Juin J. Liou - Publications

Affiliations: 
University of Central Florida, Orlando, FL, United States 
Area:
Electronics and Electrical Engineering, Electricity and Magnetism Physics, Materials Science Engineering

158 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Yang Z, Yang Y, Yu N, Liou JJ. Improving ESD Protection Robustness Using SiGe Source/Drain Regions in Tunnel FET. Micromachines. 9. PMID 30545073 DOI: 10.3390/mi9120657  0.4
2016 Wei HP, Yeh KC, Liou JJ, Chen YM, Cheng CT. Estimating the risk of river flow under climate change in the Tsengwen River Basin Water (Switzerland). 8. DOI: 10.3390/w8030081  0.44
2016 Xi Y, Salcedo JA, Dong A, Liou JJ, Hajjar JJ. Robust Protection Device for Electrostatic Discharge/Electromagnetic Interference in Industrial Interface Applications Ieee Transactions On Device and Materials Reliability. 16: 263-265. DOI: 10.1109/TDMR.2016.2530701  0.64
2016 Miao M, Zhou Y, Salcedo JA, Hajjar JJ, Liou JJ. A New Method to Estimate Failure Temperatures of Semiconductor Devices under Electrostatic Discharge Stresses Ieee Electron Device Letters. DOI: 10.1109/LED.2016.2608328  0.64
2016 Huang X, Liou JJ, Liu Z, Liu F, Liu J, Cheng H. A New High Holding Voltage Dual-Direction SCR with Optimized Segmented Topology Ieee Electron Device Letters. 37: 1311-1313. DOI: 10.1109/LED.2016.2598063  0.64
2016 Deng W, Huang J, Ma X, Liou JJ, Yu F. A compact drain current model for heterostructure HEMTs including 2DEG density solution with two subbands Solid-State Electronics. 115: 54-59. DOI: 10.1016/j.sse.2015.10.005  0.48
2015 Liou JJ, Hsieh MT, Cherng JF, Chen HH. Cost reduction of system-level tests with stressed structural tests and SVM Ieee/Ifip International Conference On Vlsi and System-On-Chip, Vlsi-Soc. 2015: 177-182. DOI: 10.1109/VLSI-SoC.2015.7314412  1
2015 Wang TH, Chiu CW, Wu WC, Wang JW, Lin CY, Chiu CT, Liou JJ. Pseudo-multiple-exposure-based tone fusion with local region adjustment Ieee Transactions On Multimedia. 17: 470-484. DOI: 10.1109/TMM.2015.2403612  1
2015 Zhou Y, Miao M, Salcedo JA, Hajjar JJ, Liou JJ. Compact Thermal Failure Model for Devices Subject to Electrostatic Discharge Stresses Ieee Transactions On Electron Devices. 62: 4128-4134. DOI: 10.1109/TED.2015.2491223  0.64
2015 Zeng J, Dong S, Liou JJ, Han Y, Zhong L, Wang W. Design and analysis of an area-efficient high holding voltage ESD protection device Ieee Transactions On Electron Devices. 62: 606-614. DOI: 10.1109/TED.2014.2381511  0.6
2015 Liang H, Gu X, Dong S, Liou JJ. RC-Embedded LDMOS-SCR with High Holding Current for High-Voltage I/O ESD Protection Ieee Transactions On Device and Materials Reliability. 15: 495-499. DOI: 10.1109/TDMR.2015.2463120  0.6
2015 Wang Z, Klebanov M, Cooper RB, Liang W, Courtney S, Liou JJ. No-Snapback Silicon-Controlled Rectifier for Electrostatic Discharge Protection of High-Voltage ICs Ieee Electron Device Letters. 36: 1121-1123. DOI: 10.1109/LED.2015.2479612  0.44
2015 Deng W, Huang J, Ma X, Liou JJ. An explicit surface potential calculation and compact current model for AlGaN/GaN HEMTs Ieee Electron Device Letters. 36: 108-110. DOI: 10.1109/LED.2015.2388706  0.56
2015 Hsu TS, Chiu JL, Yu CK, Liou JJ. A fast and accurate network-on-chip timing simulator with a flit propagation model 20th Asia and South Pacific Design Automation Conference, Asp-Dac 2015. 797-802. DOI: 10.1109/ASPDAC.2015.7059108  1
2015 Chien HW, Lai JL, Wu CC, Huang CT, Hsu TS, Liou JJ. Design of a scalable many-core processor for embedded applications 20th Asia and South Pacific Design Automation Conference, Asp-Dac 2015. 24-25. DOI: 10.1109/ASPDAC.2015.7058928  1
2015 Luo S, Salcedo JA, Hajjar JJ, Zhou Y, Liou JJ. A new methodology for human metal model characterization 2015 Asia-Pacific International Symposium On Electromagnetic Compatibility, Apemc 2015. 329-332. DOI: 10.1109/APEMC.2015.7175272  0.56
2015 Jia Z, Xu JL, Wu X, Zhang MM, Liou JJ. A back-gated ferroelectric field-effect transistor with an Al-doped zinc oxide channel Chinese Physics Letters. 32. DOI: 10.1088/0256-307X/32/2/028501  0.56
2015 Wang W, Jin H, Guo W, Dong S, Liang W, Liou JJ, Han Y. Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28nm processing Microelectronics Reliability. DOI: 10.1016/j.microrel.2015.12.038  0.44
2015 Liou JJ, Lin CC, Lin CH. Editorial Microelectronics Reliability. 55: 2173. DOI: 10.1016/j.microrel.2015.09.033  0.32
2015 Xi Y, Salcedo JA, Zhou Y, Liou JJ, Hajjar JJ. Design and characterization of ESD solutions with EMC robustness for automotive applications Microelectronics Reliability. DOI: 10.1016/j.microrel.2015.09.018  0.64
