| Year |
Citation |
Score |
| 2018 |
Yun W, Cordier M, Stripe B, Lewis S, Kirz J. Next-generation X-ray Optics for High Resolution Applications Microscopy and Microanalysis. 24: 304-305. DOI: 10.1017/S1431927618013843 |
0.507 |
|
| 2018 |
Yun W, Seshadri S, Lewis S, Gelb J, Lau S, Kirz J. Novel sub-eV high throughput laboratory micro-XAS (x-ray absorption spectrometer) for chemical state analysis through XANES and EXAFS Microscopy and Microanalysis. 24: 1008-1009. DOI: 10.1017/S1431927618005536 |
0.496 |
|
| 2018 |
Gelb J, Lewis S, Lau S, Kirz J, Yun W. Advancements in X-Ray Analysis for Correlative Microscopy Microscopy and Microanalysis. 24: 358-359. DOI: 10.1017/S1431927618002283 |
0.536 |
|
| 2017 |
Lau S, Lewis SJ, Yun W, Stripe B, Kirz J, Lyon A, Reynolds D, Ian Spink R. Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity Microscopy and Microanalysis. 23: 44-45. DOI: 10.1017/S1431927617000903 |
0.41 |
|
| 2016 |
Stock SR, Müller B, Wang G, Yun W, Kalra M, Michaelson J, Kirz J, Lewis SJ, Cong W, Yang Q. Image guided onco-histology with Tri-contrast, super-high-resolution x-ray CT for rapid tumor characterization and margin delineation Proceedings of Spie. DOI: 10.1117/12.2238147 |
0.499 |
|
| 2015 |
Sun Y, Gleber SC, Jacobsen C, Kirz J, Vogt S. Optimizing detector geometry for trace element mapping by X-ray fluorescence. Ultramicroscopy. 152: 44-56. PMID 25600825 DOI: 10.1016/J.Ultramic.2014.12.014 |
0.634 |
|
| 2013 |
Shapiro D, Roy S, Celestre R, Chao W, Doering D, Howells M, Kevan S, Kilcoyne D, Kirz J, Marchesini S, Seu KA, Schirotzek A, Spence J, Tyliszczak T, Warwick T, et al. Development of coherent scattering and diffractive imaging and the COSMIC facility at the Advanced Light Source Journal of Physics: Conference Series. 425. DOI: 10.1088/1742-6596/425/19/192011 |
0.481 |
|
| 2013 |
Sun C, Portmann G, Hertlein M, Kirz J, Marcus MA, Robin DS. Pseudo-Single-Bunch with Adjustable Frequency Synchrotron Radiation News. 26: 9-13. DOI: 10.1080/08940886.2013.791209 |
0.402 |
|
| 2013 |
Chapman H, Kirz J, Stampanoni M. X-ray Microscopy and Microtomography Synchrotron Radiation News. 26: 2-3. DOI: 10.1080/08940886.2013.771061 |
0.578 |
|
| 2012 |
Feser M, Howells MR, Kirz J, Rudati J, Yun W. Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope. Journal of Synchrotron Radiation. 19: 751-8. PMID 22898954 DOI: 10.1107/S0909049512023813 |
0.78 |
|
| 2012 |
Kirz J, Miao J. David Sayre (1924-2012). Nature. 484: 38. PMID 22481349 DOI: 10.1038/484038A |
0.451 |
|
| 2011 |
Huang X, Miao H, Nelson J, Turner J, Steinbrener J, Shapiro D, Kirz J, Jacobsen C. Anti-contamination device for cryogenic soft X-ray diffraction microscopy. Nuclear Instruments & Methods in Physics Research. Section a, Accelerators, Spectrometers, Detectors and Associated Equipment. 638: 171-175. PMID 21547016 DOI: 10.1016/J.Nima.2011.02.085 |
0.742 |
|
| 2011 |
Stampanoni M, Kirz J. Third International Workshop on Imaging Techniques with Synchrotron Radiation Synchrotron Radiation News. 24: 46-47. DOI: 10.1080/08940886.2011.567174 |
0.331 |
|
| 2011 |
Falcone R, Jacobsen C, Kirz J, Marchesini S, Shapiro D, Spence J. New directions in X-ray microscopy Contemporary Physics. 52: 293-318. DOI: 10.1080/00107514.2011.589662 |
0.774 |
|
| 2010 |
Huang X, Nelson J, Steinbrener J, Kirz J, Turner JJ, Jacobsen C. Incorrect support and missing center tolerances of phasing algorithms. Optics Express. 18: 26441-9. PMID 21164994 DOI: 10.1364/Oe.18.026441 |
0.581 |
|
| 2010 |
Nelson J, Huang X, Steinbrener J, Shapiro D, Kirz J, Marchesini S, Neiman AM, Turner JJ, Jacobsen C. High-resolution x-ray diffraction microscopy of specifically labeled yeast cells. Proceedings of the National Academy of Sciences of the United States of America. 107: 7235-9. PMID 20368463 DOI: 10.1073/Pnas.0910874107 |
0.767 |
|
| 2010 |
Corlett JN, Baptiste KM, Byrd JM, Denes P, Falcone RW, Feng J, Graves M, Kirz J, Li D, Padmore HA, Papadopoulos C, Penn G, Qiang J, Robin DS, Ryne R, et al. Design studies for A VUV-SOFT X-RAY FEL facility at LBNL Ipac 2010 - 1st International Particle Accelerator Conference. 2639-2641. |
0.42 |
|
| 2009 |
Howells MR, Beetz T, Chapman HN, Cui C, Holton JM, Jacobsen CJ, Kirz J, Lima E, Marchesini S, Miao H, Sayre D, Shapiro DA, Spence JC, Starodub D. An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy. Journal of Electron Spectroscopy and Related Phenomena. 170: 4-12. PMID 20463854 DOI: 10.1016/J.Elspec.2008.10.008 |
0.81 |
|
| 2009 |
