| Year |
Citation |
Score |
| 2021 |
Grauby S, Ben Amor A, Hallais G, Vincent L, Dilhaire S. Imaging Thermoelectric Properties at the Nanoscale. Nanomaterials (Basel, Switzerland). 11. PMID 34062797 DOI: 10.3390/nano11051199 |
0.328 |
|
| 2020 |
Zenji A, Rampnoux JM, Grauby S, Dilhaire S. Ultimate-resolution thermal spectroscopy in time domain thermoreflectance (TDTR) Journal of Applied Physics. 128: 65106. DOI: 10.1063/5.0015391 |
0.354 |
|
| 2019 |
Ben Amor A, Djomani D, Fakhfakh M, Dilhaire S, Vincent L, Grauby S. Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction. Nanotechnology. PMID 31195385 DOI: 10.1088/1361-6528/Ab29A6 |
0.373 |
|
| 2018 |
Petsagkourakis I, Pavlopoulou E, Cloutet E, Chen YF, Liu X, Fahlman M, Berggren M, Crispin X, Dilhaire S, Fleury G, Hadziioannou G. Correlating the Seebeck coefficient of thermoelectric polymer thin films to their charge transport mechanism Organic Electronics. 52: 335-341. DOI: 10.1016/J.Orgel.2017.11.018 |
0.755 |
|
| 2017 |
Lozan O, Sundararaman R, Ea-Kim B, Rampnoux JM, Narang P, Dilhaire S, Lalanne P. Increased rise time of electron temperature during adiabatic plasmon focusing. Nature Communications. 8: 1656. PMID 29162822 DOI: 10.1038/S41467-017-01802-Y |
0.756 |
|
| 2017 |
d'Acremont Q, Pernot G, Rampnoux JM, Furlan A, Lacroix D, Ludwig A, Dilhaire S. High-throughput heterodyne thermoreflectance: Application to thermal conductivity measurements of a Fe-Si-Ge thin film alloy library. The Review of Scientific Instruments. 88: 074902. PMID 28764526 DOI: 10.1063/1.4986469 |
0.769 |
|
| 2017 |
Coffy E, Dodane G, Euphrasie S, Mosset A, Vairac P, Martin N, Baida H, Rampnoux JM, Dilhaire S. Anisotropic propagation imaging of elastic waves in oriented columnar thin films Journal of Physics D: Applied Physics. 50: 484005. DOI: 10.1088/1361-6463/Aa92Ad |
0.331 |
|
| 2017 |
Furlan A, Grochla D, D'Acremont Q, Pernot G, Dilhaire S, Ludwig A. Influence of Substrate Temperature and Film Thickness on Thermal, Electrical, and Structural Properties of HPPMS and DC Magnetron Sputtered Ge Thin Films Advanced Engineering Materials. 19: 1600854. DOI: 10.1002/Adem.201600854 |
0.751 |
|
| 2016 |
Petsagkourakis I, Pavlopoulou E, Portale G, Kuropatwa BA, Dilhaire S, Fleury G, Hadziioannou G. Structurally-driven Enhancement of Thermoelectric Properties within Poly(3,4-ethylenedioxythiophene) thin Films. Scientific Reports. 6: 30501. PMID 27470637 DOI: 10.1038/Srep30501 |
0.767 |
|
| 2016 |
Casanova A, D'Acremont Q, Santarelli G, Dilhaire S, Courjaud A. Ultrafast amplifier additive timing jitter characterization and control. Optics Letters. 41: 898-900. PMID 26974074 DOI: 10.1364/Ol.41.000898 |
0.32 |
|
| 2016 |
Chandezon J, Rampnoux JM, Dilhaire S, Audoin B, Guillet Y. In-line femtosecond common-path interferometer in reflection mode. Optics Express. 23: 27011-9. PMID 26480362 DOI: 10.1364/Oe.23.027011 |
0.336 |
|
| 2016 |
Michaud J, Bechou L, Veyrie D, Laruelle F, Dilhaire S, Grauby S. Thermal Behavior of High Power GaAs-Based Laser Diodes in Vacuum Environment Ieee Photonics Technology Letters. 28: 665-668. DOI: 10.1109/Lpt.2015.2504394 |
0.4 |
|
| 2015 |