2015 Gu K, Liou JJ, Li W, Liu Y, Li P. Total ionizing dose sensitivity of function blocks in FRAM Microelectronics Reliability. 55: 873-878. DOI: 10.1016/j.microrel.2015.03.001  0.6
2015 Cui Q, Liou JJ, Hajjar JJ, Salcedo J, Zhou Y, Parthasarathy S. On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits On-Chip Electro-Static Discharge (Esd) Protection For Radio-Frequency Integrated Circuits. 1-86. DOI: 10.1007/978-3-319-10819-3  0.6
2015 Chao YC, Li HC, Liou JJ, Chen YM. Flow simulation in Gaoping River using dynamical downscaling data Taiwan Water Conservancy. 63: 75-84.  0.4
2015 Li HC, Wei SP, Cheng CT, Liou JJ, Chen YM, Yeh KC. Applying risk analysis to the disaster impact of extreme typhoon events under climate change Journal of Disaster Research. 10: 513-526.  0.4
2014 Liou JJ, El-Wardany TI. Numerical investigation of lubricated deep rolling process in a complex roller path Advanced Materials Research. 966: 406-424. DOI: 10.4028/www.scientific.net/AMR.966-967.406  0.48
2014 Kimura N, Chiang S, Wei HP, Su YF, Chu JL, Cheng CT, Liou JJ, Chen YM, Lin LY. Tsengwen Reservoir watershed hydrological flood simulation under global climate change using the 20 km mesh Meteorological Research Institute atmospheric general circulation model (MRI-AGCM) Terrestrial, Atmospheric and Oceanic Sciences. 25: 449-461. DOI: 10.3319/TAO.2014.01.02.01(Hy)  0.44
2014 Jia Z, Xu J, Wu X, Zhang M, Zhang N, Liu J, Liu Z, Liou JJ. Metal-semiconductor-insulator-metal structure field-effect transistors based on zinc oxides and doped ferroelectric thin films Journal of British Studies. 1633. DOI: 10.1557/opl.2014.130  0.32
2014 Chang CL, Liou JJ, Hui HT, Chen CE. Modern phased arrays and their hybrid intelligent processing International Journal of Antennas and Propagation. 2014. DOI: 10.1155/2014/780324  0.68
2014 Wang SS, Ho JJ, Liou JJ, Ho JS, Hsu WC, Lu WH, Tsai SY, Hung HS, Wang KL. Performance improvements of selective emitters by laser openings on large-area multicrystalline Si solar cells International Journal of Photoenergy. 2014. DOI: 10.1155/2014/291904  0.32
2014 Chen CE, Liou JJ. New balanced linear transceiver designs for a MIMO interfering broadcast channel Ieee Wireless Communications and Networking Conference, Wcnc. 1298-1302. DOI: 10.1109/WCNC.2014.6952357  0.32
2014 Chiang JL, Liou JJ, Wei C, Cheng KS. A feature-space indicator Kriging approach for remote sensing image classification Ieee Transactions On Geoscience and Remote Sensing. 52: 4046-4055. DOI: 10.1109/TGRS.2013.2279118  0.44
2014 Ho CS, Chang SJ, Chen SC, Liou JJ, Li H. A reliable Si3N4/Al2O3-HfO 2 Stack MIM capacitor for high-voltage analog applications Ieee Transactions On Electron Devices. 61: 2944-2949. DOI: 10.1109/TED.2014.2332046  0.6
2014 Wang Z, Sun RC, Liou JJ, Liu DG. Optimized pmos-triggered bidirectional SCR for low-voltage esd protection applications Ieee Transactions On Electron Devices. 61: 2588-2594. DOI: 10.1109/TED.2014.2320827  0.64
2014 He L, Chiang TK, Liou JJ, Zheng W, Liu Z. A new analytical subthreshold potential/current model for quadruple-gate junctionless MOSFETs Ieee Transactions On Electron Devices. 61: 1972-1978. DOI: 10.1109/TED.2014.2318325  0.6
2014 Luo S, Salcedo JA, Parthasarathy S, Zhou Y, Hajjar JJ, Liou JJ. In situ ESD protection structure for variable operating voltage interface applications in 28-nm CMOS process Ieee Transactions On Device and Materials Reliability. 14: 1061-1067. DOI: 10.1109/TDMR.2014.2364719  0.84
2014 Xi Y, Malobabic S, Vashchenko V, Liou JJ. Miscorrelation between air gap discharge and human metal model stresses due to multi-finger turn-on effect Ieee Transactions On Device and Materials Reliability. 14: 864-868. DOI: 10.1109/TDMR.2014.2332432  0.6
2014 Luo S, Salcedo JA, Hajjar JJ, Zhou Y, Liou JJ. A novel product-level human metal model characterization methodology Ieee Transactions On Device and Materials Reliability. 14: 772-774. DOI: 10.1109/TDMR.2014.2311298  0.6
2014 Lai JY, Huang CT, Hsu TS, Liou JJ, Yeh TH, Cheng LC, Lu JM. Methodology of exploring ESL/RTL many-core platforms for developing embedded parallel applications International System On Chip Conference. 286-291. DOI: 10.1109/SOCC.2014.6948942  1
2014 Luo S, Salcedo JA, Hajjar JJ, Zhou Y, Liou JJ. ESD protection device with dual-polarity conduction and high blocking voltage realized in CMOS process Ieee Electron Device Letters. 35: 437-439. DOI: 10.1109/LED.2014.2305634  0.64
2014 Wang Z, Liou JJ. Evaluation of geometry layout and metal pattern to optimize ESD performance of silicon controlled rectifier (SCR) Ieee International Reliability Physics Symposium Proceedings. DOI: 10.1109/IRPS.2014.6861133  0.64
