Dong-Joo Kim, Ph.D. - Publications

Affiliations: 
2001 North Carolina State University, Raleigh, NC 
Area:
Materials Science Engineering

76 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2022 Cha YL, Jo JH, Kim DJ, Kim SH. Electrically Tunable Solution-Processed Transparent Conductive Thin Films Based on Colloidally Dispersed ITO@Ag Composite Ink. Nanomaterials (Basel, Switzerland). 12. PMID 35745397 DOI: 10.3390/nano12122060  0.346
2020 Ko J, Cho DH, Kim D, Yoon YS. Suppression of formation of lithium dendrite via surface modification by 2-D lithium phosphorous oxynitride as a highly stable anode for metal lithium batteries Journal of Alloys and Compounds. 845: 156280. DOI: 10.1016/J.Jallcom.2020.156280  0.476
2019 Lee E, VahidMohammadi A, Yoon YS, Beidaghi M, Kim DJ. Two-Dimensional Vanadium Carbide MXene for Gas Sensors with Ultrahigh Sensitivity Toward Nonpolar Gases. Acs Sensors. PMID 31244007 DOI: 10.1021/Acssensors.9B00303  0.308
2017 Yapabandara K, Mirkhani V, Sultan MS, Ozden B, Khanal MP, Park M, Wang S, Hamilton MC, Chung Y, Kim D, Sk MH. Study of device instability of bottom-gate ZnO transistors with sol–gel derived channel layers Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35: 9. DOI: 10.1116/1.4979321  0.372
2016 Chung Y, Park H, Lee E, Kim S, Kim D. Communication—Gas Sensing Behaviors of Electrophoretically Deposited Nickel Oxide Films from Morphologically Tailored Particles Journal of the Electrochemical Society. 163. DOI: 10.1149/2.0751613Jes  0.414
2016 Won SS, Lee J, Venugopal V, Kim D, Lee J, Kim IW, Kingon AI, Kim S. Lead-free Mn-doped (K0.5,Na0.5)NbO3 piezoelectric thin films for MEMS-based vibrational energy harvester applications Applied Physics Letters. 108: 232908. DOI: 10.1063/1.4953623  0.634
2015 Chung Y, Park H, Kim DJ, Cho SB, Yoon YS. Growth and dielectric properties of ZnO nanoparticles deposited by using electrophoretic deposition Journal of the Korean Physical Society. 66: 1359-1363. DOI: 10.3938/Jkps.66.1359  0.377
2015 Chung Y, Park H, Lee E, Lee S, Kim D. Gas Sensing Properties of Hierarchically Structured Zinc Oxide Films by Electrophoretic Deposition Ecs Transactions. 69: 17-22. DOI: 10.1149/06937.0017ECST  0.33
2015 Chung Y, Park H, Lee E, Lee S, Kim D. Gas Sensing Behaviors of Hierarchically Structured Nickel Oxide Film by Electrophoretic Deposition Ecs Transactions. 66: 53-58. DOI: 10.1149/06638.0053ecst  0.313
2014 Tong F, Chung Y, Goswami J, Davis V, Hamilton M, Kim DJ, Koo H, Lee KK, Park M. Surface plasmon resonance properties of DC magnetron sputtered Ag nanoislands on ITO-glass and In2O3-PET substrates Electronics Letters. 50: 623-624. DOI: 10.1049/El.2014.0442  0.382
2014 Park H, Ahn H, Chung Y, Cho SB, Yoon YS, Kim D. Transition of gas sensing behavior in non-reduced graphene oxides with thermal annealing Materials Letters. 136: 164-167. DOI: 10.1016/J.Matlet.2014.07.184  0.409