Savelli G, Stein SS, Bernard-Granger G, Faucherand P, Montès L, Dilhaire S, Pernot G. Titanium-based silicide quantum dot superlattices for thermoelectrics applications. Nanotechnology. 26: 275605. PMID 26086207 DOI: 10.1088/0957-4484/26/27/275605 |
0.734 |
|
| 2015 |
Abbas A, Guillet Y, Rampnoux JM, Rigail P, Mottay E, Audoin B, Dilhaire S. Picosecond time resolved opto-acoustic imaging with 48 MHz frequency resolution. Optics Express. 22: 7831-43. PMID 24718159 DOI: 10.1364/Oe.22.007831 |
0.66 |
|
| 2014 |
Pradere C, Caumes JP, BenKhemis S, Pernot G, Palomo E, Dilhaire S, Batsale JC. Thermoreflectance temperature measurement with millimeter wave. The Review of Scientific Instruments. 85: 064904. PMID 24985839 DOI: 10.1063/1.4884639 |
0.758 |
|
| 2014 |
Rojo MM, Martín J, Grauby S, Borca-Tasciuc T, Dilhaire S, Martin-Gonzalez M. Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale. 6: 7858-65. PMID 24933655 DOI: 10.1039/C4Nr00107A |
0.401 |
|
| 2014 |
Lozan O, Perrin M, Ea-Kim B, Rampnoux JM, Dilhaire S, Lalanne P. Anomalous light absorption around subwavelength apertures in metal films. Physical Review Letters. 112: 193903. PMID 24877942 DOI: 10.1103/Physrevlett.112.193903 |
0.751 |
|
| 2014 |
Altet J, González JL, Gomez D, Perpiñà X, Claeys W, Grauby S, Dufis C, Vellvehi M, Mateo D, Reverter F, Dilhaire S, Jordà X. Electro-thermal characterization of a differential temperature sensor in a 65nm CMOS IC: Applications to gain monitoring in RF amplifiers Microelectronics Journal. 45: 484-490. DOI: 10.1016/J.Mejo.2014.02.009 |
0.382 |
|
| 2013 |
Aissou K, Shaver J, Fleury G, Pécastaings G, Brochon C, Navarro C, Grauby S, Rampnoux JM, Dilhaire S, Hadziioannou G. Nanoscale block copolymer ordering induced by visible interferometric micropatterning: a route towards large scale block copolymer 2D crystals. Advanced Materials (Deerfield Beach, Fla.). 25: 213-7. PMID 23172715 DOI: 10.1002/Adma.201203254 |
0.491 |
|
| 2013 |
Muñoz Rojo M, Grauby S, Rampnoux J, Caballero-Calero O, Martin-Gonzalez M, Dilhaire S. Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy Journal of Applied Physics. 113: 054308. DOI: 10.1063/1.4790363 |
0.427 |
|
| 2013 |
Grauby S, Puyoo E, Rampnoux J, Rouvière E, Dilhaire S. Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy The Journal of Physical Chemistry C. 117: 9025-9034. DOI: 10.1021/Jp4018822 |
0.784 |
|
| 2012 |
Altet J, Mateo D, Perpiñà X, Grauby S, Dilhaire S, Jordà X. Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring. The Review of Scientific Instruments. 82: 094902. PMID 21974611 DOI: 10.1063/1.3633957 |
0.346 |
|
| 2011 |
Pradere C, Clerjaud L, Batsale JC, Dilhaire S. High speed heterodyne infrared thermography applied to thermal diffusivity identification. The Review of Scientific Instruments. 82: 054901. PMID 21639530 DOI: 10.1063/1.3581335 |
0.797 |
|
| 2011 |
Pernot G, Michel H, Vermeersch B, Burke P, Lu H, Rampnoux JM, Dilhaire S, Ezzahri Y, Gossard A, Shakouri A. Frequency-dependent thermal conductivity in time domain thermoreflectance analysis of thin films Materials Research Society Symposium Proceedings. 1347: 1-7. DOI: 10.1557/Opl.2011.1277 |
0.814 |
|
| 2011 |