2014 Jia Z, Liu J, Liu Z, Liou JJ, Liu H, Yang W, Zhao J. A reliability-boosted ferroelectric random access memory with random-dynamic reference cells 2014 Ieee 6th International Memory Workshop, Imw 2014. DOI: 10.1109/IMW.2014.6849392  0.32
2014 Liang H, Huang L, Gu X, Cao H, Dong S, Liou JJ. Key factors affecting trigger voltage of SCRS for ESD protection Proceedings - 2014 Ieee 12th International Conference On Solid-State and Integrated Circuit Technology, Icsict 2014. DOI: 10.1109/ICSICT.2014.7021290  0.64
2014 Chiang JY, Kuo JH, Hsu TS, Liou JJ. Chip clustering with mutual information on multiple clock tests and its application to yield tuning 2014 32nd Ieee International Conference On Computer Design, Iccd 2014. 243-248. DOI: 10.1109/ICCD.2014.6974688  1
2014 Jia Z, Liu J, Tao Z, Liu Z, Liou JJ, Liu H, Yang W, Zhao J. High-speed and low-power FRAM with a bitline-segmental array 2014 Ieee International Conference On Electron Devices and Solid-State Circuits, Edssc 2014. DOI: 10.1109/EDSSC.2014.7061266  0.6
2014 Zhang G, Dong A, Liu N, Tian R, Yang X, Liu Z, Lee K, Lin HC, Liou JJ, Yuxin W. Failure analysis of Gate-all-around Nanowire Field Effect Transistor under TLP test 2014 Ieee International Conference On Electron Devices and Solid-State Circuits, Edssc 2014. DOI: 10.1109/EDSSC.2014.7061114  0.56
2014 Chen CE, Liou JJ. New min-max fairness MSE-based transceivers for multiple-input-multiple-output interfering broadcast channels 2014 Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, Apsipa 2014. DOI: 10.1109/APSIPA.2014.7041528  0.32
2014 Liu J, Liu Z, Jia Z, Liou JJ. A novel DTSCR with a variation lateral base doping structure to improve turn-on speed for ESD protection Journal of Semiconductors. 35. DOI: 10.1088/1674-4926/35/6/064010  0.84
2014 Jia Z, Zhang G, Liu J, Liu Z, Liou JJ. Reference voltage generation scheme enhancing speed and reliability for 1T1C-type FRAM Electronics Letters. 50: 154-156. DOI: 10.1049/el.2013.3193  0.6
2014 Cui Q, Parthasarathy S, Salcedo JA, Liou JJ, Hajjar JJ, Zhou Y. Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications Microelectronics Reliability. 54: 57-63. DOI: 10.1016/j.microrel.2013.09.021  0.6
2014 Liu W, Liou JJ. Characterization of nanowire devices under electrostatic discharge stress conditions Nanowire Field Effect Transistors: Principles and Applications. 2147483647: 129-151. DOI: 10.1007/978-1-4614-8124-9_6  0.6
2014 Su YF, Liou JJ, Cheng CT, Kitoh A. Assessment of the change of typhoon rainfall event characteristics using dynamic downscaling data under a climate change scenario Journal of Taiwan Agricultural Engineering. 60: 48-60.  0.44
2014 Wei SP, Li HC, Yeh KC, Yang SH, Liou JJ. Regional drainage characteristics and overflow prevention in a fish farm area Journal of Taiwan Agricultural Engineering. 60: 1-14.  0.4
2014 Aliaj B, Vashcheiiko VA, Liou JJ, Mitchell T. Overcoming multi finger turn-on in HV DIACs using local polv-ballasting Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2014.  0.56
2013 Chang CS, Leung CY, Liou JJ. Describing force patterns: a method for classifying sit-to-stand movement in elderly people. Perceptual and Motor Skills. 116: 163-74. PMID 23829143 DOI: 10.2466/10.25.26.PMS.116.1.163-174  0.92
2013 Liou JJ, Chang CS, Chan HC, Huang WH. Applying grey relational analysis in kansei engineering for cluster analysis in local cultural museum Proceedings of the 8th Iasted International Conference On Advances in Computer Science, Acs 2013. 460-466. DOI: 10.2316/P.2013.801-045  0.92
2013 Lai JY, Chen PY, Chen YH, Hsu TS, Huang CT, Liou JJ. Design of high-throughput inter-PE communication with application-level flow control protocol for many-core architectures Acm International Conference Proceeding Series. 41-44. DOI: 10.1145/2489068.2489074  1
2013 Li TY, Huang SY, Hsu HJ, Tzeng CW, Huang CT, Liou JJ, Ma HP, Huang PC, Bor JC, Tien CC, Wang CH, Wu CW. AC-plus scan methodology for small delay testing and characterization Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 21: 329-341. DOI: 10.1109/Tvlsi.2012.2187223  1
2013 Dong S, Miao M, Wu J, Zeng J, Liu Z, Liou JJ. Low-capacitance SCR structure for RF I/O application Ieee Transactions On Electromagnetic Compatibility. 55: 241-247. DOI: 10.1109/TEMC.2012.2216271  0.6
2013 Wang Z, Liou JJ, Cho KL, Chiu HC. Development of an electrostatic discharge protection solution in gan technology Ieee Electron Device Letters. 34: 1491-1493. DOI: 10.1109/LED.2013.2283865  0.68
