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Harald Rose - Publications

Affiliations: 
1980-2000 Technische Universität Darmstadt 
Area:
Electron microscopy
Website:
https://de.wikipedia.org/wiki/Harald_Rose_(Physiker)
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39 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2022 Li Z, Biskupek J, Kaiser U, Rose H. Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick Samples. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-11. PMID 35249588 DOI: 10.1017/S1431927622000289  0.309
2022 Rose H. Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector. Ultramicroscopy. 235: 113484. PMID 35177296 DOI: 10.1016/j.ultramic.2022.113484  0.398
2020 Mohn MJ, Biskupek J, Lee Z, Rose H, Kaiser U. Lattice contrast in the core-loss EFTEM signal of graphene. Ultramicroscopy. 219: 113119. PMID 32987248 DOI: 10.1016/J.Ultramic.2020.113119  0.355
2019 Lee Z, Lehnert T, Kaiser U, Rose H. Comparison of different imaging models handling partial coherence for aberration-corrected HRTEM at 40-80 kV. Ultramicroscopy. PMID 30773417 DOI: 10.1016/J.Ultramic.2019.01.007  0.419
2019 Rose H, Nejati A, Müller H. Magnetic Cc/Cs-corrector compensating for the chromatic aberration and the spherical aberration of electron lenses. Ultramicroscopy. 203: 139-144. PMID 30553616 DOI: 10.1016/J.Ultramic.2018.11.014  0.413
2018 Lee Z, Kaiser U, Rose H. Prospects of annular differential phase contrast applied for optical sectioning in STEM. Ultramicroscopy. 196: 58-66. PMID 30282062 DOI: 10.1016/J.Ultramic.2018.09.012  0.399
2016 Lee Z, Hambach R, Kaiser U, Rose H. Significance of matrix diagonalization in modelling inelastic electron scattering. Ultramicroscopy. 175: 58-66. PMID 28129597 DOI: 10.1016/J.Ultramic.2016.11.011  0.4
2016 Linck M, Hartel P, Uhlemann S, Kahl F, Müller H, Zach J, Haider M, Niestadt M, Bischoff M, Biskupek J, Lee Z, Lehnert T, Börrnert F, Rose H, Kaiser U. Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV. Physical Review Letters. 117: 076101. PMID 27563976 DOI: 10.1103/Physrevlett.117.076101  0.477
2016 Ophus C, Ciston J, Pierce J, Harvey TR, Chess J, McMorran BJ, Czarnik C, Rose HH, Ercius P. Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry. Nature Communications. 7: 10719. PMID 26923483 DOI: 10.1038/Ncomms10719  0.414
2016 Lee Z, Biskupek J, Lehnert T, Rose H, Linck M, Hartel P, Müller H, Haider M, Kaiser U. Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations Microscopy and Microanalysis. 22: 894-895. DOI: 10.1017/S1431927616005316  0.345
2016 Ophus C, Ciston J, Yang H, Pierce J, Harvey TT, Chess J, McMorran BJ, Czarnik C, Rose H, Ercius P. Phase Contrast Imaging of Weakly-Scattering Samples with Matched Illumination and Detector Interferometry–Scanning Transmission Electron Microscopy (MIDI–STEM) Microscopy and Microanalysis. 22: 460-461. DOI: 10.1017/S1431927616003159  0.463
2014 Lee Z, Rose H, Lehtinen O, Biskupek J, Kaiser U. Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope images. Ultramicroscopy. 145: 3-12. PMID 24566042 DOI: 10.1016/J.Ultramic.2014.01.010  0.435
2013 Lee Z, Rose H, Hambach R, Wachsmuth P, Kaiser U. The influence of inelastic scattering on EFTEM images--exemplified at 20 kV for graphene and silicon. Ultramicroscopy. 134: 102-12. PMID 23870401 DOI: 10.1016/J.Ultramic.2013.05.020  0.377
2013 Rose H. The Long-Lasting Struggle to Achieve Atomic-Resolution Microscopy by Correcting the Aberrations of Electron Lenses Microscopy and Microanalysis. 19: 2006-2007. DOI: 10.1017/s1431927613012026  0.337
2012 Lee Z, Meyer JC, Rose H, Kaiser U. Optimum HRTEM image contrast at 20 kV and 80 kV--exemplified by graphene. Ultramicroscopy. 112: 39-46. PMID 22088506 DOI: 10.1016/J.Ultramic.2011.10.009  0.484
2011 Kaiser U, Biskupek J, Meyer JC, Leschner J, Lechner L, Rose H, Stöger-Pollach M, Khlobystov AN, Hartel P, Müller H, Haider M, Eyhusen S, Benner G. Transmission electron microscopy at 20 kV for imaging and spectroscopy. Ultramicroscopy. 111: 1239-46. PMID 21801697 DOI: 10.1016/J.Ultramic.2011.03.012  0.492
2010 Schmidt T, Marchetto H, Lévesque PL, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E, Freund HJ. Double aberration correction in a low-energy electron microscope. Ultramicroscopy. 110: 1358-61. PMID 20692099 DOI: 10.1016/J.Ultramic.2010.07.007  0.451