Dilhaire S, Pernot G, Calbris G, Rampnoux JM, Grauby S. Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology Journal of Applied Physics. 110: 114314. DOI: 10.1063/1.3665129 |
0.79 |
|
| 2011 |
Puyoo E, Grauby S, Rampnoux J, Rouvière E, Dilhaire S. Scanning thermal microscopy of individual silicon nanowires Journal of Applied Physics. 109: 024302. DOI: 10.1063/1.3524223 |
0.783 |
|
| 2010 |
Puyoo E, Grauby S, Rampnoux JM, Rouvière E, Dilhaire S. Thermal exchange radius measurement: application to nanowire thermal imaging. The Review of Scientific Instruments. 81: 073701. PMID 20687725 DOI: 10.1063/1.3455214 |
0.789 |
|
| 2010 |
Pernot G, Stoffel M, Savic I, Pezzoli F, Chen P, Savelli G, Jacquot A, Schumann J, Denker U, Mönch I, Deneke Ch, Schmidt OG, Rampnoux JM, Wang S, Plissonnier M, ... ... Dilhaire S, et al. Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers. Nature Materials. 9: 491-5. PMID 20436465 DOI: 10.1038/Nmat2752 |
0.769 |
|
| 2010 |
Clerjaud L, Pradere C, Batsale J, Dilhaire S. Heterodyne method with an infrared camera for the thermal diffusivity estimation with periodic local heating in a large range of frequencies (25 Hz to upper than 1 kHz) Quantitative Infrared Thermography Journal. 7: 115-128. DOI: 10.3166/Qirt.7.115-128 |
0.784 |
|
| 2010 |
Aldrete-Vidrio E, Mateo D, Altet J, Salhi MA, Grauby S, Dilhaire S, Onabajo M, Silva-Martinez J. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements Measurement Science and Technology. 21. DOI: 10.1088/0957-0233/21/7/075104 |
0.383 |
|
| 2009 |
Altet J, Aldrete-Vidrio E, Mateo D, Salhi A, Grauby S, Claeys W, Dilhaire S, Perpiñà X, Jordà X. Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization. The Review of Scientific Instruments. 80: 026101. PMID 19256677 DOI: 10.1063/1.3073963 |
0.381 |
|
| 2009 |
Michel H, Pernot G, Rampnoux J, Dilhaire S, Grauby S, Ezzahri Y, Shakouri A. Investigating Coherent Zone-Folded Acoustic Phonons in Si/SiGe Superlattices by Transient Thermoreflectance Technique Mrs Proceedings. 1221. DOI: 10.1557/Proc-1221-Cc08-03 |
0.781 |
|
| 2009 |
Grauby S, Salhi A, Rampnoux J, Claeys W, Dilhaire S. Fast Laser Scanning Imaging System for Surface Displacement Measurements Ieee Electron Device Letters. 30: 222-224. DOI: 10.1109/Led.2008.2012177 |
0.345 |
|
| 2009 |
Grauby S, Patino Lopez L, Salhi A, Puyoo E, Rampnoux J, Claeys W, Dilhaire S. Joule expansion imaging techniques on microlectronic devices Microelectronics Journal. 40: 1367-1372. DOI: 10.1016/J.Mejo.2008.04.016 |
0.768 |
|
| 2009 |
Pradère C, Batsale J, Goyhénèche J, Pailler R, Dilhaire S. Thermal properties of carbon fibers at very high temperature Carbon. 47: 737-743. DOI: 10.1016/J.Carbon.2008.11.015 |
0.372 |
|
| 2008 |
Dilhaire S, Rampnoux J, Pernot G, Calbris G, Grauby S, Rossignol C, Ermeneux S, Mottay E. Photothermal and photoacoustic imaging by ultrafast optical sampling The Journal of the Acoustical Society of America. 123: 3705-3705. DOI: 10.1121/1.2935125 |
0.767 |
|
| 2008 |
Aldrete-Vidrio E, Salhi MA, Altet J, Grauby S, Mateo D, Michel H, Clerjaud L, Rampnoux JM, Rubio A, Claeys W, Dilhaire S. Using temperature as observable of the frequency response of RF CMOS amplifiers Proceedings - 13th Ieee European Test Symposium, Ets 2008. 47-52. DOI: 10.1109/ETS.2008.15 |
