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Zhi Cui, Ph.D. - Publications

Affiliations: 
2005 University of Central Florida, Orlando, FL, United States 
Area:
Electronics and Electrical Engineering
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2006 Cui Z, Liou JJ, Yue Y, Wong H. A new approach to characterize and predict lifetime of deep-submicron nMOS devices International Journal of High Speed Electronics and Systems. 16: 315-323. DOI: 10.1142/S0129156406003667  0.595
2005 Cui Z, Liou JJ. A spice-like reliability model for deep-submicron CMOS technology Solid-State Electronics. 49: 1702-1707. DOI: 10.1016/J.Sse.2005.09.003  0.548
2005 Cui Z, Liou JJ, Yue Y, Wong H. Substrate current, gate current and lifetime prediction of deep-submicron nMOS devices Solid-State Electronics. 49: 505-511. DOI: 10.1016/J.Sse.2004.11.020  0.585
2003 Cui Z, Liou JJ, Yue Y. A new extrapolation method for long-term degradation prediction of deep-submicron MOSFETs Ieee Transactions On Electron Devices. 50: 1398-1401. DOI: 10.1109/Ted.2003.813473  0.531
2003 Cui Z, Liou JJ, Yue Y, Vinson J. Empirical reliability modeling for 0.18-μm MOS devices Solid-State Electronics. 47: 1515-1522. DOI: 10.1016/S0038-1101(03)00006-6  0.563
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