2010 Marko M, Rose H. The contributions of Otto Scherzer (1909-1982) to the development of the electron microscope. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 16: 366-74. PMID 20569527 DOI: 10.1017/S143192761000019X  0.424
2010 Rose H. Theoretical aspects of image formation in the aberration-corrected electron microscope. Ultramicroscopy. 110: 488-99. PMID 19896274 DOI: 10.1016/J.Ultramic.2009.10.003  0.424
2009 Rose HH. Future trends in aberration-corrected electron microscopy. Philosophical Transactions. Series a, Mathematical, Physical, and Engineering Sciences. 367: 3809-23. PMID 19687067 DOI: 10.1098/rsta.2009.0062  0.413
2009 Kabius B, Hartel P, Haider M, Müller H, Uhlemann S, Loebau U, Zach J, Rose H. First application of Cc-corrected imaging for high-resolution and energy-filtered TEM. Journal of Electron Microscopy. 58: 147-55. PMID 19398781 DOI: 10.1093/Jmicro/Dfp021  0.426
2009 Rose HH. Historical aspects of aberration correction. Journal of Electron Microscopy. 58: 77-85. PMID 19254915 DOI: 10.1093/jmicro/dfp012  0.408
2008 Rose HH. Optics of high-performance electron microscopes. Science and Technology of Advanced Materials. 9: 014107. PMID 27877933 DOI: 10.1088/1468-6996/9/1/014107  0.357
2008 Kabius B, Rose H. Chapter 7 Novel Aberration Correction Concepts Advances in Imaging and Electron Physics. 153: 261-281. DOI: 10.1016/S1076-5670(08)01007-0  0.469
2008 Rose H. Chapter 1 History of Direct Aberration Correction Advances in Imaging and Electron Physics. 153: 3-39. DOI: 10.1016/S1076-5670(08)01001-X  0.412
2005 Rose H. Prospects for aberration-free electron microscopy. Ultramicroscopy. 103: 1-6. PMID 15777594 DOI: 10.1016/J.Ultramic.2004.11.017  0.479
2005 Rose H, Wan W. Aberration correction in electron microscopy Proceedings of the Ieee Particle Accelerator Conference. 2005: 44-48. DOI: 10.1109/PAC.2005.1590354  0.369
2003 Hartel P, Preikszas D, Spehr R, Müller H, Rose H. Mirror corrector for low-voltage electron microscopes Advances in Imaging and Electron Physics. 120: 41-133. DOI: 10.1016/S1076-5670(02)80034-9  0.484
2002 Weitbssäcker C, Rose H. Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part II). Journal of Electron Microscopy. 51: 45-51. PMID 12003241 DOI: 10.1093/Jmicro/50.5.383  0.358
2002 Kabius B, Haider M, Uhlemann S, Schwan E, Urban K, Rose H. First application of a spherical‐aberration corrected transmission electron microscope in materials science Journal of Electron Microscopy. 51. DOI: 10.1093/Jmicro/51.Supplement.S51  0.442
1999 Urban K, Kabius B, Haider M, Rose H. A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope Journal of Electron Microscopy. 48: 821-826. DOI: 10.1093/Oxfordjournals.Jmicro.A023753  0.473
1999 Rose H. Prospects for realizing a sub-Å sub-eV resolution EFTEM Ultramicroscopy. 78: 13-25. DOI: 10.1016/S0304-3991(99)00025-X  0.442
1998 Müller H, Rose H, Schorsch P. A coherence function approach to image simulation Journal of Microscopy. 190: 73-88. DOI: 10.1046/J.1365-2818.1998.3050868.X  0.497
1998 Rödel W, Goenner H, Nienhaus U, Rössler U, Rose H, Grassberger P, Appel H, Perlt H. Raith: Bergmann/Schaefer: Lehrbuch der Experimentalphysik/Raith: Bergmann/Schaefer: Lehrbuch der Experimentalphysik/Lüders.: Physik für Naturwissenschaftler/Ridley.: Electrons and Phonons in Semiconductor Multilayers/Amelinckx: Electron Microscopy - Princ Physik Journal. 54: 450-454. DOI: 10.1002/phbl.19980540519  0.323
1996 Uhlemann S, Rose H. Acceptance of imaging energy filters Ultramicroscopy. 63: 161-167. DOI: 10.1016/0304-3991(96)00054-X  0.34
1996 Angert I, Burmester C, Dinges C, Rose H, Schröder RR. Elastic and inelastic scattering cross-sections of amorphous layers of carbon and vitrified ice Ultramicroscopy. 63: 181-192. DOI: 10.1016/0304-3991(96)00036-8  0.337
1996 Hartel P, Rose H, Dinges C. Conditions and reasons for incoherent imaging in STEM Ultramicroscopy. 63: 93-114. DOI: 10.1016/0304-3991(96)00020-4  0.411
1995 Kahl F, Rose H. Theoretical Concepts of Electron Holography Advances in Imaging and Electron Physics. 94: 197-257. DOI: 10.1016/S1076-5670(08)70146-0  0.439
1994 Rose H. Correction of aberrations, a promising means for improving the spatial and energy resolution of energy-filtering electron microscopes Ultramicroscopy. 56: 11-25. DOI: 10.1016/0304-3991(94)90142-2  0.425
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