0.766 |
|
| 2008 |
Altet J, Aldrete-Vidrio E, Mateo D, Perpiñà X, Jordà X, Vellvehi M, Millán J, Salhi A, Grauby S, Claeys W, Dilhaire S. A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits Measurement Science and Technology. 19: 115704. DOI: 10.1088/0957-0233/19/11/115704 |
0.44 |
|
| 2007 |
Grauby S, Salhi A, Rampnoux JM, Michel H, Claeys W, Dilhaire S. Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices. The Review of Scientific Instruments. 78: 074902. PMID 17672785 DOI: 10.1063/1.2757473 |
0.415 |
|
| 2007 |
Ezzahri Y, Grauby S, Rampnoux JM, Michel H, Pernot G, Claeys W, Dilhaire S, Rossignol C, Zeng G, Shakouri A. Coherent phonons inSi∕SiGesuperlattices Physical Review B. 75. DOI: 10.1103/Physrevb.75.195309 |
0.781 |
|
| 2007 |
Pradere C, Batsale JC, Goyheneche JM, Pailler R, Dilhaire S. Estimation of the transverse coefficient of thermal expansion on carbon fibers at very high temperature Inverse Problems in Science and Engineering. 15: 77-89. DOI: 10.1080/17415970600574047 |
0.328 |
|
| 2007 |
Ezzahri Y, Grauby S, Dilhaire S, Rampnoux JM, Claeys W. Cross-plan Si∕SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics Journal of Applied Physics. 101: 013705. DOI: 10.1063/1.2403236 |
0.45 |
|
| 2006 |
Rampnoux JM, Michel H, Salhi MA, Grauby S, Claeys W, Dilhaire S. Time gating imaging through thick silicon substrate: a new step towards backside characterisation Microelectronics Reliability. 46: 1520-1524. DOI: 10.1016/J.Microrel.2006.07.029 |
0.348 |
|
| 2006 |
Pradère C, Goyhénèche J, Batsale J, Dilhaire S, Pailler R. Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature International Journal of Thermal Sciences. 45: 443-451. DOI: 10.1016/J.Ijthermalsci.2005.05.010 |
0.394 |
|
| 2005 |
Rossignol C, Rampnoux JM, Perton M, Audoin B, Dilhaire S. Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses. Physical Review Letters. 94: 166106. PMID 15904252 DOI: 10.1103/Physrevlett.94.166106 |
0.331 |
|
| 2005 |
Dilhaire S, Grauby S, Claeys W. Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis Ieee Electron Device Letters. 26: 461-463. DOI: 10.1109/Led.2005.851090 |
0.363 |
|
| 2005 |
Grauby S, Dilhaire S, Jorez S, Claeys W. Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging Ieee Electron Device Letters. 26: 78-80. DOI: 10.1109/Led.2004.841468 |
0.359 |
|
| 2005 |
Lopez LDP, Dilhaire S, Grauby S, Salhi MA, Ezzahri Y, Claeys W, Batsale JC. Characterization of thermoelectric devices by laser induced Seebeck electromotive force (LIS-EMF) measurement Journal of Physics D: Applied Physics. 38: 1489-1497. DOI: 10.1088/0022-3727/38/10/001 |
0.701 |
|
| 2005 |
Ezzahri Y, Dilhaire S, Grauby S, Rampnoux JM, Claeys W, Zhang Y, Zeng G, Shakouri A. Study of thermomechanical properties of Si∕SiGe superlattices using femtosecond transient thermoreflectance technique Applied Physics Letters. 87: 103506. DOI: 10.1063/1.2009069 |
0.705 |
|
| 2005 |
Pradère C, Goyhénèche JM, Batsale JC, Dilhaire S, Pailler R. Specific-heat measurement of single metallic, carbon, and ceramic fibers at very high temperature Review of Scientific Instruments. 76: 064901. DOI: 10.1063/1.1927102 |