2013 Cui Q, Salcedo JA, Parthasarathy S, Zhou Y, Liou JJ, Hajjar JJ. High-robustness and low-capacitance silicon-controlled rectifier for high-speed I/O ESD protection Ieee Electron Device Letters. 34: 178-180. DOI: 10.1109/LED.2012.2233708  0.68
2013 Liou JJ. Challenges of designing electrostatic discharge (ESD) protection in modern and emerging CMOS technologies Isne 2013 - Ieee International Symposium On Next-Generation Electronics 2013. 1-3. DOI: 10.1109/ISNE.2013.6512271  0.6
2013 Liou JJ. Challenges on designing electrostatic discharge protection solutions for low power electronics Proceedings of the International Symposium On Low Power Electronics and Design. 248. DOI: 10.1109/ISLPED.2013.6629303  0.6
2013 Cui Q, Liou JJ. Novel drain-less multi-gate pHEMT for electrostatic discharge (ESD) protection in GaAs technology Ieee International Reliability Physics Symposium Proceedings. DOI: 10.1109/IRPS.2013.6532073  0.6
2013 Liu Z, Dong A, Ji Z, Wang L, He L, Liang W, Miao J, Liou JJ. Evaluation of electrostatic discharge (ESD) characteristics for bottom contact organic thin film transistor 2013 Ieee International Conference of Electron Devices and Solid-State Circuits, Edssc 2013. DOI: 10.1109/EDSSC.2013.6628187  0.68
2013 Hsu SY, Hsu CH, Hsu TS, Liou JJ. A region-based framework for design feature identification of systematic process variations Proceedings of the Asian Test Symposium. 265-270. DOI: 10.1109/ATS.2013.56  1
2013 Huang NX, Han HR, Liao WT, Huang CH, Wang WC, Shiau MS, Cheng CH, Wu HC, Hsu HS, Liou JJ, Liao SS, Sun RC, Lu GB, Liu DG. Integrated amorphous-Si TFT circuits for gate drivers on LCD panels Proceedings of International Conference On Asic. DOI: 10.1109/ASICON.2013.6811951  0.68
2013 Jia Z, Wang L, Zhang N, Ren T, Liou JJ. Effects of anode materials on resistive characteristics of NiO thin films Applied Physics Letters. 102. DOI: 10.1063/1.4789523  0.68
2013 Dong S, Zhong L, Zeng J, Guo W, Li H, Wang J, Guo Z, Liou JJ. Study of graphene field-effect transistors under electrostatic discharge stresses Electronics Letters. 49: 1086-1087. DOI: 10.1049/el.2013.1865  0.68
2013 Cui Q, Zhang S, Liou JJ. Novel ESD protection solution for single-ended mixer in GaAs pHEMT technology Microelectronics Reliability. 53: 952-955. DOI: 10.1016/j.microrel.2013.03.013  0.6
2013 Ortiz-Conde A, García-Sánchez FJ, Muci J, Terán Barrios A, Liou JJ, Ho CS. Revisiting MOSFET threshold voltage extraction methods Microelectronics Reliability. 53: 90-104. DOI: 10.1016/j.microrel.2012.09.015  0.6
2013 Zhou Y, Ellis D, Hajjar JJ, Olney A, Liou JJ. VfTLP-VTH: A new method for quantifying the effectiveness of ESD protection for the CDM classification test Microelectronics Reliability. 53: 196-204. DOI: 10.1016/j.microrel.2012.04.011  0.68
2012 Chen YS, Chen SH, Liou JJ. Comparison of multispectral image processing techniques to brain MR Image classification Applied Mechanics and Materials. 182: 1998-2002. DOI: 10.4028/www.scientific.net/AMM.182-183.1998  0.92
2012 Liou JJ. Challenges of electrostatic discharge (ESD) protection in silicon nanowire technology 2012 28th International Conference On Microelectronics - Proceedings, Miel 2012. 11-13. DOI: 10.1109/MIEL.2012.6222788  0.6
2012 Malobabic S, Salcedo JA, Hajjar JJ, Liou JJ. NLDMOS ESD scaling under human metal model for 40-V mixed-signal applications Ieee Electron Device Letters. 33: 1595-1597. DOI: 10.1109/LED.2012.2213574  0.68
2012 Liu W, Liou JJ, Yeh HC, Wang H, Li Y, Yeo KS. Bidirectional diode-triggered silicon-controlled rectifiers for low-voltage ESD protection Ieee Electron Device Letters. 33: 1360-1362. DOI: 10.1109/LED.2012.2210384  0.68
2012 Dong S, Wu J, Miao M, Zeng J, Han Y, Liou JJ. High-holding-voltage silicon-controlled rectifier for ESD applications Ieee Electron Device Letters. 33: 1345-1347. DOI: 10.1109/LED.2012.2208934  0.68
2012 Miao M, Dong S, Wu J, Zeng J, Liou JJ, Ma F, Li H, Han Y. Minimizing multiple triggering effect in diode-triggered silicon-controlled rectifiers for ESD protection applications Ieee Electron Device Letters. 33: 893-895. DOI: 10.1109/LED.2012.2191930  0.68
2012 Salcedo JA, Hajjar JJ, Malobabic S, Liou JJ. Bidirectional devices for automotive-grade electrostatic discharge applications Ieee Electron Device Letters. 33: 860-862. DOI: 10.1109/LED.2012.2190261  0.68
2012 Dong S, Jin H, Miao M, Wu J, Liou JJ. Novel capacitance coupling complementary dual-direction SCR for high-voltage ESD Ieee Electron Device Letters. 33: 640-642. DOI: 10.1109/LED.2012.2188015  0.32
