of ionized cluster beam deposited aluminum films on SiO2 Applied Physics Letters. 53: 1765-1767. DOI: 10.1063/1.100478  1
1988 Hummel RE, Smith RJ. The passivation of nickel in aqueous solutions-III. The passivation of Ni-30 wt% Cu alloys as studied by in situ electrochemical and optical techniques Corrosion Science. 28: 279-288. DOI: 10.1016/0010-938X(88)90110-2  1
1988 Hummel RE. Differential reflectometry and its application in materials science Surface and Interface Analysis. 12: 11-14. DOI: 10.1002/sia.740120105  1
1988 Hummel RE, Goho WM. Optical Properties and Electronic Structure of Copper–Cobalt Alloys Physica Status Solidi (B). 147: 417-420. DOI: 10.1002/pssb.2221470147  1
1988 Hummel RE. On the current density dependence of electromigration in thin films Physica Status Solidi (a). 107: K175-K179. DOI: 10.1002/pssa.2211070259  1
1988 Hummel RE, Goho WM, Gerold V. The influence of precipitation on the optical properties and electronic structure of copper‐cobalt alloys Physica Status Solidi (a). 106: 641-649. DOI: 10.1002/pssa.2211060237  1
1987 Hummel RE. Application and deterioration of thin films used for microelectronic devices Studies in Surface Science and Catalysis. 32: 111-133. DOI: 10.1016/S0167-2991(09)60452-3  1
1987 Lee SY, Hummel RE, Dehoff RT. On the role of indium underlays in the prevention of thermal grooving in thin gold films Thin Solid Films. 149: 29-48. DOI: 10.1016/0040-6090(87)90246-X  1
1987 Smith RJ, Hummel RE, Ambrose JR. The passivation of nickel in aqueous solutions-II. An in situ investigation of the passivation of nickel using optical and electrochemical techniques Corrosion Science. 27: 815-826. DOI: 10.1016/0010-938X(87)90039-4  1
1987 Hummel RE, Smith RJ, Verink ED. The passivation of nickel in aqueous solutions-I. The identification of insoluble corrosion products on nickel electrodes using optical and ESCA techniques Corrosion Science. 27: 803-813. DOI: 10.1016/0010-938X(87)90038-2  1
1985 Hummel RE. ELECTROMIGRATION AND THERMAL GROOVING IN THIN FILMS Proceedings - the Electrochemical Society. 85: 17-22.  1
1984 Hummel RE, Enderlein R. New look at the line shape of differential reflectograms for dilute alloys Physical Review B. 29: 1529-1533. DOI: 10.1103/PhysRevB.29.1529  1
1984 Hummel RE, Lee SY. ELECTROMIGRATION IN THIN GOLD-INDIUM FILMS Electrochemical Society Extended Abstracts. 84: 850.  1
1984 Hummel RE, Goho SM, DeHoff RT. ROLE OF THERMAL GROOVING, THERMOTRANSPORT AND ELECTROTRANSPORT ON THE FAILURE OF THIN FILM METALLIZATIONS Annual Proceedings - Reliability Physics (Symposium). 234-241.  1
1983 Hummel RE, Matts-Goho S, DeHoff RT. New insights on the reversal of the site of electromigration failure in gold films doped with alkali Journal of Applied Physics. 54: 2855-2856. DOI: 10.1063/1.332278  1
1983 Hummel RE. Differential reflectometry and its application to the study of alloys, ordering, corrosion, and surface properties Physica Status Solidi (a). 76: 11-44. DOI: 10.1002/pssa.2210760102  1
1982 Urban FK, Hummel RE, Verink ED. Differential reflectometry of thin film metal oxides on copper, tungsten, molybdenum and chromium Corrosion Science. 22: 647-660. DOI: 10.1016/0010-938X(82)90045-2  1
1981 Hummel RE, DeHoff RT, Matts-Goho S, Goho WM. Thermal grooving, thermotransport and electrotransport in doped and undoped thin gold films Thin Solid Films. 78: 1-14. DOI: 10.1016/0040-6090(81)90412-0  1
1981 Hummel RE. Reflectivity of silver- and aluminium-based alloys for solar reflectors Solar Energy. 27: 449-455. DOI: 10.1016/0038-092X(81)90040-2  1