0.395 |
|
| 2005 |
Ezzahri Y, Patiño Lopez L, Chapuis O, Dilhaire S, Grauby S, Claeys W, Volz S. Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers Superlattices and Microstructures. 38: 69-75. DOI: 10.1016/J.Spmi.2005.04.005 |
0.656 |
|
| 2005 |
Grauby S, Salhi A, Claeys W, Trias D, Dilhaire S. ElectroStatic Discharge Fault Localization by Laser Probing Microelectronics Reliability. 45: 1482-1486. DOI: 10.1016/J.Microrel.2005.07.038 |
0.373 |
|
| 2004 |
Dilhaire S, Grauby S, Jorez S, Claeys W. Strain Energy Imaging of a Power MOS Transistor Using Speckle Interferometry Ieee Transactions On Reliability. 53: 293-296. DOI: 10.1109/Tr.2004.829165 |
0.316 |
|
| 2004 |
Dilhaire S, Grauby S, Claeys W. Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions Applied Physics Letters. 84: 822-824. DOI: 10.1063/1.1645326 |
0.384 |
|
| 2004 |
Altet J, Salhi MA, Dilhaire S, Ivanov A. Calibration-free heat source localisation in ICs entirely covered by metal layers Electronics Letters. 40: 241-242. DOI: 10.1049/El:20040172 |
0.331 |
|
| 2004 |
Altet J, Rampnoux J, Batsale J, Dilhaire S, Rubio A, Claeys W, Grauby S. Applications of temperature phase measurements to IC testing Microelectronics Reliability. 44: 95-103. DOI: 10.1016/S0026-2714(03)00138-0 |
0.363 |
|
| 2004 |
Patiño-Lopez LD, Salhi MA, Dilhaire S, Grauby S, Rampnoux JM, Jorez S, Claeys W. Thermal study of PN thermoelectric couple by laser induced Seebeck EMF measurement Superlattices and Microstructures. 35: 375-387. DOI: 10.1016/j.spmi.2003.09.003 |
0.332 |
|
| 2004 |
Dilhaire S, Grauby S, Claeys W, Batsale J. Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy Microelectronics Journal. 35: 811-816. DOI: 10.1016/J.Mejo.2004.06.012 |
0.45 |
|
| 2004 |
Rossignol C, Meri H, Perton M, Audoin B, Rampnoux J, Dilhaire S. Femtosecond laser generation and detection of longitudinal and shear acoustic waves in a sub-micrometric film Physica Status Solidi (C). 1: 2745-2748. DOI: 10.1002/Pssc.200405367 |
0.314 |
|
| 2003 |
Grauby S, Dilhaire S, Jorez S, Lopez LD, Rampnoux JM, Claeys W. Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique. Applied Optics. 42: 1763-8. PMID 12683753 DOI: 10.1364/Ao.42.001763 |
0.414 |
|
| 2003 |
Marinier G, Dilhaire S, Lopez LDP, Benzohra M. Dynamic characterization of SiO 2 -Au microcantilevers using Michelson interferometer Proceedings of Spie. 5116: 406-413. DOI: 10.1117/12.498827 |
0.362 |
|
| 2003 |
Grauby S, Dilhaire S, Jorez S, Claeys W. Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices Review of Scientific Instruments. 74: 645-647. DOI: 10.1063/1.1520316 |
0.363 |
|
| 2003 |
Altet J, Salhi MA, Dilhaire S, Syal A, Ivanov A. Localisation of devices acting as heat sources in ICs covered entirely by metal layers Electronics Letters. 39: 1440-1442. DOI: 10.1049/El:20030907 |
0.332 |
|
| 2003 |
Andriamonje G, Pouget V, Ousten Y, Lewis D, Danto Y, Rampnoux J, Ezzahri Y, Dilhaire S, Grauby S, Claeys W, Rossignol C, Audoin B. Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits Microelectronics Reliability. 43: 1803-1807. DOI: 10.1016/S0026-2714(03)00307-X |