2012 Liou JJ, Cui Q. Novel Electrostatic Discharge (ESD) protection solution in GaAs pHEMT technology Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. DOI: 10.1109/IPFA.2012.6306333  0.6
2012 Liu Z, He J, Liou JJ, Liu J, Miao M, Dong S. Segmented SCR for high voltage ESD protection Icsict 2012 - 2012 Ieee 11th International Conference On Solid-State and Integrated Circuit Technology, Proceedings. DOI: 10.1109/ICSICT.2012.6467917  0.68
2012 Cui Q, Zhang S, Zhao Y, Hou B, Liou JJ. A novel electrostatic discharge (ESD) protection circuit in D-mode pHEMT technology Technical Digest - Ieee Compound Semiconductor Integrated Circuit Symposium, Csic. DOI: 10.1109/CSICS.2012.6340079  0.32
2012 Kuo JH, Hsu TS, Liou JJ. Test cost reduction for performance yield recovery by classification of multiple-clock test data Proceedings of the Asian Test Symposium. 320-325. DOI: 10.1109/ATS.2012.54  1
2012 Gao M, Lisherness P, Cheng KT, Liou JJ. On error modeling of electrical bugs for post-silicon timing validation Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 701-706. DOI: 10.1109/ASPDAC.2012.6165046  1
2012 Wu CF, Liou JJ, Lin JL. Evaluation of visual performance using LED signboards under different ambient conditions Procedia Engineering. 29: 975-980. DOI: 10.1016/j.proeng.2012.01.074  0.92
2012 Wu YC, Hou JC, Liou JJ, Su YF, Cheng KS. Assessing the impact of climate change on basin-average annual typhoon rainfalls with consideration of multisite correlation Paddy and Water Environment. 10: 103-112. DOI: 10.1007/s10333-011-0271-5  0.44
2012 Chu HJ, Pan TY, Liou JJ. Change-point detection of long-duration extreme precipitation and the effect on hydrologic design: A case study of south Taiwan Stochastic Environmental Research and Risk Assessment. 26: 1123-1130. DOI: 10.1007/s00477-012-0566-0  0.44
2012 Wu YC, Liou JJ, Su YF, Cheng KS. Establishing acceptance regions for L-moments based goodness-of-fit tests for the Pearson type III distribution Stochastic Environmental Research and Risk Assessment. 26: 873-885. DOI: 10.1007/s00477-011-0519-z  0.44
2012 Lai JY, Chen PY, Hsu TS, Huang CT, Liou JJ. Design and analysis of a many-core processor architecture for multimedia applications 2012 Conference Handbook - Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, Apsipa Asc 2012 1
2011 Chen BS, Hsu CY, Liou JJ. Robust design of biological circuits: evolutionary systems biology approach. Journal of Biomedicine & Biotechnology. 2011: 304236. PMID 22187523 DOI: 10.1155/2011/304236  1
2011 Chu HJ, Pan TY, Liou JJ. Extreme precipitation estimation with Typhoon Morakot using frequency and spatial analysis Terrestrial, Atmospheric and Oceanic Sciences. 22: 549-558. DOI: 10.3319/TAO.2011.05.10.02(TM)  0.44
2011 Liu W, Liou JJ, Singh N, Lo GQ, Chung J, Jeong YH. Electrostatic discharge (ESD) protection challenges of gate-all-around nanowire field-effect transistors Ecs Transactions. 34: 55-60. DOI: 10.1149/1.3567559  0.68
2011 Yu LE, Shin C, Paik S, Liou JJ, Shin Y. Sampling correlation sources for timing yield analysis of sequential circuits with clock networks Journal of Circuits, Systems and Computers. 20: 1547-1569. DOI: 10.1142/S0218126611008043  0.72
2011 Cui Q, Cheng CS, Liou JJ, Chiu HC. Development of a new pHEMT-based electrostatic discharge protection structure Ieee Transactions On Electron Devices. 58: 2974-2980. DOI: 10.1109/TED.2011.2152843  0.6
2011 Malobabic S, Salcedo JA, Righter AW, Hajjar JJ, Liou JJ. Correlation of human metal model and transmission line pulsing testing Ieee Electron Device Letters. 32: 1200-1202. DOI: 10.1109/LED.2011.2160141  0.6
2011 Liu W, Liou JJ, Kuribara K, Fukuda K, Sekitani T, Someya T, Chung J, Jeong YH, Wang Z, Lin CL. Study of organic thin-film transistors under electrostatic discharge stresses Ieee Electron Device Letters. 32: 967-969. DOI: 10.1109/LED.2011.2142411  0.68
2011 Liou JJ, Liu W, Kuribara K, Fukuda K, Sekitani T, Someya T, Luo S. Investigation of organic thin-film transistors for electrostatic discharge applications Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. DOI: 10.1109/IPFA.2011.5992795  0.68
2011 Liu W, Liou JJ, Singh N, Lo GQ, Chung J, Jeong YH. Characterization and failure analysis of Sub-10 nm diameter, gate-all-around nanowire field-effect transistors subject to electrostatic discharge (ESD) Proceedings - International Nanoelectronics Conference, Inec. DOI: 10.1109/INEC.2011.5991616  0.68
2011 Jin H, Dong SR, Miao M, Wu J, Ma F, Luo JK, Liou JJ. Whole chip ESD protection for 2.4 GHz LNA 2011 Ieee International Conference of Electron Devices and Solid-State Circuits, Edssc 2011. DOI: 10.1109/EDSSC.2011.6117571  0.68
