Vidya Ramaswamy, Ph.D. - Publications
Affiliations: | 2001 | Stanford University, Palo Alto, CA |
Area:
Materials Science EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2004 | Ramaswamy V, Nix WD, Clemens BM. Coherency and surface stress effects in metal multilayers Scripta Materialia. 50: 711-715. DOI: 10.1016/J.Scriptamat.2003.11.037 | 0.642 | |||
2002 | Gill SPA, Gao H, Ramaswamy V, Nix WD. Confined capillary stresses during the initial growth of thin films on amorphous substrates Journal of Applied Mechanics, Transactions Asme. 69: 425-432. DOI: 10.1115/1.1469001 | 0.446 | |||
2001 | Ramaswamy V, Phillips MA, Nix WD, Clemens BM. Observation of the strengthening of Pt layers in Ni/Pt and Pd/Pt multilayers by in-situ substrate curvature measurement Materials Science and Engineering A. 319: 887-892. DOI: 10.1016/S0921-5093(01)01006-1 | 0.65 | |||
2000 | Phillips MA, Ramaswamy V, Clemens BM, Nix WD. A model for calculating substrate curvature during coalescence of PT islands on an amorphous substrate Materials Research Society Symposium - Proceedings. 578: 39-44. DOI: 10.1557/Proc-578-39 | 0.541 | |||
2000 | Phillips MA, Ramaswamy V, Clemens BM, Nix WD. Stress and microstructure evolution during initial growth of Pt on amorphous substrates Journal of Materials Research. 15: 2540-2546. DOI: 10.1557/Jmr.2000.0364 | 0.602 | |||
2000 | Clemens BM, Nix WD, Ramaswamy V. Surface-energy-driven intermixing and its effect on the measurement of interface stress Journal of Applied Physics. 87: 2816-2820. DOI: 10.1063/1.372261 | 0.595 | |||
1998 | Ramaswamy V, Clemens BM, Nix WD. Stress Evolution During Growth of Sputtered Ni/Cu Multilayers Mrs Proceedings. 528. DOI: 10.1557/Proc-528-161 | 0.613 | |||
1997 | Ramaswamy V, Nix WD, Clemens BM. Stress Evolution In Sputtered Fcc Metal Multilayers Mrs Proceedings. 505. DOI: 10.1557/Proc-505-589 | 0.615 | |||
1996 | Hufnagel TC, Kautzky MC, Ramaswamy V, Leming A, Clemens BM. Structural Transformations Due to Intermixing During Deposition oF Fe/Pt(001) Epitaxial Multilayers Mrs Proceedings. 441. DOI: 10.1557/Proc-441-367 | 0.571 | |||
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