0.661 |
|
| 2003 |
Dilhaire S, Salhi A, Grauby S, Claeys W. Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability. 43: 1609-1613. DOI: 10.1016/S0026-2714(03)00282-8 |
0.385 |
|
| 2001 |
Altet J, Rubio A, Schaub E, Dilhaire S, Claeys W. Thermal coupling in integrated circuits: application to thermal testing Ieee Journal of Solid-State Circuits. 36: 81-91. DOI: 10.1109/4.896232 |
0.412 |
|
| 2000 |
Dilhaire S, Schaub E, Claeys W, Altet J, Rubio A. Localisation of heat sources in electronic circuits by microthermal laser probing International Journal of Thermal Sciences. 39: 544-549. DOI: 10.1016/S1290-0729(00)00235-0 |
0.435 |
|
| 1999 |
Quintard V, Dilhaire S, Phan T, Claeys W. Temperature measurements of metal lines under current stress by high-resolution laser probing Ieee Transactions On Instrumentation and Measurement. 48: 69-74. DOI: 10.1109/19.755063 |
0.406 |
|
| 1999 |
Altet J, Rubio A, Claeys W, Dilhaire S, Schaub E, Tamamoto H. Journal of Electronic Testing. 14: 57-66. DOI: 10.1023/A:1008397205559 |
0.339 |
|
| 1999 |
Dilhaire S, Jorez S, Cornet A, Schaub E, Claeys W. Optical method for the measurement of the thermomechanical behaviour of electronic devices Microelectronics Reliability. 39: 981-985. DOI: 10.1016/S0026-2714(99)00134-1 |
0.363 |
|
| 1999 |
Dilhaire S, Altet J, Jorez S, Schaub E, Rubio A, Claeys W. Fault localisation in ICs by goniometric laser probing of thermal induced surface waves Microelectronics Reliability. 39: 919-923. DOI: 10.1016/S0026-2714(99)00123-7 |
0.347 |
|
| 1999 |
Nassim K, Joannes L, Cornet A, Dilhaire S, Schaub E, Claeys W. High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor Microelectronics Journal. 30: 1125-1128. DOI: 10.1016/S0026-2692(99)00074-9 |
0.381 |
|
| 1998 |
Altet J, Rubio A, Dilhaire S, Schaub E, Claeys W. BiCMOS thermal sensor circuit for built-in test purposes Electronics Letters. 34: 1307. DOI: 10.1049/El:19980947 |
0.326 |
|
| 1998 |
Dilhaire S, Phan T, Schaub E, Claeys W. Sondes laser et méthodologies pour l'analyse thermique à l'échelle micrométrique. Application à la microélectronique Revue GéNéRale De Thermique. 37: 49-59. DOI: 10.1016/S0035-3159(97)82466-X |
0.44 |
|
| 1998 |
Dilhaire S, Cornet A, Rauzan C, Claeys W, Schaub E. Measurement of the thermomechanical behaviour of the solder-lead interface in solder joints by laser probing : a new method for measuring the bond quality Microelectronics Reliability. 38: 1293-1296. DOI: 10.1016/S0026-2714(98)00080-8 |
0.349 |
|
| 1998 |
Nassim K, Joannes L, Cornet A, Dilhaire S, Schaub E, Claeys W. Thermomechanical deformation imaging of power devices by electronic speckle pattern interferometry (ESPI) Microelectronics Reliability. 38: 1341-1345. DOI: 10.1016/S0026-2714(98)00079-1 |
0.321 |
|
| 1998 |
Dilhaire S, Phan T, Schaub E, Claeys W. Thermomechanical effects in metal lines on integrated circuits analysed with a differential polarimetric interferometer Microelectronics Reliability. 38: 1591-1597. DOI: 10.1016/S0026-2714(98)00033-X |
0.409 |
|
| 1998 |
