| Year |
Citation |
Score |
| 2014 |
Dubroca T, Brown G, Hummel RE. Detection of explosives by differential hyperspectral imaging Optical Engineering. 53. DOI: 10.1117/1.OE.53.2.021112 |
1 |
|
| 2013 |
Dubroca T, Moyant K, Hummel RE. Ultra-violet and visible absorption characterization of explosives by differential reflectometry. Spectrochimica Acta. Part a, Molecular and Biomolecular Spectroscopy. 105: 149-55. PMID 23299022 DOI: 10.1016/j.saa.2012.11.090 |
1 |
|
| 2013 |
Yuksel SE, Dubroca T, Hummel RE, Gader PD. Diperential reflection spectroscopy: A novel method for explosive detection Acta Physica Polonica A. 123: 263-264. DOI: 10.12693/APhysPolA.123.263 |
1 |
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| 2012 |
Yuksel SE, Dubroca T, Hummel RE, Gader PD. An automatic detection software for differential reflection spectroscopy Proceedings of Spie - the International Society For Optical Engineering. 8390. DOI: 10.1117/12.919431 |
1 |
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| 2012 |
Dubroca T, Guetard G, Hummel RE. Influence of spatial differential reflection parameters on 2,4,6-trinitrotoluene (TNT) absorption spectra Proceedings of Spie - the International Society For Optical Engineering. 8358. DOI: 10.1117/12.918385 |
1 |
|
| 2011 |
Dubroca T, Hummel RE. Detection of explosives by hyper-spectral differential reflectometry Materials Research Society Symposium Proceedings. 1405: 127-132. DOI: 10.1557/opl.2012.225 |
1 |
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| 2011 |
Dubroca T, Vishwanathan K, Hummel RE. The limit of detection for explosives in spectroscopic differential reflectometry Proceedings of Spie - the International Society For Optical Engineering. 8018. DOI: 10.1117/12.884154 |
1 |
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| 2011 |
Zare A, Gader P, Bolton J, Yuksel S, Dubroca T, Close R, Hummel R. Sub-pixel target spectra estimation and detection using functions of multiple instances Workshop On Hyperspectral Image and Signal Processing, Evolution in Remote Sensing. DOI: 10.1109/WHISPERS.2011.6080874 |
1 |
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| 2008 |
Dubroca T, Hummel RE, Angerhofer A. Response to "comment on Quasiferromagnetism in semiconductors'" [Appl. Phys. Lett. 93, 036101 (2008)] Applied Physics Letters. 93. DOI: 10.1063/1.2959725 |
1 |
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| 2008 |
Kim K, Hummel RE. Infrared luminescence from spark-processed silicon Journal of Physics and Chemistry of Solids. 69: 199-205. DOI: 10.1016/j.jpcs.2007.08.055 |
1 |
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| 2007 |
Schöllhorn C, Fuller AM, Gratier J, Hummel RE. Developments on standoff detection of explosive materials by differential reflectometry. Applied Optics. 46: 6232-6. PMID 17805355 |
0.72 |
|
| 2007 |
Schöllhorn C, Fuller AM, Gratier J, Hummel RE. Developments on standoff detection of explosive materials by differential reflectometry Applied Optics. 46: 6232-6236. DOI: 10.1364/AO.46.006232 |
1 |
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| 2007 |
Schöllhorn C, Fuller AM, Gratier J, Hummel RE. New developments on standoff detection of explosive materials by differential reflectometry Proceedings of Spie - the International Society For Optical Engineering. 6554. DOI: 10.1117/12.722429 |
1 |
|
| 2007 |
Kim K, Hummel RE. Infrared electroluminescence from erbium-doped spark-processed silicon Journal of Luminescence. 127: 339-348. DOI: 10.1016/j.jlumin.2006.12.009 |
1 |
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| 2006 |
Fuller AM, Hummel RE, Schöllhorn C, Holloway PH. Stand off detection of explosive materials by differential reflection spectroscopy Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6378. DOI: 10.1117/12.686353 |
1 |
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| 2006 |
Kim K, Hummel RE. Infrared photoluminescence from erbium-doped spark-processed silicon Journal of Applied Physics. 100. DOI: 10.1063/1.2266216 |
1 |
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| 2006 |
Hummel RE, Fuller AM, Schöllhorn C, Holloway PH. Detection of explosive materials by differential reflection spectroscopy Applied Physics Letters. 88. DOI: 10.1063/1.2210077 |