Huang X, Nelson J, Kirz J, Lima E, Marchesini S, Miao H, Neiman AM, Shapiro D, Steinbrener J, Stewart A, Turner JJ, Jacobsen C. Soft X-ray diffraction microscopy of a frozen hydrated yeast cell. Physical Review Letters. 103: 198101. PMID 20365955 DOI: 10.1103/Physrevlett.103.198101 |
0.83 |
|
| 2009 |
Chen S, Lyon A, Kirz J, Seshadri S, Feng Y, Feser M, Sassolini S, Duewer F, Zeng X, Huang C. Absolute efficiency measurement of high-performance zone plates Proceedings of Spie - the International Society For Optical Engineering. 7448. DOI: 10.1117/12.825367 |
0.757 |
|
| 2009 |
Miao H, Downing K, Huang X, Kirz J, Marchesini S, Nelson J, Shapiro D, Steinbrener J, Stewart A, Jacobsen C. Cryo diffraction microscopy: Ice conditions and finite supports Journal of Physics: Conference Series. 186. DOI: 10.1088/1742-6596/186/1/012055 |
0.557 |
|
| 2009 |
Kirz J, Jacobsen C. The history and future of X-ray microscopy Journal of Physics: Conference Series. 186. DOI: 10.1088/1742-6596/186/1/012001 |
0.657 |
|
| 2009 |
Corlett J, Baptiste K, Byrd JM, Denes P, Falcone R, Kirz J, McCurdy W, Padmore H, Penn G, Qiang J, Robin D, Sannibale F, Schoenlein R, Staples J, Steier C, et al. Design Studies for a VUV–Soft X-ray Free-Electron Laser Array Synchrotron Radiation News. 22: 25-31. DOI: 10.1080/08940880903256817 |
0.436 |
|
| 2008 |
Falcone R, Stohr J, Bergmann U, Corlett J, Galayda J, Hastings J, Hettel B, Hussain Z, Kirz J, McCurdy B, Raubenheimer T, Sannibale F, Seeman J, Shen Z-, Schoenlein B, et al. Scientific Needs for Future X-Ray Sources in the U.S.: A White Paper Lawrence Berkeley National Laboratory. DOI: 10.2172/939899 |
0.346 |
|
| 2008 |
Kirz J. Coherence Experiments at the ALS Synchrotron Radiation News. 21: 25-29. DOI: 10.1080/08940880802268251 |
0.48 |
|
| 2008 |
Chen S, Lyon A, Kirz J, Seshadri S, Feng Y, Feser M, Sassolini S, Duewer F, Zeng X, Huang C. Absolute zone plate efficiency measurement using laboratory X-ray sources Journal of X-Ray Science and Technology. 16: 235-241. |
0.405 |
|
| 2007 |
Belkacem A, Byrd JM, Corlett J, Fawley W, Kirz J, Lidia S, McCurdy W, Padmore H, Penn G, Pogorelov I, Qiang J, Robin D, Sannibale F, Schoenlein R, Staples J, et al. Design Studies for a High-Repetition-Rate FEL Facility at LBNL Synchrotron Radiation News. 20: 20-27. DOI: 10.1080/08940880701744758 |
0.37 |
|
| 2006 |
Kirz J. X-ray microscopy techniques for nanostructure analysis Microscopy and Microanalysis. 12: 572-573. DOI: 10.1017/S1431927606062398 |
0.531 |
|
| 2005 |
Shapiro D, Thibault P, Beetz T, Elser V, Howells M, Jacobsen C, Kirz J, Lima E, Miao H, Neiman AM, Sayre D. Biological imaging by soft x-ray diffraction microscopy. Proceedings of the National Academy of Sciences of the United States of America. 102: 15343-6. PMID 16219701 DOI: 10.1073/Pnas.0503305102 |
0.836 |
|
| 2005 |
Shapiro D, Thibault P, Beetz T, Elser V, Howells M, Jacobsen C, Kirz J, Lima E, Miao H, Neiman AM, Sayre D. Diffraction imaging of the yeast cell: first results Acta Crystallographica Section a Foundations of Crystallography. 61: c33-c33. DOI: 10.1107/S0108767305098600 |
0.737 |
|
| 2005 |
Beetz T, Howells MR, Jacobsen C, Kao CC, Kirz J, Lima E, Mentes TO, Miao H, Sanchez-Hanke C, Sayre D, Shapiro D. Apparatus for X-ray diffraction microscopy and tomography of cryo specimens Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 545: 459-468. DOI: 10.1016/J.Nima.2004.12.040 |
0.821 |
|
| 2004 |
Miao J, Chapman HN, Kirz J, Sayre D, Hodgson KO. Taking X-ray diffraction to the limit: macromolecular structures from femtosecond X-ray pulses and diffraction microscopy of cells with synchrotron radiation. Annual Review of Biophysics and Biomolecular Structure. 33: 157-76. PMID 15139809 DOI: 10.1146/Annurev.Biophys.33.110502.140405 |
0.844 |
|
| 2004 |
Chemla DS, Feinberg B, Hussain Z, Kirz J, Krebs GF, Padmore HA, Robin DS, Robinson AL, Smith NV. An Upgrade for the advanced Light source Synchrotron Radiation News. 17: 46-51. DOI: 10.1080/08940880408603113 |
0.32 |
|
| 2004 |
Kirz J, Beetz T, Feser M, Fleckenstein H, Hornberger B, Howells M, Jacobsen C, Larson B, Lerotic M, Lima E, Lu M, Miao H, Sayre D, Shapiro D, Stein A, et al. Scanning soft X-ray microscopy and diffraction imaging Microscopy and Microanalysis. 10: 120-121. DOI: 10.1017/S1431927604882746 |
0.854 |
|
| 2003 |
Beetz T, Feser M, Fleckenstein H, Hornberger B, Jacobsen C, Kirz J, Lerotic M, Lima E, Lu M, Sayre D, Shapiro D, Stein A, Tennant D, Wirick S. Soft x‐ray microscopy at the NSLS Synchrotron Radiation News. 16: 11-15. DOI: 10.1080/08940880308603016 |
0.785 |
|
| 2003 |
Lima E, Shapiro D, Kirz J, Sayre D. Algorithmic image reconstruction using iterative phase retrieval schema Journal De Physique. Iv : Jp. 104: 631-634. DOI: 10.1051/Jp4:20030159 |