Lewis D, Dilhaire S, Phan T, Quintard V, Hornung V, Claeys W. Modelling and experimental study of heat deposition and transport in a semiconductor laser diode Microelectronics Journal. 29: 171-179. DOI: 10.1016/S0026-2692(97)00055-4 |
0.397 |
|
| 1997 |
Phan T, Dilhaire S, Quintard V, Lewis D, Claeys W. The method of dynamic separation and its application to quantitative thermal analysis of microelectronic devices by laser interferometry and reflectometry Measurement Science and Technology. 8: 303-316. DOI: 10.1088/0957-0233/8/3/013 |
0.442 |
|
| 1997 |
Phan T, Dilhaire S, Batsale J, Quintard V, Claeys W. Laser probing determination of the thermal conductivity of integrated circuit dielectric layers High Temperatures-High Pressures. 29: 81-88. DOI: 10.1068/Htec367 |
0.382 |
|
| 1997 |
Phan T, Dilhaire S, Quintard V, Lewis D, Claeys W. Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation Journal of Applied Physics. 81: 1157-1168. DOI: 10.1063/1.363985 |
0.402 |
|
| 1997 |
Dilhaire S, Phan T, Schaub E, Claeys W. High sensitivity and high resolution differential interferometer: Micrometric polariscope for thermomechanical studies in microelectronics Microelectronics Reliability. 37: 1587-1590. DOI: 10.1016/S0026-2714(97)00116-9 |
0.338 |
|
| 1996 |
Quintard V, Deboy G, Dilhaire S, Lewis D, Phan T, Claeys W. Laser beam thermography of circuits in the particular case of passivated semiconductors Microelectronic Engineering. 31: 291-298. DOI: 10.1016/0167-9317(95)00351-7 |
0.39 |
|
| 1996 |
QUINTARD V, PARMENTIER B, PHAN T, LEWIS D, DILHAIRE S, CLAEYS W. LASER PROBE MEASUREMENTS OF QUALITY EVOLUTION OF SOLDER JOINTS DURING THERMAL CYCLING AGEING TESTS Quality and Reliability Engineering International. 12: 447-451. DOI: 10.1002/(Sici)1099-1638(199611)12:6<447::Aid-Qre66>3.0.Co;2-L |
0.363 |
|
| 1995 |
Claeys W, Dilhaire S, Lewis D, Quintard V, Phan T, Aucouturier JL. Optical ammeter for integrated circuit characterization and failure analysis Quality and Reliability Engineering International. 11: 247-251. DOI: 10.1002/Qre.4680110406 |
0.332 |
|
| 1994 |
Claeys W, Dilhaire S, Quintard V, Lewis D, Phan T, Aucouturier JL. Interferences of Peltier thermal waves produced in ohmic contacts upon integrated circuits Le Journal De Physique Iv. 4: C7-195-C7-198. DOI: 10.1051/Jp4:1994747 |
0.434 |
|
| 1994 |
Claeys W, Quintard V, Dilhaire S, Lewis D, Danto Y. Early detection of ageing in solder joints through laser probe thermal analysis of the peltier effect Quality and Reliability Engineering International. 10: 289-295. DOI: 10.1002/Qre.4680100407 |
0.394 |
|
| 1994 |
Claeys W, Quintard V, Dilhaire S, Lewis D, Danto Y. Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe Quality and Reliability Engineering International. 10: 237-242. DOI: 10.1002/Qre.4680100314 |
0.447 |
|
| 1993 |
Claeys W, Dilhaire S, Quintard V. Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing Microelectronic Engineering. 24: 411-420. DOI: 10.1016/0167-9317(94)90093-0 |
0.412 |
|
| 1993 |
Claeys W, Dilhaire S, Quintard V, Dom JP, Danto Y. Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components Quality and Reliability Engineering International. 9: 303-308. DOI: 10.1002/Qre.4680090411 |
0.414 |
|
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