Year |
Citation |
Score |
2020 |
Carter CB, Norton MG, Blanford CF. Celebrating 1000 issues Journal of Materials Science. 55: 10281-10283. DOI: 10.1007/S10853-020-04731-2 |
0.566 |
|
2017 |
Carter CB, Blanford CF. All authors must now supply ORCID identifiers Journal of Materials Science. 52: 6147-6149. DOI: 10.1007/S10853-017-0919-7 |
0.561 |
|
2016 |
Blanford CF, Carter CB. The art of being found: crafting the right title Journal of Materials Science. 51: 8761-8763. DOI: 10.1007/S10853-016-0110-6 |
0.561 |
|
2016 |
Carter CB, Blanford CF. Plagiarism and detection Journal of Materials Science. 1-2. DOI: 10.1007/S10853-016-0004-7 |
0.559 |
|
2016 |
Winterstein JP, Sezen M, Rečnik A, Carter CB. Electron microscopy observations of the spinel-forming reaction using MgO nanocubes on Al2O3 substrates Journal of Materials Science. 51: 144-157. DOI: 10.1007/S10853-015-9366-5 |
0.699 |
|
2015 |
Li Z, Tan X, Li P, Kalisvaart P, Janish MT, Mook WM, Luber EJ, Jungjohann KL, Carter CB, Mitlin D. Coupling In Situ TEM and Ex Situ Analysis to Understand Heterogeneous Sodiation of Antimony. Nano Letters. 15: 6339-48. PMID 26389786 DOI: 10.1021/Acs.Nanolett.5B03373 |
0.32 |
|
2015 |
Janish MT, Mook WM, Carter CB. Nucleation of fcc Ta when heating thin films Scripta Materialia. 96: 21-24. DOI: 10.1016/J.Scriptamat.2014.10.010 |
0.356 |
|
2015 |
Janish MT, Mackay DT, Liu Y, Jungjohann KL, Carter CB, Norton MG. TEM in situ lithiation of tin nanoneedles for battery applications Journal of Materials Science. 51: 589-602. DOI: 10.1007/S10853-015-9318-0 |
0.302 |
|
2015 |
Janish MT, Kotula PG, Boyce BL, Carter CB. Observations of fcc and hcp tantalum Journal of Materials Science. 50: 3706-3715. DOI: 10.1007/S10853-015-8931-2 |
0.354 |
|
2014 |
Winterstein JP, Carter CB. Electron-beam damage and point defects near grain boundaries in cerium oxide Journal of the European Ceramic Society. 34: 3007-3018. DOI: 10.1016/J.Jeurceramsoc.2014.02.017 |
0.683 |
|
2011 |
Bhowmick S, Xue Y, Winterstein J, Carter CB. Influence of alumina impurities on microstructure of LSM–CeO2 composites Solid State Ionics. 187: 68-77. DOI: 10.1016/J.Ssi.2011.02.007 |
0.704 |
|
2011 |
Riesterer JL, Carter CB. Changes in dewetting behavior of SiO2 films on TiO2 substrates due to film thickness and crucible choice Journal of Materials Science. 46: 4397-4406. DOI: 10.1007/S10853-011-5353-7 |
0.321 |
|
2010 |
Bhowmick S, Basu J, Xue Y, Carter CB. Hydrothermal Synthesis of Nanocrystalline Barium Cerate Using Hexamethylenetetramine Journal of the American Ceramic Society. 93: 4041-4046. DOI: 10.1111/J.1551-2916.2010.03998.X |
0.368 |
|
2010 |
Basu J, Divakar R, Winterstein JP, Carter CB. Low-temperature and ambient-pressure synthesis and shape evolution of nanocrystalline pure, La-doped and Gd-doped CeO2 Applied Surface Science. 256: 3772-3777. DOI: 10.1016/J.Apsusc.2010.01.024 |
0.697 |
|
2009 |
Basu J, Carter CB, Divakar R, Mukherjee B, Ravishankar N. Nanopatterning by solid-state dewetting on reconstructed ceramic surfaces Applied Physics Letters. 94. DOI: 10.1063/1.3127442 |
0.35 |
|
2009 |
Winterstein J, Carter C. Reacting Oxide Nanoparticles with a Substrate Microscopy and Microanalysis. 15: 1332-1333. DOI: 10.1017/S1431927609097955 |
0.651 |
|
2009 |
Basu J, Bhowmick S, Winterstein J, Wang C, Xue Y, Carter C. Microscopy of Oxide Nanoparticles for Energy Applications Microscopy and Microanalysis. 15: 1404-1405. DOI: 10.1017/S1431927609096305 |
0.653 |
|
2009 |
Winterstein J, Wang C, Carter C. Electron Microscopy Analysis of Interfaces in Oxides for Energy Applications Microscopy and Microanalysis. 15: 1444-1445. DOI: 10.1017/S143192760909357X |
0.665 |
|
2009 |
Nowak JD, Carter CB. Forming contacts and grain boundaries between MgO nanoparticles Journal of Materials Science. 44: 2408-2418. DOI: 10.1007/S10853-009-3308-Z |
0.347 |
|
2008 |
Basu J, Divakar R, Nowak J, Hofmann S, Colli A, Franciosi A, Carter CB. Structure and growth mechanism of ZnSe nanowires Journal of Applied Physics. 104: 64302. DOI: 10.1063/1.2977722 |