0.697 |
|
| 2003 |
Beetz T, Jacobsen C, Kao CC, Kirz J, Mentes O, Sanchez-Hanke C, Sayre D, Shapiro D. Development of a novel apparatus for experiments in soft x-ray diffraction imaging and diffraction tomography Journal De Physique. Iv : Jp. 104: 27-30. DOI: 10.1051/Jp4:200300022 |
0.746 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.826 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Jacobsen C, Beetz T, Feser M, Fleckenstein H, Hornberger B, Kirz J, Lima E, Lu M, Shapiro D, Stein A, Wirick S. X-ray spectromicroscopy: high resolution chemical state imaging in complex organic systems Acta Crystallographica Section a Foundations of Crystallography. 58: c198-c198. DOI: 10.1107/S0108767302092917 |
0.4 |
|
| 2002 |
Sayre D, Miao J, Kirz J, Yun WB, Chapman HN, Hodgson K, Jacobsen C, Shapiro D. A history thus far of oversampling and single particle imaging Acta Crystallographica Section a Foundations of Crystallography. 58: c197-c197. DOI: 10.1107/S0108767302092899 |
0.67 |
|
| 2002 |
Beetz T, Feser M, Jacobsen C, Kirz J, Sayre D, Shapiro D, Sheynkin Y, Stein A, Wirick S. Soft X-ray microscopy at the NSLS Proceedings - International Symposium On Biomedical Imaging. 2002: 137-140. DOI: 10.1016/0167-5087(84)90500-3 |
0.765 |
|
| 2001 |
Feser M, Beetz T, Jacobsen C, Kirz J, Wirick S, Stein A, Schäfer T. Scanning transmission soft x-ray microscopy at beamline X-1A at the NSLS - Advances in instrumentation and selected applications Proceedings of Spie - the International Society For Optical Engineering. 4506: 146-153. DOI: 10.1117/12.450955 |
0.626 |
|
| 2001 |
Osanna A, Jacobsen C, Kirz J, Sheynkin Y. Cryogenic scanning transmission microscopy for biochemical analysis of the sperm. Fertility and Sterility. 76: S265. DOI: 10.1016/S0015-0282(01)02794-7 |
0.535 |
|
| 2000 |
Winn B, Ade H, Buckley C, Feser M, Howells M, Hulbert S, Jacobsen C, Kaznacheyev K, Kirz J, Osanna A, Maser J, McNulty I, Miao J, Oversluizen T, Spector S, et al. Illumination for coherent soft X-ray applications: the new X1A beamline at the NSLS. Journal of Synchrotron Radiation. 7: 395-404. PMID 16609227 DOI: 10.1107/S0909049500012942 |
0.814 |
|
| 2000 |
Miao J, Kirz J, Sayre D. The oversampling phasing method. Acta Crystallographica. Section D, Biological Crystallography. 56: 1312-5. PMID 10998627 DOI: 10.1107/S0907444900008970 |
0.603 |
|
| 2000 |
Maser J, Osanna A, Wang Y, Jacobsen C, Kirz J, Spector S, Winn B, Tennant D. Soft X-ray microscopy with a cryo scanning transmission X-ray microscope: I. Instrumentation, imaging and spectroscopy. Journal of Microscopy. 197: 68-79. PMID 10620150 DOI: 10.1046/J.1365-2818.2000.00630.X |
0.851 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.802 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Chapman HN, Vogt S, Jacobsen C, Kirz J, Miao J, Wang Y, Winn B, Oversluizen T. A shutter–photodiode combination for UV and soft X-ray beamlines Journal of Synchrotron Radiation. 6: 50-50. DOI: 10.1107/S0909049598013879 |
0.464 |
|
| 1999 |
Miao J, Charalambous P, Kirz J, Sayre D. Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens Nature. 400: 342-344. DOI: 10.1038/22498 |
0.703 |
|
| 1998 |
Jacobsen C, Kirz J. X-ray microscopy with synchrotron radiation. Nature Structural Biology. 5: 650-3. PMID 9699617 DOI: 10.1038/1341 |
0.68 |
|
| 1998 |
Feser M, Carlucci-Dayton M, Jacobsen C, Kirz J, Neuhäusler U, Smith G, Yu B. Applications and instrumentation advances with the Stony Brook scanning transmission X-ray microscope Proceedings of Spie - the International Society For Optical Engineering. 3449: 19-29. DOI: 10.1117/12.330348 |
0.651 |
|
| 1998 |
Maser J, Jacobsen C, Wang Y, Osanna A, Winn B, Kirz J. Imaging, Spectroscopy and Tomography of Frozen Hydrated Specimens With the Cryo Scanning Transmission X-Ray Microscope at The NSLS Microscopy and Microanalysis. 4: 354-355. DOI: 10.1017/S1431927600021899 |
0.842 |
|
| 1997 |
Osanna A, Boese J, Jacobsen C, Kirz J. Soft X-Ray Spectroscopy of Amino Acids and Peptides Microscopy and Microanalysis. 3: 911-912. DOI: 10.1017/S1431927600011442 |
0.602 |
|
| 1997 |
Boese J, Osanna A, Jacobsen C, Kirz J. Carbon edge XANES spectroscopy of amino acids and peptides Journal of Electron Spectroscopy and Related Phenomena. 85: 9-15. DOI: 10.1016/S0368-2048(97)00032-7 |
0.583 |
|
| 1997 |
Ade H, Smith AP, Zhang H, Zhuang GR, Kirz J, Rightor E, Hitchcock A. X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS Journal of Electron Spectroscopy and Related Phenomena. 84: 53-72. DOI: 10.1016/S0368-2048(97)00013-3 |
0.613 |
|
| 1997 |