1 |
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| 2006 |
Dubroca T, Hack J, Hummel RE, Angerhofer A. Quasiferromagnetism in semiconductors Applied Physics Letters. 88. DOI: 10.1063/1.2198483 |
1 |
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| 2006 |
Polihronov JG, Hedström M, Cheng HP, Hummel RE. Absorption and emission of light in spark-processed silicon Journal of Physics and Chemistry of Solids. 67: 1543-1549. DOI: 10.1016/j.jpcs.2006.01.121 |
1 |
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| 2006 |
Hummel RE, Fuller AM, Schöllhorn C, Holloway PH. Remote Sensing of Explosive Materials Using Differential Reflection Spectroscopy Trace Chemical Sensing of Explosives. 303-310. DOI: 10.1002/9780470085202.ch15 |
1 |
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| 2005 |
Rowland J, Yoo JS, Kim KH, Hummel RE, Holloway P. The stability of Y 3Al 5O 12:Ce, ZnSrCuAl, Y 2O 2S:Eu, and (Sr 0.98Ba 0.02) 2SiO 4:Eu under UV irradiation Electrochemical and Solid-State Letters. 8. DOI: 10.1149/1.1861897 |
1 |
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| 2005 |
Hummel RE. Understanding materials science: History - Properties - Applications Understanding Materials Science: History - Properties - Applications. 1-440. DOI: 10.1007/b137957 |
1 |
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| 2005 |
Kartopu G, Karavanskii VA, Serincan U, Turan R, Hummel RE, Ekinci Y, Gunnæs A, Finstad TG. Can chemically etched germanium or germanium nanocrystals emit visible photoluminescence? Physica Status Solidi (a) Applications and Materials Science. 202: 1472-1476. DOI: 10.1002/pssa.200461140 |
1 |
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| 2004 |
Kartopu G, Bayliss SC, Hummel RE, Ekinci Y. Simultaneous micro-Raman and photoluminescence study of spark-processed germanium: Report on the origin of the orange photoluminescence emission band Journal of Applied Physics. 95: 3466-3472. DOI: 10.1063/1.1650919 |
1 |
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| 2004 |
Polihronov JG, Dubroca T, Manuel M, Hummel RE. Porosity and density of spark-processed silicon Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 107: 124-133. DOI: 10.1016/j.mseb.2003.10.112 |
1 |
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| 2003 |
Shepherd N, Hummel RE. A model for the electroluminescence of spark-processed Si Journal of Physics and Chemistry of Solids. 64: 967-974. DOI: 10.1016/S0022-3697(02)00456-0 |
1 |
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| 2003 |
Polihronov JG, Hummel RE, Cheng HP. Optical properties and energetics of oxygenated silicon ring-shaped clusters Journal of Luminescence. 101: 55-62. DOI: 10.1016/S0022-2313(02)00388-5 |
1 |
|
| 2003 |
Shepherd N, Hummel RE. Improved electroluminescence of spark-processed silicon by an aerosol-assisted technique Physica Status Solidi (a) Applied Research. 197: 222-227. DOI: 10.1002/pssa.200306504 |
1 |
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| 2002 |
Stora ME, Hummel RE. Photoluminescence of spark-processed metals Journal of Physics and Chemistry of Solids. 63: 1867-1872. DOI: 10.1016/S0022-3697(02)00172-5 |
1 |
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| 2002 |
Stora ME, Hummel RE. Variation of spark-processing parameters on the photoluminescence properties of spark-processed silicon Journal of Physics and Chemistry of Solids. 63: 1655-1668. DOI: 10.1016/S0022-3697(01)00250-5 |
1 |
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| 2002 |
Polihronov JG, Hedström M, Hummel RE, Cheng HP. Semi-empirical calculation of the optical spectra of silica clusters in spark-processed silicon Journal of Luminescence. 96: 119-128. DOI: 10.1016/S0022-2313(01)00414-8 |
1 |
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| 2001 |
Hummel RE, Shepherd N, Burton D. Interpretation of photoluminescence spectra obtained for spark-processed Si Applied Physics Letters. 79: 3218-3220. DOI: 10.1063/1.1418264 |
1 |
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| 2001 |
Chang SS, Choi GJ, Park HJ, Stora ME, Hummel RE. UV and green photoluminescence from spark-processed zinc Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 83: 29-34. DOI: 10.1016/S0921-5107(00)00799-6 |