2014 Park H, Tong F, Sujan A, Chung Y, Park M, Tatarchuk BJ, Koo H, Ahn H, Yoon YS, Kim DJ. Growth of nanostructured ZnO on wearable fabrics for functional garment Materials Letters. 118: 47-50. DOI: 10.1016/J.Matlet.2013.12.041  0.383
2013 Park H, Ahn H, Kim S, Jeong J, Held DW, Kim D. Electrochemical Synthesis of Amorphous Fe-B Alloys for Magnetostrictive Resonant Sensor Ecs Solid State Letters. 3. DOI: 10.1149/2.005401Ssl  0.376
2013 Park H, Ahn H, Kim S, Jeong J, Kim DJ. Deposition and Characterization of FeB thin films by Electrochemical Method Ecs Transactions. 45: 37-42. DOI: 10.1149/04514.0037ECST  0.357
2013 Nguyen HH, Kim D, Park D, Kim K. Effect of initial precursor concentration on TiO2 thin film nanostructures prepared by PCVD system Journal of Energy Chemistry. 22: 375-381. DOI: 10.1016/S2095-4956(13)60048-0  0.325
2012 Tong F, Kim K, Wang Y, Thapa R, Sharma Y, Modic A, Claude Ahyi A, Issacs-Smith T, Williams J, Ahn H, Park H, Kim D, Lee S, Lim E, Lee KK, et al. Growth of ZnO Nanorod Arrays on Flexible Substrates: Effect of Precursor Solution Concentration Isrn Nanomaterials. 2012: 1-7. DOI: 10.5402/2012/651468  0.345
2012 Ahn H, Park H, Joo J, Kim D. Volatile Gas Sensing Properties of Phase and Composition Gradient SnOx Thin Films by Combinatorial Sputter Deposition Ecs Solid State Letters. 2. DOI: 10.1149/2.001302Ssl  0.437
2012 Jee SH, Lee SH, Kim D, Kwak J, Nam S, Yoon YS. Enhancement of Cycling Performance by Li2O–Sn Anode for All-Solid-State Batteries Japanese Journal of Applied Physics. 51: 85803. DOI: 10.1143/Jjap.51.085803  0.427
2012 Tong F, Kim K, Martinez D, Thapa R, Ahyi A, Williams J, Kim D, Lee S, Lim E, Lee KK, Park M. Flexible organic/inorganic hybrid solar cells based on conjugated polymer and ZnO nanorod array Semiconductor Science and Technology. 27: 105005. DOI: 10.1088/0268-1242/27/10/105005  0.356
2012 Jee SH, Kim JH, Baek JH, Kim D, Kang SS, Yoon YS. Stability increase of fuel clad with zirconium oxynitride thin film by metalorganic chemical vapor deposition Thin Solid Films. 520: 5340-5345. DOI: 10.1016/J.Tsf.2012.03.096  0.478
2012 Kim S, Leung A, Koo CY, Kuhn L, Jiang W, Kim D, Kingon AI. Lead-free (Na0.5K0.5)(Nb0.95Ta0.05)O3–BiFeO3 thin films for MEMS piezoelectric vibration energy harvesting devices Materials Letters. 69: 24-26. DOI: 10.1016/J.Matlet.2011.11.069  0.624
2012 Yoon YS, Jee SH, Kakati N, Maiti J, Kim D, Lee SH, Yoon HH. Work function effects of ZnO thin film for acetone gas detection Ceramics International. 38: S653-S656. DOI: 10.1016/J.Ceramint.2011.05.128  0.465
2011 Ahn H, Kim SB, Kim DJ. Thickness effect of sputtered ZnO seed layer on the fabrication of ZnO nanorods on flexible polyimide films and their ethanol gas sensing properties Materials Research Society Symposium Proceedings. 1303: 163-168. DOI: 10.1557/Opl.2011.412  0.443
2011 Ahn H, Kim SB, Kim DJ. Effects of argon to oxygen ratio and post annealing on R.F. sputtered SnO 2 thin film for ethylene gas detection Materials Research Society Symposium Proceedings. 1292: 111-116. DOI: 10.1557/Opl.2011.21  0.434