Ade H, Smith AP, Zhang H, Zhuang GR, Kirz J, Rightor E, Hitchcock A. X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS Journal of Electron Spectroscopy and Related Phenomena. 84: 53-72. |
0.538 |
|
| 1996 |
Osanna A, Jacobsen C, Kalinovsky A, Kirz J, Maser J, Wang S. X-ray microscopy: preparations for studies of frozen hydrated specimens. Scanning Microscopy. Supplement. 10: 349-56; discussion 3. PMID 9601552 |
0.526 |
|
| 1996 |
Zhang X, Balhorn R, Mazrimas J, Kirz J. Mapping and measuring DNA to protein ratios in mammalian sperm head by XANES imaging. Journal of Structural Biology. 116: 335-44. PMID 8812992 DOI: 10.1006/Jsbi.1996.0051 |
0.389 |
|
| 1996 |
Winn B, Ade H, Buckley C, Howells M, Hulbert S, Jacobsen C, Kirz J, McNulty I, Miao J, Oversluizen T, Pogorelski I, Wirick S. X1A: Second‐generation undulator beamlines serving soft x‐ray spectromicroscopy experiments at the NSLS Review of Scientific Instruments. 67: 3359-3359. DOI: 10.1063/1.1147466 |
0.773 |
|
| 1996 |
Jacobsen C, Chapman HN, Fu J, Kalinovsky A, Kirz J, Maser J, Osanna A, Spector S, Tennant D, Wang S, Wirick S, Zhang X. Biological microscopy and soft X-ray optics at Stony Brook Journal of Electron Spectroscopy and Related Phenomena. 80: 337-341. DOI: 10.1016/0368-2048(96)02987-8 |
0.658 |
|
| 1995 |
Kirz J, Jacobsen C, Howells M. Soft X-ray microscopes and their biological applications. Quarterly Reviews of Biophysics. 28: 33-130. PMID 7676009 DOI: 10.1017/S0033583500003139 |
0.69 |
|
| 1995 |
Kirz J. Remembering x-rays. Science (New York, N.Y.). 270: 934. PMID 7481797 DOI: 10.1126/Science.270.5238.934 |
0.535 |
|
| 1995 |
Ko CH, Kirz J, Ade H, Hulbert S, Johnson E, Anderson E. Applications of the X1A scanning photoemission spectromicroscope for element identification on material surfaces Materials Research Society Symposium - Proceedings. 375: 303-305. DOI: 10.1557/Proc-375-303 |
0.594 |
|
| 1995 |
Williams S, Jacobsen C, Kirz J, Maser J, Wirick S, Zhang X, Ade H, Rivers M. Instrumentation developments in scanning soft x-ray microscopy at the NSLS (invited) Review of Scientific Instruments. 66: 1271-1275. DOI: 10.1063/1.1146020 |
0.712 |
|
| 1995 |
Ko CH, Kirz J, Ade H, Johnson E, Hulbert S, Anderson E. Development of a second generation scanning photoemission microscope with a zone plate generated microprobe at the National Synchrotron Light Source Review of Scientific Instruments. 66: 1416-1418. DOI: 10.1063/1.1145926 |
0.543 |
|
| 1995 |
Maser JM, Chapman HN, Jacobsen CJ, Kalinovsky A, Kirz J, Osanna A, Spector S, Wang S, Winn B, Wirick S, Zhang X. Scanning transmission x-ray microscope at the NSLS: from XANES to cryo Proceedings of Spie - the International Society For Optical Engineering. 2516: 78-89. |
0.479 |
|
| 1994 |
Botto RE, Cody GD, Kirz J, Ade H, Behal S, Disko M. Selective chemical mapping of coal microheterogeneity by scanning transmission X-ray microscopy Energy & Fuels. 8: 151-154. DOI: 10.1021/Ef00043A026 |
0.616 |
|
| 1994 |
Zhang X, Ade H, Jacobsen C, Kirz J, Lindaas S, Williams S, Wirick S. Micro-XANES: Chemical contrast in the scanning transmission X-ray microscope Nuclear Inst. and Methods in Physics Research, A. 347: 431-435. DOI: 10.1016/0168-9002(94)91922-4 |
0.756 |
|
| 1994 |
Kirz J, Ade H, Anderson E, Buckley C, Chapman H, Howells M, Jacobsen C, Ko CH, Lindaas S, Sayre D, Williams S, Wirick S, Zhang X. New results in soft X-ray microscopy Nuclear Inst. and Methods in Physics Research, B. 87: 92-97. DOI: 10.1016/0168-583X(94)95242-6 |
0.753 |
|
| 1994 |
Zhang X, Balhorn R, Jacobsen C, Kirz J, Williams S. Mapping DNA and protein in biological samples using the scanning transmission x-ray microscope Proceedings - Annual Meeting, Microscopy Society of America. 50-51. |
0.341 |
|
| 1993 |
Williams S, Zhang X, Jacobsen C, Kirz J, Lindaas S, Van'T Hof J, Lamm SS. Measurements of wet metaphase chromosomes in the scanning transmission X-ray microscope Journal of Microscopy. 170: 155-165. DOI: 10.1111/J.1365-2818.1993.Tb03335.X |
0.548 |
|
| 1993 |
Pellegrini C, Rosenzweig J, Nuhn HD, Pianetta P, Tatchyn R, Winick H, Bane K, Morton P, Raubenheimer T, Seeman J, Halbach K, Kim KJ, Kirz J. A 2 to 4 nm high power FEL on the SLAC linac Nuclear Inst. and Methods in Physics Research, A. 331: 223-227. DOI: 10.1016/0168-9002(93)90047-L |
0.39 |
|
| 1993 |
Zhang X, Ade H, Jacobsen C, Kirz J, Lindaas S, Oehler V, Williams S, Wirick S. Chemical contrast in scanning transmission x-ray microscope Proceedings - Annual Meeting, Microscopy Society of America. 648-649. |
0.633 |
|
| 1993 |
Jacobsen C, Kirz J, Lindaas S, Wirick S, Zhang X, Williams S, Anderson E, Kern D, Ade H. NSLS X 1AL scanning x-ray microscope Proceedings - Annual Meeting, Microscopy Society of America. 636-637. |
