| Year |
Citation |
Score |
| 2019 |
Takano H, Hashimoto K, Nagatani Y, Irwin J, Omlor L, Kumar A, Tkachuk A, Wu Y, Momose A. Improvement in quantitative phase mapping by a hard x-ray microscope equipped with a Lau interferometer Optica. 6: 1012. DOI: 10.1364/OPTICA.6.001012 |
0.318 |
|
| 2015 |
Sorrentino A, Nicolás J, Valcárcel R, Chichón FJ, Rosanes M, Avila J, Tkachuk A, Irwin J, Ferrer S, Pereiro E. MISTRAL: a transmission soft X-ray microscopy beamline for cryo nano-tomography of biological samples and magnetic domains imaging. Journal of Synchrotron Radiation. 22: 1112-7. PMID 26134819 DOI: 10.1107/S1600577515008632 |
0.316 |
|
| 2012 |
Wang J, Karen Chen Y, Yuan Q, Tkachuk A, Erdonmez C, Hornberger B, Feser M. Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution Applied Physics Letters. 100: 143107. DOI: 10.1063/1.3701579 |
0.342 |
|
| 2010 |
Izzo JR, Joshi AS, Grew KN, Chiu WKS, Tkachuk A, Wang SH, Yun W. Erratum: Nondestructive Reconstruction and Analysis of Solid Oxide Fuel Cell Anodes Using X-Ray Computed Tomography at Sub-50 nm Resolution [J. Electrochem. Soc., 155, B504 (2008)] Journal of the Electrochemical Society. 157: S5. DOI: 10.1149/1.3271150 |
0.315 |
|
| 2009 |
Andrews JC, Brennan S, Pianetta P, Ishii H, Gelb J, Feser M, Rudati J, Tkachuk A, Yun W. Full-field transmission X-ray microscopy at SSRL Journal of Physics: Conference Series. 186. DOI: 10.1088/1742-6596/186/1/012002 |
0.339 |
|
| 2008 |
Tian Y, Li W, Chen J, Liu L, Liu G, Tkachuk A, Tian J, Xiong Y, Gelb J, Hsu G, Yun W. High resolution hard x-ray microscope on a second generation synchrotron source. The Review of Scientific Instruments. 79: 103708. PMID 19044720 DOI: 10.1063/1.3002484 |
0.383 |
|
| 2008 |
Zeng X, Duewer F, Feser M, Huang C, Lyon A, Tkachuk A, Yun W. Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes. Applied Optics. 47: 2376-81. PMID 18449303 DOI: 10.1364/Ao.47.002376 |
0.41 |
|
| 2008 |
Pianetta P, Andrews J, Brennan S, Almeida E, van der Meulen M, Tkachuk A, Gelb J, Rudati J, Feser M, Yun W. F-12 Invited—A High Resolution Hard X-ray Bioimaging Facility At SSRL Powder Diffraction. 23: 177-177. DOI: 10.1154/1.2951692 |
0.309 |
|
| 2008 |
Tkachuk A, Feser M, Duewer F, Gelb J, Hsu G, Wang S, Yun W. C-12 Invited—Hard X-ray Full Field 3D Imaging with sub-50 nm Resolution Powder Diffraction. 23: 173-173. DOI: 10.1154/1.2951645 |
0.3 |
|
| 2008 |
Izzo JR, Joshi AS, Grew KN, Chiu WKS, Tkachuk A, Wang SH, Yun W. Nondestructive Reconstruction and Analysis of SOFC Anodes Using X-ray Computed Tomography at Sub-50 nm Resolution Journal of the Electrochemical Society. 155: B504. DOI: 10.1149/1.2895067 |
0.333 |
|
| 2008 |
Feser M, Gelb J, Chang H, Cui H, Duewer F, Lau SH, Tkachuk A, Yun W. Sub-micron resolution CT for failure analysis and process development Measurement Science and Technology. 19. DOI: 10.1088/0957-0233/19/9/094001 |
0.354 |
|
| 2007 |
Tkachuk A, Duewer F, Cui H, Feser M, Wang S, Yun W. X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source Zeitschrift FüR Kristallographie - Crystalline Materials. 222. DOI: 10.1524/Zkri.2007.222.11.650 |
0.387 |
|
| 2007 |
Tkachuk A, Cui H, Chen H, Duewer F, Feser M, Lau S, Yun W. Multi-length Scale X-ray Tomography using Laboratory and Synchrotron Sources Microscopy and Microanalysis. 13. DOI: 10.1017/S143192760707208X |
0.322 |
|
| 2004 |
Tolmachev YV, Menzel A, Tkachuk AV, Chu YS, You H. In Situ Surface X-Ray Scattering Observation of Long-Range Ordered ( 19 × 19 )R23.4°-13CO Structure on Pt(111) in Aqueous Electrolytes Electrochemical and Solid-State Letters. 7: E23. DOI: 10.1149/1.1645354 |
0.364 |
|
| 2004 |
Chu YS, Tkachuk A, Lai B, Hu ZW, Menzel A, You H. Application of Full-Field X-ray Diffraction Microscopy in Biological and Material Science Microscopy and Microanalysis. 10: 1038-1039. DOI: 10.1017/S1431927604886070 |
0.344 |
|
| 2004 |
Vogt S, Chu YS, Tkachuk A, Ilinski P, Walko DA, Tsui F. Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam Applied Surface Science. 223: 214-219. DOI: 10.1016/S0169-4332(03)00895-X |
0.379 |
|
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