0.33 |
|
2008 |
Winterstein JP, Basu J, Herzing A, Anderson IM, Carter CB. Combined structural and chemical investigations of ceria nanoparticles in the TEM Microscopy and Microanalysis. 14: 280-281. DOI: 10.1017/S1431927608087060 |
0.649 |
|
2008 |
Basu J, Divakar R, Winterstein JP, Ravishankar N, Carter CB. In situ microscopy: A tool to understand mechanisms Microscopy and Microanalysis. 14: 246-247. DOI: 10.1017/S143192760808673X |
0.643 |
|
2008 |
Blanford CF, Carter CB, Stein A. In situ high-temperature electron microscopy of 3DOM cobalt, iron oxide, and nickel Journal of Materials Science. 43: 3539-3552. DOI: 10.1007/S10853-008-2550-0 |
0.698 |
|
2007 |
Mook WM, Nowak JD, Perrey CR, Carter CB, Mukherjee R, Girshick SL, McMurry PH, Gerberich WW. Compressive stress effects on nanoparticle modulus and fracture Physical Review B - Condensed Matter and Materials Physics. 75. DOI: 10.1103/Physrevb.75.214112 |
0.655 |
|
2006 |
Gerberich WW, Mook WM, Chambers MD, Cordill MJ, Perrey CR, Carter CB, Miller RE, Curtin WA, Mukherjee R, Girshick SL. An energy balance criterion for nanoindentation-induced single and multiple dislocation events Journal of Applied Mechanics, Transactions Asme. 73: 327-334. DOI: 10.1115/1.2125988 |
0.681 |
|
2006 |
Blanford CF, Carter CB, Stein A. Determination of void arrangements in inverse opals by transmission electron microscopy Journal of Physics: Conference Series. 26: 264-267. DOI: 10.1088/1742-6596/26/1/063 |
0.588 |
|
2006 |
Riesterer JL, Farrer JK, Munoz NE, Gilliss SR, Ravishankar N, Carter CB. Studying alumina boundary migration using combined microscopy techniques Journal of Physics: Conference Series. 26: 123-126. DOI: 10.1088/1742-6596/26/1/029 |
0.717 |
|
2006 |
Bentley J, Gilliss SR, Carter CB, Al-Sharab JF, Cosandey F, Anderson IM, Kotula PJ. Nanoscale EELS analysis of oxides: composition mapping, valence determination and beam damage Journal of Physics: Conference Series. 26: 69-72. DOI: 10.1088/1742-6596/26/1/016 |
0.688 |
|
2006 |
McCarty KF, Pierce JP, Carter CB. Translation-related domain boundaries form to relieve strain in a thin alumina film on NiAl (110) Applied Physics Letters. 88. DOI: 10.1063/1.2191739 |
0.306 |
|
2006 |
Bentley J, Farrer JK, Johnson MT, Carter CB. Forsterite Formed on MgO Single Crystals During In-Situ Annealing Microscopy and Microanalysis. 12: 814-815. DOI: 10.1017/S1431927606066876 |
0.717 |
|
2006 |
Riesterer J, Gilliss S, Ravishankar N, Carter C. A Study of Dewetting on (001) Rutile using AFM Microscopy and Microanalysis. 12: 1028-1029. DOI: 10.1017/S143192760606418X |
0.763 |
|
2006 |
Riesterer J, Farrer J, Ravishankar N, Carter C. Studying Trapped Grains in Alumina using SEM and EBSD Microscopy and Microanalysis. 12: 1020-1021. DOI: 10.1017/S1431927606063069 |
0.774 |
|
2006 |
Cordill MJ, Chambers MD, Lund MS, Hallman DM, Perrey CR, Carter CB, Bapat A, Kortshagen U, Gerberich WW. Plasticity responses in ultra-small confined cubes and films Acta Materialia. 54: 4515-4523. DOI: 10.1016/J.Actamat.2006.05.037 |
0.665 |
|
2006 |
Perrey CR, Carter CB. Insights into nanoparticle formation mechanisms Journal of Materials Science. 41: 2711-2722. DOI: 10.1007/S10853-006-7874-Z |
0.676 |
|
2006 |
Farrer JK, Carter CB. Defect structure in GaN pyramids Journal of Materials Science. 41: 779-792. DOI: 10.1007/S10853-006-6563-2 |
0.742 |
|
2006 |
Farrer JK, Carter CB, Ravishankar N. The effects of crystallography on grain-boundary migration in alumina Journal of Materials Science. 41: 661-674. DOI: 10.1007/S10853-006-6482-2 |
0.758 |
|
2006 |
Farrer JK, Carter CB. Texture in solid-state reactions Journal of Materials Science. 41: 5169-5184. DOI: 10.1007/S10853-006-0428-6 |
0.743 |
|
2006 |
Deneen J, Mook WM, Minor A, Gerberich WW, Carter CB. In situ deformation of silicon nanospheres Journal of Materials Science. 41: 4477-4483. DOI: 10.1007/S10853-006-0085-9 |
0.333 |
|
2005 |