0.442 |
|
| 1993 |
Williams SP, Jacobsen CJ, Kirz J, Zhang X, Van't Hof J, Lamm S. Radiation damage to chromosomes in the scanning transmission x-ray microscope Proceedings of Spie - the International Society For Optical Engineering. 1741: 318-324. |
0.589 |
|
| 1992 |
McNulty I, Kirz J, Jacobsen C, Anderson EH, Howells MR, Kern DP. High-Resolution Imaging by Fourier Transform X-ray Holography. Science (New York, N.Y.). 256: 1009-12. PMID 17795006 DOI: 10.1126/Science.256.5059.1009 |
0.762 |
|
| 1992 |
Ade H, Zhang X, Cameron S, Costello C, Kirz J, Williams S. Chemical contrast in X-ray microscopy and spatially resolved XANES spectroscopy of organic specimens. Science (New York, N.Y.). 258: 972-5. PMID 1439809 DOI: 10.1126/Science.1439809 |
0.663 |
|
| 1992 |
Buckley CJ, Foster GF, Burge RE, Ali SY, Scotchford CA, Kirz J, Rivers ML. Elemental imaging of cartilage by scanning x-ray microscopy Review of Scientific Instruments. 63: 588-590. DOI: 10.1063/1.1143804 |
0.424 |
|
| 1992 |
Kirz J, Ade H, Jacobsen C, Ko CH, Lindaas S, McNulty I, Sayre D, Williams S, Zhang X, Howells M. Soft x-ray microscopy with coherent x rays Review of Scientific Instruments. 63: 557-563. DOI: 10.1063/1.1142705 |
0.796 |
|
| 1992 |
Jacobsen C, Kirz J, Williams S. Resolution in soft X-ray microscopes Ultramicroscopy. 47: 55-79. DOI: 10.1016/0304-3991(92)90185-M |
0.716 |
|
| 1991 |
Howells MR, Kirz J, Sayre D. X-ray microscopes. Scientific American. 264: 88-94. PMID 2000484 DOI: 10.1038/Scientificamerican0291-88 |
0.599 |
|
| 1991 |
Ade H, Kirz J, Hulbert S, Johnson E, Anderson E, Kern D. Images of a microelectronic device with the X1-SPEM, a first generation scanning photoemission microscope at the National Synchrotron Light Source Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 9: 1902-1906. DOI: 10.1116/1.577541 |
0.54 |
|
| 1991 |
Kirz J. X‐ray microscopy Synchrotron Radiation News. 4: 17-22. DOI: 10.1080/08940889108602606 |
0.336 |
|
| 1991 |
Jacobsen C, Williams S, Anderson E, Browne MT, Buckley CJ, Kern D, Kirz J, Rivers M, Zhang X. Diffraction-limited imaging in a scanning transmission x-ray microscope Optics Communications. 86: 351-364. DOI: 10.1016/0030-4018(91)90016-7 |
0.706 |
|
| 1990 |
Rarback H, Buckley C, Ade H, Camilo F, Digennaro R, Hellman S, Howells M, Iskander N, Jacobsen C, Kirz J, Krinsky S, Lindaas S, McNulty I, Oversluizen M, Rothman S, et al. Coherent Radiation for X-Ray Imaging-The Soft X-Ray Undulator and the X1A Beamline at the NSLS. Journal of X-Ray Science and Technology. 2: 274-96. PMID 21307430 DOI: 10.1016/0895-3996(90)90017-G |
0.789 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/Josaa.7.001847 |
0.712 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Jacobsen C, Howells M, Kirz J, Rothman S. X-ray holographic microscopy using photoresists Journal of the Optical Society of America A. 7: 1847. DOI: 10.1364/JOSAA.7.001847 |
0.48 |
|
| 1990 |
Ade H, Kirz J, Hulbert S, Johnson E, Anderson E, Kern D. A scanning photoelectron microscope (SPEM) at the NSLS Physica Scripta. 41: 737-739. DOI: 10.1088/0031-8949/41/6/001 |
0.596 |
|
| 1990 |
Rothman S, Anderson E, Attwood D, Batson P, Goncz K, Tackaberry R, Turek S, Howells M, Buckley C, Kern D, Jacobsen C, Kirz J, Rarback H, Rivers M, Shu D. Soft X-ray Microscopy in Biology and Medicine: Status and Prospects Physica Scripta. 1990: 18-22. DOI: 10.1088/0031-8949/1990/T31/002 |
0.616 |
|
| 1990 |
Kirz J, Ade H, Anderson E, Attwood D, Buckley C, Hellman S, Howells M, Jacobsen C, Kern D, Lindaas S, McNulty I, Oversluizen M, Rarback H, Rivers M, Rothman S, et al. X-ray Microscopy with the NSLS Soft X-ray Undulator Physica Scripta. 1990: 12-17. DOI: 10.1088/0031-8949/1990/T31/001 |
0.768 |
|
| 1990 |
Ade H, Kirz J, Hulbert SL, Johnson ED, Anderson E, Kern D. X-ray spectromicroscopy with a zone plate generated microprobe Applied Physics Letters. 56: 1841-1843. DOI: 10.1063/1.103064 |
0.56 |
|
| 1990 |
Ade H, Kirz J, Hulbert S, Johnson E, Anderson E, Kern D. Scanning photoelectron microscope with a zone plate generated microprobe Nuclear Inst. and Methods in Physics Research, A. 291: 126-131. DOI: 10.1016/0168-9002(90)90046-9 |
0.602 |
|
| 1990 |
McNulty I, Kirz J, Jacobsen C, Anderson E, Howells MR, Rarback H. Soft-X-ray microscope using fourier transform holography Nuclear Inst. and Methods in Physics Research, A. 291: 74-79. DOI: 10.1016/0168-9002(90)90036-6 |
0.766 |
|
| 1990 |