2011 Ahn H, Wikle HC, Kim S, Liu D, Lee S, Park M, Kim D. Geometric Effect of ZnO Nanorods on Ethanol Sensing Properties: The Relative Role of a Seed Layer Journal of the Electrochemical Society. 159. DOI: 10.1149/2.012202Jes  0.445
2011 Liu D, Zhou B, Yoon SH, Kim S, Ahn H, Prorok BC, Kim S, Kim D. Determination of the True Young's Modulus of Pb(Zr0.52Ti0.48)O3 Films by Nanoindentation: Effects of Film Orientation and Substrate Journal of the American Ceramic Society. 94: 3698-3701. DOI: 10.1111/J.1551-2916.2011.04867.X  0.481
2011 Kim S, Park J, Ahn H, Liu D, Kim D. Temperature effects on output power of piezoelectric vibration energy harvesters Microelectronics Journal. 42: 988-991. DOI: 10.1016/J.Mejo.2011.05.005  0.316
2011 Jee SH, Kakati N, Lee SH, Ahn HS, Kim D, Bang J, Yoon YS. Characteristics of Li–P–W–O–N electrolyte for all solid state electrochromic devices Electrochimica Acta. 56: 9741-9745. DOI: 10.1016/J.Electacta.2011.07.123  0.431
2011 Ahn H, Wang Y, Jee SH, Park M, Yoon YS, Kim D. Enhanced UV activation of electrochemically doped Ni in ZnO nanorods for room temperature acetone sensing Chemical Physics Letters. 511: 331-335. DOI: 10.1016/J.Cplett.2011.06.045  0.329
2011 Liu D, Zhou B, Yoon SH, Wikle HC, Wang Y, Park M, Prorok BC, Kim D. Effects of the structural layer in MEMS substrates on mechanical and electrical properties of Pb(Zr0.52Ti0.48)O3 films Ceramics International. 37: 2821-2828. DOI: 10.1016/J.Ceramint.2011.04.125  0.488
2011 Kang C, Park J, Shen D, Ahn H, Park M, Kim D. Growth and characterization of (K0.5 Na0.5)NbO3 thin films by a sol–gel method Journal of Sol-Gel Science and Technology. 58: 85-90. DOI: 10.1007/S10971-010-2359-6  0.459
2010 Kim DJ, Kim KS. Prediction of TiO2 thin film growth on the glass beads in a rotating plasma chemical vapor deposition reactor. Journal of Nanoscience and Nanotechnology. 10: 3211-5. PMID 20358924  0.351
2010 Lee S, Akhtar MS, Hyung J, Kim D, Kim T, Yang O. Perforated ZnO Nanotube/TiO 2 Thin Film Electrode-Based Dye Sensitized Solar Cells Journal of the Korean Physical Society. 56: 813-817. DOI: 10.3938/Jkps.56.813  0.402
2010 Ahn H, Park J, Kim S, Jee SH, Yoon YS, Kim D. Vertically Aligned ZnO Nanorod Sensor on Flexible Substrate for Ethanol Gas Monitoring Electrochemical and Solid State Letters. 13. DOI: 10.1149/1.3479692  0.326
2010 KIM D, PHAM HC, KIM K. APPLICATION OF PCVD PROCESS TO UNIFORM COATING OF TiO2 THIN FILMS ON POLYPROPYLENE BEADS Surface Review and Letters. 17: 329-335. DOI: 10.1142/S0218625X10013928  0.347
2010 Noh JH, Ryu SY, Jo SJ, Kim CS, Sohn SW, Rack PD, Kim DJ, Baik HK. Indium oxide thin-film transistors fabricated by RF sputtering at room temperature Ieee Electron Device Letters. 31: 567-569. DOI: 10.1109/Led.2010.2046133  0.455
2010 Jee SH, Lee M, Ahn HS, Kim D, Choi JW, Yoon SJ, Nam SC, Kim SH, Yoon YS. Characteristics of a new type of solid-state electrolyte with a LiPON interlayer for Li-ion thin film batteries Solid State Ionics. 181: 902-906. DOI: 10.1016/J.Ssi.2010.04.017  0.493
