Marc Schaepkens - Publications
Affiliations: | State University of New York, Albany, Albany, NY, United States |
Year | Citation | Score | |||
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2003 | Li X, Oehrlein GS, Schaepkens M, Ellefson RE, Frees LC. Spatially resolved mass spectrometric sampling of inductively coupled plasmas using a movable sampling orifice Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 21: 1971-1977. DOI: 10.1116/1.1619413 | 0.411 | |||
2001 | Schaepkens M, Oehrlein GS. A Review of SiO2 Etching Studies in Inductively Coupled Fluorocarbon Plasmas Journal of the Electrochemical Society. 148. DOI: 10.1149/1.1348260 | 0.454 | |||
1999 | Li X, Schaepkens M, Oehrlein GS, Ellefson RE, Frees LC, Mueller N, Korner N. Mass spectrometric measurements on inductively coupled fluorocarbon plasmas: Positive ions, radicals and endpoint detection Journal of Vacuum Science and Technology. 17: 2438-2446. DOI: 10.1116/1.581980 | 0.448 | |||
1998 | Schaepkens M, Oehrlein GS, Hedlund C, Jonsson LB, Blom H. Selective SiO2-to-Si3N4 etching in inductively coupled fluorocarbon plasmas: Angular dependence of SiO2 and Si3N4 etching rates Journal of Vacuum Science and Technology. 16: 3281-3286. DOI: 10.1116/1.581534 | 0.381 | |||
1998 | Schaepkens M, Oehrlein GS. Asymmetric microtrenching during inductively coupled plasma oxide etching in the presence of a weak magnetic field Applied Physics Letters. 72: 1293-1295. DOI: 10.1063/1.121068 | 0.423 | |||
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