Year |
Citation |
Score |
2014 |
Ahmadi E, Chalabi H, Kaun SW, Shivaraman R, Speck JS, Mishra UK. Contribution of alloy clustering to limiting the two-dimensional electron gas mobility in AlGaN/GaN and InAlN/GaN heterostructures: Theory and experiment Journal of Applied Physics. 116. DOI: 10.1063/1.4896967 |
0.566 |
|
2014 |
Yang T, Shivaraman R, Speck JS, Wu Y. The influence of random indium alloy fluctuations in indium gallium nitride quantum wells on the device behavior Journal of Applied Physics. 116: 113104. DOI: 10.1063/1.4896103 |
0.458 |
|
2014 |
Ahmadi E, Shivaraman R, Wu F, Wienecke S, Kaun SW, Keller S, Speck JS, Mishra UK. Elimination of columnar microstructure in N-face InAlN, lattice-matched to GaN, grown by plasma-assisted molecular beam epitaxy in the N-rich regime Applied Physics Letters. 104. DOI: 10.1063/1.4866435 |
0.579 |
|
2013 |
Shivaraman R, Kawaguchi Y, Tanaka S, Denbaars SP, Nakamura S, Speck JS. Comparative analysis of 202̄1 and 202̄1 ̄ semipolar GaN light emitting diodes using atom probe tomography Applied Physics Letters. 102. DOI: 10.1063/1.4812363 |
0.394 |
|
2013 |
Shivaraman R, Wu Y-, Choi S, Chung R, Speck J. Atom Probe Tomography of III-Nitrides Based Semiconducting Devices Microscopy and Microanalysis. 19: 956-957. DOI: 10.1017/S1431927613006776 |
0.46 |
|
2012 |
Wu Y, Shivaraman R, Wang K, Speck JS. Analyzing the physical properties of InGaN multiple quantum well light emitting diodes from nano scale structure Applied Physics Letters. 101: 83505. DOI: 10.1063/1.4747532 |
0.449 |
|
2012 |
Choi S, Wu F, Shivaraman R, Young EC, Speck JS. Publisher’s Note: “Observation of columnar microstructure in lattice-matched InAlN/GaN grown by plasma assisted molecular beam epitaxy” [Appl. Phys. Lett. 100, 232102 (2012)] Applied Physics Letters. 101: 49903. DOI: 10.1063/1.4740223 |
0.476 |
|
2012 |
Choi S, Wu F, Shivaraman R, Young EC, Speck JS. Observation of columnar microstructure in lattice-matched InAlN/GaN grown by plasma assisted molecular beam epitaxy Applied Physics Letters. 100: 232102. DOI: 10.1063/1.4725482 |
0.501 |
|
2011 |
Prosa TJ, Clifton PH, Zhong H, Tyagi A, Shivaraman R, DenBaars SP, Nakamura S, Speck JS. Erratum: “Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate” [Appl. Phys. Lett. 98, 191903 (2011)] Applied Physics Letters. 98: 239901. DOI: 10.1063/1.3598937 |
0.388 |
|
2011 |
Prosa TJ, Clifton PH, Zhong H, Tyagi A, Shivaraman R, DenBaars SP, Nakamura S, Speck JS. Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate Applied Physics Letters. 98: 191903. DOI: 10.1063/1.3589370 |
0.408 |
|
2011 |
Chung RB, Wu F, Shivaraman R, Keller S, Denbaars SP, Speck JS, Nakamura S. Growth study and impurity characterization of AlxIn 1-xN grown by metal organic chemical vapor deposition Journal of Crystal Growth. 324: 163-167. DOI: 10.1016/J.Jcrysgro.2011.04.025 |
0.454 |
|
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