2010 Ahn H, Noh JH, Kim SB, Overfelt RA, Yoon YS, Kim DJ. Effect of annealing and argon-to-oxygen ratio on sputtered SnO2 thin film sensor for ethylene gas detection Materials Chemistry and Physics. 124: 563-568. DOI: 10.1016/J.Matchemphys.2010.07.012  0.44
2010 Jee SH, Oh JY, Ahn HS, Kim D, Wikle HC, Kim SH, Yoon YS. Amorphous Li–B–W–O solid-state electrolyte thin film for a solid-state ionic power sources Journal of Materials Science. 45: 1709-1714. DOI: 10.1007/S10853-009-3904-Y  0.468
2009 Kim DJ, Baeg JO, Moon SJ, Kim KS. Uniform coating of TiO2 thin films on particles by rotating cylindrical PCVD reactor. Journal of Nanoscience and Nanotechnology. 9: 4285-92. PMID 19916444  0.333
2009 Hyung J, Akhtar MS, Kim D, Lee S, Yang O. ZnO-nanowire-covered TiO$_{2}$ Thin-film Electrodes for Improvingthe Photovoltaic Properties of Dye-sensitized Solar Cells Journal of the Korean Physical Society. 55: 89-93. DOI: 10.3938/Jkps.55.89  0.413
2009 Jee SH, Kakati N, Kim SH, Kim D, Yoon YS. Work Function Effects of Nano Structured ZnO Thin Film on the Acetone Gas Sensitivity Mrs Proceedings. 1174. DOI: 10.1557/Proc-1174-V06-23  0.413
2009 Kim DJ, Baeg JO, Moon SJ, Kim KS. Uniform coating of Tio 2 thin films on particles by rotating cylindrical PCVD reactor Journal of Nanoscience and Nanotechnology. 9: 4285-4292. DOI: 10.1166/jnn.2009.M47  0.332
2009 Johnson ML, LeVar O, Yoon SH, Park JH, Huang S, Kim DJ, Cheng Z, Chin BA. Dual-cathode method for sputtering magnetoelastic iron-boron films Vacuum. 83: 958-964. DOI: 10.1016/J.Vacuum.2008.11.004  0.39
2009 Park JH, Yoon SH, Shen D, Choe SY, Yoon YS, Park M, Kim DJ. Effects of preferred orientation on the piezoelectric properties of Pt/ Pb(Zr 0.3Ti 0.7)O 3/Pt thin films grown by sol-gel process Journal of Materials Science: Materials in Electronics. 20: 366-373. DOI: 10.1007/S10854-008-9735-9  0.369
2008 Liu D, Yoon SH, Zhou B, Prorok BC, Kim D. Investigation of the Crystalline Orientations and Substrates Dependence on Mechanical Properties of PZT Thin Films by Nanoindentation Mrs Proceedings. 1129. DOI: 10.1557/Proc-1129-V11-05  0.489
2008 Shen D, Park JH, Ajitsaria J, Choe SY, Wikle HC, Kim DJ. The design, fabrication and evaluation of a MEMS PZT cantilever with an integrated Si proof mass for vibration energy harvesting Journal of Micromechanics and Microengineering. 18. DOI: 10.1088/0960-1317/18/5/055017  0.335
2008 Kim D, Park J, Shen D, Lee JW, Kingon AI, Yoon YS, Kim S. Thickness dependence of submicron thick Pb(Zr0.3Ti0.7)O3 films on piezoelectric properties Ceramics International. 34: 1909-1915. DOI: 10.1016/J.Ceramint.2007.07.016  0.633
2008 Kim DJ, Shen D, Yoon SH, Choe SY, Kaufman DY. Effect of Ru and LaNiO3 barrier layers on lead zirconate titanate films grown on nickel-based metal foils by sol-gel process Ceramics International. 34: 1261-1265. DOI: 10.1016/J.Ceramint.2007.03.017  0.413
2008 Yoon SH, Liu D, Shen D, Park M, Kim D. Effect of chelating agents on the preferred orientation of ZnO films by sol-gel process Journal of Materials Science. 43: 6177-6181. DOI: 10.1007/S10853-008-2929-Y  0.441