1 |
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| 2000 |
Stora ME, Hummel RE. Novel photoconductive effect in spark-processed silicon with metal contacts Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 69: 118-126. DOI: 10.1016/S0921-5107(99)00229-9 |
1 |
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| 2000 |
Chang SS, Choi GJ, Hummel RE. Optical properties of spark-processed Ge Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 76: 237-240. DOI: 10.1016/S0921-5107(00)00456-6 |
1 |
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| 2000 |
Chang SS, Hummel RE. Comparison of photoluminescence behavior of porous germanium and spark-processed Ge Journal of Luminescence. 86: 33-38. DOI: 10.1016/S0022-2313(99)00179-9 |
1 |
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| 2000 |
Hummel RE, Stora ME, Shepherd N, Yu S, Fajardo F. Electroluminescence and magnetic field quenching of photoluminescence of spark-processed Si Journal of Porous Materials. 7: 131-134. |
1 |
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| 1999 |
Chang SS, Sakai A, Hummel RE. Luminescence properties of ambient air aged and thermally oxidized porous silicon Materials Science and Engineering B. 64: 118-122. |
1 |
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| 1998 |
Singh RK, Jung SM, Lee SM, Hummel RE. Novel method for the formation of large-grained, silicon thin films on amorphous substrates Journal of the Electrochemical Society. 145: 3963-3966. |
1 |
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| 1998 |
Hummel RE. Implantation damage and epitaxial regrowth of silicon studied by differential reflectometry Materials Science and Engineering A. 253: 50-61. |
1 |
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| 1998 |
Hummel RE, Shepherd N, Ludwig MH, Stora ME. Does the fast, blue photoluminescence from spark-processed silicon originate from tungsten doping? Thin Solid Films. 325: 1-3. |
1 |
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| 1998 |
Malone DW, Hummel RE. Electromigration failure of integrated circuit metallizations subjected to high-frequency pulsed currents Journal of Applied Physics. 83: 5750-5760. |
1 |
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| 1997 |
Kurmaev EZ, Shamin SN, Galakhov VR, Sokolov VI, Ludwig MH, Hummel RE. X-ray emission spectra and the effect of oxidation on the local structure of porous and spark-processed silicon Journal of Physics Condensed Matter. 9: 2671-2681. DOI: 10.1088/0953-8984/9/12/013 |
1 |
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| 1997 |
Ludwig MH, Augustin A, Hummel RE. Colour-switching effect of photoluminescent silicon after spark-processing in oxygen Semiconductor Science and Technology. 12: 981-986. DOI: 10.1088/0268-1242/12/8/009 |
1 |
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| 1997 |
Malone DW, Hummel RE. Electromigration in integrated circuits Critical Reviews in Solid State and Materials Sciences. 22: 199-238. |
1 |
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| 1997 |
Kurmaev EZ, Galakhov VR, Shamin SN, Sokolov VI, Hummel RE, Ludwig MH. Local structure of porous silicon studied by means of X-ray emission spectroscopy Applied Physics a: Materials Science and Processing. 65: 183-189. |
1 |
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| 1997 |
Rupp S, Quilty J, Trodahl HJ, Ludwig MH, Hummel RE. Raman study of the relationship between nanoparticles and photoluminescence in spark-processed silicon Applied Physics Letters. 70: 723-725. |
1 |
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| 1997 |
Ludwig MH, Augustin A, Hummel RE. Multicolor-effects of luminescing, nanostructured silicon after spark-processing in pure and composite gases Materials Research Society Symposium - Proceedings. 452: 153-158. |
1 |
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| 1997 |
Hack J, Ludwig MH, Geerts W, Hummel RE. Ferromagnetic properties of spark-processed photoluminescing silicon Materials Research Society Symposium - Proceedings. 452: 147-152. |
1 |
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| 1996 |