2011 Chen SH, Lin HM, Hsieh CC, Huang CT, Liou JJ, Chung YC. TurboVG: A HW/SW co-designed multi-core OpenVG accelerator for vector graphics applications with embedded power profiler Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 97-98. DOI: 10.1109/ASPDAC.2011.5722315  0.72
2011 Liou JJ, Chen YY, Chen CC, Chien CY, Wu KL. Diagnosis-assisted supply voltage configuration to increase performance yield of cell-based designs Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 279-284. DOI: 10.1109/ASPDAC.2011.5722198  1
2011 Liou JJ, Chang J, Cao GB, Chang G, Feng C. Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology Proceedings of International Conference On Asic. 256-258. DOI: 10.1109/ASICON.2011.6157170  0.68
2011 García-Sánchez FJ, Latorre-Rey AD, Liu W, Chen WC, Lin HC, Liou JJ, Muci J, Ortiz-Conde A. A continuous semi-empiric transfer characteristics model for surrounding gate undoped polysilicon nanowire MOSFETs Solid-State Electronics. 63: 22-26. DOI: 10.1016/j.sse.2011.05.004  0.68
2011 Liu X, Yuan JS, Liou JJ. Thermal reliability of VCO using InGaP/GaAs HBTs Microelectronics Reliability. 51: 2147-2152. DOI: 10.1016/j.microrel.2011.07.019  0.56
2011 Chiu HC, Cheng CS, Kao HL, Fu JS, Cui Q, Liou JJ. A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology Microelectronics Reliability. 51: 2137-2142. DOI: 10.1016/j.microrel.2011.07.007  0.32
2011 Aliaj B, Vashchenko VA, Shibkov A, Liou JJ. Self-protection capability of integrated NLDMOS power arrays in ESD pulse regimes Microelectronics Reliability. 51: 2015-2030. DOI: 10.1016/j.microrel.2011.05.017  0.84
2011 Chang MK, Liou JJ, Chen ML. T-S fuzzy model-based tracking control of a one-dimensional manipulator actuated by pneumatic artificial muscles Control Engineering Practice. 19: 1442-1449. DOI: 10.1016/j.conengprac.2011.08.002  0.92
2011 Liou JJ, Su YF, Chiang JL, Cheng KS. Gamma random field simulation by a covariance matrix transformation method Stochastic Environmental Research and Risk Assessment. 25: 235-251. DOI: 10.1007/s00477-010-0434-8  0.44
2011 Cheng KS, Hou JC, Liou JJ, Wu YC, Chiang JL. Stochastic simulation of bivariate gamma distribution: A frequency-factor based approach Stochastic Environmental Research and Risk Assessment. 25: 107-122. DOI: 10.1007/s00477-010-0427-7  0.44
2011 Chang CS, Leung CY, Liou JJ. PC-based warning mechanism system of fall risk in elderly Communications in Computer and Information Science. 174: 8-12. DOI: 10.1007/978-3-642-22095-1_2  0.92
2011 Liou JJ, Huang LL, Wu CF, Yeh CL, Chen YH. A study of vision ergonomic of LED display signs on different environment illuminance Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 6781: 53-62. DOI: 10.1007/978-3-642-21741-8_7  0.92
2011 Pan TY, Liou JJ, Su SK, Chu HJ. Radar rainfall mapping and hydrologic modeling for flood inundation in Linbain River basin, Taiwan 32nd Asian Conference On Remote Sensing 2011, Acrs 2011. 1: 638-643.  0.44
2011 Li CF, Lee CY, Wang CH, Chang SL, Denq LM, Chi CC, Hsu HJ, Chu MY, Liou JJ, Huang SY, Huang PC, Ma HP, Bor JC, Wu CW, Tien CC, et al. A low-cost wireless interface with no external antenna and crystal oscillator for Cm-range contactless testing Proceedings - Design Automation Conference. 771-776.  1
2010 Chang CS, Leung CY, Liou JJ, Tsai WW. Evaluation of key points in the sit-to-stand movement using two force platforms. Perceptual and Motor Skills. 111: 496-502. PMID 21162451 DOI: 10.2466/10.15.26.PMS.111.5.496-502  0.92
2010 Ho JJ, Cheng YT, Lee W, Tsai SY, Chen LY, Liou JJ, Chang SH, Shen H, Wang KL. Efficiency improved by H2 forming gas treatment for Si-based solar cell applications International Journal of Photoenergy. 2010. DOI: 10.1155/2010/634162  0.32
2010 Ho JJ, Cheng YT, Lee WJ, Tsai SY, Lu YA, Liou JJ, Chang SH, Wang KL. Investigation of low-cost surface processing techniques for large-size multicrystalline silicon solar cells International Journal of Photoenergy. 2010. DOI: 10.1155/2010/268035  0.32
2010 Liu W, Liou JJ, Jiang Y, Singh N, Lo GQ, Chung J, Jeong YH. Investigation of sub-10-nm diameter, gate-all-around nanowire field-effect transistors for electrostatic discharge applications Ieee Transactions On Nanotechnology. 9: 352-354. DOI: 10.1109/TNANO.2009.2038225  0.6
2010 Li Y, Liou JJ. Evaluation of transient behavior of polysilicon-bound diode for fast ESD applications Ieee Transactions On Electron Devices. 57: 2736-2743. DOI: 10.1109/TED.2010.2063032  0.68