2007 Ko JH, Kim SH, Jee SH, Yoon YS, Kim D. Characteristics of ZrO2 thin films deposited by reactive magnetron sputtering Journal of the Korean Physical Society. 50: 1843-1847. DOI: 10.3938/Jkps.50.1843  0.467
2007 Lee J, Chang J, Kim D, Yoon Y, Kim J. Performance Improvement of Organic Thin-Film Transistors by Electrode/Pentacene Interface Treatment Using a Hydrogen Plasma Ieee Electron Device Letters. 28: 379-382. DOI: 10.1109/Led.2007.895382  0.318
2007 Zhou Y, Ahyi C, Tin C, Williams J, Park M, Kim D, Cheng A, Wang D, Hanser A, Preble EA, Williams NM, Evans K. Fabrication and device characteristics of Schottky-type bulk GaN-based “visible-blind” ultraviolet photodetectors Applied Physics Letters. 90: 121118. DOI: 10.1063/1.2715114  0.311
2007 Kim D. Effects of barrier layers on the electrical properties of (Pb,La)(Zr,Ti)O3 films on nickel foils Materials Science and Engineering B-Advanced Functional Solid-State Materials. 141: 87-90. DOI: 10.1016/J.Mseb.2007.06.004  0.456
2007 Yoon SH, Kim D. Effect of substrate on the preferred orientation of ZnO films by chemical solution deposition Journal of Crystal Growth. 303: 568-573. DOI: 10.1016/J.Jcrysgro.2006.11.351  0.439
2006 Yoon SH, Kim D. Fabrication of Piezoelectric ZnO and PZT Films for FPW Device Mrs Proceedings. 966. DOI: 10.1557/Proc-0966-T07-07  0.479
2003 Kim S, Yang J, Koo CY, Yeom J, Yoon E, Hwang CS, Park J, Kang S, Kim D, Ha J. Dielectric and Electromechanical Properties of Pb(Zr,Ti)O3Thin Films for Piezo-Microelectromechanical System Devices Japanese Journal of Applied Physics. 42: 5952-5955. DOI: 10.1143/JJAP.42.5952  0.347
2003 Kim DJ, Maria JP, Kingon AI, Streiffer SK. Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr1-XTX)O3 thin films as a function of composition Journal of Applied Physics. 93: 5568-5575. DOI: 10.1063/1.1566478  0.595
2002 Kim D-, Kaufman DY, Streiffer SK, Lee TH, Erck R, Auciello O. Chemical Solution Deposition of PLZT Films on Base Metal Foils Mrs Proceedings. 748. DOI: 10.1557/Proc-748-U15.4  0.405
2001 Rodriguez BJ, Kim DJ, Kingon AI, Nemanich R. Measurement of the effective piezoelectric constant of nitride thin films and heterostructures using scanning force microscopy Mrs Proceedings. 693: 571-576. DOI: 10.1557/Proc-693-I9.9.1  0.589
2001 Kim D, Maria J, Kingon AI. Compositional Effects on the Piezoelectric and Ferroelectric Properties of Chemical Solution Deposited PZT Thin Films Mrs Proceedings. 688. DOI: 10.1557/Proc-688-C10.7.1  0.623
2001 Yoon S, Wicaksana D, Kim D, Kim S, Kingon AI. Effect of hydrogen on true leakage current characteristics of (Pb, La)(Zr, Ti)O 3 thin-film capacitors with Pt- or Ir-based top electrodes Journal of Materials Research. 16: 1185-1189. DOI: 10.1557/Jmr.2001.0163  0.539
2001 Chen IS, Roeder JF, Kim DJ, Maria JP, Kingon AI. Metalorganic chemical vapor deposition Pb(Zr,Ti)O3 and selected lower electrode structures as a pathway to integrated piezoelectric microelectromechanical systems Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 1833-1840. DOI: 10.1116/1.1401747  0.591