Thompson S, Perrey CR, Belich TJ, Blackwell C, Carter CB, Kakalios J, Kortshagen U. Experimental Study of Silane Plasma Nanoparticle Formation in Amorphous Silicon Thin Films Mrs Proceedings. 862. DOI: 10.1557/PROC-862-A8.1 |
0.683 |
|
2005 |
Ding YP, Bapat A, Dong Y, Perrey CR, Kortshagen UR, Carter CB, Campbell SA. A single nanoparticle silicon transistor Device Research Conference - Conference Digest, Drc. 2005: 165-166. DOI: 10.1109/DRC.2005.1553104 |
0.66 |
|
2005 |
Thompson S, Perrey CR, Carter CB, Belich TJ, Kakalios J, Kortshagen U. Experimental investigations into the formation of nanoparticles in a/nc-Si:H thin films Journal of Applied Physics. 97. DOI: 10.1063/1.1849435 |
0.683 |
|
2005 |
Gerberich WW, Mook WM, Cordill MJ, Carter CB, Perrey CR, Heberlein JV, Girshick SL. Reverse plasticity in single crystal silicon nanospheres International Journal of Plasticity. 21: 2391-2405. DOI: 10.1016/J.Ijplas.2005.03.001 |
0.682 |
|
2005 |
Gilliss SR, Bentley J, Carter CB. Electron energy-loss spectroscopic study of the surface of ceria abrasives Applied Surface Science. 241: 61-67. DOI: 10.1016/J.Apsusc.2004.09.018 |
0.742 |
|
2005 |
Gerberich WW, Cordill MJ, Mook WM, Moody NR, Perrey CR, Carter CB, Mukherjee R, Girshick SL. A boundary constraint energy balance criterion for small volume deformation Acta Materialia. 53: 2215-2229. DOI: 10.1016/J.Actamat.2005.01.028 |
0.675 |
|
2004 |
Blanford CF, Carter CB, Stein A. A method for determining void arrangements in inverse opals. Journal of Microscopy. 216: 263-87. PMID 15566498 DOI: 10.1111/J.0022-2720.2004.01421.X |
0.661 |
|
2004 |
Perrey CR, Carter CB, Michael JR, Kotula PG, Stach EA, Radmilovic VR. Using the FIB to characterize nanoparticle materials. Journal of Microscopy. 214: 222-36. PMID 15157190 DOI: 10.1111/J.0022-2720.2004.01325.X |
0.691 |
|
2004 |
A SS, Shenoy VB, Carter CB, Ravishankar N. Nanopatterning on Reconstructed Ceramic Surfaces Mrs Proceedings. 819. DOI: 10.1557/Proc-819-N5.8 |
0.328 |
|
2004 |
Deb B, Altay A, Gilliss SR, Munoz N, Carter CB. Technique for Monitoring the Etching Rate of Alumina Mrs Proceedings. 819. DOI: 10.1557/Proc-819-N3.11 |
0.735 |
|
2004 |
Bapat A, Dong Y, Perrey CR, Carter CB, Campbell SA, Kortshagen UR. Silicon Nanoparticle Synthesis Using Constricted Mode Capacitive Silane Plasma Mrs Proceedings. 818: 405-410. DOI: 10.1557/Proc-818-M14.4.1 |
0.646 |
|
2004 |
Perrey CR, Deneen JM, Carter CB. The Effects of Processing on the Morphology of Nanoparticles Mrs Proceedings. 818. DOI: 10.1557/Proc-818-M11.10.1 |
0.685 |
|
2004 |
Perrey CR, Thompson SS, Lentzen M, Kortshagen U, Carter CB. Understanding the structure of Si nanoclusters in a/nc-Si:H films using spherical aberration-corrected transmission electron microscopy Mrs Proceedings. 808: 17-22. DOI: 10.1557/Proc-808-A8.7 |
0.7 |
|
2004 |
Johnson MT, Carter CB, Schmalzried H. Behavior of MgFe2O4 Films on MgO in an Electric Field Journal of the American Ceramic Society. 83: 1768-1772. DOI: 10.1111/J.1151-2916.2000.Tb01462.X |
0.35 |
|
2004 |
Johnson MT, Carter CB, Michael J. SEM Analysis of Oxide Thin Films and Reactions Journal of the American Ceramic Society. 82: 1644-1646. DOI: 10.1111/J.1151-2916.1999.Tb01981.X |
0.351 |
|
2004 |
Mallamaci MP, Carter CB. Crystallization of Pseudo‐orthorhombic Anorthite on Basal Sapphire Journal of the American Ceramic Society. 82: 33-42. DOI: 10.1111/J.1151-2916.1999.Tb01720.X |
0.375 |
|
2004 |
Bapat A, Anderson C, Perrey CR, Carter CB, Campbell SA, Kortshagen UR. Plasma synthesis of single-crystal silicon nanoparticles for novel electronic device applications Plasma Physics and Controlled Fusion. 46. DOI: 10.1088/0741-3335/46/12B/009 |
0.704 |
|
2004 |
Munoz NE, Gilliss SR, Carter CB. The monitoring of grain-boundary grooves in alumina Philosophical Magazine Letters. 84: 21-26. DOI: 10.1080/09500830310001614487 |
0.739 |
|
2004 |
Perrey CR, Deneen JM, Carter CB. The Effects of Rapid Cooling on the Structure and Morphology of Silicon Nanoparticles Microscopy and Microanalysis. 10: 592-593. DOI: 10.1017/S1431927604885064 |
0.687 |
|
2004 |