2010 Malobabic S, Salcedo JA, Hajjar JJ, Liou JJ. Analysis of safe operating area of NLDMOS and PLDMOS transistors subject to transient stresses Ieee Transactions On Electron Devices. 57: 2655-2663. DOI: 10.1109/TED.2010.2058310  0.68
2010 Ellis DF, Zhou Y, Salcedo JA, Hajjar JJ, Liou JJ. Prediction and modeling of thin gate oxide breakdown subject to arbitrary transient stresses Ieee Transactions On Electron Devices. 57: 2296-2305. DOI: 10.1109/TED.2010.2053864  0.68
2010 Li Y, Liou JJ, Vinson JE, Zhang L. Investigation of LOCOS- and polysilicon-bound diodes for robust electrostatic discharge (ESD) applications Ieee Transactions On Electron Devices. 57: 814-819. DOI: 10.1109/Ted.2009.2039964  0.68
2010 Lin CH, Hsu SP, Liou JJ, Chuang CP, Lu WH, Chang WL. Characterization of selective-emitter solar cells consists of laser opened window and subsequently screen-printed electrodes Conference Record of the Ieee Photovoltaic Specialists Conference. 3523-3526. DOI: 10.1109/PVSC.2010.5614037  0.32
2010 Yang CY, Chen YY, Chen SY, Liou JJ. Automatic test wrapper synthesis for a wireless ATE platform Ieee Design and Test of Computers. 27: 31-41. DOI: 10.1109/Mdt.2010.59  1
2010 Li M, Dong S, Liou JJ, Song B, Han Y. A novel capacitance-coupling-triggered SCR for low-voltage ESD protection applications Ieee Electron Device Letters. 31: 1089-1091. DOI: 10.1109/LED.2010.2058844  0.68
2010 Liu W, Liou JJ, Jiang Y, Singh N, Lo GQ, Chung J, Jeong YH. Failure analysis of si nanowire field-effect transistors subject to electrostatic discharge stresses Ieee Electron Device Letters. 31: 915-917. DOI: 10.1109/LED.2010.2052911  0.68
2010 Liu Z, Liou JJ, Dong S, Han Y. Silicon-controlled rectifier stacking structure for high-voltage ESD protection applications Ieee Electron Device Letters. 31: 845-847. DOI: 10.1109/LED.2010.2050575  0.6
2010 Cui Q, Parthasarathy S, Salcedo JA, Liou JJ, Hajjar JJ, Zhou Y. Snapback and postsnapback saturation of pseudomorphic high-electron mobility transistor subject to transient overstress Ieee Electron Device Letters. 31: 425-427. DOI: 10.1109/LED.2010.2042029  0.6
2010 Huo MX, Han Y, Li Y, Song B, Liou JJ, Dong SR, Ding KB, Guo W, Huang D, Li M, Ma F, Miao M. Study of turn-on characteristics of SCRs for ESD protection with TDR-O and TDR-S TLPs Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. DOI: 10.1109/IPFA.2010.5532309  0.32
2010 Li Y, Liou JJ, Liu W. Characterization of transient behavior and failure mechanism of polysilicon-bound diode under CDM-like very-fast transmission line pulsing Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. DOI: 10.1109/IPFA.2010.5532079  0.32
2010 Song B, Han Y, Li M, Liou JJ, Dong S, Guo W, Huang D, Ma F, Miao M. Design analysis of novel substrate-triggered GGNMOS in 65nm CMOS process Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. DOI: 10.1109/IPFA.2010.5532074  0.68
2010 Liu W, Liou JJ, Li Y, Chung J, Jeong YH. Evaluation of nanowire field-effect transistors for electrostatic discharge (ESD) applications Proceedings of the International Symposium On the Physical and Failure Analysis of Integrated Circuits, Ipfa. DOI: 10.1109/IPFA.2010.5532007  0.68
2010 Liou JJ, Jiang C, Guang-Biao C, Gung C, Chia F. Electrostatic discharge (ESD): A spoiler to development of next-generation technologies? 2010 Ieee International Conference of Electron Devices and Solid-State Circuits, Edssc 2010. DOI: 10.1109/EDSSC.2010.5713681  0.32
2010 Li TY, Huang SY, Hsu HJ, Tzeng CW, Huang CT, Liou JJ, Ma HP, Huang PC, Bor JC, Wu CW, Tien CC, Wang M. AF-test: Adaptive-frequency scan test methodology for small-delay defects Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 340-348. DOI: 10.1109/DFT.2010.48  0.72
2010 Ho JJ, Cheng YT, Liou JJ, Lin CH, Dimitrov DZ, Hsu A, Tsai SY, Wang CK, Lee W, Wang KL. Advanced selective emitter structures by laser opening technique for industrial mc-Si solar cells Electronics Letters. 46: 1559-1561. DOI: 10.1049/El.2010.2471  0.32
2010 Li Y, Liou JJ. Multiple-finger turn-on uniformity in silicon-controlled rectifiers Solid-State Electronics. 54: 1641-1643. DOI: 10.1016/j.sse.2010.07.017  0.68
2010 Ortiz-Conde A, Latorre Rey AD, Liu W, Chen WC, Lin HC, Liou JJ, Muci J, García-Sánchez FJ. Parameter extraction in polysilicon nanowire MOSFETs using new double integration-based procedure Solid-State Electronics. 54: 635-641. DOI: 10.1016/j.sse.2010.01.011  0.68
2010 Liu X, Yuan Js, Liou JJ. Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance Microelectronics Reliability. 50: 365-369. DOI: 10.1016/j.microrel.2009.12.007  0.56
2010 Ortiz-Conde A, García-Sánchez FJ, Liou JJ, Ho CS. Integration-based approach to evaluate the sub-threshold slope of MOSFETs Microelectronics Reliability. 50: 312-315. DOI: 10.1016/j.microrel.2009.11.001  0.68
