Minhwan Lee, Ph.D. - Publications
Affiliations: | 2007 | Stanford University, Palo Alto, CA |
Area:
Mechanical Engineering, Physical Chemistry, Materials Science EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2009 | Lee W, Lee M, Kim YB, Prinz FB. Reduction and oxidation of oxide ion conductors with conductive atomic force microscopy. Nanotechnology. 20: 445706. PMID 19809106 DOI: 10.1088/0957-4484/20/44/445706 | 0.498 | |||
2008 | Shen Y, Lee M, Lee W, Barnett DM, Pinsky PM, Prinz FB. A resolution study for electrostatic force microscopy on bimetallic samples using the boundary element method. Nanotechnology. 19: 035710. PMID 21817595 DOI: 10.1088/0957-4484/19/03/035710 | 0.52 | |||
2006 | Lee M, Lee W, Prinz FB. Geometric artefact suppressed surface potential measurements Nanotechnology. 17: 3728-3733. DOI: 10.1088/0957-4484/17/15/019 | 0.508 | |||
2004 | Lee M, O'Hayre R, Prinz FB, Gür TM. Electrochemical nanopatterning of Ag on solid-state ionic conductor RbAg 4l 5 using atomic force microscopy Applied Physics Letters. 85: 3552-3554. DOI: 10.1063/1.1807964 | 0.486 | |||
2004 | O’Hayre R, Lee M, Prinz FB. Ionic and electronic impedance imaging using atomic force microscopy Journal of Applied Physics. 95: 8382-8392. DOI: 10.1063/1.1737047 | 0.506 | |||
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