Hagmann DR, Hummel RE. Characterization of multilayer thin film structures by differential reflection spectroscopy Materials Research Bulletin. 31: 1449-1461. DOI: 10.1016/S0025-5408(96)00153-5 |
1 |
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| 1996 |
Malone DW, Hummel RE. Electromigration in VLSI metallization test structures stressed over range of DC pulse conditions and frequencies up to 133 MHz Materials Research Society Symposium - Proceedings. 428: 115-120. |
1 |
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| 1996 |
Ludwig MH, Augustin A, Hummel RE, Gross T. On the formation process of luminescing centers in spark-processed silicon Journal of Applied Physics. 80: 5318-5324. |
1 |
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| 1996 |
Hummel RE, Ludwig MH. Spark-processing - A novel technique to prepare light-emitting, nanocrystalline silicon Journal of Luminescence. 68: 69-76. |
1 |
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| 1995 |
Ludwig MH, Menniger J, Hummel RE. Cathodoluminescing properties of spark-processed silicon Journal of Physics: Condensed Matter. 7: 9081-9089. DOI: 10.1088/0953-8984/7/47/024 |
1 |
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| 1995 |
Hummel RE, Ludwig M, Chang SS, La Torre G. Comparison of anodically etched porous silicon with spark-processed silicon Thin Solid Films. 255: 219-223. DOI: 10.1016/0040-6090(94)05682-4 |
1 |
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| 1995 |
Ludwig MH, Hummel RE, Stora M. Luminescence of spark-processed materials Thin Solid Films. 255: 103-106. DOI: 10.1016/0040-6090(94)05631-M |
1 |
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| 1995 |
Hummel RE, Ludwig MH, Hack J, Chang SS. Does the blue/violet photoluminescence of spark-processed silicon originate from hydroxyl groups? Solid State Communications. 96: 683-687. DOI: 10.1016/0038-1098(95)00414-9 |
1 |
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| 1995 |
Hummel RE, Ludwig MH, Chang SS, Fauchet PM, Vandyshev JV, Tsybeskov L. Time-resolved photoluminescence measurements in spark-processed blue and green emitting silicon Solid State Communications. 95: 553-557. DOI: 10.1016/0038-1098(95)00224-3 |
1 |
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| 1995 |
Hummel RE, Ludwig MH, Chang SS. Strong, blue, room-temperature photoluminescence of spark-processed silicon Solid State Communications. 93: 237-241. DOI: 10.1016/0038-1098(94)00644-X |
1 |
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| 1995 |
Ludwig MH, Hummel RE, Augustin A, Hack J, Menniger J. Position- and temperature-dependent optical properties of spark-processed silicon Applied Physics Letters. 67: 2542. |
1 |
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| 1995 |
Hummel RE, Ludwig MH, Chang SS. Possible mechanisms for photoluminescence in spark-processed Si Materials Research Society Symposium - Proceedings. 358: 151-156. |
1 |
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| 1994 |
Takaoka GH, Sugahara G, Hummel RE, Northby JA, Sosnowski M, Yamada I. Irradiation effects of Ar-cluster ion beams on Si surfaces Materials Research Society Symposium Proceedings. 316: 1005-1010. |
1 |
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| 1993 |
Hummel RE, Morrone A, Ludwig M, Chang SS. On the origin of photoluminescence in spark-eroded (porous) silicon Applied Physics Letters. 63: 2771-2773. DOI: 10.1063/1.110792 |
1 |
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| 1993 |
Feng SW, Hummel RE, Hagmann DR. Solid phase epitaxial regrowth of ion-implanted amorphous silicon characterized by differential reflectometry Nuclear Inst. and Methods in Physics Research, B. 74: 151-155. DOI: 10.1016/0168-583X(93)95034-3 |
1 |
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| 1993 |
Ludwig MH, Hummel RE. Differential reflectance studies of structural changes in GaAs caused by ArPLU ion bombardment Materials Research Society Symposium Proceedings. 300: 345-350. |
1 |
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| 1993 |
Hummel RE, Chang SS, Ludwig M, Morrone A. Composition and structure of spark eroded porous silicon Materials Research Society Symposium Proceedings. 283: 45-50. |
1 |