1981 Hummel RE. Differential reflectometry of sputtered silver-aluminum films between 1.6 and 6.2 eV Optics Communications. 39: 55-58. DOI: 10.1016/0030-4018(81)90454-5  1
1980 Andrews JB, Nastasi-Andrews RJ, Hummel RE. Optical investigations of short-range ordering of α-copper-aluminum alloys Physical Review B. 22: 1837-1842. DOI: 10.1103/PhysRevB.22.1837  1
1980 Shanley CW, Hummel RE, Verink ED. Differential reflectometry of corrosion products of copper Corrosion Science. 20: 481-487. DOI: 10.1016/0010-938X(80)90065-7  1
1980 Shanley CW, Hummel RE, Verink ED. Differential reflectometry-a new optical technique to study corrosion phenomena Corrosion Science. 20: 467-480. DOI: 10.1016/0010-938X(80)90064-5  1
1978 Hummel RE, Krumeich BK, Dehoff RT. The effect of minor constituents on the electrotransport-induced failure site in thin gold films Applied Physics Letters. 33: 960-962. DOI: 10.1063/1.90217  1
1978 Enderlein R, Hummel RE, Andrews JB, Nastasi‐Andrews RJ, Shanley CW. Interpretation of Compositional Modulation Spectra to Determine Some Optical Properties of Alloys Physica Status Solidi (B). 88: 173-178. DOI: 10.1002/pssb.2220880120  1
1978 Hummel RE, Shanley CW, Verink ED. DIFFERENTIAL REFLECTOMETRY - A NEW OPTICAL TECHNIQUE FOR THE STUDY OF CORROSION PHENOMENA Corrosion '77 $-$ Int Corros Forum Devoted Exclusively to the Prot and Perform of Mater 1
1977 Nastasi-Andrews RJ, Hummel RE. Optical properties and electronic structure of dilute Cu-Au, Cu-Zn, Cu-Al, Cu-Ga, Cu-Si, Cu-Ge, Cu-Sn, and Cu-As alloys Physical Review B. 16: 4314-4323. DOI: 10.1103/PhysRevB.16.4314  1
1976 Hummel RE, Dehoff RT, Geier HJ. Activation energy for electrotransport in thin aluminum films by resistance measurements Journal of Physics and Chemistry of Solids. 37: 73-80. DOI: 10.1016/0022-3697(76)90183-9  1
1975 Hummel RE, Dehoff RT. On the controversy about the direction of electrotransport in thin gold films Applied Physics Letters. 27: 64-66. DOI: 10.1063/1.88367  1
1975 Hummel RE, Geier HJ. Activation energy for electrotransport in thin silver and gold films Thin Solid Films. 25: 335-342. DOI: 10.1016/0040-6090(75)90053-X  1
1973 Hummel RE, Andrews JB. Modulated reflectivity measurements on α-phase Cu-Zn, Cu-Al, Cu-Ga, and Cu-Ge alloys Physical Review B. 8: 2449-2453. DOI: 10.1103/PhysRevB.8.2449  1
1973 Holbrook JA, Hummel RE. A "differential reflectometer" for measurements of small differences in reflectivity Review of Scientific Instruments. 44: 463-466. DOI: 10.1063/1.1686156  1
1973 Hummel RE, Holbrook JA, Andrews JB. Compositional modulation of CuZn, CuAl and CuNi alloys Surface Science. 37: 717-729. DOI: 10.1016/0039-6028(73)90362-2  1
1972 Breitling HM, Hummel RE. Electromigration in thin silver, copper, gold, indium, tin, lead and magnesium films Journal of Physics and Chemistry of Solids. 33. DOI: 10.1016/S0022-3697(72)80101-X  1
1972 Hummel RE. Observations on the electromigration in various thin films of group I-IV Thin Solid Films. 13: 175-178. DOI: 10.1016/0040-6090(72)90170-8  1
1971 Hummel RE, Breitling RM. On the direction of electromigration in thin silver, gold, and copper films Applied Physics Letters. 18: 373-375. DOI: 10.1063/1.1653704  1
1970 Hummel RE, Dove DB, Holbrook JA. Optical reflectivity measurements on alloys by compositional modulation Physical Review Letters. 25: 290-292. DOI: 10.1103/PhysRevLett.25.290  1
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