Rarback H, Buckley C, Goncz K, Ade H, Anderson E, Attwood D, Batson P, Hellman S, Jacobsen C, Kern D, Kirz J, Lindaas S, McNulty I, Oversluizen M, Rivers M, et al. The scanning transmission microscope at the NSLS Nuclear Inst. and Methods in Physics Research, A. 291: 54-59. DOI: 10.1016/0168-9002(90)90033-3 |
0.761 |
|
| 1989 |
Rothman SS, Iskander N, Attwood D, Vladimirsky Y, McQuaid K, Grendell J, Kirz J, Ade H, McNulty I, Kern D. The interior of a whole and unmodified biological object--the zymogen granule--viewed with a high-resolution X-ray microscope. Biochimica Et Biophysica Acta. 991: 484-6. PMID 2730924 DOI: 10.1016/0304-4165(89)90077-9 |
0.761 |
|
| 1989 |
Buckley C, Rarback H, Alforque R, Shu D, Ade H, Hellman S, Iskander N, Kirz J, Lindaas S, Mcnulty I, Oversluizen M, Tang E, Attwood D, DiGennaro R, Howells M, et al. Soft-x-ray imaging with the 35 period undulator at the NSLS Review of Scientific Instruments. 60: 2444-2447. DOI: 10.1063/1.1140694 |
0.753 |
|
| 1988 |
Vladimirsky Y, Kern DP, Chang THP, Attwood DT, Iskander N, Rothman S, McQuaide K, Kirz J, Ade H, McNulty I, Rarback H, Shu D. Zone plate lenses for X-ray microscopy Nuclear Inst. and Methods in Physics Research, A. 266: 324-328. DOI: 10.1016/0168-9002(88)90405-6 |
0.742 |
|
| 1988 |
Shu D, Siddons DP, Rarback H, Kirz J. Two-dimensional laser interferometric encoder for the soft X-ray scanning microscope at the NSLS Nuclear Inst. and Methods in Physics Research, A. 266: 313-317. DOI: 10.1016/0168-9002(88)90403-2 |
0.476 |
|
| 1988 |
Kirz J. New developments in X-ray microscopy Nuclear Inst. and Methods in Physics Research, A. 266: 293-295. DOI: 10.1016/0168-9002(88)90399-3 |
0.545 |
|
| 1988 |
Rarback H, Jacobsen C, Kirz J, McNulty I. The performance of the NSLS mini-undulator Nuclear Inst. and Methods in Physics Research, A. 266: 96-105. DOI: 10.1016/0168-9002(88)90366-X |
0.754 |
|
| 1987 |
Rarback H, Cinotti F, Jacobsen C, Kenney JM, Kirz J, Rosser R. Elemental analysis using differential absorption techniques. Biological Trace Element Research. 13: 103-13. PMID 24254669 DOI: 10.1007/Bf02796625 |
0.634 |
|
| 1987 |
Yang BX, Kirz J. Soft x-ray absorption cross section of argon determined by a variable absorber technique. Applied Optics. 26: 3823-6. PMID 20490147 DOI: 10.1364/Ao.26.003823 |
0.427 |
|
| 1987 |
Yang BX, Kirz J. Extended x-ray-absorption fine structure of liquid water. Physical Review. B, Condensed Matter. 36: 1361-1364. PMID 9942965 DOI: 10.1103/PhysRevB.36.1361 |
0.333 |
|
| 1987 |
Yang BX, Kirz J. Extended x-ray absorption fine structure of CO2 analyzed by a new algorithm. Physical Review. B, Condensed Matter. 35: 6100-6106. PMID 9940841 DOI: 10.1103/PhysRevB.35.6100 |
0.318 |
|
| 1987 |
Howells M, Jacobsen C, Kirz J, Feder R, McQuaid K, Rothman S. X-ray holograms at improved resolution: a study of zymogen granules. Science (New York, N.Y.). 238: 514-7. PMID 3659925 DOI: 10.1126/Science.3659925 |
0.713 |
|
| 1987 |
Jacobsen C, Kenney JM, Kirz J, Rosser RJ, Cinotti F, Rarback H, Pine J. Quantitative imaging and microanalysis with a scanning soft x-ray microscope. Physics in Medicine and Biology. 32: 431-7. PMID 3588665 DOI: 10.1088/0031-9155/32/4/002 |
0.696 |
|
| 1987 |
Yang BX, Kirz J, Xu S. Characterization of phosphors in the soft X-ray region Nuclear Inst. and Methods in Physics Research, A. 258: 141-145. DOI: 10.1016/0168-9002(87)90090-8 |
0.412 |
|
| 1987 |
Jacobsen C, Kirz J, Howells MR, Feder R, Sayre D. EXPERIMENTS IN SOFT X-RAY NEAR-FIELD DIFFRACTION IMAGING WITH AN UNDULATOR . 160, 162. |
0.465 |
|
| 1986 |
Jacobsen C, Kenney JM, Kirz J, McNulty I, Rosser RJ, Cinotti F, Rarback H, Shu D. Soft X-ray scanning microscopy: its practical use for elemental mapping at the NSLS U15 beamline. Photochemistry and Photobiology. 44: 421-3. PMID 3786465 DOI: 10.1111/J.1751-1097.1986.Tb04688.X |
0.78 |
|
| 1986 |
Jacobsen C, Kenney JM, Kirz J, McNulty I, Rosser RJ, Cinotti F, Rarback H, Shu D. Microanalysis with a soft X ray scanning microprobe. Annals of the New York Academy of Sciences. 483: 463-9. PMID 3471139 DOI: 10.1111/J.1749-6632.1986.Tb34559.X |
0.776 |
|
| 1986 |
Howells MR, Iarocci MA, Kirz J. Experiments in x-ray holographic microscopy using synchrotron radiation Journal of the Optical Society of America a-Optics Image Science and Vision. 3: 2171-2178. DOI: 10.1364/Josaa.3.002171 |
0.554 |
|
| 1986 |
Fan SF, Yun WB, Rosser RJ, Kirz J, Sayre D, Dewey MM, Colflesh D. Soft x-ray diffraction of striated muscle Proceedings of Spie - the International Society For Optical Engineering. 733: 435-439. DOI: 10.1117/12.964943 |
0.373 |
|
| 1986 |
Rarback H, Shu D, Ade H, Jacobsen C, Kirz J, McNulty I, Rosser R. An undulator based scanning microscope at the national synchrotron light source Proceedings of Spie - the International Society For Optical Engineering. 691: 107-110. DOI: 10.1117/12.936628 |