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| 1992 |
Puga MMS, Hummel RE, Burk DE. The effect of Fe, Cr and Mo on the resistivity of the top silicon layer of buried oxide silicon-on-insulator structures Semiconductor Science and Technology. 7: 1067-1071. DOI: 10.1088/0268-1242/7/8/007 |
1 |
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| 1992 |
Puga MMS, Hummel RE, Burk DE. Redistributed of Fe, Cr and Mo in buried oxide silicon-on-insulator structures during high-temperature furnace annealing Semiconductor Science and Technology. 7: 1058-1066. DOI: 10.1088/0268-1242/7/8/006 |
1 |
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| 1992 |
Hummel RE, Chang SS. Novel technique for preparing porous silicon Applied Physics Letters. 61: 1965-1967. DOI: 10.1063/1.108331 |
1 |
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| 1991 |
Hummel RE, Malone D, Kawasaki H. Electromigration and contact filling of aluminum films deposited by ion-enhanced processes Nuclear Inst. and Methods in Physics Research, B. 59: 297-301. DOI: 10.1016/0168-583X(91)95227-5 |
1 |
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| 1991 |
Hagmann DR, Xi W, Hummel RE. A study of the solid phase epitaxial regrowth of amorphous silicon utilizing differential reflectometry Nuclear Inst. and Methods in Physics Research, B. 59: 110-115. DOI: 10.1016/0168-583X(91)95187-I |
1 |
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| 1991 |
Kim JY, Hummel RE. The Effects of Tin Underlays on the Stability of Gold Thin Films during Isothermal Annealing Physica Status Solidi (a). 124: 211-219. DOI: 10.1002/pssa.2211240120 |
1 |
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| 1990 |
Hummel RE, Xi W, Hagmann DR. Ion Implantation Damage and Annealing of Silicon as Characterized by Differential Reflectometry Journal of the Electrochemical Society. 137: 3583-3588. DOI: 10.1149/1.2086272 |
1 |
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| 1990 |
Hummel RE, Smith RJ. The passivation of nickel in aqueous solutions-IV. Optical and electrochemical investigations of the anodic behavior of nickel in chloride-containing solutions Corrosion Science. 30: 849-854. DOI: 10.1016/0010-938X(90)90008-S |
1 |
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| 1990 |
Kim JY, Hummel RE. Hole and Hillock Formation in Gold Metallizations at Elevated Temperatures Deposited on Titanium, Vanadium, and Other Barrier Layers Physica Status Solidi (a). 122: 255-273. DOI: 10.1002/pssa.2211220125 |
1 |
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| 1989 |
Hummel RE, Hoang HH. On the electromigration failure under pulsed conditions Journal of Applied Physics. 65: 1929-1931. DOI: 10.1063/1.342879 |
1 |
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| 1989 |
Hummel RE, Yamada I. Electromigration behavior of aluminum films deposited on silicon by ionized cluster beam and other techniques Applied Physics Letters. 54: 18-20. DOI: 10.1063/1.100823 |
1 |
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| 1989 |
Hummel RE. Electromigration of ionized cluster beam deposited aluminum metallizations . 207-209. |
1 |
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| 1988 |
Hummel RE, Xi W, Holloway PH, Jones KA. Optical investigations of ion implant damage in silicon Journal of Applied Physics. 63: 2591-2594. DOI: 10.1063/1.340996 |
1 |
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| 1988 |
Hummel RE, Yamada I. Electromigration behavior of ionized cluster beam deposited aluminum films on SiO2 Applied Physics Letters. 53: 1765-1767. DOI: 10.1063/1.100478 |
1 |
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| 1988 |
Hummel RE, Smith RJ. The passivation of nickel in aqueous solutions-III. The passivation of Ni-30 wt% Cu alloys as studied by in situ electrochemical and optical techniques Corrosion Science. 28: 279-288. DOI: 10.1016/0010-938X(88)90110-2 |
1 |
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| 1988 |
Hummel RE. Differential reflectometry and its application in materials science Surface and Interface Analysis. 12: 11-14. DOI: 10.1002/sia.740120105 |
1 |
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| 1988 |