Perrey CR, Deneen JM, Thompson SS, Lentzen M, Kortshagen U, Carter CB. Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy Microscopy and Microanalysis. 10: 996-997. DOI: 10.1017/S1431927604884976 |
0.695 |
|
2004 |
Munoz N, Gilliss S, Carter C. Remnant grooves on alumina surfaces Surface Science. 573: 391-402. DOI: 10.1016/J.Susc.2004.10.006 |
0.734 |
|
2004 |
Hafiz J, Wang X, Mukherjee R, Mook W, Perrey CR, Deneen J, Heberlein JVR, McMurry PH, Gerberich WW, Carter CB, Girshick SL. Hypersonic plasma particle deposition of Si-Ti-N nanostructured coatings Surface and Coatings Technology. 188: 364-370. DOI: 10.1016/J.Surfcoat.2004.08.226 |
0.685 |
|
2004 |
Perrey CR, Thompson S, Lentzen M, Kortshagen U, Carter CB. Observation of Si nanocrystals in a/nc-Si:H films by spherical-aberration corrected transmission electron microscopy Journal of Non-Crystalline Solids. 343: 78-84. DOI: 10.1016/J.Jnoncrysol.2004.06.013 |
0.71 |
|
2003 |
Blanford CF, Carter CB. Electron radiation damage of MCM-41 and related materials. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 9: 245-63. PMID 12807675 DOI: 10.1017/S1431927603030447 |
0.615 |
|
2003 |
Gilliss SR, Ravishankar N, Farrer JK, Carter CB. Boundary Migration in Rutile Microscopy and Microanalysis. 9: 676-677. DOI: 10.2172/822867 |
0.803 |
|
2003 |
Belich TJ, Thompson S, Perrey C, Kortshagen U, Carter C, Kakalios J. Hydrogenated Amorphous Silicon Thin Films with Nanocrystalline Silicon Inclusions Mrs Proceedings. 762. DOI: 10.1557/PROC-762-A14.4 |
0.667 |
|
2003 |
Bapat A, Perrey CR, Campbell SA, Carter CB, Kortshagen U. Synthesis of highly oriented, single-crystal silicon nanoparticles in a low-pressure, inductively coupled plasma Journal of Applied Physics. 94: 1969-1974. DOI: 10.1063/1.1586957 |
0.699 |
|
2003 |
Cohen D, Carter CB. Σ = 3, {112} Lateral Twin Boundaries in GaP Interface Science. 11: 391-401. DOI: 10.1023/A:1026187726360 |
0.358 |
|
2003 |
Perrey CR, Carter CB, Lentzen M. Application of Variable CS HRTEM to the Study of Nanoscale Structures Microscopy and Microanalysis. 9: 958-959. DOI: 10.1017/S1431927603444796 |
0.659 |
|
2003 |
Gilliss SR, Riesterer J, Altay A, Carter CB. On the Faceting of Alumina Surfaces Microscopy and Microanalysis. 9: 674-675. DOI: 10.1017/S1431927603443377 |
0.773 |
|
2003 |
Gilliss SR, Bentley J, Carter CB. Electron Energy-Loss Spectroscopy of Ceria Abrasives Microscopy and Microanalysis. 9: 420-421. DOI: 10.1017/S1431927603442104 |
0.716 |
|
2003 |
Perrey CR, Carter CB, Bentley J, Lentzen M. Analysis of Amorphous and Oxide Surface Layers on Nanoparticles Microscopy and Microanalysis. 9: 412-413. DOI: 10.1017/S1431927603442062 |
0.699 |
|
2003 |
Perrey CR, Lentzen M, Carter CB. Distinct as Snowflakes: the Shapes of Silicon Nanoscale Particles Microscopy and Microanalysis. 9: 394-395. DOI: 10.1017/S1431927603441974 |
0.672 |
|
2003 |
Carter CB, Gilliss SR, Perrey CR. Effects Of Sample Preparation In Analysis: Imaging Microscopy and Microanalysis. 9: 102-103. DOI: 10.1017/S143192760344107X |
0.75 |
|
2003 |
Gilliss SR, Munoz N, Perrey CR, Riesterer J, Ravishankar N, Farrer JK, Carter CB. Analysis of Grain Boundary Migration in Alumina Microscopy and Microanalysis. 9: 64-65. DOI: 10.1017/S1431927603441019 |
0.757 |
|
2003 |
Ravishankar N, Gilliss SR, Carter C. Glass and metals on crystalline oxides Journal of the European Ceramic Society. 23: 2777-2785. DOI: 10.1016/S0955-2219(03)00289-9 |
0.739 |
|
2003 |
Gerberich WW, Mook WM, Perrey CR, Carter CB, Baskes MI, Mukherjee R, Gidwani A, Heberlein J, McMurry PH, Girshick SL. Superhard silicon nanospheres Journal of the Mechanics and Physics of Solids. 51: 979-992. DOI: 10.1016/S0022-5096(03)00018-8 |
0.667 |
|
2002 |
Ravishankar N, Gilliss SR, Carter CB. Dewetting of liquids on ceramic surfaces at high temperatures. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 8: 257-67. PMID 12533223 DOI: 10.1017/S1431927602020196 |
0.787 |
|
2002 |
Perrey CR, Mook WM, Carter CB, Gerberich WW. Characterization of mechanical deformation of nanoscale volumes Materials Research Society Symposium - Proceedings. 740: 87-92. DOI: 10.1557/Proc-740-I3.13 |
