| Year |
Citation |
Score |
| 2017 |
McCausland JA, Withanage S, Mallik RR, Lyuksyutov SF. Functionalization of undoped and p-doped Si (100) using atomic force microscope tips in the presence of propan-2-ol, butan-2-ol and toluene Surface Science. 661: 16-21. DOI: 10.1016/J.Susc.2017.02.012 |
0.438 |
|
| 2013 |
Lee WK, Tsoi S, Whitener KE, Stine R, Robinson JT, Tobin JS, Weerasinghe A, Sheehan PE, Lyuksyutov SF. Robust reduction of graphene fluoride using an electrostatically biased scanning probe Nano Research. 6: 767-774. DOI: 10.1007/S12274-013-0355-1 |
0.367 |
|
| 2012 |
Banerjee HP, Weerasinghe AT, Lyuksyutov SF. Analysis of beam interference reflected from atomic force microscope tip and periodic silicon surface under various humidity conditions Proceedings of Spie - the International Society For Optical Engineering. 8497. DOI: 10.1117/12.928451 |
0.44 |
|
| 2011 |
Lyuksyutov SF, Rackaitis M, Nedashkivska V. Instability of nanostructures patterned in polystyrene under high electric field gradients Applied Surface Science. 257: 4581-4585. DOI: 10.1016/J.Apsusc.2010.12.057 |
0.42 |
|
| 2008 |
Rowicka E, Kashyn D, Reagan MA, Hirano T, Paramonov PB, Dolog I, Mallik RR, Lyuksyutov SF. Influence of Water condensation on charge transport and electric breakdown between an Atomic Force Microscope tip, polymeric, and (semiconductor) CdS surfaces Current Nanoscience. 4: 166-172. DOI: 10.2174/157341308784340868 |
0.761 |
|
| 2008 |
Rackaitis M, Kashyn D, Rowicka E, Paramonov PB, Mallik RR, Lyuksyutov SF. Voltage-assisted asperity formation in styrene butadiene at room temperature: Cross-linking at the nanoscale Physical Review B - Condensed Matter and Materials Physics. 78. DOI: 10.1103/Physrevb.78.064201 |
0.734 |
|
| 2008 |
Rackaitis M, Kashyn D, Hirano T, Lyuksyutov SF. Topological peculiarities in liquid phase of styrene butadiene rubber thin films induced by electrostatic nanolithography Applied Physics Letters. 93. DOI: 10.1063/1.3013841 |
0.471 |
|
| 2008 |
Reagan MA, Kashyn D, Juhl S, Vaia RA, Lyuksyutov SF. Electric charging and nanostructure formation in polymeric films using combined amplitude-modulated atomic force microscopy-assisted electrostatic nanolithography and electric force microscopy Applied Physics Letters. 93. DOI: 10.1063/1.2957985 |
0.504 |
|
| 2007 |
Dolog I, Mallik RR, Lyuksyutov SF. Robust functionalization of amorphous cadmium sulfide films using z -lift amplitude modulated atomic force microscopy-assisted electrostatic nanolithography Applied Physics Letters. 90. DOI: 10.1063/1.2742910 |
0.478 |
|
| 2006 |
Paramonov PB, Lyuksyutov SF, Mayevska OV, Reagan MA, Umemura K, Tobari H, Hara M, Vaia RA, Juhl S. Rearrangements in an alkylthiolate self-assembled monolayer using electrostatic interactions between nanoscale asperity and organomercaptan molecules. Langmuir : the Acs Journal of Surfaces and Colloids. 22: 6555-61. PMID 16830997 DOI: 10.1021/La0532858 |
0.722 |
|
| 2006 |
Lyuksyutov SF, Paramonov PB, Mayevska OV, Reagan MA, Sancaktar E, Vaia RA, Juhl S. Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potential. Ultramicroscopy. 106: 909-13. PMID 16781078 DOI: 10.1016/J.Ultramic.2006.04.002 |