Hummel RE, Goho WM. Optical Properties and Electronic Structure of Copper–Cobalt Alloys Physica Status Solidi (B). 147: 417-420. DOI: 10.1002/pssb.2221470147 |
1 |
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| 1988 |
Hummel RE. On the current density dependence of electromigration in thin films Physica Status Solidi (a). 107: K175-K179. DOI: 10.1002/pssa.2211070259 |
1 |
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| 1988 |
Hummel RE, Goho WM, Gerold V. The influence of precipitation on the optical properties and electronic structure of copper‐cobalt alloys Physica Status Solidi (a). 106: 641-649. DOI: 10.1002/pssa.2211060237 |
1 |
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| 1987 |
Hummel RE. Application and deterioration of thin films used for microelectronic devices Studies in Surface Science and Catalysis. 32: 111-133. DOI: 10.1016/S0167-2991(09)60452-3 |
1 |
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| 1987 |
Lee SY, Hummel RE, Dehoff RT. On the role of indium underlays in the prevention of thermal grooving in thin gold films Thin Solid Films. 149: 29-48. DOI: 10.1016/0040-6090(87)90246-X |
1 |
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| 1987 |
Smith RJ, Hummel RE, Ambrose JR. The passivation of nickel in aqueous solutions-II. An in situ investigation of the passivation of nickel using optical and electrochemical techniques Corrosion Science. 27: 815-826. DOI: 10.1016/0010-938X(87)90039-4 |
1 |
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| 1987 |
Hummel RE, Smith RJ, Verink ED. The passivation of nickel in aqueous solutions-I. The identification of insoluble corrosion products on nickel electrodes using optical and ESCA techniques Corrosion Science. 27: 803-813. DOI: 10.1016/0010-938X(87)90038-2 |
1 |
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| 1985 |
Hummel RE. ELECTROMIGRATION AND THERMAL GROOVING IN THIN FILMS Proceedings - the Electrochemical Society. 85: 17-22. |
1 |
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| 1984 |
Hummel RE, Enderlein R. New look at the line shape of differential reflectograms for dilute alloys Physical Review B. 29: 1529-1533. DOI: 10.1103/PhysRevB.29.1529 |
1 |
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| 1984 |
Hummel RE, Lee SY. ELECTROMIGRATION IN THIN GOLD-INDIUM FILMS Electrochemical Society Extended Abstracts. 84: 850. |
1 |
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| 1984 |
Hummel RE, Goho SM, DeHoff RT. ROLE OF THERMAL GROOVING, THERMOTRANSPORT AND ELECTROTRANSPORT ON THE FAILURE OF THIN FILM METALLIZATIONS Annual Proceedings - Reliability Physics (Symposium). 234-241. |
1 |
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| 1983 |
Hummel RE, Matts-Goho S, DeHoff RT. New insights on the reversal of the site of electromigration failure in gold films doped with alkali Journal of Applied Physics. 54: 2855-2856. DOI: 10.1063/1.332278 |
1 |
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| 1983 |
Hummel RE. Differential reflectometry and its application to the study of alloys, ordering, corrosion, and surface properties Physica Status Solidi (a). 76: 11-44. DOI: 10.1002/pssa.2210760102 |
1 |
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| 1982 |
Urban FK, Hummel RE, Verink ED. Differential reflectometry of thin film metal oxides on copper, tungsten, molybdenum and chromium Corrosion Science. 22: 647-660. DOI: 10.1016/0010-938X(82)90045-2 |
1 |
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| 1981 |
Hummel RE, DeHoff RT, Matts-Goho S, Goho WM. Thermal grooving, thermotransport and electrotransport in doped and undoped thin gold films Thin Solid Films. 78: 1-14. DOI: 10.1016/0040-6090(81)90412-0 |
1 |
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| 1981 |
Hummel RE. Reflectivity of silver- and aluminium-based alloys for solar reflectors Solar Energy. 27: 449-455. DOI: 10.1016/0038-092X(81)90040-2 |
1 |
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| 1981 |
Hummel RE. Differential reflectometry of sputtered silver-aluminum films between 1.6 and 6.2 eV Optics Communications. 39: 55-58. DOI: 10.1016/0030-4018(81)90454-5 |
1 |
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| 1980 |