0.694 |
|
2002 |
Bapat A, Kortshagen UR, Campbell SA, Perrey CR, Carter CB. Synthesis of Crystalline Silicon Nanoparticles in Low-Pressure Inductive Plasmas Mrs Proceedings. 737: 301-306. DOI: 10.1557/Proc-737-F1.10 |
0.716 |
|
2002 |
Yanina SV, Carter CB. Precipitation from a reactive silicate on MgO Journal of Materials Research. 17: 3056-3064. DOI: 10.1557/Jmr.2002.0444 |
0.788 |
|
2002 |
Ravishankar N, Carter CB. Bunching of Surface Steps and Facet Formation on Analumina Surface Journal of Materials Research. 17: 98-106. DOI: 10.1557/Jmr.2002.0016 |
0.312 |
|
2002 |
Gilliss SR, Ravishankar N, Kotula PG, Michael JR, Carter CB. Application of FIB and TEM for the Characterization of Dewetting Behavior on Ceramics Microscopy and Microanalysis. 8: 562-563. DOI: 10.1017/S1431927602105484 |
0.708 |
|
2002 |
Perrey CR, Carter CB, Kotula PG, Michael JR. Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy Microscopy and Microanalysis. 8: 1144-1145. DOI: 10.1017/S1431927602103795 |
0.678 |
|
2002 |
Yanina SV, Carter CB. Terraces and ledges on (001) spinel surfaces Surface Science. 513. DOI: 10.1016/S0039-6028(02)01825-3 |
0.779 |
|
2002 |
Yanina SV, Carter CB. Dislocations at spinel surfaces Surface Science. 511: 133-146. DOI: 10.1016/S0039-6028(02)01561-3 |
0.79 |
|
2001 |
Farrer JK, Carter CB, Mao Z, McKernan S. Thickness-fringe Contrast Analysis of Defects in GaN Mrs Proceedings. 673. DOI: 10.1557/Proc-673-P3.12 |
0.747 |
|
2001 |
Ravishankar N, Carter CB. Exuding Liquid from Grain Boundaries in Alumina Journal of the American Ceramic Society. 84: 859-862. DOI: 10.1111/J.1151-2916.2001.Tb00752.X |
0.354 |
|
2001 |
Gilliss SR, Fairer JK, Ravishankar N, Schwabel MG, Carter CB. Microanalysis of AFM Tips Coated with Cerium Oxide Microscopy and Microanalysis. 7: 1236-1237. DOI: 10.1017/S1431927600032256 |
0.71 |
|
2001 |
Ravishankar N, Carter CB. Surface Steps on Flux-Grown Alumina Microscopy and Microanalysis. 7: 416-417. DOI: 10.1017/S1431927600028154 |
0.317 |
|
2000 |
Ravishankar N, Farrer JK, Carter CB. Exudation of Silicate Liquid from Polycrystalline Alumina Mrs Proceedings. 654. DOI: 10.1557/Proc-654-Aa5.8.1 |
0.757 |
|
2000 |
Farrer JK, Ravishankar N, Michael JR, Carter CB. Grain Boundary Migration in Alumina Mrs Proceedings. 652. DOI: 10.1557/Proc-652-Y1.2 |
0.739 |
|
2000 |
Ramamurthy S, Schmalzried H, Carter CB. Interaction of silicate liquid with a sapphire surface Philosophical Magazine. 80: 2651-2674. DOI: 10.1080/01418610008216497 |
0.353 |
|
2000 |
Ravishankar N, Carter CB. Glass/Crystal Interfaces in Liquid-Phase Sintered Materials Interface Science. 8: 295-304. DOI: 10.1023/A:1008767111340 |
0.319 |
|
2000 |
Gilliss SR, Yanina SV, Ravishankar N, Carter CB. Surfaces of Gadolinium Gallium Garnet Microscopy and Microanalysis. 6: 716-717. DOI: 10.1017/S1431927600036072 |
0.715 |
|
2000 |
Yanina SV, Carter CB. Evaporation Spirals on {111} and {001} Surfaces of MgAl2O4 Spinel Microscopy and Microanalysis. 6: 714-715. DOI: 10.1017/S1431927600036060 |
0.778 |
|
2000 |
Ravishankar N, Carter CB. Silicate Glass and Evaporation from Sapphire Surfaces Microscopy and Microanalysis. 6: 388-389. DOI: 10.1017/S1431927600034437 |
0.304 |
|
2000 |
Blanford CF, Yan HW, Stein A, Carter CB. SEM and TEM of Metallic Inverse Opals Microscopy and Microanalysis. 6: 70-71. DOI: 10.1017/S1431927600032840 |
0.623 |
|
1999 |
Cohen D, McKernan S, Carter CB. Characterization of the Absolute Crystal Polarity across Twin Boundaries in Gallium Phosphide Using Convergent-Beam Electron Diffraction. Microscopy and Microanalysis. 5: 173-186. PMID 10383990 DOI: 10.1017/S1431927699000124 |
0.322 |
|
1999 |
Ravishankar N, Carter CB. Control of Grain Boundary Microstructures in Liquid-Phase Sintered Alumina Mrs Proceedings. 586: 59. DOI: 10.1557/Proc-586-59 |
0.348 |
|
1999 |
Zagrebelny AV, Lilleodden ET, Gerberich WW, Carter CB. Indentation of silicate-glass films on Al2O3 substrates Journal of the American Ceramic Society. 82: 1803-1808. DOI: 10.1111/J.1151-2916.1999.Tb02002.X |