0.685 |
|
| 1986 |
Yang BX, Kirz J, McNulty I. Variable pressure ion chamber for relative and absolute flux measurement Proceedings of Spie - the International Society For Optical Engineering. 689: 34-39. DOI: 10.1117/12.936561 |
0.422 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.566 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Kirz J, Sayre D. Soft X-ray microscopy Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 246: 695-697. DOI: 10.1016/0168-9002(86)90175-0 |
0.478 |
|
| 1986 |
Yang BX, Kirz J, Kao YH, Sham TK. Soft X-ray spectroscopy with a scintillation detector Nuclear Inst. and Methods in Physics Research, A. 246: 523-526. DOI: 10.1016/0168-9002(86)90144-0 |
0.459 |
|
| 1986 |
Rarback H, Krinsky S, Mortazavi P, Shu D, Kirz J, Jacobsen C, Howells M. An undulator source beamline for soft X-ray imaging Nuclear Inst. and Methods in Physics Research, A. 246: 159-162. DOI: 10.1016/0168-9002(86)90065-3 |
0.693 |
|
| 1985 |
Kennedy JM, Jacobsen C, Kirz J, Rarback H, Cinotti F, Thomlinson W, Rosser G, Schidlovsky G. Absorption microanalysis with a scanning soft X-ray microscope: mapping the distribution of calcium in bone. Journal of Microscopy. 138: 321-8. PMID 4032469 DOI: 10.1111/J.1365-2818.1985.Tb02626.X |
0.638 |
|
| 1985 |
Glass H, Adams M, Coutrakon G, Finley D, Jaffe D, Kirz J, McCarthy R, Hubbard JR, Mangeot PH, Peisert A, Charpak G, Santiard JC, Sauli F, Brown C, Jonckheere A, et al. Identification of high transverse-momentum hadrons with a ring-imaging cerenkov counter Ieee Transactions On Nuclear Science. 32: 692-696. DOI: 10.1109/Tns.1985.4336924 |
0.313 |
|
| 1985 |
Howells M, Kirz J, Sayre D, Schmahl G. Soft-X-Ray Microscopes Physics Today. 38: 22-32. DOI: 10.1063/1.880983 |
0.525 |
|
| 1985 |
Yang BX, Kirz J, Sham TK. Oxygen K-edge absorption spectra of O2, CO and CO2 Physics Letters A. 110: 301-304. DOI: 10.1016/0375-9601(85)90777-7 |
0.371 |
|
| 1985 |
Yang BX, Kao YH, Kirz J, Gu CX, Bhargava RN, Cammack DA, Dalby RJ. Transmission measurements of soft X-ray absorption fine structure in solids by a new scintillation technique Physics Letters A. 113: 283-288. DOI: 10.1016/0375-9601(85)90029-5 |
0.485 |
|
| 1985 |
Bing Xin Yang, Kirz J, Sham TK. Scintillation counter for soft X-ray spectroscopy Nuclear Inst. and Methods in Physics Research, A. 236: 419-422. DOI: 10.1016/0168-9002(85)90187-1 |
0.495 |
|
| 1984 |
Kern D, Coane P, Acosta R, Chang THP, Feder R, Houzego P, Molzen W, Powers J, Speth A, Viswanathan R, Kirz J, Rarback H, Kenney J. Electron beam fabrication and characterization of fresnel zone plates for soft x-ray microscopy Proceedings of Spie - the International Society For Optical Engineering. 447: 204-213. DOI: 10.1117/12.939200 |
0.403 |
|
| 1984 |
Howells MR, Iarocci M, Kenney J, Kirz J, Rarback H. X-Ray Holographic Microscopy Experiments at the Brookhaven Synchrotron Light Source Proceedings of Spie - the International Society For Optical Engineering. 447: 193-203. DOI: 10.1117/12.939199 |
0.434 |
|
| 1984 |
Kenney JM, Kirz J, Rarback H. Scanning soft x-ray microscopy with a fresnel zoneplate at the national synchrotron light source Proceedings of Spie - the International Society For Optical Engineering. 447: 158-163. DOI: 10.1117/12.939193 |
0.455 |
|
| 1984 |
Kenney JM, Kirz J, Rarback H, Howells MR, Chang P, Coane PJ, Feder R, Houzego PJ, Kern DP, Sayre D. Soft X-ray microscopy at the NSLS Nuclear Instruments and Methods in Physics Research. 222. DOI: 10.1016/0167-5087(84)90500-3 |
0.495 |
|
| 1984 |
Kenney JM, Kirz J, Rarback H, Howells MR, Chang P, Coane PJ, Feder R, Houzego PJ, Kern DP, Sayre D. Soft X-ray microscopy at the NSLS Nuclear Instruments and Methods in Physics Research. 222. DOI: 10.1016/0167-5087(84)90500-3 |
0.495 |
|
| 1980 |
Kirz J. Specimen damage considerations in biological microprobe analysis. Scanning Electron Microscopy. 239-49. PMID 6252602 |
0.432 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/J.1749-6632.1980.Tb47215.X |
0.494 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Kirz J, Burg R, Rarback H. PLANS FOR A SCANNING TRANSMISSION X-RAY MICROSCOPE Annals of the New York Academy of Sciences. 342: 135-147. DOI: 10.1111/j.1749-6632.1980.tb47215.x |
0.43 |
|
| 1980 |
Bacino W, Ferguson T, Nodulman L, Slater W, Ticho H, Diamant-Berger A, Donaldson G, Duro M, Hall A, Irwin G, Kirkby J, Merritt F, Wojcicki S, Burns R, Condon P, ... ... Kirz J, et al. Evidence for unequal lifetimes of the D0 and D+ Physical Review Letters. 45: 329-332. DOI: 10.1103/Physrevlett.45.329 |