Andrews JB, Nastasi-Andrews RJ, Hummel RE. Optical investigations of short-range ordering of α-copper-aluminum alloys Physical Review B. 22: 1837-1842. DOI: 10.1103/PhysRevB.22.1837 |
1 |
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| 1980 |
Shanley CW, Hummel RE, Verink ED. Differential reflectometry of corrosion products of copper Corrosion Science. 20: 481-487. DOI: 10.1016/0010-938X(80)90065-7 |
1 |
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| 1980 |
Shanley CW, Hummel RE, Verink ED. Differential reflectometry-a new optical technique to study corrosion phenomena Corrosion Science. 20: 467-480. DOI: 10.1016/0010-938X(80)90064-5 |
1 |
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| 1978 |
Hummel RE, Krumeich BK, Dehoff RT. The effect of minor constituents on the electrotransport-induced failure site in thin gold films Applied Physics Letters. 33: 960-962. DOI: 10.1063/1.90217 |
1 |
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| 1978 |
Enderlein R, Hummel RE, Andrews JB, Nastasi‐Andrews RJ, Shanley CW. Interpretation of Compositional Modulation Spectra to Determine Some Optical Properties of Alloys Physica Status Solidi (B). 88: 173-178. DOI: 10.1002/pssb.2220880120 |
1 |
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| 1978 |
Hummel RE, Shanley CW, Verink ED. DIFFERENTIAL REFLECTOMETRY - A NEW OPTICAL TECHNIQUE FOR THE STUDY OF CORROSION PHENOMENA Corrosion '77 $-$ Int Corros Forum Devoted Exclusively to the Prot and Perform of Mater. |
1 |
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| 1977 |
Nastasi-Andrews RJ, Hummel RE. Optical properties and electronic structure of dilute Cu-Au, Cu-Zn, Cu-Al, Cu-Ga, Cu-Si, Cu-Ge, Cu-Sn, and Cu-As alloys Physical Review B. 16: 4314-4323. DOI: 10.1103/PhysRevB.16.4314 |
1 |
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| 1976 |
Hummel RE, Dehoff RT, Geier HJ. Activation energy for electrotransport in thin aluminum films by resistance measurements Journal of Physics and Chemistry of Solids. 37: 73-80. DOI: 10.1016/0022-3697(76)90183-9 |
1 |
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| 1975 |
Hummel RE, Dehoff RT. On the controversy about the direction of electrotransport in thin gold films Applied Physics Letters. 27: 64-66. DOI: 10.1063/1.88367 |
1 |
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| 1975 |
Hummel RE, Geier HJ. Activation energy for electrotransport in thin silver and gold films Thin Solid Films. 25: 335-342. DOI: 10.1016/0040-6090(75)90053-X |
1 |
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| 1973 |
Hummel RE, Andrews JB. Modulated reflectivity measurements on α-phase Cu-Zn, Cu-Al, Cu-Ga, and Cu-Ge alloys Physical Review B. 8: 2449-2453. DOI: 10.1103/PhysRevB.8.2449 |
1 |
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| 1973 |
Holbrook JA, Hummel RE. A "differential reflectometer" for measurements of small differences in reflectivity Review of Scientific Instruments. 44: 463-466. DOI: 10.1063/1.1686156 |
1 |
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| 1973 |
Hummel RE, Holbrook JA, Andrews JB. Compositional modulation of CuZn, CuAl and CuNi alloys Surface Science. 37: 717-729. DOI: 10.1016/0039-6028(73)90362-2 |
1 |
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| 1972 |
Breitling HM, Hummel RE. Electromigration in thin silver, copper, gold, indium, tin, lead and magnesium films Journal of Physics and Chemistry of Solids. 33. DOI: 10.1016/S0022-3697(72)80101-X |
1 |
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| 1972 |
Hummel RE. Observations on the electromigration in various thin films of group I-IV Thin Solid Films. 13: 175-178. DOI: 10.1016/0040-6090(72)90170-8 |
1 |
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| 1971 |
Hummel RE, Breitling RM. On the direction of electromigration in thin silver, gold, and copper films Applied Physics Letters. 18: 373-375. DOI: 10.1063/1.1653704 |
1 |
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| 1970 |
Hummel RE, Dove DB, Holbrook JA. Optical reflectivity measurements on alloys by compositional modulation Physical Review Letters. 25: 290-292. DOI: 10.1103/PhysRevLett.25.290 |
1 |
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