0.336 |
|
1999 |
Johnson MT, Michael JR, Gilliss SR, Carter CB. Iron oxide on (001) MgO Philosophical Magazine A. 79: 2887-2898. DOI: 10.1080/01418619908212031 |
0.734 |
|
1999 |
Blanford C, Stein A, Carter C. Electron Microscopy of Hierarchical Materials Microscopy and Microanalysis. 5: 820-821. DOI: 10.1017/S1431927600017426 |
0.666 |
|
1999 |
Ravishankar N, Carter CB. Migration of Silicate Liquid Out of Grain Boundaries in Ceramics Microscopy and Microanalysis. 5: 800-801. DOI: 10.1017/S1431927600017323 |
0.303 |
|
1999 |
Johnson MT, Kotula PG, Carter CB. Growth of nickel ferrite thin films using pulsed-laser deposition Journal of Crystal Growth. 206: 299-307. DOI: 10.1016/S0022-0248(99)00342-5 |
0.324 |
|
1999 |
Yang W, McPherson SA, Mao Z, McKernan S, Carter CB. Single-crystal GaN pyramids grown on (1 1 1)Si substrates by selective lateral overgrowth Journal of Crystal Growth. 204: 270-274. DOI: 10.1016/S0022-0248(99)00205-5 |
0.314 |
|
1998 |
Johnson MT, Carter CB. Thin-Film Reaction between [alpha]-Fe2O3 and (001) MgO. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 4: 141-5. PMID 23232183 DOI: 10.1017/S1431927698980138 |
0.32 |
|
1998 |
Caldwell DA, Chen L-, Bensaoula AH, Farrer JK, Carter CB, Palmstrøm CJ. In-Situ Regrowthi of GaAs Through Controlled Phase Transformations and Reactions of Thin Films on GaAs Mrs Proceedings. 514. DOI: 10.1557/Proc-514-455 |
0.712 |
|
1998 |
Mallamaci MP, Sartain KB, Carter CB. Crystallization of calcium hexaluminate on basal alumina Philosophical Magazine. 77: 561-575. DOI: 10.1080/01418619808224069 |
0.316 |
|
1998 |
Johnson MT, Gilliss SR, Carter CB. Use of Pt Markers in the Study of Solid-State Reactions in the
Presence of an Electric Field Microscopy and Microanalysis. 4: 158-163. DOI: 10.1017/S1431927698980151 |
0.735 |
|
1998 |
Blanford CF, Bentley J, Stein A, Carter CB. An Investigation Into Beam Damage of Mesoporous Materials Microscopy and Microanalysis. 4: 712-713. DOI: 10.1017/S1431927600023680 |
0.662 |
|
1998 |
Mao Z, Johnson MT, Carter CB. Microstructural Characterization of GaN on (0001) Sapphire Microscopy and Microanalysis. 4: 628-629. DOI: 10.1017/S1431927600023266 |
0.306 |
|
1998 |
Yanina SV, Johnson MT, Mao Z, Carter CB. On Devitrification of Monticellite (CaMgSiO4) Films Grown on (001)-Oriented Single-Crystal MgO. Microscopy and Microanalysis. 4: 590-591. DOI: 10.1017/S1431927600023072 |
0.777 |
|
1997 |
Johnson MT, Mao Z, Carter CB. Crystal Defects In Gan On (0001) Sapphire Mrs Proceedings. 482: 405. DOI: 10.1557/Proc-482-405 |
0.346 |
|
1997 |
Johnson MT, Gilliss SR, Carter CB. Electric-Field Effects on Reactions Between Oxides Mrs Proceedings. 481. DOI: 10.1557/Proc-481-303 |
0.73 |
|
1997 |
Zagrebelny AV, Lilleodden ET, Carter CB. Effect of glass composition on mechanical properties of interfaces between alumina and silicate glass Materials Research Society Symposium - Proceedings. 458: 179-184. DOI: 10.1557/Proc-458-179 |
0.354 |
|
1997 |
Heffelfinger JR, Carter CB. The effect of surface structure on the growth of ceramic thin films Philosophical Magazine Letters. 76: 223-232. DOI: 10.1080/095008397179192 |
0.328 |
|
1997 |
Yanina SV, Johnson MT, Carter CB. The Dynamics of Mgo Surface Faceting Microscopy and Microanalysis. 3: 741-742. DOI: 10.1017/S143192760001059X |
0.771 |
|
1997 |
Zagrebelny AV, Carter CB. Indentation of strained silicate-glass films on alumina substrates Scripta Materialia. 37: 1869-1875. DOI: 10.1016/S1359-6462(97)00380-1 |
0.302 |
|
1997 |
Heffelfinger JR, Carter CB. Mechanisms of surface faceting and coarsening Surface Science. 389: 188-200. DOI: 10.1016/S0039-6028(97)00411-1 |
0.356 |
|
1996 |
Cohen D, Carter CB. Characterization Of APB's In GaP Mrs Proceedings. 442. DOI: 10.1557/Proc-442-503 |
0.366 |
|
1996 |
Zagrebelny AV, Nelson JC, Carter CB. Micromechanical Deformation of Single-Crystal Alumina Surfaces Mrs Proceedings. 440: 189. DOI: 10.1557/Proc-440-189 |
0.322 |
|
1996 |