2000 Letendu F, Hugon MC, Desvignes JM, Agius B, Vickridge I, Kim DJ, Kingon AI. Oxidation resistance of TaSiN diffusion barriers Integrated Ferroelectrics. 31: 315-322. DOI: 10.1080/10584580008215664  0.543
2000 Kim S, Lee D, Hwang CS, Kim D, Kingon AI. Thermally induced voltage offsets in Pb(Zr,Ti)O3 thin films Applied Physics Letters. 77: 3036-3038. DOI: 10.1063/1.1324001  0.61
1999 Chen I, Kim D, Maria J, Roeder JF, Kingon AI. Preparation of Piezoelectric PZT Thin Films by Mocvd for MEMS Applications Mrs Proceedings. 596: 541. DOI: 10.1557/Proc-596-541  0.612
1999 Kim S, Kim DJ, Lee KM, Park M, Kingon AI, Nemanich RJ, Im J, Streiffer SK. An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique Journal of Materials Research. 14: 4395-4401. DOI: 10.1557/Jmr.1999.0594  0.609
1999 Kim S, Kim D, Streiffer SK, Kingon AI. Preparation and ferroelectric properties of mixed composition layered lead zirconate titanate thin films for nonvolatile memory applications Journal of Materials Research. 14: 2476-2483. DOI: 10.1557/Jmr.1999.0332  0.606
1999 Kim S, Kim D, Hong J, Streiffer SK, Kingon AI. Imprint and Fatigue Properties of Chemical Solution Derived Pb 1–- x La x (Zr y Ti 1– y ) 1– x /4 O 3 Thin Films Journal of Materials Research. 14: 1371-1377. DOI: 10.1557/Jmr.1999.0187  0.493
1999 Maiwa H, Christman JA, Kim S, Kim D, Maria J, Chen B, Streiffer SK, Kingon AI. Measurement of Piezoelectric Displacements of Pb(Zr, Ti)O3 Thin Films Using a Double-Beam Interferometer Japanese Journal of Applied Physics. 38: 5402-5405. DOI: 10.1143/Jjap.38.5402  0.598
1999 Kim SH, Kim DJ, Im J, Streiffer SK, Auciello O, Maria JP, Kingon AI. Impact of changes in the Pt heterostructure bottom electrodes on the ferroelectric properties of SBT thin films Integrated Ferroelectrics. 26: 253-268. DOI: 10.1080/10584589908215626  0.585
1999 Kim D, Kim S, Maria J, Kingon AI. Influences on imprint failure of SrBi2Ta2O9 thin film capacitors Integrated Ferroelectrics. 25: 351-361. DOI: 10.1080/10584589908210185  0.578
1999 Kim S, Kim DJ, Im J, Kim CE, Kingon AI. Ferroelectric Properties of New Chemical Solution Derived SBT Thin Films for Non-Volatile Memory Devices Journal of Sol-Gel Science and Technology. 16: 57-63. DOI: 10.1023/A:1008748718231  0.57
1998 Kim D, Kim S, Maria J, Kingon AI. Thermally Induced Imprint of PZT and SBT Thin Films Mrs Proceedings. 541: 469. DOI: 10.1557/Proc-541-469  0.564
1998 Ishizuka Y, Kim DJ, Streiffer SK, Kingon AI. Characterization and Oxidation Kinetics of Reactively Sputtered Ti 1−x Al x N Film Mrs Proceedings. 541: 191. DOI: 10.1557/Proc-541-191  0.528
1995 Kim DJ, Choi DJ, Kim YW. Effect of reactant depletion on the microstructure and preferred orientation of polycrystalline SiC films by chemical vapor deposition Thin Solid Films. 266: 192-197. DOI: 10.1016/0040-6090(96)80023-X  0.313
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