0.554 |
|
| 1979 |
Bacino W, Ferguson T, Nodulman L, Slater W, Ticho H, Diamant-Berger A, Donaldson G, Duro M, Hall A, Irwin G, Kirkby J, Merritt F, Wojcicki S, Burns R, Condon P, ... ... Kirz J, et al. Semileptonic decays on the D meson Physical Review Letters. 43: 1073-1076. DOI: 10.1103/Physrevlett.43.1073 |
0.583 |
|
| 1979 |
Bacino W, Ferguson T, Nodulman L, Slater WE, Ticho HK, Diamant-Berger A, Donaldson G, Duro M, Hall A, Irwin G, Kirkby J, Merritt F, Wojcicki S, Burns R, Condon P, ... ... Kirz J, et al. Nature of the -W coupling Physical Review Letters. 42: 749-752. DOI: 10.1103/Physrevlett.42.749 |
0.541 |
|
| 1979 |
Bacino W, Ferguson T, Nodulman L, Slater W, Ticho H, Diamant-Berger A, Donaldson G, Duro M, Hall A, Irwin G, Kirkby J, Merritt F, Wojcicki S, Burns R, Condon P, ... ... Kirz J, et al. Measurement of the branching ratios for τ→πντ and τ→μνμντ Physical Review Letters. 42: 6-9. DOI: 10.1103/Physrevlett.42.6 |
0.549 |
|
| 1978 |
Kirz J, Sayre D, Dilger J. Comparative analysis of X-ray emission microscopies for biological specimens Annals of the New York Academy of Sciences. 291-305. DOI: 10.1111/J.1749-6632.1978.Tb25655.X |
0.507 |
|
| 1978 |
Sayre D, Kirz J, Feder R. Assessment of the potential of ultrasoft X-ray microscopy Annals of the New York Academy of Sciences. 286-290. DOI: 10.1111/J.1749-6632.1978.Tb25654.X |
0.524 |
|
| 1978 |
Bacino W, Ferguson T, Nodulman L, Slater W, Ticho HK, Diamant-Berger A, Faessler M, Hall A, Irwin G, Kirkby J, Merritt F, Wojcicki S, Burns R, Condon P, Cowell P, ... Kirz J, et al. Measurement of the threshold behavior of + - production in e+e- annihilation Physical Review Letters. 41: 13-15. DOI: 10.1103/Physrevlett.41.13 |
0.596 |
|
| 1978 |
Bacino W, Baumgarten A, Birkwood L, Buchanan C, Burns R, Chronoviat M, Condon P, Coombes R, Cowell P, Diamant-Berger A, Faessler M, Ferguson T, Hall A, Hauptman J, Kirkby J, ... Kirz J, et al. Measurement of the D semileptonic branching ratio in e+e- annihilation at the ψ″(3770) Physical Review Letters. 40: 671-674. DOI: 10.1103/Physrevlett.40.671 |
0.548 |
|
| 1977 |
Sayre D, Kirz J, Feder R, Kim DM, Spiller E. Transmission microscropy of unmodified biological materials: comparative radiation dosages with electrons and ultrasoft x-ray photons. Ultramicroscopy. 2: 337-49. PMID 919076 DOI: 10.1016/S0304-3991(76)91997-5 |
0.389 |
|
| 1977 |
Sayre D, Kirz J, Feder R, Kim DM, Spiller E. Potential operating region for ultrasoft x-ray microscopy of biological materials. Science (New York, N.Y.). 196: 1339-40. PMID 867033 DOI: 10.1126/Science.867033 |
0.496 |
|
| 1976 |
Feder R, Sayre D, Spiller E, Topalian J, Kirz J. Specimen replication for electron microscopy using x rays and x-ray resist Journal of Applied Physics. 47: 1192-1193. DOI: 10.1063/1.322704 |
0.5 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/Josa.64.000301 |
0.346 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1974 |
Kirz J. Phase zone plates for x rays and the extreme uv Journal of the Optical Society of America. 64: 301. DOI: 10.1364/JOSA.64.000301 |
0.397 |
|
| 1972 |
Thun R, Blieden HR, Finocchiaro G, Kirz J, Nef C, Bowen D, Earles D, Faissler W, Garelick D, Gettner M, Glaubman M, Gottschalk B, Lutz G, Moromisato J, Shibata EI, et al. Measurement of neutral-meson production in π-p+π-pX0 at 13.4 GeV/c Physical Review Letters. 28: 1733-1735. DOI: 10.1103/Physrevlett.28.1733 |
0.357 |
|
| 1966 |
Chung SU, Neveu-René M, Dahl OI, Kirz J, Miller DH, Guiragossin ZGT. Analysis of the B enhancement Physical Review Letters. 16: 481-485. DOI: 10.1103/Physrevlett.16.481 |
0.335 |
|
| 1964 |
Rosenfeld AH, Barbaro-Galtieri A, Barkas WH, Bastien PL, Kirz J, Roos M. Data on elementary particles and resonant states Reviews of Modern Physics. 36: 977-1004. DOI: 10.1103/Revmodphys.36.977 |
0.514 |
|
| 1963 |
Kirz J, Schwartz J, Tripp RD. Reaction π-+p→π-+π++n from 360 to 800 MeV Physical Review. 130: 2481-2484. DOI: 10.1103/Physrev.130.2481 |
0.509 |
|
| 1962 |
Kirz J, Schwartz J, Tripp RD. I=2 S-Wave - scattering length Physical Review. 126: 763-765. DOI: 10.1103/Physrev.126.763 |
0.513 |
|
| 1961 |
Berge JP, Bastien P, Dahl O, Ferro-Luzzi M, Kirz J, Miller DH, Murray JJ, Rosenfeld AH, Tripp RD, Watson MB. Pion-Lambda resonance (Y1*) Physical Review Letters. 6: 557-562. DOI: 10.1103/Physrevlett.6.557 |
0.682 |
|
| 1961 |
Humphrey WE, Kirz J, Rosenfeld AH, Leitner J, Rhee YI. Evidence for low rates for decay of- and hyperons Physical Review Letters. 6: 478-481. DOI: 10.1103/Physrevlett.6.478 |
0.518 |
|
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