Zagrebelny AV, Nelson JC, Lilleodden ET, Ramamurthy S, Carter CB. Alumina-silicate glass interfacial properties probed by micromechanical testing techniques Materials Research Society Symposium - Proceedings. 401: 103-108. DOI: 10.1557/Proc-401-103 |
0.346 |
|
1995 |
Kotula PG, Carter CB. Nucleation of Solid‐State Reactions between Nickel Oxide and Aluminium Oxide Journal of the American Ceramic Society. 78: 248-250. DOI: 10.1111/J.1151-2916.1995.Tb08395.X |
0.349 |
|
1995 |
Zhu JG, Palmstrom CJ, Carter CB. Lattice matched GaAs/Sc0.3Er0.7As/GaAs heterostructures grown on various substrate orientations Journal of Applied Physics. 77: 4321-4328. DOI: 10.1063/1.359455 |
0.574 |
|
1995 |
Zhu JG, Palmstrom CJ, Carter CB. Study of molecular-beam epitactic growth of GaAs on (100) Sc xE1-xAs/GaAs Journal of Applied Physics. 77: 4312-4320. DOI: 10.1063/1.359454 |
0.575 |
|
1995 |
Heffelfinger JR, Bench MW, Carter CB. On the faceting of ceramic surfaces Surface Science. 343. DOI: 10.1016/0039-6028(95)00896-9 |
0.355 |
|
1994 |
Kotula PG, Erickson DD, Carter CB. Use of Thin‐Film Substrates to Study Enhanced Solid‐State Phase Transformations Journal of the American Ceramic Society. 77: 3287-3291. DOI: 10.1111/J.1151-2916.1994.Tb04588.X |
0.313 |
|
1993 |
Mallamaci MP, Bentley J, Carter CB. In-Situ TEM Crystallization of Anorthite-Glass Films on α-Al 2 O 3 Mrs Proceedings. 321. DOI: 10.1557/Proc-321-567 |
0.339 |
|
1993 |
Mallamaci MP, Ramamurthy S, Carter CB. Liquid Infiltration of MgO and Al 2 O 3 Thin Films Mrs Proceedings. 318: 589. DOI: 10.1557/Proc-318-589 |
0.355 |
|
1993 |
King S, Heffelfinger J, Mallamaci M, McKernan S, Carter CB. Surface Steps on (100) MgO Foils Imaged by TEM, SEM and AFM Mrs Proceedings. 318. DOI: 10.1557/Proc-318-407 |
0.312 |
|
1993 |
King S, Carter CB. The Role Of Steps On The Micro Structure Of Titanium-Oxide Films Deposited By Pld Onto (100) Mgo Surfaces Mrs Proceedings. 317: 65. DOI: 10.1557/Proc-317-65 |
0.344 |
|
1993 |
Tietz LA, Carter CB. Structure of the Fe2O3–Al2O3 (1102) interface Philosophical Magazine. 67: 729-744. DOI: 10.1080/01418619308207186 |
0.32 |
|
1993 |
Tietz LA, Carter CB. Structure of the Fe2O3–Al2O3 (0001) interface Philosophical Magazine. 67: 699-727. DOI: 10.1080/01418619308207185 |
0.348 |
|
1992 |
Mckernan S, Carter CB. Image simulations of Ge twin boundaries Mrs Proceedings. 295: 173. DOI: 10.1557/Proc-295-173 |
0.302 |
|
1992 |
Kotula PG, Carter CB. Interfacial Reactions During Processing of Thin Nickel Oxide Films Grown by Pulsed-Laser Ablation Mrs Proceedings. 285. DOI: 10.1557/Proc-285-373 |
0.319 |
|
1992 |
King S, Carter CB. A TEM study of step morphology on the non-uhv heat-treated MgO (100) surface Mrs Proceedings. 280: 157. DOI: 10.1557/Proc-280-157 |
0.309 |
|
1992 |
Susnitzky DW, Carter CB. Surface Morphology of Heat‐Treated Ceramic Thin Films Journal of the American Ceramic Society. 75: 2463-2478. DOI: 10.1111/J.1151-2916.1992.Tb05599.X |
0.349 |
|
1991 |
Anderson IM, Tietz LA, Carter CB. Interface Structure Of Iron Oxide Thin Films Grown On Sapphire And Single-Crystal MgO Mrs Proceedings. 238. DOI: 10.1557/Proc-238-807 |
0.309 |
|
1991 |
Susnitzky DW, Carter CB. Defect/surface interactions in heat-treated ceramic thin films Journal of Materials Research. 6: 2403-2411. DOI: 10.1557/Jmr.1991.2403 |
0.363 |
|
1991 |
Carter CB, Anderson G, Ponce F. Accommodation Of Misfit During The Initial Growth Of Gaas On 111-Si Philosophical Magazine. 63: 279-298. DOI: 10.1080/01418619108204850 |
0.314 |
|
1991 |
Norton MG, Kotula PG, Carter CB. Oriented aluminum nitride thin films deposited by pulsed‐laser ablation Journal of Applied Physics. 70: 2871-2873. DOI: 10.1063/1.349352 |
0.32 |
|
1990 |
Norton MG, Carter CB. Interfaces in Structural Ceramics Mrs Bulletin. 15: 51-59. DOI: 10.1557/S088376940005867X |
0.334 |
|
1990 |
Finstad TG, Palmstrøm CJ, Mounier S, Keramidas VG, Zhu JG, Carter CB. Initial Stages of Gaas Growth on Sc l-X Er x as Surfaces Mrs Proceedings. 202: 413. DOI: 10.1557/Proc-202-413 |
0.5 |
|
1990 |