2010 Malobabic S, Salcedo JA, Righter AW, Hajjar JJ, Liou JJ. A new ESD design methodology for high voltage DMOS applications Electrical Overstress/Electrostatic Discharge Symposium Proceedings 0.68
2010 Zhou Y, Hajjar JJ, Ellis DF, Olney AH, Liou JJ. A new method to evaluate effectiveness of CDM ESD protection Electrical Overstress/Electrostatic Discharge Symposium Proceedings 0.68
2010 Aliaj B, Vashchenko V, Lindorfer P, Tcherniaev A, Ershov M, Liou JJ, Hopper P. Study of power arrays in ESD operation regimes Electrical Overstress/Electrostatic Discharge Symposium Proceedings 0.68
2010 Liou JJ, Wu CF, Lin CL. Development of safety the arm training system based on artificial pneumatic muscles via computer technologies Proceedings - Apchi-Ergofuture 2010. 397-401.  0.92
2010 Muci J, Latorre Rey AD, García-Sánchez FJ, Lugo Muñoz DC, Ortiz-Conde A, Ho CS, Liou JJ, Pavanello MA, Doria RT. Extraction of mobility degradation and source-and-drain resistance in MOSFETs Journal of Integrated Circuits and Systems. 5: 103-109.  0.68
2010 Ho WJ, Liou JJ, Chen CJ. Characterization of InP based SAGCM avalanche photodetector for single photon fiber optic communications Progress in Electromagnetics Research Symposium. 2: 1574-1578.  0.32
2009 García-Sánchez FJ, Muci J, Muñoz DCL, Rey ADL, Ortiz-Conde A, Ho CS, Liou JJ. Extraction of MOSFET model parameters from the measured source-to-drain resistance Ecs Transactions. 23: 353-360. DOI: 10.1149/1.3183739  0.68
2009 Tzeng CW, Lin CY, Huang SY, Huang CT, Liou JJ, Ma HP, Huang PC, Wu CW. iScan: Indirect-access scan test over HOY test platform 2009 International Symposium On Vlsi Design, Automation and Test, Vlsi-Dat '09. 60-63. DOI: 10.1109/VDAT.2009.5158095  1
2009 Yu LE, Shin C, Liou JJ, Shin Y. Timing yield estimation with clock network correlations by propagating discrete probability distributions 2009 Ieee International Conference On Integrated Circuit Design and Technology, Icicdt 2009. 63-66. DOI: 10.1109/ICICDT.2009.5166266  1
2009 Yeh WK, Wang CC, Hsu CW, Fang YK, Wu SM, Ou CC, Lin CL, Gan KJ, Weng CJ, Chen PY, Yuan JS, Liou JJ. Impact of oxide trap charge on performance of strained fully depleted SOI metal-gate MOSFET 2009 Ieee International Conference On Electron Devices and Solid-State Circuits, Edssc 2009. 197-200. DOI: 10.1109/EDSSC.2009.5394288  0.68
2009 Chen SY, Chen YY, Yang CY, Liou JJ. Multiple-core under test architecture for wireless testing platform Proceedings of the Asian Test Symposium. 275-280. DOI: 10.1109/ATS.2009.43  1
2009 Chen YY, Liou JJ. A non-intrusive and accurate inspection method for segment delay variabilities Proceedings of the Asian Test Symposium. 343-348. DOI: 10.1109/ATS.2009.32  1
2009 Hsu CW, Liao JL, Yeh JC, Chen JJ, Huang SY, Liou JJ. Memory-aware power modeling for PAC DSP core 2009 1st Asia Symposium On Quality Electronic Design, Asqed 2009. 319-324. DOI: 10.1109/ASQED.2009.5206396  1
2009 Cheng KS, Hou JC, Wu YC, Liou JJ. Assessing the impact of climate change on annual typhoon rainfall-a stochastic simulation approach Paddy and Water Environment. 7: 333-340. DOI: 10.1007/s10333-009-0183-9  0.44
2009 Wu CF, Liou JJ. PC-based rehabilitation system with biofeedback Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 5624: 204-211. DOI: 10.1007/978-3-642-02731-4_24  0.92
2009 Liou JJ, Malobabic S, Ellis DF, Salcedo JA, Hajjar JJ, Zhou Y. Transient safe operating area (TSOA) Definition for ESD applications Electrical Overstress/Electrostatic Discharge Symposium Proceedings 0.6
2009 Aliaj B, Vashchenko V, Cui Q, Liou JJ, Tcherniaev A, Ershov M, LaFonteese D. 2.5-dimensional simulation for analyzing power arrays subject to ESD stresses Electrical Overstress/Electrostatic Discharge Symposium Proceedings 0.68
2006 Lu SY, Hsieh PY, Liou JJ. Exploring linear structures of critical path delay faults to reduce test efforts Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 100-106. DOI: 10.1109/ICCAD.2006.320072  1
2002 Liou JJ, Wang LC, Cheng KT, Dworak J, Mercer MR, Kapur R, Williams TW. Analysis of delay test effectiveness with a multiple-clock scheme Ieee International Test Conference (Tc). 407-416. DOI: 10.1109/TEST.2002.1041786  1
1990 Liou JJ, Lin LY, Juane RF, Chang NC, Tsai WC, Hu ST. [Cloning and sequencing of hemolysin gene from clinical Aeromonas hydrophila]. Zhonghua Minguo Wei Sheng Wu Ji Mian Yi Xue Za Zhi = Chinese Journal of Microbiology and Immunology. 23: 134-46. PMID 2394188  0.4
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