0.768 |
|
| 2006 |
Paramonov PB, Lyuksyutov SF. Erratum: “Density-functional description of water condensation in proximity of nanoscale asperity” [J. Chem. Phys. 123, 084705 (2005)] The Journal of Chemical Physics. 124: 219905. DOI: 10.1063/1.2202321 |
0.691 |
|
| 2006 |
Dharaiya DP, Jana SC, Lyuksyutov SF. Production of electrically conductive networks in immiscible polymer blends by chaotic mixing Polymer Engineering and Science. 46: 19-28. DOI: 10.1002/Pen.20445 |
0.351 |
|
| 2005 |
Paramonov PB, Lyuksyutov SF. Density-functional description of water condensation in proximity of nanoscale asperity. The Journal of Chemical Physics. 123: 084705. PMID 16164319 DOI: 10.1063/1.2007632 |
0.72 |
|
| 2005 |
Lyuksyutov S. Nano-Patterning in Polymeric Materials and Biological Objects Using Atomic Force Microscopy Electrostatic Nanolithography Current Nanoscience. 1: 245-251. DOI: 10.2174/157341305774642966 |
0.398 |
|
| 2004 |
Lyuksyutov SF, Paramonov PB, Sharipov RA, Sigalov G. Induced nanoscale deformations in polymers using atomic force microscopy Physical Review B. 70. DOI: 10.1103/Physrevb.70.174110 |
0.756 |
|
| 2004 |
Juhl S, Phillips D, Vaia RA, Lyuksyutov SF, Paramonov PB. Precise formation of nanoscopic dots on polystyrene film using z-lift electrostatic lithography Applied Physics Letters. 85: 3836-3838. DOI: 10.1063/1.1807012 |
0.719 |
|
| 2003 |
Lyuksyutov SF, Vaia RA, Paramonov PB, Juhl S, Waterhouse L, Ralich RM, Sigalov G, Sancaktar E. Electrostatic nanolithography in polymers using atomic force microscopy. Nature Materials. 2: 468-72. PMID 12819776 DOI: 10.1038/Nmat926 |
0.752 |
|
| 2003 |
Lyuksyutov SF, Paramonov PB, Dolog I, Ralich RM. Peculiarities of an anomalous electronic current during atomic force microscopy assisted nanolithography on n-type silicon Nanotechnology. 14: 716-721. DOI: 10.1088/0957-4484/14/7/305 |
0.73 |
|
| 2003 |
Lyuksyutov SF, Paramonov PB, Juhl S, Vaia RA. Amplitude-modulated electrostatic nanolithography in polymers based on atomic force microscopy Applied Physics Letters. 83: 4405-4407. DOI: 10.1063/1.1629787 |
0.768 |
|
| 2001 |
Ramsier RD, Ralich RM, Lyuksyutov SF. Nanolithography of silicon: An approach for investigating tip-surface interactions during writing Applied Physics Letters. 79: 2820-2822. DOI: 10.1063/1.1413736 |
0.309 |
|
| 2001 |
Chen J, Rao AM, Lyuksyutov S, Itkis ME, Hamon MA, Hu H, Cohn RW, Eklund PC, Colbert DT, Smalley RE, Haddon RC. Dissolution of full-length single-walled carbon nanotubes Journal of Physical Chemistry B. 105: 2525-2528. DOI: 10.1021/Jp002596I |
0.331 |
|
| 1999 |
Gotpagar J, Lyuksyutov S, Cohn R, Grulke E, Bhattacharyya D. Reductive Dehalogenation of Trichloroethylene with Zero-Valent Iron: Surface Profiling Microscopy and Rate Enhancement Studies Langmuir. 15: 8412-8420. DOI: 10.1021/La990325X |
0.344 |
|
| 1999 |
Cohn RW, Lyuksyutov SF, Walsh KM, Crain MM. Nanolithography Considerations for Multi-Passband Grating Filters Optical Review. 6: 345-354. DOI: 10.1007/S10043-999-0345-4 |
0.324 |
|
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