Zhu JG, Palmstrdøm CJ, Carter CB. Defects in Mbe-Grown GaAs/Sc x Er 1–x As/GaAs Layers Mrs Proceedings. 198: 177. DOI: 10.1557/Proc-198-177 |
0.502 |
|
1990 |
Zhu JG, Carter CB, Palmstrom CJ. Misfit Dislocations at Mismatched Epitactic Heterojunctions Mrs Proceedings. 198. DOI: 10.1557/Proc-198-171 |
0.58 |
|
1990 |
PalmstrØM CJ, Harbison JP, Sands T, Ramesh R, Finstad TG, Mounier S, Zhu JG, Carter CB, Florez LT, Keramidas VG. Buried Metal/III-V Semiconductor Heteroepitaxy: Approaches to Lattice Matching Mrs Proceedings. 198: 153. DOI: 10.1557/Proc-198-153 |
0.515 |
|
1990 |
Zhu JG, Carter CB. 60° dislocations in (001) GaAs/Si interfaces Philosophical Magazine. 62: 319-328. DOI: 10.1080/01418619008242506 |
0.548 |
|
1990 |
Norton MG, Summerfelt SR, Carter CB. Surface preparation for the heteroepitactic growth of ceramic thin films Applied Physics Letters. 56: 2246-2248. DOI: 10.1063/1.103246 |
0.364 |
|
1990 |
Zhu JG, Carter CB, Palmstrøm CJ, Mounier S. Microstructure of epitactically grown GaAs/ErAs/GaAs Applied Physics Letters. 56: 1323-1325. DOI: 10.1063/1.102506 |
0.608 |
|
1989 |
Mckernan S, Carter CB. High-Resolution Electron Microscopy of Olivine-Magnetite Interfaces. Mrs Proceedings. 280: 553. DOI: 10.1557/Proc-280-553 |
0.304 |
|
1989 |
Norton MG, Tietz LA, Carter CB, Russek SE, Moeckly BH, Buhrman RA. Grain Boundaries in Yba 2 Cu 3 O 7-δ Thin Films Mrs Proceedings. 169: 513. DOI: 10.1557/Proc-169-513 |
0.335 |
|
1989 |
Zhu JG, Palmstrøm CJ, Mounier S, Carter CB. Characterization of ErAs/GaAs and GaAs/ErAs/GaAs Structures Mrs Proceedings. 160: 325. DOI: 10.1557/Proc-160-325 |
0.556 |
|
1989 |
Zhu JG, McKeman S, Palmstrøm CJ, Carter CB. High-Resolution Imaging of Coga/GaAs and Eras/GaAs Interfaces Mrs Proceedings. 159. DOI: 10.1557/Proc-159-89 |
0.527 |
|
1989 |
Tietz LA, Summerfelt SR, English GR, Carter CB. Early stages of the heteroepitactic growth of hematite on (0001) Al2O3 by transmission electron microscopy Applied Physics Letters. 55: 1202-1204. DOI: 10.1063/1.102464 |
0.357 |
|
1989 |
Norton MG, Tietz LA, Summerfelt SR, Carter CB. Observation of the early stages of growth of superconducting thin films by transmission electron microscopy Applied Physics Letters. 55: 2348-2350. DOI: 10.1063/1.102363 |
0.338 |
|
1989 |
Zhu JG, Carter CB, Palmstrøm CJ, Garrison KC. Characterization of the CoGa/GaAs interface Applied Physics Letters. 55: 39-41. DOI: 10.1063/1.101748 |
0.603 |
|
1989 |
De Cooman BC, Carter CB, Wicks GW, Tanoue T, Eastman LF. The structure of InAs/GaSb superlattices Thin Solid Films. 170: 49-62. DOI: 10.1016/0040-6090(89)90621-4 |
0.379 |
|
1988 |
Zhu JG, McKernan S, Carter CB, Schaff WJ, Eastman LF. Dislocations in GaAs/Si Interfaces Mrs Proceedings. 144: 285. DOI: 10.1557/Proc-144-285 |
0.608 |
|
1988 |
McKernan S, Zhu JG, Carter CB, Caridi E, Schaff W. Defects and Interfaces in GaAs Grown on Si Mrs Proceedings. 116. DOI: 10.1557/Proc-116-273 |
0.562 |
|
1987 |
De Cooman BC, McKernan S, Carter CB, Ralston JR, Wicks GW, Eastman LF. The Observation of Stacking-Fault Tetrahedra in III-V Compounds Philosophical Magazine Letters. 56: 85-90. DOI: 10.1080/09500838708205254 |
0.332 |
|
1986 |
Ralston J, Wicks GW, Eastman LF, De Cooman BC, Carter CB. Defect structure and intermixing of ion-implanted AlxGa 1-xAs/GaAs superlattices Journal of Applied Physics. 59: 120-123. DOI: 10.1063/1.336852 |
0.366 |
|
1986 |
Schaus CF, Shealy JR, Eastman LF, Cooman BC, Carter CB. Improved GaAs/AlGaAs quantum-well heterostructures by organometallic vapor-phase epitaxy Journal of Applied Physics. 59: 678-680. DOI: 10.1063/1.336637 |
0.386 |
|
1985 |
Cooman BCD, Carter CB, Ralston J, Wicks GW, Eastman LF. THE DEFECT STRUCTURE OF ION-IMPLANTED Al x Ga 1−x As/GaAs SUPERLATFICES Mrs Proceedings. 56: 333. DOI: 10.1557/Proc-56-333 |
0.323 |
|
1985 |
Ralston J, Wicks GW, Eastman LF, Rathbun L, DeCooman BC, Carter CB. INTERMIXING OF ION-IMLANTED AlGaAs/GaAs SUPERLATTICES Mrs Proceedings. 56: 327. DOI: 10.1557/Proc-56-327 |
0.372 |
|
Show low-probability matches. |